37.

5 Change of Phase Due to Reflection

A wave traveling from a medium of index of refraction n
1

toward a medium of index of refraction n
2
undergoes a 180 phase
change upon reflection when n
2
> n
1
. There is no phase change in
the reflected wave if n
2
< n
1
.



37.6 Interference in Thin Films
Why thin films of oil on water and soap bubbles displays color
patterns?


Review: The wavelength of light
n
in a medium whose
refraction index is n is
n
=

0
n
, where
0
is the wavelength of
light in free space.

The condition for constructive interference in thin films is
2t = (m+
1
2
)
n


2nt = (m+
1
2
)
0
(m = 0, 1, 2, )
This takes into account (1) differences in the distances traveled
by two rays and (2) phase changes that occur upon reflection.

The condition for destructive interference in thin films is
2nt = m (m = 0, 1, 2, )

The color pattern is due to variation of thickness of films.
Newton's Rings

Example: Calculate the thickness of a soap bubble film (n = 1.33)
that results in constructive interference with 600 nm light.
Solution:
For constructive interference:
2nt = (m +
1
2
) (m = 0, 1, 2, )
Thus, t =
(m +
1
2
)
2n
=
(m+
1
2
)600nm
2(1.33)
= (m +
1
2
)225.6nm
t = 113 nm, 338 nm, 789 nm, and so on.

Example: Nonreflective coating for solar cells.
A transparent thin film of silicon monoxide (SiO, n = 1.45) is
coated on the surface of a solar cell (n = 3.5) to minimize reflective
losses. Determine the minimum film thickness that produces the
least reflection at a wavelength of 550 nm, near the center of the
visible spectrum.

Solution: Reflected bean #1 and #2
must have destructive interference.

Since both beams have 180 phase
change, the condition for the
destructive interference is

2t = (m+
1
2
)
SiO
= (m+
1
2
) / n
SiO


For the minimum thickness, m = 0
t = / 4n
SiO
= 550nm/(4 1.45)
= 94.8 nm