In2quality of Ferrous Steel-Coatings 01

-1 -
Rev. 110214-1
D-MATERIALS: IRON + STEEL
Layers, surfaces + walls measure safe
TSL measurement solutions for IRON, STEEL + STAINLESS STEEL

Type of Materials Diffusion and surface layers, thin / thick layers / walls / Duplex-u. Multi Layer Background measurements, Measurement /Solution Requirements about ... - Influence of coating on the material properties: Optical / electrical / mechanical / chemical / thermal / porosity - Solgel, Electrochemical coating, thermal spraying, PVD / CVD Phosphating.
0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197 www.tslmandelkow.com mailto: info@tslmandelkow.com
-2 APPLICATION TSL-favored SYSTEMS LAYER THICKNESS, MT/QS/US/QW/EL/DF/AU/FI/US/FH1 DUPLEX THICKNESS MT / FI / EL / AU + DF THIN PCI / delta / GA MATERIAL THICKNESS MT/QS/US/QW/EL/DF/AU/FI/US/FH1 SURFACE .- roughness / TOPOGRAPHY / PORE PCI / SU / PCT / TH / TY / FI / PO Color, luster, cleanliness / PURITY delta / PG / CC / PCI
SPECIAL APPLICATIONS RADII, INTERNAL PIPE, SMALL AREAS MT / EL / DF / AU / FI / PCI / FH STAINLESS STEEL + AUSTENIT MT / EL / DF / AU / QS / FH LayerMaterials PAINT / PAINT + ENAMEL / CERAMIC other organic THICK QA / MT / DF / EL / AU / FI / RA / delta / PCI / CCS ZINC / galv.NICKEL QA / MT / DF / EL / AU / FI / RA / GA Order process MT / QA / QW / EL / DF / AU / FI / PCI / delta
OrdereProcess,specifically Plating STAINLESS STEEL, PHOSPHATE. MT / DF / QS / FH / MT / DF / EL / AU / POWDER SOLGEL, THERM.SPRITZEN, PVD, CVD QA / RA / EL / alpha / delta / PCI / CCS BASE-COAT PROCESS alpha + el.TAUCH ONLINE MEASUREMENT It should be noted that most solutions as online versions, and more extensively for the 8-hour operation to date as budget systems are available. .
Please choose in the google video mode, the corresponding measurement applications
0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197
www.tslmandelkow.com
mailto: info@tslmandelkow.com
-3 NAVIGATION NOTE Dear reader of our Representations, in order to effectively and accurately find your desired Task Stellungn by TSL Solving strategies and systems please use the following 5 Choice of topic buttons, if you are :
>starting from Your material to be measured at Material >or Your Application starting >or the already knownn Procedure >or if you apply for a Commercial unit Interest >content / editorial Backgrounds- And on our problem-solving opportunities, Engineering and want to inform R & D.
-> -> -> ->
-> MATERIAL -> APPLICATION -> SYSTEMS -> SHOP -> SUPPORT
We give up the search word input, the experience shows very often user Expectations not responded. They are therefore our opportunities for your measuring task by image-navigation after the 3-th level. By Press Your right Choice of topics-Key to move from the 1st -,in the 2nd level where you to your Target . Approach From the 2. Level navigate by Image keyingUntil you are in der 4. Level
Phone> 0049 - (0) - 9841 - 40-1189
TV Conference> -1197
-4 -
From the very start - working principle of the most common measuring method
Non-destructive coating thickness measurement, SDM, on metals Non-destructive measurement of wall thicknesses, WDM, metals
For the most widely used measurement application procedures are established that define the two effects from the use of a sensor over a metallic base material (GW) as a carrier of the layer to be measured. Each mechanisch/magnetische- or inductive force between a sending and a receiving sensor is a metal as a carrier of the layer affected by the distance to be measured (= layer thickness). The thicker the layer, the smaller the sensor effect can be evaluated. Distance measurement between sensors and the respective base material as a reference. This base material (or substrate, or backing material) therefore first determined that, in some cases to use measurement processes. The layer to be measured is defined the distance to the substrate, where it in alloys Interactions with the substrate may.
As a sensor of a measuring unit, these technologies are encapsulated in the different measuring probes almost all manufacturers and measurement principles of portable devices. Nearly all issues of induction SDM resulting from the ratio of the injected primary to secondary measurable / measured energy. The focus will thus binding the magnetic transmission properties of the base metal. Here, almost all potential for conflict and solution strategies are later
-5 -
Magnetic-inductive measuring method
Application SDM of non-magnetic layers on FE substrates. WDM non-magnetic materials to reference-FE. - Also suitable building sites, measuring time: usually faster than 5 seconds. Each suitability for conductive thick films (galvanizing) to consider! System cost-EUR: 400 Training needs: 5 Measuring time: 5 sec better Preparation / set-up time: 5 min Prerequisites: Electric-magnetic alignment at the (same) uncoated object using standards.
For magnetizable metal substrates with non-magnetizable coatings. Substrate thickness: 0.5-1mm minimal, depending on the sensor. The coating must be tough enough to be the pressure of each patch test probe tip to yield.
-6 -
Eddy current measuring method
Device Type: Optical almost identical to the inductive method is the only high-frequency coil of the probe usually horizontally, which the measurement area determines effect.
SDM of electrically non-conductive layers on highly conductive substrates. WDM non-conductive materials to reference ladder - there significant advantages over ultrasound systems at very high accuracy. Suitable for non-conductive thick films and materials (fiberglass, etc.).
Requirements: Electrical adjustment on the uncoated object using standards. also suitable building sites, System Cost: 400
-7 Training Needs: 4
Measuring time: 10 sec Preparation / set-up time: 1 min. Requirements: Electrical adjustment on the uncoated object using standards. Substrate thickness: approx 40m minimal. For non-magnetic metal substrates with non-conductive coatings. The coating must be tough enough to resist the pressure of each patch Measurement probe tip is not to yield.
-8 -
Hall probes Procedure

