COMPOSITE INSPECTION

CFRP Radii Inspection Application Guide

Radii Inspection Solution

OmniScanMX Curved Linear Array Software Tools for Composite Inspection

Photo used with the permission of Avior, Produits Intgrs

920-185A-EN

The Company
Olympus NDT designs and manufactures ultrasonic and eddy current test systems for manual and automated nondestructive testing. These systems are used throughout the world for the analysis of defects resulting from processes such as welding, extrusion, and casting, as well as from wear, corrosion, and fatigue. The companys broad field of activity includes aerospace and automotive manufacturing, petrochemical industries, construction welding, and in-service inspection. To serve these markets, Olympus NDT has manufacturing facilities in the United States and Canada. The company manufactures state-of-the-art, conventional and phased-array ultrasonic equipment and probes for the inspection of a wide range of tubes, plates, welds, and composite structures. Olympus NDT offers high-quality products and services that have earned excellent reputations for providing cost-effective solutions and excellent support and customer service.

Table of Contents
CFRP Radii Inspection Application Guide
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Basic Concepts. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Terminology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Probe Positioning. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Typical Setup Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . Data Analysis. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 4 4 5 6 6

Radii Inspection Solution

OmniScanMX. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 General Phased Array Software Features. . . . . . . . . . . . . . . . . 8 Software Tools for Composite Inspection. . . . . . . . . . . . . . . . 9 Curved Array Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Immersion Corner Wedges for Curved Array Probes. . . . . . 13

Options and Accessories

Custom Wedges. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Mini Wheel Small Footprint Encoder . . . . . . . . . . . . . . . . . 14 TomoView PC-Based Analysis Software . . . . . . . . . . . . . . . 15

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Introduction
Parts manufactured of carbon fiber reinforced plastics (CFRP) pose an inspection challenge because of their many shapes and thicknesses. Several parts in the aerospace industry consist of corners such as spars, stringers, and top-hat structures. Typical corner inspections are performed in a manufacturing environment. Inspection of these corners is relatively new but is becoming more and more important with the increasing usage of CFRP laminates in aircraft structures. Traditional inspections are performed manually with a conventional ultrasonic probe. The slow and tedious nature of this inspection approach and the strong dependency on the inspector, are major disadvantages. The OmniScanPA uses appropriate probe holders and curved linear arrays composed of 16 to 64 elements that fire in sequence to cover the entire corner in a single pass. The inspection of the entire corner becomes an encoded one-line scan. The geometry of the probe allows for all of the ultrasonic beams to coincide at 90 with the surface of the part in a manner similar to flat surface inspections. Furthermore, the unit provides multiple amplitude or time-of-flight C-scan mapping views that make data analysis an easy task. The main advantages of using the OmniScan PA for this application, is the possibility of inspecting the entire corner in one simple scan. This encoded data can then be used for sizing indications and defects. With respect to inspection speed, a typical setup can inspect along a corner at up to 200mm/s.

This radius inspection solution is based on: OmniScan MX instrument OmniScan MXU software -- Familiar menu-driven interface -- Multiple C-scan option -- A-Scan and C-scan data storage -- TCG -- One-button switching between PA and UT -- Customizable color palette for amplitude and thickness C-scans -- Live A-scan and B-scan Curved PA probes -- Acoustic impedance matched with water -- High circumferential resolution around the radius -- Corrosion-resistant stainless steel case -- Waterproof guaranteed to 1 m (3.28 ft) -- Compatible with adjustable immersion wedges Immersion corner wedges for curved array probes -- Available in specific radius and angle -- Adjustable radius to fit on various components to be inspected -- Designed to perform manual scans with a Mini Wheel encoder, or a time base

