Beruflich Dokumente
Kultur Dokumente
N
jccrs
=1
(S)
Where:
N
sag
number of expected voltage sags;
N
years
number of years of simulation;
X
i
number of voltage sags for a specific year.
The results give a general view of the performance of the
end-user busbar, in terms of voltage sag frequency. For exam-
ple, for an end-user with a sensitive equipment or process, the
results can help in estimating per year costs. In this kind of
analysis, it is necessary to know the sensitivity of the process,
obtained from equipment manufacturers, according to sensitiv-
ity curves such as CBEMA or ITIC [1], [5], [14].In order to
consider the time as a variable in the adopted methodology it
would be necessary the adjustment of the each line protec-
tions.
Curves in Figs. 3 to 5 show that, for 1,000 Monte Carlo
simulations (SMC), the average number of voltage sags for the
end-user is 67. Fig. 3 shows that there is a large variation in
the number of expected sags between years, however, in the
230 kV
138 kV
13.8 kV
Client C
busbar 9112 (380V)
69 kV
138 kV
138 kV
long term the average value converges fast. Fig. 4 shows that
the maximum number of voltage sags (bar graph) coincides
with the same average value.
The frequency of voltage sags according to sag magnitude
Fig. 3. Performance of the simulation and estimation of the average number
of voltage sags at busbar 9112 for 1,000 years, for a fault impedance of 0
(zero) .
Fig. 4. Frequency and cummulative distribution of voltage sags at busbar
9112 for 1,000 years, for a fault impedance of 0 (zero) .
Fig. 5. Probability density of sag magnitude classes at busbar 9112, for a fault
impedance of 0 (zero) .
Fig. 6. Performance of the simulation and estimation of the average number
of voltage sags at busbar 9112 for 1,000 years, for a random fault impedance.
Fig. 7. Frequency and cummulative distribution of voltage sags at busbar
9112 for 1,000 years, for a random fault impedance.
Fig. 8. Probability density of sag magnitude classes at busbar 9112, for a
random fault impedance.
classes can be assessed by Fig. 5. It can be seen that the end-
user has a greater number of voltage sags in the classes of 0.70
to 0.85 p.u. and of 0.85 to 0.9 p.u.. The number of voltage sags
in the class of 0.50 to 0.70 p.u. is slightly lesser. Fig. 5 also
shows that the busbar 9112 has a very low probability of volt-
age sags in the class of 0.10 to 0.50 p.u., when solid faults are
simulated.
According to the second set of simulations, where the fault
impedance was a random variable, the number of average
voltage sags falls to 59, as shown in Figs. 6-8. Fig. 8 shows a
small increase in the number of voltage sags in the class of
0.10 to 0.50 p.u.. However, the number of voltage sags in the
100 200 300 400 500 600 700 800 900 1000
0
10
20
30
40
50
60
70
80
90
Simulations or scenarios
N
u
m
b
e
r
o
f
v
o
l
t
a
g
e
s
a
g
s
p
e
r
y
e
a
r
Simulation Performance
Mean
45 50 55 60 65 70 75 80 85 90 95
0
10
20
30
40
50
60
70
80
90
Number of voltage sags per year
N
u
m
b
e
r
o
f
S
M
C
C
u
m
u
l
a
t
i
v
e
f
r
e
q
u
e
n
c
y
o
f
v
o
l
t
a
g
e
s
a
g
s
(
%
)
0
10
20
30
40
50
60
70
80
90
100
-10 0 10 20 30 40 50 60 70 80 90
0
0.05
0.1
0.15
0.2
0.25
0.3
0.35
0.4
Number of voltage sag per year
P
r
o
b
a
b
i
l
i
t
y
d
e
n
s
i
t
y
0,1 <= sag < 0,9
0,85 < sag < 0,9
0,7 < sag <= 0,85
0,5 < sag <= 0,7
0,1 <= sag <= 0,5
100 200 300 400 500 600 700 800 900 1000
0
10
20
30
40
50
60
70
80
Simulations or scenarios
N
u
m
b
e
r
o
f
v
o
l
t
a
g
e
s
a
g
s
p
e
r
y
e
a
r
Simulation performance
Mean
40 50 60 70 80 90
0
10
20
30
40
50
60
70
80
Number of voltage sags per year
N
u
m
b
e
r
o
f
S
M
C
F
r
e
q
u
e
n
c
y
c
u
m
u
l
a
t
i
v
e
o
f
v
o
l
t
a
g
e
s
a
g
s
(
%
)
0
10
20
30
40
50
60
70
80
90
100
-10 0 10 20 30 40 50 60 70 80 90
0
0.02
0.04
0.06
0.08
0.1
0.12
0.14
0.16
0.18
0.2
Number of voltage sags per year
P
r
o
b
a
b
i
l
i
t
y
d
e
n
s
i
t
y
0,1 <= sag < 0,9
0,85 < sag < 0,9
0,7 < sag <= 0,85
0,5 < sag <= 0,7
0,1 <= sag <= 0,5
other classes diminished, mostly those voltage sags in the
class of 0.50 to 0.70 p.u..
