KC(1)-276.

dst:
Test Object - Device Settings
Substation/Bay:
Substation:
Bay:

220KV TDHB
BV RP276

Substation address:
Bay address:

220KV TDHB /BV RP276

7SA522
1012107944

Manufacturer:
Device address:

SIEMENS

50.00 Hz
100.0 V
1.000 A

Number of phases:
V primary:
I primary:

3
220.0 kV
1.500 kA

1.732

IN / I nom:

1.000

120.0 V

I max:

10.00 A

Deglitch time:

0.000 s

HB-HD

Device:
Name/description:
Device type:
Serial/model number:
Additional info 1:
Additional info 2:

Nominal Values:
f nom:
V nom (secondary):
I nom (secondary):

Residual Voltage/Current Factors:

VLN / VN:

Limits:
V max:

Debounce/Deglitch Filters:
Debounce time:

5.000 ms

Overload Detection:
Suppression time:

50.00 ms

Test Object - Other RIO Functions

CB Configuration
Description

Name

Value

CB trip time
CB close time
52a/b %

CB trip time
CB close time
52a/b %

50.00 ms
100.00 ms
20.00 %

Test Object - Distance Settings

System parameters:
Line length:
PT connection:
Impedance correction
1A/I nom:
Impedances in primary
values:

1.000
at line
no

Line angle:
CT starpoint:

82.00
Dir. line

Tol. T abs. -:
Tol. Z abs.:

100.0 ms
100.0 m

XE/XL:

0.830000

no

Tolerances:
Tol. T rel.:
Tol. T abs. +:
Tol. Z rel.:

1.000 %
100.0 ms
5.000 %

Grounding factor:
RE/RL:
Separate arc
resistance:

0.820000
no

Zone Settings:
Label

Type

Fault loop Trip time

Tol.T rel

Tol.T abs+ Tol.T abs- Tol.Z rel.

Tol.Z abs

Z1
Z1
Z1B
Z1B
Z2
Z2
Z3
Z3

Tripping
Tripping
extended
extended
Tripping
Tripping
Tripping
Tripping

L-L
L-E
L-L
L-E
L-L
L-E
L-L
L-E

1.000 %
1.000 %
1.000 %
1.000 %
1.000 %
1.000 %
1.000 %
1.000 %

100.0 ms
100.0 ms
100.0 ms
100.0 ms
100.0 ms
100.0 ms
100.0 ms
100.0 ms

100.0 m
100.0 m
100.0 m
100.0 m
100.0 m
100.0 m
100.0 m
100.0 m

0.000 s
0.000 s
0.000 s
0.000 s
500.0 ms
500.0 ms
3.000 s
3.000 s

100.0 ms
100.0 ms
100.0 ms
100.0 ms
100.0 ms
100.0 ms
100.0 ms
100.0 ms

5.000 %
5.000 %
5.000 %
5.000 %
5.000 %
5.000 %
5.000 %
5.000 %

X/

30

20

10

-10

-30

-20

-10

10

20

30

R/

Linked XRIO References

Reference Name Unit Value XRIO Path

Test Settings
Test model:
Test model:
Allow reduction of
ITest/VTest:

constant test current

no

ITest

700.0 mA

1.000 s
500.0 ms

Max. fault:
Time reference:

6.000 s
fault inception

off
yes

Extended zones:

not active

Fault Inception:
Mode:
DC-offset:

random
no

Times:
Prefault:
Postfault:

Other:
CB simulation:
Switch off at zero
crossing:

Test Results
Shot Test: Fault Type L1-E
|Z|
904.4 m
14.83
20.00
23.37
17.30
22.27
25.55
24.00
26.08
32.00
26.19
27.33
34.12
42.50
47.29
31.57

Phi

t nom

50.00
115.79
-18.46
35.51
117.55
-20.00
35.97
117.74
-20.00
41.19
118.82
-20.00
41.28
118.07
52.25
-20.86

0.000 s
0.000 s
0.000 s
0.000 s
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s

t act.

Dev.

17.40 ms
47.90 ms
46.60 ms
38.30 ms
558.1 ms
552.7 ms
543.1 ms
556.4 ms
553.1 ms
536.3 ms
3.057 s
3.057 s
3.036 s
3.058 s
3.043 s
3.083 s

ITest

17.40 ms
47.90 ms
46.60 ms
38.30 ms
11.62 %
10.54 %
8.62 %
11.28 %
10.62 %
7.26 %
1.913 %
1.91 %
1.21 %
1.937 %
1.45 %
2.767 %

Result

700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA

Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed

X/

30

20

10

-10

-20

-10

Shot Test: Fault Type L2-E

10

20

30

R/

|Z|
904.4 m
14.83
20.00
23.37
17.30
22.27
25.55
24.00
26.08
32.00
26.19
27.33
34.12
42.50
47.29
31.57

Phi

t nom

50.00
115.79
-18.46
35.51
117.55
-20.00
35.97
117.74
-20.00
41.19
118.82
-20.00
41.28
118.07
52.25
-20.86

0.000 s
0.000 s
0.000 s
0.000 s
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s

t act.