CFRP Radii Inspection Application Guide

Basic Concepts
Phased array technology is a nondestructive technique that enables the generation of an ultrasonic beam where parameters such as angle, focal distance, and focal point size are controlled through software. Furthermore, this beam can be multiplexed over a large array. In composite inspection, a 0 electronic scan is performed through successive firing of the elements. When no time delay is applied to the elements, the PA probe fires a 0 beam and does not apply any steering or focusing. There are a multitude of benefits associated with using phased array ultrasound for inspecting flat and corner-shaped composite parts. Notably, the enhanced data imaging reduces the human-error factor. Likewise, the use of C-scan imaging increases the reliability of the inspection because it guarantees the full coverage of the inspected surface. Also, the large multielement probes increase inspection speed and resolution. With the use of an appropriate scanner, radii can be inspected in one pass, while a linear encoder assists in defect positioning and sizing. As well, future analysis and periodic comparisons can be done because the A-scan and C-scan data is stored. Furthermore, the OmniScanPA instrument supports both phased array and conventional ultrasonic modes with one-button switching between the two techniques.

1 Aperture: 4 element

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Direction of the electronic scan

Flat linear array

SUMMARY
While conventional UT may be used for radius inspection, the OmniScan PA technology explained in this guide improves the detection of defects typical to this inspection (notably delamination). Phased array technology brings these added advantages: FASTER inspection speed FULL COVERAGE in a single scan BETTER probability of detection (POD) REPORTING and traceability

Aperture: 4 element 1 Direction of the electronic scan

Curved linear array

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Terminology
CFRP radii are charaterized by three main parameters: Part radius Part opening angle Thickness The specific linear Curved Array PA probes used to inspect these radii are defined by the probe radius and the probe angle.

Two main inspection types exist, which are characterized by the relative position of the probe to corner: Inside the corner ID Outside the corner OD

OD
16 Probe radius: R Part radius: r Thickness: T Part opening angle:

ID
16 Probe radius: R Part radius: r Thickness: T Part opening angle: T

T 1 R r

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Probe Positioning
The geometry of the probe allows for all of the ultrasonic beams to coincide at 90 with the surface of the part in a manner similar to flat surface inspections. With the probe positioned correctly, the inspection becomes identical to a 0 flat inspection as each focal law intersects the surface at 90. The front wall in the corner of the part appears as a straight horizontal surface. A similar approach can be applied for inspection from inside the corner as well as from outside the corner. Olympus offers several probes and probe holders to meet the challenges of corner inspections including adjustable immersion wedges that are adaptable to a range of corner radii. The probe holders are chosen and positioned according to the corner geometry. The probe holder must be aligned so that the center radius coincides with the center of radius of the corner. With these holders the same probe can be used for a range of corner geometries by simply changing or adjusting the probe holder.

Probe radius does not coincide with the part radius.

Probe radius coincides with the part radius creating two concentric circles.

Probe radius does not coincide with the part radius.

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16

16

1 T

R r T 1

r T

Uncompleted front-wall echo

Completed front-wall echo

Uncompleted front-wall echo

Typical Setup Configuration

The front wall of the corner of the parts is viewed as a straight horizontal interface. The gate setups for C-scan displays are almost identical to the flat part inspection setup. However, the OmniScanPA allows A-scans to be synchronized to an interface gate (I), which gives flexibility to the probe position with respect to the radius. The A and B data gates as well as the TCG correction, are all synchronized to the interface gate.

Gate I Gate A

TWO OR THREE GATES (I, A, B)

Gate I can be used to synchronize the other 2 gates on the front wall. Gate A typically begins right after the front wall and continues past the back wall. This gate is used to produce amplitude and time-of-flight (TOF) C-scans. Gate B is typically employed to monitor backwall amplitude when the panel has a relatively constant thickness.

Gate B TCG

C-SCAN DISPLAYS (A%, TOF, B%)

Depending on the sample and the defects, each display has its merits and inconveniences.

TIME-CORRECTED GAIN (TCG)

To obtain 80% front-wall and back-wall echoes.

