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Topic: D
Presentation: P
Motivation
Measurements were carried out in laboratory conditions using a set consisting of infrared camera with close-up 50m lenses to study HICs boards. Our motivation was to investigate so called narcissus effect [1].
An equalization box was created for easy and quick emissivity evaluation. It enables measurement of the temperature dependence and the spatial distribution of the emissivity up to 600C. It is composed of titanium hot plate PZ 28-3TD-Harry Gestigkeit with programmable controller TR 28 3T for precise temperature regulation and computer with ThermaCAM Researcher application installed.
For evaluation the influence of the angle of view on emissivity coefficients are carried out the experiments with a pipe made of a heat insulating material with emissivity 0,96. In the pipe
C
4 3 .0 C
LI02
42
40
42
LI01
38
36
40 38
LI03
a
C 43
3 6 .5 C
42
b
Fig. 1: IR image of Au layer made by close-up lenses and showing narcissus effect Fig. 2: Line temperature profiles for no compensated (a) and compensated narcissus effect (b) of the IR image
there is placed a rotating pad (a sample holder). A scale for reading the angle movement is placed over the pipe, and the angle of pad rotation is read from the pointer. The pointer is immovably connected with the pad.
Results
Relative temperature change according to the observation angle of HIC boards components is studied. In fact at small angles (perpendicular observation) from a small distance we have a significant effect on the absolute value of the emissivity. For escaping from this effect a precise adjustment of the working regime of the camera must be made by taking into account of the distance and the reflected temperature.
35 .9 C
SP02: 33.0
SP02: 25.2
27 .1 C
35
SP01: 34.2 SP03: 33.1
SP01: 24.9 SP03: 24.6
26
30
24
26 .0 C
23 .0 C
An equalization box was created for easy and quick emissivity evaluation. It enables measurement of the temperature dependence and the spatial distribution of the emissivity up to 600C. An emissivity map is also generated from the whole image or selected box area.
Acknowledgement
The authors would like to thank for the support of SIF under which contract 1-854/2007 S, the present work was conducted.
References
[1] X. Maldague, " Theory and Practice of Infrared Technology for Nondestructive Testing ", John Wiley&Sons, Inc, 2001.