SDM / WDM non-magnetic layers on FE substrates. WDM non-magnetic materials to reference-FE (Also as a ball), - a ball serves as Referenzpol - significant safety advantages over eg. Ultrasound systems at very high accuracy and significant radius capability. Requirements: Electric-magnetic alignment on the uncoated object using standards.
Suitable building sites, especially near stream areas .- often for thin substrates - rolling Measuring time: 5 seconds System Cost: beginning EUR 700 Training Needs: 4 Measuring time: 1-10 sec Preparation / set-up time: 1 min. For magnetizable metal substrates with non-magnetizable coatings.
-9 The coating must be tough enough to be the pressure of each patch test probe tip to yield.
Technology Hall does not require acoustic impedance-dependent adjustments of the wall-material Properties compared with ultrasonic techniques (US-WDM) with changing metrics and Geometries. It also eliminates the coupling fluid.
The wall thickness may be only a few micrometers (microns) of millimeters to centimeters.
Magnetic Static-Methode
Application SDM / WDM by non-magnetic layers (regions) FE-substrates. WDM non-magnetic materials to FE. Even for soft Schhicht / wall materials.
- Also suitable building site System Cost: from 100 Training required: 2 Measuring time: 10 sec Preparation / set-up time: 30 sec
-10 Requirements: No adjustment, therefore, close application limits. Substrate thickness note (about 1 mm minimum)! For magnetizable metal substrates with non-magnetizable coatings. The coating does not have to be hard enough to not have the pressure of each patch test probe tip to give, since Measurement of release of the pressure goes to zero. Wiche materials such as rubber, are so often measured.
Examples of industrially used systems + technology
NAVIGATION within the TSL kathegorisierten materials / methods described in the direction of measurement system distribution in each case above TSL-operated working area. Other operations are u.U. very different. Some commercial areas require individual user information, so we ask you for your request-> aA
Ratings are the first orientation, of course, subject to individual review and if profitability analysis. Points 7, 9, 10 and 11, we respond to the knowledge of concrete Questions individually -> a.A.
-11 -
GLOSSARY SDM-> coating being measured WDM-> Walls/material being measured TSL-system-name in thickness Measuremnet technologies inductive Wiedycurrent ULTRAsonics Hall-sensor Optic Interferometer electricstat Coulommetric Tactile R xray Thermic 03 Area Measurementarea in m -> useful / border 04 prakt. Tolerance Tol in the above industries, operating range: under 100 micron in microns, / / About 100 micron-> in% of reading 05 USP- Efficiency and solution height such as: power Measure possible / Physics fits better than conventionally used procedures / simple / safer to use / less need for training .... other benefits 0 -> there is no 10 -> relevance in competition 06 measurement electronic data pratised 1 -> low 10 -> high 07 known Risk per Operator error 1 -> low 10 -> high 08 Knowledge needed: Responsible / Operator 1 -> Instruction 5 -> Training 10 -> education 09 known payback in months with device cuts, frequency / solvent storage 10 TestPart-Costs, under section 10 in the particular environment including staff / training / Test Preparation in EUR 1 -> low 10 -> high 11 possible Potential of Prevention, Returns /ComplianceCosts 0P USE 01 TYPE 02 Physics Abbreviations used as following
finding details visit-> Systems
-12 -
APPLICATION/ Measurement of LAYER THICKNESS, MATERIAL THICKNESS MT/FH1QS/EL/DF/AU/FI/US/FH7/delta