Display showing A-scan, Sscan, and TOF C-scan Display showing A-scan, amplitude C-scan, and TOF C-scan

Data Analysis
The main differences between inspecting the corners in this way and inspecting a flat panel are: The correlation required for index sizing on the corners. The beam inversion for ID inspections
Is 1 T R r d s 16

Display showing A-scan, S-scan, and amplitude C-scan

s = Is (r + d) R
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INDEX SIZING ON THE CORNERS

Indication sizing in the scan direction can be directly measured from the encoded readings and the displays on the OmniScan. In the index direction, a geometric conversion taking into account the radius of the phased array probe (R), the radius of the corner (r), the depth of the indication (d), the thickness of the part (T) and the indication size as displayed on the OmniScan (S), is required to obtain the actual indication size (s). This conversion is also dependant on the type of inspection (ID or OD).
Probe radius: R Part radius: r Thickness: T Size of indication: s Size of indication as seen by the probe: Is Depth of indication: d

Is 1 R

d s r

s = Is (r + T - d) R

BEAM INVERSION FOR ID INSPECTION

When performing an inspection from the inside diameter (ID), the beam created from the first elements of the probe reflects on the highest part of the corner (beam 1), whereas the beam created from the last elements reflects on the bottom part of the corner (beam 8). Therefore, the beams are inverted on the S-scan display as well as on the C-scan.
8

16

Beam 8

Beam 1
8

Due to the beam inversion phenomenom the beams are inverted on the C-scan.

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Radii Inspection Solution

OmniScanMX
With hundreds of units being used throughout the world, the OmniScanMX is Olympus most successful portable and modular phased array and eddy current array test instrument. The OmniScan family includes the innovative phased array and eddy current array test modules, as well as the conventional eddy current and ultrasound modules; all designed to meet the most demanding NDT requirements. The OmniScan MX offers a high acquisition rate and powerful software features, in a portable, modular instrument, for efficient manual and automated inspections.

RUGGED, PORTABLE, AND BATTERY OPERATED

The OmniScan is built to work in the harshest field conditions. A solid polycarbonate-based casing and rubber bumpers make it a rugged instrument capable of withstanding drops and shocks. The OmniScan is so compact and lightweight (only 4.6kg, 10.1lb) that it can be carried easily and handled anywhere, inside or outside. The OmniScan runs for 6 hours with its two lithium-ion batteries.

With hundreds of units being used throughout the world, the OmniScanMX is Olympus most successful portable and modular phased array and eddy current array test instrument.

USER INTERFACE
The 8.4in. real-time display (60Hz A-scan refresh rate) with an SVGA resolution of 800 x 600, allows you to clearly see defects and details under any light conditions. A scroll knob and function keys make it easy to navigate the menus and to select functions. A mouse and keyboard can also be connected for users wanting a more PC-like interface.

SETUP AND REPORTING

Setup storage is compatible with Microsoft Windows (exportable using a CompactFlash card). Complete report setups, including reading configurations, that can be customized using HTML page layouts. Easy report generation; from acquired data to complete report in seconds On-screen interactive help that can be customized for procedure-oriented setups using HTML script templates Setup preview Predefined setups

OmniScan 16:128 phased array module offers live switching from phased array mode to conventional UT mode for quick verification and defect sizing useful for certain code requirement applications.

CONNECTIVITY, DATA STORAGE, AND IMAGING

The OmniScan offers alarm outputs and standard PC ports: USB, SVGA out, and Ethernet. It offers internal data storage capability and extended storage using a CompactFlash (CF) card, USB, or network storage device.

The OmniScan offers thourough report configuration, and easy generation; from acquired data to complete personalized report in seconds.

General Phased Array Software Features

FULL-FEATURED CSCAN
Monitors amplitude, peak position, crossing level position, and thickness on each gate Ascan data storage and Cscan postprocessing capabilities Optional I gate for surface-following synchronization or measurement gate, or TCG/DAC curves Customizable color palette for amplitude and thickness Cscans

WIZARDS FOR GROUPS AND FOCAL LAWS

The Group and Focal Law Wizards allow you to enter all probe, part, and beam parameters, and to generate all focal laws in one step instead of generating them with each change. The step-by-step approach prevents the user from missing a parameter change. Onboard help provides general information on parameters to be set.

