Beruflich Dokumente
Kultur Dokumente
s s
VERY RUGGED BIPOLAR TECHNOLOGY HIGH OPERATING JUNCTION TEMPERATURE WIDE RANGE OF PACKAGES
1 2
TO-3
2 1
TO-218
Uni t
C C 1/7
September 1999
BU931 / BU931P
THERMAL DATA
T O-3 R t hj-ca se Thermal Resistance Junction-case Max 1 T O-218 1.1
o
C/W
Min.
Typ .
Un it A mA A mA mA V
V CEO(sus ) Collector-Emitter Sustaining Voltage (I B = 0) V CE(sat ) Collector-Emitter Saturation Voltage Base-Emitter Saturation Voltage DC Current G ain Diode Forward Voltage Functional Test (see fig. 1) ts tf INDUCTIVE LOAD Storage Time Fall T ime (see fig. 3)
V V V V V V
V BE(s at)
h FE VF
s s
DC Current Gain
2/7
BU931 / BU931P
Collector Emitter Saturation Voltage Collector Emitter Saturation Voltage
3/7
BU931 / BU931P
FIGURE 1: Functional Test Circuit FIGURE 2: Functional Test Waveforms
4/7
BU931 / BU931P
DIM.
P G
P003F
5/7
BU931 / BU931P
DIM.
L5 L3 L2
L6
E H F R 1 2 3
P025A
6/7
BU931 / BU931P
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. The ST logo is a trademark of STMicroelectronics 1999 STMicroelectronics Printed in Italy All Rights Reserved STMicroelectronics GROUP OF COMPANIES Australia - Brazil - China - Finland - France - Germany - Hong Kong - India - Italy - Japan - Malaysia - Malta - Morocco Singapore - Spain - Sweden - Switzerland - United Kingdom - U.S.A. http://www.st.com .
7/7