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  • Chapter I Introduction: Chapter Iv Low Power Patterngeneration

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    Teja Patti
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    This document outlines the contents of a work on system-on-chip (SOC) testing. It includes chapters on introducing SOC and linear feedback shift registers, an overview of VLSI, SOC background covering attributes, design tools, power consumption and manufacturing processes. Subsequent chapters cover SOC testing, test tools and approaches, built-in self-test using LFSR pattern generation, and the idea of low power test pattern generation.

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    This document outlines the contents of a work on system-on-chip (SOC) testing. It includes chapters on introducing SOC and linear feedback shift registers, an overview of VLSI, SOC background covering attributes, design tools, power consumption and manufacturing processes. Subsequent chapters cover SOC testing, test tools and approaches, built-in self-test using LFSR pattern generation, and the idea of low power test pattern generation.

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    © All Rights Reserved
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    Markieren Sie unangemessene Inhalte
    6 Ansichten2 Seiten

    Chapter I Introduction: Chapter Iv Low Power Patterngeneration

    Hochgeladen von

    Teja Patti
    This document outlines the contents of a work on system-on-chip (SOC) testing. It includes chapters on introducing SOC and linear feedback shift registers, an overview of VLSI, SOC background covering attributes, design tools, power consumption and manufacturing processes. Subsequent chapters cover SOC testing, test tools and approaches, built-in self-test using LFSR pattern generation, and the idea of low power test pattern generation.

    Copyright:

    © All Rights Reserved
    Als DOCX, PDF, TXT herunterladen oder online auf Scribd lesen
    Markieren Sie unangemessene Inhalte
    von 2

    CONTENTS

    CHAPTER I

    INTRODUCTION

    1.1

    INTRODUCTION TO SYSTEM-ON-CHIP (SOC)

    1.2

    LINEAR FEEDBACK SHIFT REGISTERS (LFSR )

    1.3

    INTRODUCTION TO BIST

    1.4

    INTRODUCTION TO VLSI

    1.4.1 OVERVIEW

    1.4.2 WHAT IS VLSI?

    1.4.3APPLICATIONS

    1.4.4 ASIC

    CHAPTER II SOC BACKGROUND


    2.1

    SOC

    2.2

    SOC Attributes

    2.3
    2.4
    2.5
    2.6

    SOC Design Tools and Methodology


    SOC Power Consumption
    SOC Manufacturing Processes
    SOC Test and Assembly

    CHAPTER III
    3.1

    SOC TEST

    SOC TEST

    9
    10
    11
    12
    14
    16

    3.2 SOC Test Tools and Methodology


    3.3 Test Approaches (External and Conventional DFT)
    3.4

    Built-In-Self-Test (BIST)

    20

    3.5

    BIST Pattern Generation Using LFSR

    22

    3.6

    LFSR

    23
    24
    25
    26

    CHAPTER IV
    4.1

    LOW POWER PATTERNGENERATION

    Idea Behind Low Power Test Pattern Generation

    CONTENTS

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