Examples of the Focal Law Wizard

CALIBRATION PROCEDURES AND PARAMETERS

All calibration procedures are guided by a step-by-step menu using Next and Back navigation. Adjustable 256-level color palette Positive or negative gate on RF signal (independent for each gate) Eight completely configurable alarms on single-gate events or multiple-gate events, filter for noccurrences from one or multiple channels 2axis mechanical encoding with data acquisition synchronization on mechanical movement Optional data library to access Ascans and/or Cscans on PCs for custom processing

FULL-FEATURED BSCAN
Easy-to-interpret cross-sectional view of inspected parts Visual identification of acquired thickness values

FULL-FEATURED ASCAN
Peak-hold mode (always keeps the signal that shows the maximum amplitude in gateA) Gate threshold-level crossing (changes the color of the curve that is over the gate level) Thinnest mode automatically selects and displays the focal law with the thinnest part section Colorselectable Ascan display Reject mode filters signals below a defined amplitude threshold 3 A-scan displays, fill, hollow, and two-colored 60Hz Ascan refresh rate with envelope and peak overlays inside the gate
Example of sensitivity calibration

ADVANCED REAL-TIME DATA PROCESSING

Real-time data interpolation to improve spatial representation of defects during acquisition of data User-selectable high-pass and low-pass filters to enhance Ascan and imaging quality

Live switching between conventional UT and phased array UT

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Software Tools for Composite Inspection

The rugged and portable OmniScan PA offers a high acquisition rate and powerful software features to efficiently perform manual and automated inspections. This section showcases a series of useful features for composite inspection such as: Gate measurements Gate synchronization Thickness configuration Range: how to set the minimum range Automatic tracking the thinnest or highest beam in gate At Layout ABS Reading I/(w) C-scan analysis readings list

GATE A ON I/
Gate A is synchronized on gate I crossing.

Gate start A is considered from I/ position (0,27 mm + 1,15 mm = 1,42 mm).

GATE MEASUREMENT
PEAK (^)
Position is taken at the maximal signal amplitude in the gate and the amplitude is also taken at the maximum signal in the gate. Go to Gate/Alarm > Gate > Gate = A Gate/Alarm > Gate > Parameters = Mode Gate/Alarm > Gate > Synchro. = I/

Peak measurement

A-SCAN SYNCHRONIZATION (GATE IF ON I/)

Edge measurement

Edge position of the signal in Gate I is automatically placed at 0mm. Gate Is threshold becomes important. Gate I is no longer displayed on the screen. Gates A and B are automatically synchronized on I/. Gate starts A and B are considered from 0 mm.

EDGE (/)

Edge position of the signal in Gate IF is automatically placed at 0 mm Gate start (A and B) are considered from 0 mm.

Position is taken at the crossing position in the gate and the amplitude is taken at the maximum signal.

GATES SYNCHRONIZATION
GATES ON PULSE
Gate start is considered from the 0mm position This mode allows the user to verify the probes position with respect to the radius, while performing the manual scan.

Go to Gate/Alarm > Gate > Gate = I Gate/Alarm > Gate > Parameters = Mode Go to A-Scan Sync = I/ Go to Gate/Alarm > Gate > Gate = I and parameters = Mode Go to A-Scan synchro = Pulse

GATE B ON A/

Gate B is synchronized on the crossing position of gate A. By setting gate B immediately after the crossing signal in gate A, the first peak amplitude can be monitored.

THICKNESS CONFIGURATION
Many gate combinations can be configured in the OmniScan in order to provide the correct thickness measurement. The Min. and Max. values are used to set up the color palette scale. By default, everything below the minimum value is colored red and everything above the maximum is colored blue.

Display showing the effect of setting the point quantity on the range value. On the left, the number of points is set to 320; on the right the number is set to 160.

DISPLAY WITH AUTOMATIC DATA CURSOR SELECTION

Display showing the effect of setting the maximum thickness value. On the left, the Max. is set to 50mm; on the right the Max is set to 5.5mm.