u-tube> Video mode: Applications
TSL-SYSTEMS
Largely current EU standard. Built in or external probes. External probes often in the system 2 to about 20 000m Data transfer and / or internal statistics, Internal memory for data series (batches) and / or memory for spec. Adjustment settings (applications). Equipment portable / stationary, by radio, infrared, or via interface multiplexing / Mux. Accessory sets, tripod / handling, roll-additives, Mux, data, radio ... BUTTON > Systems> Hand Measuring-> Options Measurement and transferPrograms for every need, BUTTON > Systems> hand-held> Options + programs
TSL-TYPE USE
PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA
FAILURE RISK
KNOWLEDGE InPlace. COSTS
PREV
OP 01 02 03
MT Series
04 05 06 07 08 09
10
11
SDM / WDM MT IND / WI 2-10 000 2 / / 1-3 - 8 AA 10 / 5 aA aA aA
TSL-TYPE USE
FAILURE RISK
KNOWLEDGE Amort.
COSTS
PREV
OP 01 02 03
MT 700 Series
04 05 06 07
08
09
10
11
SDM / WDM MT IND / WI 4-10 000 3 / / 1-3 - 2 aA 10 / 5 a.a a.a a.A.
-13 -
TSL-TYPE USE
FAILURE RISK
KNOWLEDGE Amort.
COSTS
PREV
OP
01 02
03
Sensors
04
05 06 07
08
09
10
11
SDM / WDM MT IND / WI 2-800 000 1 / / 1-5 4 - aA 10 / 6 a.a a.a a.A.
TSL-TYPE USE
FAILURE RISK KNOWLEDGE Amort.
COSTS
PREV
OP 01 02 03
FH 1 Series
04 05 06 07
08
09
10
11
SDM / WDM FH1 BONDING force 5-20 000 3 / / 3-10 5 / 10 - aA 6 / 1 a.a a.a a.A.
A representative type-section of our extensive product range, - According to fitness, we offer you the system or even more suitable for your needs.
TSL-TYPE USE
FAIL-RISIKO KNOWLEDGE Amort.
COSTS
PREV
OP 01 02 03
FH 7 Series
04 05 06 07
08
09
10
11
SDM / WDM FH7 HALL 20-18 000 3 / / 2-3 10 10 aA 5 / 2 a.a a.a a.A.
-14 -
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
GA Series
04 05
06
07
08
09
10
11
SDM GA coulommetr. 0.2 0.3 8 2 20 / 150 aA 10 / 7 a.a a.a a.A.
TSL-TYPE USE
COSTS
PREV
OP
01
02 03
Alpha Series
04 05 06 07
08
09
10
11
SDM alpha el-static 0.2-50 3 0.1 10 10 aA 5 / 2 a.a a.a a.A.
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
Delta Series
04 05
06
07
08
09
10
11
SDM / WDM delta white light 0.02-30/4000 0.01 10 10 2 6 / 2 aA aA 5th
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
PCI Series
04 05
06
07
08
09
10
11
SDM / WD PCI white light 1-90/14000 0.01/0.1 10 10 2 6 / 2 aA aA 10