Dev.

16.80 ms
47.40 ms
47.60 ms
37.10 ms
551.8 ms
553.0 ms
536.9 ms
552.8 ms
552.8 ms
542.7 ms
3.052 s
3.053 s
3.037 s
3.052 s
3.037 s
3.064 s

ITest

16.80 ms
47.40 ms
47.60 ms
37.10 ms
10.36 %
10.6 %
7.38 %
10.56 %
10.56 %
8.54 %
1.737 %
1.78 %
1.243 %
1.74 %
1.227 %
2.123 %

Result

700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA

Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed

X/

30

20

10

-10

-20

-10

10

20

30

R/

Shot Test: Fault Type L3-E

|Z|
904.4 m
14.83
20.00
23.37
17.30
22.27
25.55
24.00
26.08
32.00
26.19
27.33
34.12
42.50
47.29
31.57

Phi
50.00
115.79
-18.46
35.51
117.55
-20.00
35.97
117.74
-20.00
41.19
118.82
-20.00
41.28
118.07
52.25
-20.86

t nom
0.000 s
0.000 s
0.000 s
0.000 s
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s

t act.
17.20 ms
47.10 ms
47.30 ms
37.20 ms
552.7 ms
551.8 ms
537.2 ms
552.0 ms
556.6 ms
537.7 ms
3.053 s
3.052 s
3.038 s
3.053 s
3.037 s
3.082 s

Dev.
17.20 ms
47.10 ms
47.30 ms
37.20 ms
10.54 %
10.36 %
7.44 %
10.4 %
11.32 %
7.54 %
1.753 %
1.73 %
1.263 %
1.76 %
1.227 %
2.74 %

ITest
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA

Result
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed

X/

30

20

10

-10

-20

-10

10

20

30

R/

Shot Test: Fault Type L1-L2

|Z|
1.267
4.466
9.796
14.36
14.18
12.00
5.829
16.00
16.00
20.00
23.19
9.642
23.05
22.66
24.92
11.42
24.75
29.89
15.26
40.00
40.00

Phi
60.00
-10.00
114.10
106.17
71.65
117.01
-10.00
110.00
68.39
118.11
114.00
-17.24
66.76
118.02
113.61
-17.95
64.81
118.54
-20.00
110.79
70.00

t nom
0.000 s
0.000 s
0.000 s
0.000 s
0.000 s
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s

t act.
17.50 ms
47.10 ms
47.90 ms
46.80 ms
37.60 ms
552.3 ms
552.0 ms
551.8 ms
536.2 ms
551.9 ms
556.1 ms
557.4 ms
536.6 ms
3.052 s
3.052 s
3.052 s
3.037 s
3.052 s
3.052 s
3.052 s
3.037 s

Dev.
17.50 ms
47.10 ms
47.90 ms
46.80 ms
37.60 ms
10.46 %
10.4 %
10.36 %
7.24 %
10.38 %
11.22 %
11.48 %
7.32 %
1.74 %
1.747 %
1.72 %
1.237 %
1.737 %
1.737 %
1.737 %
1.217 %

ITest
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA

Result
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed

X/

30

20

10

-10

-20

-10

10

20

30

R/

Shot Test: Fault Type L2-L3

|Z|
1.267
4.466
9.796
14.36
14.18
12.00
5.829
16.00
16.00
20.00
23.19
9.642
23.05
22.66
24.92
11.42
24.75
29.89
15.26
40.00
40.00

Phi
60.00
-10.00
114.10
106.17
71.65
117.01
-10.00
110.00
68.39
118.11
114.00
-17.24
66.76
118.02
113.61
-17.95
64.81
118.54
-20.00
110.79
70.00

t nom
0.000 s
0.000 s
0.000 s
0.000 s
0.000 s
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s

t act.
23.70 ms
47.10 ms
47.70 ms
46.00 ms
36.40 ms
552.3 ms
552.0 ms
552.7 ms
536.6 ms
552.0 ms
552.2 ms
551.7 ms
536.5 ms
3.052 s
3.057 s
3.052 s
3.036 s
3.052 s
3.053 s
3.052 s
3.037 s

