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CLK INH
SH/LD
provided by eight individual direct data (A–H)
CLK
VCC
inputs that are enabled by a low level at the
NC
shift/load (SH/LD) input. The ’HC165 also feature
a clock-inhibit (CLK INH) function and a 3 2 1 20 19
complementary serial (QH) output. E 4 18 D
F 5 17 C
Clocking is accomplished by a low-to-high 6 16 NC
NC
transition of the clock (CLK) input while SH/LD is 7 15 B
G
held high and CLK INH is held low. The functions 8 14 A
of CLK and CLK INH are interchangeable. Since H 9 10 11 12 13
a low CLK and a low-to-high transition of CLK INH
QH
QH
NC
SER
GND
also accomplish clocking, CLK INH should be
changed to the high level only while CLK is high.
Parallel loading is inhibited when SH/LD is held NC – No internal connection
high. While SH/LD is low, the parallel inputs to the
register are enabled independently of the levels of
the CLK, CLK INH, or serial (SER) inputs.
The SN54HC165 is characterized for operation over the full military temperature range of –55°C to 125°C. The
SN74HC165 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
INPUTS
FUNCTION
SH/LD CLK CLK INH
L X X Parallel load
H H X No change
H X H No change
H L ↑ Shift†
H ↑ L Shift†
† Shift = content of each internal register shifts
toward serial output QH. Data at SER is
shifted into the first register.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Copyright 1997, Texas Instruments Incorporated
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
logic symbol†
SRG8
1
SH/LD C1 [LOAD]
15
CLK INH ≥1
2 C2/
CLK
10
SER 2D
11
A 1D
12
B 1D
13
C
14
D
3
E
4
F
5
G
6 9
H 1D QH
7
QH
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, N, PW, and W packages.
15 9
CLK INH QH
2
CLK
S S S S S S S S
10 C1 C1 C1 C1 C1 C1 C1 C1
SER 1D 1D 1D 1D 1D 1D 1D 1D
R R R R R R R R
7
QH
CLK
CLK INH
SER L
SH/LD
A H
B L
C H
Data D L
Inputs
E H
F L
G H
H H
QH H H L H L H L H
QH L L H L H L H L
timing requirements over recommended operating free-air temperature range (unless otherwise
noted)
TA = 25°C SN54HC165 SN74HC165
VCC UNIT
MIN MAX MIN MAX MIN MAX
2V 0 6 0 4.2 0 5
fclock Clock frequency 4.5 V 0 31 0 21 0 25 MHz
6V 0 36 0 25 0 29
2V 80 120 100
SH/LD low 4.5 V 16 24 20
6V 14 20 17
tw Pulse duration ns
2V 80 120 100
CLK high or low 4.5 V 16 24 20
6V 14 20 17
2V 80 120 100
↑
SH/LD high before CLK↑ 4.5 V 16 24 20
6V 14 20 17
2V 40 60 50
↑
SER before CLK↑ 4.5 V 8 12 10
6V 7 10 9
2V 100 150 125
tsu Setup time ↑
CLK INH low before CLK↑ 4.5 V 20 30 25 ns
6V 17 25 21
2V 40 60 50
↑
CLK INH high before CLK↑ 4.5 V 8 12 10
6V 7 10 9
2V 100 150 125
↓
Data before SH/LD↓ 4.5 V 20 30 25
6V 17 26 21
2V 5 5 5
↑
SER data after CLK↑ 4.5 V 5 5 5
6V 5 5 5
th Hold time ns
2V 5 5 5
↓
PAR data after SH/LD↓ 4.5 V 5 5 5
6V 5 5 5
VCC
Input 50% 50%
0V
tPLH tPHL
VCC In-Phase VOH
Reference 50% 90% 90%
Output 50% 50%
Input 10% 10%
0V VOL
tr tf
tsu th
tPHL tPLH
Data VCC VOH
90% 90% Out-of-Phase 90% 90%
Input 50% 50% 50% 50%
10% 10% 0 V Output 10% 10%
VOL
tr tf tf tr
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
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