DISPOSITION GUIDELINES FOR STM WLCSP WAFER SORT

Disposition Guidelines for STM WLCSP Wafer Sort

--Follow Email Distribution to report the hold lots.

MEMORY DEVICES
Devices Involved:Pxxx
P71C_xxx
P791_xxx

FOR P7(V_4W080TA, RESORT/RESORT AS FRESH IS FORBIDDEN (die will if
resort)-Will indicate in PDMS.
Device Background:
These are low cost serial EPROM
One-Time Programming (OTP) device
T2 sort option used
Sorted on J750 platform
Internal Disposition:
Normally dont resort for function fail rejects bins, if see site issue, dispose 1x
wafer to resort and monitor first:
o Can recover, resort the rest
o If no recovery report to STM disposition ( TAKE NOTE it may change to
other function bins(bin 5/8/9) due to the program setting)

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FOR P7(V_4W080TA, RESORT IS FORBIDDEN (die will if resort);

If any wafer fails hi conty, it is ok to send that wafer for resort (conty (HBIN4)
only) without the need to ask STM for disposition. If not recoverable, report to
STM ;
If for some reason, prober hangs halfway while sorting the wafer, it is ok to resort
that affected wafer as fresh EXCEPT P7(V_4W080TA
You may trackout the wafers if the effective yield is >=98% but conty is >0.5%.
Please ensure that the conty is not caused by map shift. If such pattern is detected,
call PE. Illustration shown below:

DISPOSITION GUIDELINES FOR STM WLCSP WAFER SORT

Low Yield Lot Reporting:

A table showing the following fields for the low yield wafers:
o Wafer ID -> wafer no. can be just wafer slot id
o Total -> GDPW per wafer
o Tested = GDPW-HBINF
o Pass -> Pass dies per wafer
o Fail -> Failed dies per wafer
o O/S -> HBIN4 rejects
o Effective Yield = (Pass / Tested) x100%
o O/S % = (O/S / Tested) x 100%
o Remarks -> can leave it blank.

Need to attach wafermaps and test summaries for the affected low yield wafers in
the email to STM.

Effective yield for STM WLCSP devices: Pxx series devices -> 98% min yield, 0.5% max conty

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Equation for calculating effective yield -> (BIN1 / (GDPW - BINF)).

Equation for calculating effective conty yield -> (BIN4 / (GDPW - BINF)).
It is ok to trackout the wafers if effective yield>=98% but conty >= 0.5%

DISPOSITION GUIDELINES FOR STM WLCSP WAFER SORT

NORMAL DEVICES
Devices Involved: Hxx
H*CR_414*
H*CR_427*
H*GD_432*
H*N6_411*
..
Device Background:
T2 sort option used
Auto resort upon completion of wafer sorting
Sorted on HP93K C200 platform
Internal Disposition:
Send affected low yield wafers for 1X resort(on diff tester if available). If still not
able to recover, report to STM
~Thank you~

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