According to Figs. 9 to 11, where a large fault impedance is
simulated (15 ), the average number of voltage sags falls to
35. Fig. 9 shows that the variability of the expected number of
sags does not change compared with the previous set of simu-
lations. Fig. 10 shows that the most common number of sags is
36, although the average number of sags is 35. Fig. 11 shows
that the number of sags in the class of 0.1 to 0.5 p.u. is similar
to the number of sags obtained in the set of simulation with
Fig. 9. Performance of the simulation and calculus of average number of
voltage sags at busbar 9112 for 1,000 years, for a fault impedance of 15 .
Fig. 10. Frequency and cummulative distribution of voltage sags at busbar
9112 for 1,000 years, for a fault impedance of 15 .
Fig. 11. Probability density of sag magnitude classes at busbar 9112, for a
fault impedance of 15 .
TABLE III
AVERAGE NUMBER OF VOLTAGE SAGS ACCORDING TO VOLTAGE CLASS AND
FAULT IMPEDANCE AT BUSBAR 9112.
Fault
impedance
()
Sag magnitude classes (p.u.)
0.1- 0.5 0.5 - 0.7 0.7 - 0.85 0.85 - 0.9 0.1 - 0.9
0 0 21.0 23.0 23.0 66.8
Random 4.1 14.4 19.1 21.1 58.6
2 5.1 14.7 20.3 20.5 60.5
5 5.3 14.0 18.6 22.0 59.9
10 0 16.6 9.3 26.1 52.0
15 0 2.3 19.6 12.6 34.5
TABLE IV
RELATIVE VARIATION OF VOLTAGE SAGS AT BUSBAR 9112 FOR 0 (ZERO) AND
15 FAULT IMPEDANCES.
Sag magnitude
classes (p.u.)
0.1-0.5 0.5-0.7 0.7-0.85 0.85-0.9 0.1-0.9
Variation (%) 0 -88 -15 -45 -48
0 . Fig. 11 shows also that the difference between the sag
magnitude classes is larger than in the previous sets of simula-
tions.
Finally, the effect of the fault impedance on voltage sags at
the monitored end-user busbars summarized in Table III. This
table shows the average frequency of voltage sags for each
magnitude class. Also it is seen that the increase of the fault
impedance leads to a considerable decrease of the voltage sags
frequency (class of 0.1 to 0.9 p.u.). That cannot be concluded
to the most severe voltage sags (class of 0.1 to 0.5 p.u.), where
the sag frequency does not reduce with the increase of fault
impedance.
In order to quantify the variation of voltage sag frequency
for each sag magnitude class due to the fault impedance, the
percent relative variation is calculated by (4). The fault im-
pedances for this calculation are 0 (zero) and 15 . The results
are shown in Table IV. According to this table, it can be con-
cluded that: (a) the number of voltage sags in the class of 0.1-
0.5 p.u. does not change; (b) the number of voltage sags in the
class of 0.5-0.7 p.u. decreases 88 %; (c) the number of voltage
sags in the class of 0.7-0.85 p.u. decreases 15 %; (d) the num-
ber of voltage sags in the class of 0.85-0.90p.u. decreases 45
%; and (e) in general, the number of voltage sags decreases 48
%.