When in the phased array configuration, the user must select, with the data cursor, the A-scan he wants to display. The OmniScan can automatically display the A-scan with: The highest signal in gate A The minimum thickness value in gate A

Measurements > Thickness > Source = A/ - I/ Measurements > Thickness > Min. = 0.05 Measurements > Thickness > Max. = 50

HOW TO SET THE MINIMUM RANGE

Composite materials can be manufactured in a wide range of thicknesses. When inspecting thin parts, it is often necessary to reduce the range to analyze the area of interest. The range is directly proportional to the number of points recorded on each single Ascan. By default, the points quantity is set to 320. For example, in a material with a velocity of 3000m/s and without compression, the minimum range permitted by the OmniScan is 4.80mm. It is also possible to reduce that range to 0.48mm by directly editing the minimum number of points quantity on the OmniScan to 32. UT Settings > Advanced > Points Qty. = 32 UT Settings > General > Range = edit or scroll with the knob

Note that layouts containing a B-scan cannot be displayed when using either of these two modes.

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Display > Properties > Scan = A-Scan Display > Properties > Source = Highest (%) Display > Properties > Source = Thinnest

READING I(W)/
This reading displays the water column between the probe and the part.

LAYOUT: ABS
The ABS layout offers an A-scan, B-scan, and S-scan to be viewed all at the same time while in acquisition or setup mode. Furthermore, once the acquisition is complete and the OmniScan has been switched to analysis mode, this layout adds the C-scan view in order to facilitate quick and easy analysis.

Measurements > Reading > Field x (1, 2, 3, or 4)= I(w)/

C-SCAN ANALYSIS READINGS LIST

A predefined group of reading fields has been selected in order to facilitate the analysis.

Display > Selection > Display = A-B-S

A%: amplitude of the signal in the gate S(m-r): distance on the scan axis obtained by subtracting the position of the reference cursor from the position of the measurement cursor I(m-r): distance on the index axis obtained by subtracting the position of the reference cursor from the position of the measurement cursor T(A/-I/): thickness measurement Measurements > Reading > Group = C-scan Analysis

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Curved Array Probes

3.5CC10.2-16-R1

3.5CC25-32-R4

3.5CC50-64-R5

As a world leader in PA probe manufacturing, Olympus NDT has once again proved its superior applications knowledge with the introduction of the Curved Array Probe series. Every aspect of the probes has been examined and optimized for more inspection possibilities and a more ergonomic design.

Advantages
Acoustic impedance matched with water High circumferential resolution around the radius Corrosion-resistant stainless steel case Waterproof guaranteed to 1 m (3.28 ft) Compatible with adjustable immersion wedges (shown on page 13)
R A

R casing

Choosing the appropriate curved array probe

Choosing the appropriate probe depends on the geometry of the part. The main factors that need to be considered are the inspection type (ID or OD), the radius of the corner, and the angle of the corner. Once the choice of probes has been narrowed, the thickness of the part as well as the footprint of the probe and wedge must be taken into consideration. The following steps should be used as a guideline: Step 1: Choose the appropriate probes that match the inspection type, radius and angle of the corner to be inspected. (This is especially important for ID inspections where the minimum radius that can be inspected is determined by the angle of the corner.) Step 2: Validate whether these probes are compatible with the maximum thickness of the part. Step 3: Ensure that the size of the probe is conducive to the part geometry. Care must be taken with H beams to ensure that the probe and wedge are small enough to fit in between the flanges.
For more information contact an Olympus representative.

Probe Specifications and Dimensions

Part number 3.5CC10.2-16-R1 5CC10.2-16-R1 3.5CC25-32-R4 5CC25-32-R4 3.5CC50-64-R5 5CC50-64-R5 Casing type R1 R1 R4 R4 R5 R5 Frequency Number of Elevation Pitch (mm) (MHz) element (mm) 3.5 5.0 3.5 5.0 3.5 5.0 16 16 32 32 64 64 1.0 1.0 1.32 1.32 1.65 1.65 5.0 5.0 6.0 6.0 6.0 6.0 Radius (mm) (R) 10.2 10.2 25.0 25.0 50.0 50.0 Angle () (A) 90 90 90 90 121 121 Inspection type ID ID ID, OD ID, OD OD OD Minimum part opening angle () 70 70 70 70 50 50

These probes come standard with an OmniScan connector and a 2.5m (8.2ft) cable, or can be specially fitted with other connectors and cable lengths. 12

