Mode 1 :

l eff ,1 = min( l eff , cp ; l eff , nc )

(2.3.6.a)

Mode 2 :

l eff ,2 = l eff ,nc

(2.3.6.b)

Mode 3 :

(2.3.6.c)

Circular pattern (l eff,cp)

Non-circular patterns (l eff,nc)

(a) Different yield line patterns

F / B t.Rd

Mode 3

1
Mode 2
0,8
Mode 1

0,6

Mode 1*

0,4
0,2

4 leff Mpl.Rd / Bt.Rd

0
0

0,5

1,5

2,5

(b) Design resistance

Figure 2.3.3 T-stub resistance according revised Annex J

2.3.1.2

Alternative approach for Mode 1 failure

The accuracy of the T-stub approach is quite good when the resistance is governed by failure
modes 2 and 3. The formulae for failure mode 1, on the other hand, has been seen quite
conservative, and sometimes too conservative, when a plastic mechanism forms in the T-stub
flange (Jaspart, 1991).

2.22