Dev.
23.70 ms
47.10 ms
47.70 ms
46.00 ms
36.40 ms
10.46 %
10.4 %
10.54 %
7.32 %
10.4 %
10.44 %
10.34 %
7.3 %
1.73 %
1.907 %
1.727 %
1.207 %
1.743 %
1.773 %
1.737 %
1.24 %

ITest
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA

Result
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed

X/

30

20

10

-10

-20

-10

10

20

30

R/

Shot Test: Fault Type L3-L1

|Z|
1.267
4.466
9.796
14.36
14.18
12.00
5.829
16.00
16.00
20.00
23.19
9.642
23.05
22.66
24.92
11.42
24.75
29.89
15.26
40.00
40.00

Phi
60.00
-10.00
114.10
106.17
71.65
117.01
-10.00
110.00
68.39
118.11
114.00
-17.24
66.76
118.02
113.61
-17.95
64.81
118.54
-20.00
110.79
70.00

t nom
0.000 s
0.000 s
0.000 s
0.000 s
0.000 s
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s

t act.
19.70 ms
46.90 ms
46.90 ms
46.60 ms
36.00 ms
552.0 ms
552.2 ms
552.6 ms
542.6 ms
551.9 ms
551.9 ms
552.5 ms
536.5 ms
3.053 s
3.052 s
3.052 s
3.037 s
3.052 s
3.053 s
3.052 s
3.036 s

Dev.
19.70 ms
46.90 ms
46.90 ms
46.60 ms
36.00 ms
10.4 %
10.44 %
10.52 %
8.52 %
10.38 %
10.38 %
10.5 %
7.3 %
1.75 %
1.747 %
1.737 %
1.223 %
1.73 %
1.757 %
1.747 %
1.207 %

ITest
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA

Result
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed

X/

30

20

10

-10

-20

-10

10

20

30

R/

Shot Test: Fault Type L1-L2-L3

|Z|
1.267
4.466
9.796
14.36
14.18
12.00
5.829
16.00
16.00
20.00
23.19
9.642
23.05
22.66
24.92
11.42
24.75
29.89
15.26
40.00
40.00

Phi
60.00
-10.00
114.10
106.17
71.65
117.01
-10.00
110.00
68.39
118.11
114.00
-17.24
66.76
118.02
113.61
-17.95
64.81
118.54
-20.00
110.79
70.00

t nom
0.000 s
0.000 s
0.000 s
0.000 s
0.000 s
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
500.0 ms
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s
3.000 s

t act.
22.90 ms
47.20 ms
47.50 ms
47.30 ms
36.80 ms
552.4 ms
552.3 ms
551.8 ms
536.3 ms
551.9 ms
556.6 ms
551.9 ms
536.8 ms
3.052 s
3.052 s
3.052 s
3.042 s
3.053 s
3.057 s
3.057 s
3.037 s

Dev.
22.90 ms
47.20 ms
47.50 ms
47.30 ms
36.80 ms
10.48 %
10.46 %
10.36 %
7.26 %
10.38 %
11.32 %
10.38 %
7.36 %
1.737 %
1.733 %
1.743 %
1.387 %
1.75 %
1.89 %
1.907 %
1.243 %

ITest
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA
700.0 mA

Result
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed

X/

30

20

10

-10

-20

-10

10

20

30

R/

Shot Details:
Parameters:
Fault Type:
| Z |:
R:
ITest

L1-L2-L3
40.00
13.68
700.0 mA

Phi:
X:

70.00
37.59

3.037 s
3.000 s
2.900 s

Assessment:
Dev.:
t max:

Passed
1.243 %
no trip

Results:
t act.:
t nom:
t min:

Fault Quantities (natural):

VL1:
VL2:
VL3:
IL1:
IL2:
IL3:
VFault:
IFault:

28.00 V
28.00 V
28.00 V
700.0 mA
700.0 mA
700.0 mA
28.00 V
700.0 mA

0.00
-120.00
120.00
-70.00
-190.00
50.00
0.00
-70.00

Fault

Postfault
Trip

V/V
30
20
10
0
-0.5

-10

0.0

0.5

1.0

1.5

2.0

2.5

3.0

1.5

2.0

2.5

3.0

1.5

2.0

2.5

3.0

t/s

-20
-30
-40
VL1

VL2

VL3

I/A
0.75
0.50
0.25
0.00
-0.5

-0.25

0.0

0.5

1.0

t/s

-0.50
-0.75
-1.00
IL1

IL2

IL3

Trip
Start
-0.5

0.0

0.5

1.0

Cursor Data
Time
Cursor 1
Cursor 2
C2 - C1

Test State:
Test passed

Signal
0.000 s <none>
3.037 s <none>
3.037 s

Value
n/a
n/a
n/a

t/s