High frequency and noise model of gate-all-around metal-oxide-semiconductor fiel d-effect transistors This paper appears in: Journal

of Applied Physics Date of Publication: Apr 2009 Author(s): Nae, B. Departament d Enginyeria Electrnica, Elctrica i Automtica, Universitat Rovira i Virg ili, 43007 Tarragona, Spain Lazaro, A. ; Iniguez, B. Volume: 105 , Issue: 7 Page(s): 074505 - 074505-8 Product Type: Journals & Magazines High Frequency and Noise Model of Gate-All-Around MOSFETs Nae, B.; Lazaro, A.; Iniguez, B. Electron Devices, 2009. CDE 2009. Spanish Conference on Topic(s): Components, Circuits, Devices & Systems ; Engineered Materials, Die lectrics & Plasmas ; Photonics & Electro-Optics Digital Object Identifier: 10.1109/SCED.2009.4800443 Publication Year: 2009 , Page(s): 112 - 115

RF and Noise Performance of Multiple-Gate SOI MOSFETs Lazaro, A.; Iniguez, B. European Microwave Integrated Circuits Conference, 2006. The 1st Topic(s): Fields, Waves & Electromagnetics Digital Object Identifier: 10.1109/EMICC.2006.282815 Publication Year: 2006 , Page(s): 312 - 315 Cited by 1 IEEE Conference Publications Characterization and Modeling of 1/ f Noise in Si-nanowire FETs: Effects of Cyl indrical Geometry and Different Processing of Oxides Rock-Hyun Baek; Chang-Ki Baek; Hyun-Sik Choi; Jeong-Soo Lee; Yun Young Yeoh; Kyo ung Hwan Yeo; Dong-Won Kim; Kinam Kim; Kim, D.M.; Yoon-Ha Jeong Nanotechnology, IEEE Transactions on Volume: 10 , Issue: 3 Topic(s): Bioengineering ; Communication, Networking & Broadcasting ; Compon ents, Circuits, Devices & Systems ; Computing & Processing (Hardware/Software) ; Engineering Profession ; Fields, Waves & Electromagnetics ; Robotics & Cont rol Systems Digital Object Identifier: 10.1109/TNANO.2010.2044188 Publication Year: 2011 , Page(s): 417 - 423 Cited by 4 IEEE Journals & Magazines

Compact model of MOSFET electron tunneling current through ultra-thin SiO2 and h igh-k gate stacks This paper appears in: Device Research Conference, 2003 Date of Conference: 23-25 June 2003 Author(s): Fei Li Microelectron. Res. Center, Texas Univ., Austin, TX, USA Mudanai, S.P. ; Yang-yu Fan ; Register, L.F. ; Banerjee, S.K. Page(s): 47 - 48

Product Type: Conference Publications