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Immersion Corner Wedges for Curved Array Probes

SR1-I81-ADJ

SR4-IE90-ADJ

Available for specific radius and angle, and a radius adjustment to fit various components Designed to perform manual scans Designed to be used with the Mini Wheel encoder

NUMBERING SYSTEM USED TO ORDER WEDGES FOR CURVED ARRAY PROBES

SR1-I90-0.125
Wedge type Inspection type Radius Angle of inspected part

GLOSSARY USED TO ORDER WEDGES

Wedge type
SR1 = wedge for curved probe type R1 SR4 = wedge for curved probe type R4 SR5 = wedge for curved probe type R5 I = internal E = external

Angle of inspected part ()

81 = 81 90 = 90 98 = 98 Custom angles can be ordered.

Inspection type

Radius

Radius in in. ADJ = adjustable radius

Wedge Specifications
Part number SR1-I81-ADJ SR1-I90-ADJ SR1-I98-ADJ SR4-IE90-ADJ Probe type R1 R1 R1 R4 Angle of the inspected part () 81 90 98 90 Radius range in mm (in.) 4 to 14 (0.157 to 0.551) 3 to 14 (0.118 to 0.551) 3 to 13 (0.118 to 0.512) 3 to 20 (0.118 to 0.787) Inspection type ID ID ID ID, OD
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Options and Accessories

Custom Wedges
REQUIRED INFORMATION FOR CUSTOM WEDGE ORDERS
When ordering custom wedges that are not listed, the following information must be provided: 1. 2. 3. 4. 5. 6. Part geometry (such as: I-beam, L, Z frame) Preferred inspection approach: ID or OD Probe casing type: R1, R4, or R5. Fixed or variable radius Part opening angle () Corner inner radius (provide maximum and minimum radii if variable wedge is requested) 7. Maximum part thickness in the radius

Mini Wheel Small Footprint Encoder

The Mini Wheel encoder is used to position the probe and to accurately measure defects in the scan axis. It synchronizes data acquisition with probe movement.

SPECIFICATIONS

D
RESOLUTION 12 steps/mm

E C A B

A = 27 mm (1.06 in.) B = 28.7mm (1.12 in.) C = 22.5 mm (0.89 in.)

D = 24 mm (0.94 in.) E = 17.5 mm (0.69 in.) F = 6 mm (0.23 in.)

FEATURES

14

Waterproof (IP68) Small dimensions Encoder resolution engraved on the wheel (12 steps/mm) Removable encoder wheel Double O-ring tire for better adherence Strain relief for cable protection Spring-loaded pin for adaptable encoder attachment 2 M3 threaded holes on top of the casing for rigid attachment DE version compatible with the OmniScan instrument BX version compatible with the TomoScan FOCUS LT instrument

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TomoView PC-Based Analysis Software

OmniScan is compatible with Olympus TomoView PC-based software family. OmniScan data is seamlessly imported into TomoView for further processing and analysis. For example, TomoView Lite Aero is dedicated to aerospace data analysis and offers: Simple and quick data display Generation of binary C-scan Defect sizing with SNR Multiple data files C-scan merge Offline resynchronization of A-scan Post acquisition C-scan creation Color palette edition and compression Software gain adjustment 1:1 display ratio

The free TomoVIEWER application can also be used to view data acquired by the OmniScan.

C-SCAN GENERATION
Digitize image data based on a reference zone (mean value, standard deviation) or select a specific threshold Digitize a region of interest (between cursors) or digitize the full C-scan image Remove any spurious indications (between cursors) Save results to companion file (A01) Choose from Full, Analysis, and Lite Aero editions of TomoView
Raw image Binary image

Reference area between the reference and measurement cursors

Binary image based on the SNR values

DEFECT SIZING WITH SNR

Computes signal-to-noise ratio and total area of indications below a certain SNR level Easy selection of signal-to-noise ratio using a slider or directly edited values User-selectable colors Available with C-scan data Available with Full, Analysis, and Lite Aero editions of TomoView
Reference area defined by the contour cursors (pink)

Reference Area Information

Displays mean value (Amplitude or Depth) and standard deviation value of reference area.

