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Pin 1 G
Pin 2 D
Pin 3 S
Type BUZ 51
VDS
1000 V
ID
3.4 A
RDS(on)
4
Package TO-220 AB
Maximum Ratings Parameter Continuous drain current Symbol Values 3.4 Unit A
ID IDpuls
13.5
TC = 29 C
Pulsed drain current
TC = 25 C
Avalanche current,limited by Tjmax Avalanche energy,periodic limited by Tjmax Avalanche energy, single pulse
3.4 12 mJ
VGS Ptot
20 125
V W
TC = 25 C
Operating temperature Storage temperature Thermal resistance, chip case Thermal resistance, chip to ambient DIN humidity category, DIN 40 040 IEC climatic category, DIN IEC 68-1
Semiconductor Group
C K/W
07/96
BUZ 51
Electrical Characteristics, at Tj = 25C, unless otherwise specified Parameter Symbol min. Static Characteristics Drain- source breakdown voltage Values typ. max. Unit
V(BR)DSS
1000 3 0.1 10 10 3.6 4
VGS(th)
2.1
VGS=VDS, ID = 1 mA
Zero gate voltage drain current
IDSS
1 100
IGSS
100
nA 4
VGS = 20 V, VDS = 0 V
Drain-Source on-resistance
RDS(on)
VGS = 10 V, ID = 2.2 A
Semiconductor Group
07/96
BUZ 51
Electrical Characteristics, at Tj = 25C, unless otherwise specified Parameter Symbol min. Dynamic Characteristics Transconductance Values typ. max. Unit
gfs
1 3 980 85 45 -
S pF 1300 130 70 ns 15 25
Ciss Coss
-
Crss
-
td(on)
tr
70 105
td(off)
175 235
tf
70 95
Semiconductor Group
07/96
BUZ 51
Electrical Characteristics, at Tj = 25C, unless otherwise specified Parameter Symbol min. Reverse Diode Inverse diode continuous forward current IS TC = 25 C Inverse diode direct current,pulsed A 0.95 0.3 2.5 3.4 13.5 V 1.4 s C Values typ. max. Unit
TC = 25 C
Inverse diode forward voltage
VGS = 0 V, IF = 6.8 A
Reverse recovery time
Semiconductor Group
07/96
BUZ 51
130 W 110
Ptot
100 90 80 70 60 50
ID
TC
TC
10 0
t = 23.0s p
ID
10 1
ZthJC
10 -1
100 s
10 -2 D = 0.50
1 ms
DS
=V
10
/I
0.20 10
10 ms -3
0.10 0.05
DS (on )
10 -4
single pulse
0.02 0.01
10 -1 0 10
10
10
DC 3 V 10
10 -5 -7 10
10
-6
10
-5
10
-4
10
-3
10
-2
10
-1
s 10
VDS
tp
Semiconductor Group
07/96
BUZ 51
Ptot = 125W
kj h i g
11
ID
6.0 5.5 5.0 4.5 4.0 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0.0 0 10 20 30 40 50
RDS (on)
10 9 8 7 6 5 4 3 2
VGS [V] =
a 4.0 4.5 b 5.0 c 5.5 d 6.0 e f 6.5 7.0 g 7.5 h i j k 8.0 9.0 10.0 20.0
d 5.5
d e 6.0
f 6.5 g 7.0 h 7.5
e f g i k h j
i j
8.0 9.0
k 10.0 l 20.0
1 V 75 0 0.0
60
1.0
2.0
3.0
4.0
5.0
6.5
VDS
ID
ID
gfs
3.2 2.8 2.4 2.0 1.6 1.2 0.8 0.4 0.0 0.0
0.4
0.8
1.2
1.6
2.0
2.4
VGS
A ID
3.2
Semiconductor Group
07/96
BUZ 51
RDS (on) 16
14 12 10 8 6 4 2 0 -60
98%
VGS(th)
typ
2%
98% typ
-20
20
60
100
160
Tj
Tj
Typ. capacitances
nF C 10 0
IF Ciss
10 1
10 -1
10 0
Coss Crss
10 -2 0
10
15
20
25
30
V VDS
40
10 -1 0.0
0.4
0.8
1.2
1.6
2.0
2.4
3.0
VSD
Semiconductor Group
07/96
BUZ 51
EAS
350 300
VGS
Tj
Q Gate
1200 V 1160
V(BR)DSS 1140
1120 1100 1080 1060 1040 1020 1000 980 960 940 920 900 -60
-20
20
60
100
160
Tj
Semiconductor Group
07/96
BUZ 51
Semiconductor Group
07/96
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