-15 -
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
CCS Series
04 05
06
07
08
09
10
11
SDM CCS Cut 10-10000 1 / 5 5 10 5 10 / 4 aA aA 10
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
QA Series
04 05
06
07
08
09
10
11
SDM QS RF ultrasound 10-500 2 / 5 10 7 10 10/10 aA aA 10
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
QW Series
04 05
06
07
08
09
10
11
WDM QW RF ultrasound 10-5000 2 / 5 10 7 10 10/10 aA aA 5
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
U.S. Series
04 05
06
07
08
09
10
11
WDM U.S. ultrasonic 1000-30 000 5 3 4 10 10/10 aA aA 5
TSL-TYPE USE
COSTS
PREV
-16 OP 01 02 03 RA Series 04 05 06 07 08 09 10 11
SDM RA XRF 0.2-20 0.1 5 10 aA 10 / 2 a.a a.a a.A. a.a

TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03
SU Series
04 05
06
07
08
09
10
11
Roughness SU button 0.02-160 5-10 1 3 5 10 / 3 aA aA 4
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
PG Series
04 05
06
07
08
09
10
11
GLOSS SU button 0.02-160 5-10 1 3 5 10 / 3 aA aA 4
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
PCT Series
04 05
06
07
08
09
10
11
TOPOGRAPHY PCT white light 1-90/14000 0.01/0.1 10 10 2 10 / 6 aA aA aA
TSL-TYPE USE TSL-TYPE USE
PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA
FAILURE RISK KNOWLEDGE Amort. FAILURE RISK KNOWLEDGE Amort.
COSTS COSTS
PREV PREV
OP 01 02 03
PO Series
04 05
06
07
08
09
10
11
PORE TEST PO el-static 50-11000 ---- 10 - 1 7 / 3 AA AA AA
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
MI Series
04 05
06
07
08
09
10
11
-17 SDM / WDM PO pulse radar 10 000 10 10 10 3 10 10/10 aA aA
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
PT Series
04 05
06
07
08
09
10
11
SDMpulver / wet PT Photo-Thermic 6-25 10.5 10 10 2 10 / 2 aA aA 10

TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV
OP 01 02 03
MF Series
04 05
06
07
08
09
10
11
DEEP DEFECTS -waves visually AB10 000 10 10 2 10/10 10 aA aA
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
STR Series
04 05
06
07
08
09
10
11
SDM / WDM STR WI 5000-800 000 5 10 6 3 5 / 2 AA AA 5
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
CC Series
04 05
06
07
08
09
10
11
COLORIMETRY WI CC 5000-800 000 5 10 6 3 5 / 2 AA AA 5
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
OLxz Series
04
05
06
07
08
09
10
11
ONLINE OLyz IND / WI / WLI 20-8000 0.1 / 1 10 10 1 10 / 1 AA AA 10

-18 -
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
STR Series
04 05
06
07
08
09
10
11
COLORIMETRY CN WI 2400-6000 K 5 10 6 3 5 / 2 AA AA 5 contact
TSL-TYPE USE
COSTS
PREV
OP 01 02
OLxyz Series
04
05
06
07
08
09
10
11
ONLINE OLxyz IND / WI / WLI 1-12 000 0.1 / 1 10 10 1 10 / 1 aA aA 10 contact
-19 -
Special application forms on the SDM FE grades
Hard chrome on FE Paint / powder FE Organic layers on FE Non-ferrous metals on FE Hot dip galvanizing and duplex Zinc-nickel
Note: For shares in magnetizable-layer structures (zinc / nickel, - SDM elements with nickel-units), the suitability possibly via micrograph check and correct. On methodological differences and stable processes suitable to use an automatic curve-correction program, such as TSLconvert. To it, for example, is for highway pavement thickness accounts of this process, a regulatory basis of calculation and shall be trained accordingly.
Nmaybe-conducting materials to a simple aluminum foil as a loadable Reference

