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FEATURES
Avalanche Rugged Technology Rugged Gate Oxide Technology Lower Input Capacitance Improved Gate Charge Extended Safe Operating Area Lower Leakage Current : 10 A (Max.) @ VDS = -60V Lower RDS(ON) : 0.106 (Typ.)
1
SFR/U9034
BVDSS = -60 V RDS(on) = 0.14 ID = -14 A
D-PAK
2 1 3
I-PAK
Units V A A V mJ A mJ V/ns W W W/ C
o
O 1 O 1 O 3 O
2
Total Power Dissipation (TC=25 C) Linear Derating Factor Operating Junction and Storage Temperature Range Maximum Lead Temp. for Soldering Purposes, 1/8 from case for 5-seconds
TJ , TSTG TL
300
Thermal Resistance
Symbol RJC RJA RJA Characteristic Junction-to-Case Junction-to-Ambient * Junction-to-Ambient Typ. ---Max. 2.55 50 110
o
Units C/W
SFR/U9034
Symbol BVDSS BV/TJ VGS(th) IGSS IDSS RDS(on) gfs Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd Characteristic Drain-Source Breakdown Voltage Breakdown Voltage Temp. Coeff. Gate Threshold Voltage Gate-Source Leakage , Forward Gate-Source Leakage , Reverse Drain-to-Source Leakage Current Static Drain-Source On-State Resistance Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge Gate-Source Charge Gate-Drain(Miller) Charge Min. Typ. Max. Units -60 --2.0 ------------------0.05 ------8.1 265 84 14 24 43 28 30 5.3 12 ---4.0 -100 100 -10 -100 0.14 -400 125 40 60 95 65 38 --nC ns A pF V V nA
o V/ C ID=-250A
890 1155
VGS=0V,VDS=-25V,f =1MHz See Fig 5 VDD=-30V,ID=-18A, RG=12 See Fig 13 VDS=-48V,VGS=-10V, ID=-18A See Fig 6 & Fig 12
4O 5 O 4O 5 O
Min. Typ. Max. Units --------85 0.25 -14 -56 -3.9 --A V ns C
Test Condition Integral reverse pn-diode in the MOSFET TJ=25 C,IS=-14A,VGS=0V TJ=25 C,IF=-18A diF/dt=100A/s
4 O
o o
Notes ; 1 O Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature 2 L=2.0mH, I =-14A, V =-25V, R =27*, Starting T =25oC O AS DD G J 3 I < _ -18A, di/dt < _ BVDSS , Starting T J =25oC _300A/ s, VDD < O SD 4 Pulse Test : Pulse Width = 250 s, Duty Cycle < _ 2% O 5 Essentially Independent of Operating Temperature O
SFR/U9034
Fig 2. Transfer Characteristics
[A] -ID , Drain Current
101
[A]
101
Top :
150 oC 100
25 oC
100
10-1
101
10-1
10
[A]
0.3
101
10-1
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
[pF]
1200
Capacitance
C oss 900
C iss
10
@ Notes : I =-18 A D 0 0 5 10 15 20 25 30 35
0 100
1 10
SFR/U9034
-BV DSS , (Normalized) Drain-Source Breakdown Voltage
RDS(on) , (Normalized)
2.0
1.1
1.5
1.0
1.0 @ Notes : = -10 V 1. V GS 2. I = -9.0 A D -50 -25 0 25 50 75 100 125 150 175
0.9
0.5
0.8 -75
125
150
175
0.0 -75
TJ , Junction Temperature [ C]
[A]
0.1 ms 10
1
102
[A]
12 1 ms 10 ms DC 9 6 3 0 25
100
10-1 100
101
102
50
75
100
125
150
D=0.5 10 0 0.2 0.1 0.05 @ Notes : 1. Z J C (t)=2.55 o C/W Max. 2. Duty Factor, D=t1 /t 2 3. TJ M -T C =P D M *Z J C (t)
P. DM t1. t2.
single pulse
(t) ,
10- 1
0.02 0.01
JC
10- 5
10- 4
10 - 3
10 - 2
10 - 1
100
10 1
[sec]
SFR/U9034
Current Regulator
50K 12V 200nF 300nF
VGS Qg
-10V
Qgs
Qgd
R1
Current Sampling (IG) Resistor
R2
Current Sampling (ID) Resistor
Charge
t on
t off tr td(off) tf
VDD
( 0.5 rated VDS )
td(on)
Vin
10%
LL VDS
Vary tp to obtain required peak ID
ID VDD
RG DUT -10V
tp
VDD
SFR/U9034
Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
VGS
VDD
VGS ( Driver )
10V
IS ( DUT )
IRM
di/dt IFM , Body Diode Forward Current
Vf VDS ( DUT )
VDD
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