Microwave Imaging

WILEY SERIES IN MICROWAVE AND OPTICAL ENGINEERING

KAI CHANG, Editor
Texas A&M University

A complete list of the titles in this series appears at the end of this volume.

Microwave Imaging
MATTEO PASTORINO

JOHN WILEY & SONS, INC., PUBLICATION

Copyright 2010 by John Wiley & Sons, Inc. All rights reserved Published by John Wiley & Sons, Inc., Hoboken, New Jersey Published simultaneously in Canada No part of this publication may be reproduced, stored in a retrieval system, or transmitted in any form or by any means, electronic, mechanical, photocopying, recording, scanning, or otherwise, except as permitted under Section 107 or 108 of the 1976 United States Copyright Act, without either the prior written permission of the Publisher, or authorization through payment of the appropriate per-copy fee to the Copyright Clearance Center, Inc., 222 Rosewood Drive, Danvers, MA 01923, (978) 750-8400, fax (978) 750-4470, or on the web at www.copyright.com. Requests to the Publisher for permission should be addressed to the Permissions Department, John Wiley & Sons, Inc., 111 River Street, Hoboken, NJ 07030, (201) 748-6011, fax (201) 748-6008, or online at http://www.wiley.com/go/permission. Limit of Liability/Disclaimer of Warranty: While the publisher and author have used their best efforts in preparing this book, they make no representations or warranties with respect to the accuracy or completeness of the contents of this book and specically disclaim any implied warranties of merchantability or tness for a particular purpose. No warranty may be created or extended by sales representatives or written sales materials. The advice and strategies contained herein may not be suitable for your situation. You should consult with a professional where appropriate. Neither the publisher nor author shall be liable for any loss of prot or any other commercial damages, including but not limited to special, incidental, consequential, or other damages. For general information on our other products and services or for technical support, please contact our Customer Care Department within the United States at (800) 762-2974, outside the United States at (317) 572-3993 or fax (317) 572-4002. Wiley also publishes its books in a variety of electronic formats. Some content that appears in print may not be available in electronic formats. For more information about Wiley products, visit our web site at www.wiley.com. Library of Congress Cataloging-in-Publication Data: Pastorino, Matteo. Microwave imaging / Matteo Pastorino. p. cm.(Wiley series in microwave and optical engineering) Includes bibliographical references and index. ISBN 978-0-470-27800-0 (cloth) 1. Microwave imagingIndustrial applications. 2. Nondestructive testing. 3. Radiography, Industrial. I. Title. TA417.25.P37 2010 621.367dc22 2009041788 Printed in the United States of America 10 9 8 7 6 5 4 3 2 1

Contents

1 2

Introduction Electromagnetic Scattering 2.1 2.2 2.3 2.4 2.5 2.6 2.7 2.8 Maxwells Equations Interface Conditions Constitutive Equations Wave Equations and Their Solutions Volume Scattering by Dielectric Targets Volume Equivalence Principle Integral Equations Surface Scattering by Perfectly Electric Conducting Targets References

1 4 4 6 7 9 14 16 18 19 19 20 20 22 24 28 41 53
v

The Electromagnetic Inverse Scattering Problem 3.1 3.2 3.3 3.4 3.5 Introduction Three-Dimensional Inverse Scattering Two-Dimensional Inverse Scattering Discretization of the Continuous Model Scattering by Canonical Objects: The Case of Multilayer Elliptic Cylinders References

vi

CONTENTS

Imaging Congurations and Model Approximations 4.1 4.2 4.3 4.4 4.5 4.6 4.7 4.8 4.9 Objectives of the Reconstruction Multiillumination Approaches Tomographic Congurations Scanning Congurations Congurations for Buried-Object Detection Born-Type Approximations Extended Born Approximation Rytov Approximation Kirchhoff Approximation

57 57 58 59 63 65 65 68 70 73 73 77 79 79 80 82 84 87 90 91 92 101 103 103 108 117 118 119

4.10 Greens Function for Inhomogeneous Structures References 5 Qualitative Reconstruction Methods 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 Introduction Generalized Solution of Linear Ill-Posed Problems Regularization Methods Singular Value Decomposition Singular Value Decomposition for Solving Linear Problems Regularized Solution of a Linear System Using Singular Value Decomposition Qualitative Methods for Object Localization and Shaping The Linear Sampling Method Synthetic Focusing Techniques

5.10 Qualitative Methods for Imaging Based on Approximations 5.11 Diffraction Tomography 5.12 Inversion Approaches Based on Born-Like Approximations 5.13 The Born Iterative Method 5.14 Reconstruction of Equivalent Current Density References

CONTENTS

vii

Quantitative Deterministic Reconstruction Methods 6.1 6.2 6.3 6.4 6.5 6.6 6.7 6.8 Introduction Inexact Newton Methods The Truncated Landweber Method Inexact Newton Method for Electric Field Integral Equation Formulation Inexact Newton Method for Contrast Source Formulation The Distorted Born Iterative Method Inverse Scattering as an Optimization Problem Gradient-Based Methods References

123 123 125 127 129 136 142 147 148 150 153 153 154 158 170 177 180 187 189 193 193 195 201 203 205 205 205 211

Quantitative Stochastic Reconstruction Methods 7.1 7.2 7.3 7.4 7.5 7.6 7.7 Introduction Simulated Annealing The Genetic Algorithm The Differential Evolution Algorithm Particle Swarm Optimization Ant Colony Optimization Code Parallelization References

Hybrid Approaches 8.1 8.2 8.3 Introduction The Memetic Algorithm Linear Sampling Method and Ant Colony Optimization References

Microwave Imaging Apparatuses and Systems 9.1 9.2 9.3 Introduction Scanning Systems for Microwave Tomography Antennas for Microwave Imaging

viii

CONTENTS

9.4

The Modulated Scattering Technique and Microwave Cameras References

214 226 229 229 241 252 258

10 Applications of Microwave Imaging 10.1 Civil and Industrial Applications 10.2 Medical Applications of Microwave Imaging 10.3 Shallow Subsurface Imaging References 11 Microwave Imaging Strategies, Emerging Techniques, and Future Trends 11.1 Introduction 11.2 Potentialities and Limitations of Three-Dimensional Microwave Imaging 11.3 Amplitude-Only Methods 11.4 Support Vector Machines 11.5 Metamaterials for Imaging Applications 11.6 Through-Wall Imaging References

264 264 265 269 269 272 274 274

INDEX

278