-20 Pavement thicknesses Wood thickness FRP thickness Glass thickness
Tag
Oops! In the SD measurement used terms that can confuse: Calibration a measuring instrument: Repatriation on a national / international deposited Standard mass and timed De Documentations Target-state durch a Calibration with certificate and seal. Adjustment/ Setting the meter: Electrical preparation and adjustment of the instrument for the current Messaufgabe.durch the user by means of zero and any film standard.
The Adjustment is often Manuals in more than >Calibration, 'Or' calibration < and on keyboards with> KAL <button called!
, or micron-> microns?
At this point to emphasize that according to DIN EN ISO throughout the issue is not the Greek term (micron), but binding of the metrological term microns,Micrometer, Is utilized. 1 m 1 x 10-6 M 1: 1000 000 meters 0, 000 001Meter 0,001 mm 1mm 1 x 10-3 M 1 Meter: 1000 1000 microns
-21 -
Serial measurements of very thin layers with the possibility of very thin substrates - The capacitive SDM process
Application Capacitive SDM method for thin films on thin metal sheets and Reference conductive films, the material thickness from 1 micron is hardly relevant.
Training needs: 3 Measuring time: 10 sec Preparation / set-up time: 1 min. Suitable for reference measurements with films - such as: offset printing. AB 2007 is the Procedure for Automotive Basecoat tested, here by the usual measurement error Magnetization fluctuations in thin FE-substrate are no longer significant, A unique feature!
-22 -
to discuss current measuring method
Polychromatic interferometry for rough surfaces + topography
Application topography measurement
Photothermal method for heavily pigmented layers, powder wet paint and non contact.
System cost: EUR 25 000 from sensors Training Needs: 4 Measuring time: from 2 sec
-23 Preparation / set-up time: a few min.
Impuls-Radar/Mikrowellen measurement method Application
- For roads / Thick layers / layer composite,
System Cost: sensors from about EUR 100 000 Training needs: 5 Measuring time: 0.1 seconds Preparation / setup time: minimum 10 min.
SDM ultrasonic method Application
- Even for films on organic substrates and multilayers. System Cost System from EUR 3500 Training needs: 5 Measuring time: 10 sec
-24 Preparation / set-up time: 5 min.
The matching process
The conditions in industrial production environments demand meters, which operate quickly and reliably, and when used on site are mains-independent, weather-resistant and temperature-independent. In addition, the required margin of measurement uncertainty is taken into account as it is to read from the device manufacturer. Noteworthy are the representations and conditions under which a supplier / manufacturer's instructions for instrument characteristics are achievable - even ours. A transparency of the different modes of representation, particularly in relation to the requested application solution towards us is essential, as we design solutions with the matching, so different systems. Here was a procurement (unfortunately due to the increasing pressure of a different order) does not take place in haste.
The appropriate adjustment and fixation-related applications are also used.

