Beruflich Dokumente
Kultur Dokumente
OK
SiK
NbL
CrK
MnK
FeK
NiK
0
3.28
6.57
9.85
13.13
[Distance in Microns]
Genesis Maps-Linescan D:\Imagens\varios usuarios\Profa. Margareth\Tiago\0 Nb\imagem2_1.csv 5/21/14
ROI Integral Intensities Vertical Full Scale (Cps): Auto
CK
OK
SiK
NbL
CrK
MnK
FeK
NiK