Histogram Distribution
Counts the percentage of pixels of each color level between 0% and 100% and displays the results as a graph (represents the region defined between the reference (red) and measure (blue) cursors).

Computed Indication Area

Measures the size of the area being above the Signal/Noise value (signal/noise value can be adjusted using the K value). Excludes values below gate amplitude threshold from histogram and defect area.

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CFRP Flat Panel Inspection Solution

Parts manufactured from laminate composite materials pose an inspection challenge because of their many shapes and thicknesses. However, many parts consist of a somewhat flat section such as skins, stringers, and spars. Olympus offers a complete solution for the inspection of carbon fiber reinforced plastic flat panels. This solution is based on the OmniScan flaw detector, the GLIDER scanner, and probes dedicated to CFRP flat panel inspection. The CFRP Flat Panel Inspection solution from Olympus provides a portable solution with advanced tools such as two-axis encoded C-scans with amplitude and time-of-flight (TOF) information, gate synchronization, and data recording. The GLIDER scanner is easy to use and wellsuited for raster scanning with both conventional UT and phased array probes. The Olympus CFRP solution offers important benefits:

OmnISCan SOLUTIOn

CFRP Flat Panel Inspecti

on

High inspection speed Powerful and versatile software tools Ease of deployment Greater POD Portability The Olympus CFRP Flat Panel Inspection solution can also be used for other FRP flat panels.

feATUreS
OmniScan instrumenta tion OmniScan software - Familiar menu-driven interfa ce - Multiple C-scans option - A-Scan and C-scan data storag

- TCG

- Quick swapping between PA and for prove up and defect sizing UT - Customizable color palett e for amplitude and thickness C-sca n GLIDER scanner - Well suited for PA, UT, ECA, and EC probes - High inspection speed - Two encoded axes UT and PA probes and wedge

Parts made of laminate composite materials pose an inspection chall enge because of their many shapes and thicknesses. However, many parts consi st of a somewhat flat section such as skins, string ers, and spars. Olympus offers a comp lete solution for the inspection of carbon fiber reinforced polymers flat panels. This solut ions is based on the OmniScan flaw detec tor, the GLIDER scanner and probes dedic ated to CFRP flat panel inspection. The CFRP Flat Panel Inspe ction Solution from Olympus provides a portable solution with advanced tools such as two axes encoded C-scans with amplitude and timeof-flight (TOF) information , gate synchro-

Conventional UT and Phas ed Array Inspection Solution

nization, and data recor ding. The GLIDER scanner is easy to use and well-suited for raster scanning with both conventional UT and phased array probe s. The Olympus CFRP solution offers impo rtant benefits: High inspection speed Powerful and versa tile software tools Ease of deploymen t Greater POD Portability Note: The Olympus CFRP Flat Panel Inspection Solution can also be used for other FRP flat panels.

- Near-wall probes: shorte ned dead zone at both ends - Delay line: provides excell ent nearsurface resolution - Water Pocket Rexolite wedge: for limited irrigation needs and better coupling on some surfaces

Your Challenge

920-166A-EN

is ISO 9001 certified.

Shinjuku Monilith, 3-1Nishi-Shinjuku2-chome, Shinjuku-ku, Tokyo 163-0914, Japan, Tel: 81(0)3-6901-4039 48 Woerd Avenue, Waltham, MA 02453, USA, Tel.: (1) 781-419-3900

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info@olympusNDT.com

Stock Road, Southend-on-Sea, Essex, SS2 5QH, UK, Tel.: (44) (0) 1702 616333 450 Campbell St. Unit 5, Cobourg, Ontario K9A 4C4, Tel.: (1) 905-377-9611 31 Gilby Road, Mount Waverly, Victoria, 3149, Tel.: (61) 130-013-2992 Valley Point Office Tower, 248373, Tel: (65) 68-34-00-10 CFRP Radii_Application_Guide_EN_200908 Printed in Canada Copyright 2009 by Olympus NDT. *All specifications are subject to change without notice. All brands are trademarks or registered trademarks of their respective owners.