ECE202

Course Prerequisite:

TRANSMISSION LINES AND FIELDS

ECE208 ENGINEERING ELECTROMAGNETICS

LTPC 3 0 03

Unit 1 Transmission Line theory Common types of transmission lines used in circuits, lumped circuit model for transmission line and formal solutions. Characteristic impedance, propagation constant, attenuation and phase constants. Open circuited and short circuited lines. Reflection of line not terminated in Z0- Reflection coefficient- standing wave ratioreflection factor return loss. Generator and mismatches- distortion in transmission lines. Unit 2 Planar transmission lines Microstrip lines- Characteristic impedance-Losses in microstrip lines Q-factor of microstrip line. Parallel strip lines- distributed parameters- characteristic impedance- losses Coplanar strip line- shielded strip line- tapered strip line-microstrip resonator CAT cable Unit 3 Matching and Measurement Transmission line resonator- impedance matching-single and double stub. Narrowband and broadband matching- quarter wave transformer. Measurement of VSWR, impedance, insertion loss and attenuation using Smith chart Unit 4 Introduction to EMI Electromagnetic noise sources - Coupling of transmission lines to external EM fields Coupling between lines Grounding and shielding methods. Unit 5 Waveguides General solutions for TEM, TE and TM waves- parallel plate waveguide Rectangular waveguide -TE, TM modes, power transmission, losses in rectangular waveguide excitation of modes. Circular waveguide- TE, TM modes, power transmission Dielectric fiber and rod waveguide- waveguide coupling, attenuation factor and Q of waveguide Coaxial lines TEM and higher order modes

Text Book: T1 T2 David M. Pozar, Microwave Engineering, John Wiley 2005, 3rd ed. Edward Jordan & Keith George Balmain, Electromagnetic waves & radiating systems, Prentice-Hall, 2006. References: John D. Ryder, Network lines and fields, PHI, 2006, 2nd ed. V.Prasad Kodali, Engineering Electromagnetic Compatibility, Principles, Measurements, and technologies, IEEE Electromagnetic compatibility society, IEEE press.

R1 R2