N
xag
= _
N
xag,15
-N
xag,
N
xag,
_ 1 (4)
Where:
N
sag
percent variation of voltage sag frequency;
N
sag,0
number of voltage sags for 0 fault impedance;
N
sag,15
number of voltage sags for 15 fault impedance.
V. CONCLUSION
This paper shows the effect of the fault impedance in volt-
age sags assessment. Quantitative studies were performed at
an end-user busbar. The fault impedance was considered to be
random, 0 (zero), 2, 5, 10, and 15 .
A scenario of 1,000 years was considered in order to verify
the tendency of voltage sags. Probability density and cumula-
tive frequency curves were analyzed. We observed that, the
greater the fault impedance, the smaller the average number of
100 200 300 400 500 600 700 800 900 1000
0
10
20
30
40
50
Simulations or scenarios
N
u
m
b
e
r
o
f
v
o
l
t
a
g
e
s
a
g
s
p
e
r
y
e
a
r
Simulation performance
Mean
15 20 25 30 35 40 45 50 55 60
0
10
20
30
40
50
60
70
80
90
100
Number of voltage sags per year
N
u
m
b
e
r
o
f
S
M
C
C
u
m
u
l
a
t
i
v
e
f
r
e
q
u
e
n
c
y
o
f
v
o
l
t
a
g
e
s
a
g
s
(
%
)
0
10
20
30
40
50
60
70
80
90
100
-10 0 10 20 30 40 50 60
0
0.05
0.1
0.15
0.2
0.25
0.3
0.35
0.4
Number of voltage sags per year
D
e
n
s
i
t
y
p
r
o
b
a
b
i
l
i
t
y
0,1 <= sag < 0,9
0,85 < sag < 0,9
0,7 < sag <= 0,85
0.5 < sag <= 0,7
0,1 <= sag <= 0,5
vo
er
gi
fo
m
pr
so
C
to
[1
[2
[3
[4
[5
[6
[7
[8
[9
[1
[1
[1
[1
[1
[1
oltage sags ex
r, the behavio
iven class of
ollow a gener
modeled as a r
robable to occ
The authors
oftware ANAF
OS-GOIS/C
o one of the au
] IEEE Recom
IEEE Standar
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Networks - P
Power Delive
3] J. A. Martine
an Eletromag
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Stochastic As
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an Eletromag
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L. Ramos receiv
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degree in Electri
ty of Uberlndia
cal Engineering f
arina (1998). Sin
lectrical Enginee
Gois, Brazil. H
n of soft magneti
devices, power qu
renga graduated i
of Braslia (1990)
al University of U
niversity of So
ing. Since 1994, h
ring undergradua
s Brazil, and s
urer for graduate
lude rotating elec
Finite Element M
borgne (M2001
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il, in 2003 and h
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C 61000-2-8, 2002
ved his B.S. degr
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d his M.Sc. degr
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e CELG GT Tran
CEL ENGENHA
stem Operation C
terests include p
tribution.
is B.S. degree in
University of G
cal Engineering
(1991), and his D
from Federal Univ
nce 1985, he has
ering at the Fe
His research int
ic materials, mod
uality and energy
in Electrical Engi
); received his M
Uberlndia (1993
Paulo (2004), bo
he has been lectu
ate courses at Fe
since 2004 acts a
courses at the
ctrical machines, l
Method.
) received his M
om the Itajub Fe
his Ph.D. degree
gy, Gothenburg,
-Daimler Benz T
and Teyma Abe
y, he is an Asso
ity of Rio Grand
ds of interest are p
John
ATP
ansac-
rio do
Rio de
h ed.
ley &
ent of
Monte
ection
upply
2.
ree in
tholic
ree in
Gois
nsmis-
ARIA
Center
power
Elec-
Gois
from
D. Sc.
versi-
been
ederal
erests
deling
y effi-
ineer-
M. Sc.
3) and
oth in
urer in
ederal
as re-
same
linear
M.Sc.
ederal
from
Swe-
Trans-
engoa,
ociate
de do
power