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Instrument Characteristics

Mainly they are divided in two parts: 1.Static Characteristics 2. Dynamic Characteristics

Static Characteristics
These characteristics are considered when the instrument is used to measure a quantity or a condition that do not vary with a time.

Dynamic Characteristics
These characteristics are considered when the instrument is used to measure a quantity or a condition changes rapidly wrt to time.

Desirable Statistic Characteristics


1. Accuracy 2. Reproducibility 3. Sensitivity 4. Linearity

Un desirable Statistic Characteristics 1. Drift 2. Dead Zone 3. Static error 4. Hysterisis

Accuracy
It is an ability of an instrument to indicate true value. 100% Accuracy means 0%Error.

Reproducibility
It is degree of closeness with which same value of a variable can be measured at different times. Perfect reproducibility means instrument has no drift.

Sensitivity
It denotes the smallest change in measured variable to which the instrument responds. S=Change in Output/Change in Input For Example Galvanometer Sensitivity is mm/ A

Threshold
The minimum value of Input below which no out put can be detected. Si Diode Threshold is 0.7 Volts Ge Diode Threshold is 0.3 Volts

Resolution
It is the smallest measurable input change detected by an Instrument.

Calibration
It is the operation of making an adjustment or marking a scale so that readings of an instrument conform to an accepted and certified standard. Calibration creates confidence of using instruments in user mind.

Linearity
The amount of error change throughout an instrument's measurement range. Linearity is also the amount of deviation from an instrument's ideal straight-line performance.

Dynamic Characteristics
Desirable Dynamic Characteristics 1. Speed of Response 2. Fidelity Speed of response is the rapidity with which an instrument responds to changes in measured quantity. Fidelity is the ability of an instrument to produce a wave shape identical to wave shape of input with respect to time.

Undesirable Dynamic Characterstics

1. Lag 2. Dynamic Error.

Measurement Lag
Measurement Lag is defined as delay in response of an instrument to changes in measurand quantity. Example is Hysteresis Loop [B-H Curve] in case of Electrical Machines. In any measuring system lag can occur at primary element, the transmission element and final measuring element.

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