Beruflich Dokumente
Kultur Dokumente
True Voltage
Level Shifter
Rajesh Garg
Gagandeep Mallarapu
Sunil P. Khatri
Outline
Introduction
Previous Work
Our Approach
Experimental Results
Conclusions
2
Introduction
Introduction
Introduction
Previous Work
Limited range of operation due to the usage of diodeconnected NMOS device to generate lower supply voltage
Leakage currents are higher when VDDO greater than
VDDI + VT
VDDI
Domain
GND
VDDO
node1
GND
VDDO
node2
GND
VDDO
outb
ctrl
GND
Vctrl
VTM 2
Vctrl
VDDI
Domain
To minimize
leakage current,
use high VT devices
8
All transistors except M4, M6 and M8
are
Experimental Results
Experimental Results
22
122.6
5.6
33.3
50.5
1.5
27.6
71.87
2.6
33.8
119.27
3.5
20.8
157.2
7.6
3.6
71.1
19.8
Performance Parameter
Our SS-TVLS
Combined VLS
High-to-Low
conversion
VDDI
= 1.2VRatio
and
34.9
46.5
1.3
Delay Rise (ps)
VDDO
= 0.8V
15.7
35.2
2.2
Delay Fall (ps)
Power Rise (W)
27.3
20.7
0.8
59.3
56.8
1.0
7.3
32.5
4.5
3.9
36.3
10
9.3
Experimental Results
Performance Parameter
T = 27oC
Our SS-TVLS
Combined VLS
Our SS-TVLS
Combined VLS
22.08
1.1
129.4
27.4
35.1
2.4
52
3.9
33.2
1.9
50.4
15.6
0.8
34.8
1.3
27.7
0.8
78.9
7.3
27.5
1.3
22.5
1.1
33.8
0.4
114.2
7.2
59.5
0.6
52.5
0.1
31.5
13.7
218.8
158.6
8.6
41.4
14.1
3.8
102.9
75.41
1.3
o C as9.0
Similar results
are3.8obtained
for
T = 3.6
60 o and
9032.3
11
well
Leakage
Current Low (nA)
Experimental Results
Delay
Conclusions
THANK YOU!
14