Measuring equipment plus TSL-precision stand
With a plurality of measuring devices affect conductivity / Magnetic properties of the measured wall / coating such as zinc
-25 -
or nickel, the selected measuring method for the user or subtly evident. This should already give independent advice to common problems and find out beforehand.
- Helpful Links to standards and regulations
DIN 50976
Hot dip galvanizing of components (hot dip galvanizing); requirements and testing,
DIN EN ISO 1461 (draft) hot-dip galvanizing of individual pieces
DIN EN ISO 2064 / DIN 50 928 for replacement-1 Metallic and other organic layers, definitions and Provisions relating to the measurement of film thickness: 1987-08) DIN EN ISO 2178 / Replacement for DIN 50 981: 1979-05) Non-magnetic coatings on magnetic substrates; Measurement of coating thickness, Magnetverfah, Ren DIN EN ISO 2360 / Replacement for DIN 50 984: 1978-08 Non-conductive coatings on non-magnetic substrates; Measurement of coating thickness, eddy currentprocess
-26 DIN 1319-1 Fundamentals of Metrology, Basic concepts, Quality System-Directive FORD Q-101 or the manuals of the German Society for Quality (DGQ) as a further indication for the calculation of control limits.
DIN 1319-2 Foundations of measurement; definitions for the application of Gauges
DIN 1319-3
Foundations of measurement; evaluation of measurements A single measure, measurement uncertainty
DIN EN ISO 2808 Paints and varnishes-Determination of film thickness
includes: DIN 50 981, DIN 50 984, ISO 2178, 2360, 2808, BS 5411 (3,11) 3900 (c, 5) and ASTM B499, DI 400th
-27 -
NAVIGATION NOTE Dear reader of our Representations, in order to effectively and accurately find your desired Task Stellungn by TSL Solving strategies and systems please use the following 5 Choice of topic buttons, if you are :
>starting from Your material to be measured at Material >or Your Application starting >or the already knownn Procedure >or if you apply for a Commercial unit Interest >content / editorial Backgrounds- And on our problem-solving opportunities, Engineering and want to inform R & D.
-> -> -> ->
-> MATERIAL -> APPLICATION -> SYSTEMS -> SHOP -> SUPPORT
We give up the search word input, the experience shows very often user Expectations not responded. They are therefore our opportunities for your measuring task by image-navigation after the 3-th level. By Press Your right Choice of topics-Key to move from the 1st -,in the 2nd level where you to your Target . Approach From the 2. Level navigate by Image keyingUntil you are in der 4. Level
Phone> 0049 - (0) - 9841 - 40-1189

TV Conference> -1197
-28 -

In2quality of Ferrous Steel-Coatings 01

Hochgeladen von

Dokumentinformationen

Originaltitel

Copyright

Verfügbare Formate

Dieses Dokument teilen

Dokument teilen oder einbetten

Freigabeoptionen

Stufen Sie dieses Dokument als nützlich ein?

Sind diese Inhalte unangemessen?

Copyright:

Verfügbare Formate

In2quality of Ferrous Steel-Coatings 01

Hochgeladen von

Copyright:

Verfügbare Formate

-1 -

D-MATERIALS: IRON + STEEL

Layers, surfaces + walls measure safe

TSL measurement solutions for IRON, STEEL + STAINLESS STEEL

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

-> -> -> ->

Phone> 0049 - (0) - 9841 - 40-1189

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

Magnetic-inductive measuring method

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

Eddy current measuring method

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

Hall probes Procedure

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

Examples of industrially used systems + technology

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

finding details visit-> Systems

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

APPLICATION/ Measurement of LAYER THICKNESS, MATERIAL THICKNESS MT/FH1QS/EL/DF/AU/FI/US/FH7/delta

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

KNOWLEDGE InPlace. COSTS

SDM / WDM MT IND / WI 2-10 000 2 / / 1-3 - 8 AA 10 / 5 aA aA aA

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

SDM / WDM MT IND / WI 4-10 000 3 / / 1-3 - 2 aA 10 / 5 a.a a.a a.A.

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

SDM / WDM MT IND / WI 2-800 000 1 / / 1-5 4 - aA 10 / 6 a.a a.a a.A.

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAIL-RISIKO KNOWLEDGE Amort.

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

SDM GA coulommetr. 0.2 0.3 8 2 20 / 150 aA 10 / 7 a.a a.a a.A.

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

SDM alpha el-static 0.2-50 3 0.1 10 10 aA 5 / 2 a.a a.a a.A.

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

SDM / WDM delta white light 0.02-30/4000 0.01 10 10 2 6 / 2 aA aA 5th

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

SDM / WD PCI white light 1-90/14000 0.01/0.1 10 10 2 6 / 2 aA aA 10

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

SDM CCS Cut 10-10000 1 / 5 5 10 5 10 / 4 aA aA 10

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

SDM QS RF ultrasound 10-500 2 / 5 10 7 10 10/10 aA aA 10

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

WDM QW RF ultrasound 10-5000 2 / 5 10 7 10 10/10 aA aA 5

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

WDM U.S. ultrasonic 1000-30 000 5 3 4 10 10/10 aA aA 5

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

SDM RA XRF 0.2-20 0.1 5 10 aA 10 / 2 a.a a.a a.A. a.a

Roughness SU button 0.02-160 5-10 1 3 5 10 / 3 aA aA 4

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA