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Spontaneous Outcropping of Self-Assembled Insulating
Nanodots in Solution-Derived Metallic Ferromagnetic
La0.7Sr0.3MnO3 Films
By César Moreno, Patricia Abellán, Awatef Hassini, Antoine Ruyter, Angel
Pérez del Pino, Felip Sandiumenge, Marie-Jose Casanove, José Santiso,
Teresa Puig, and Xavier Obradors*
Adv. Funct. Mater. 2009, 19, 2139–2146 ß 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim 2139
www.afm-journal.de
2140 ß 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim Adv. Funct. Mater. 2009, 19, 2139–2146
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film–substrate interfaces. Results are shown in Figure 3b. The set
of spectra were taken every 3.5 nm using an electron probe with a
diameter of 0.5 nm. The positions of the starting and final analyses
are indicated by 1 (substrate) and 2 (nanodot), as indicated in the
inset and the plot. As expected, the O–K edge peak at 532 eV is
observed through the whole profile. It is also clearly observed
that the La M5,4 edge persists across the film–nanodot interface
while the Mn L3,2 line is confined within the LSMO layer. This
indicates that the nanodots have a significant content in La and lack
Mn. EELS did not yield reliable information about the occurrence
of Sr because of the unfavorable energies associated to its edges.[24]
Accordingly, the occurrence of Sr was checked by energy dispersive
X-ray spectroscopy (EDS). Results yielded significant amounts of
Sr (20–30 wt %).
In addition to the outcropped LSO islands, TEM observations
revealed the occurrence of rounded inclusions, about 10–20 nm in
diameter, embedded within the LSMO film. Figure 4a is a low
magnification cross-section image including an LSO island and
such an inclusion, labeled Ruddelsden–Popper (R–P). In order to
gather high spatial resolution chemical information from such
Figure 3. TEM-EELS analysis of an LSMO film grown on an STO substrate
inclusions, energy filtered imaging was carried out using a Cs-
during 12 h at 1000 8C. a) Low magnification cross-sectional TEM
image showing a general view of the system where several interfacial corrected electron microscope operated at 200 kV, enabling a
nanodots are observed; b) EELS line scan across the interfaces nanodot– spatial resolution of 1 nm. To that purpose, an inclusion in contact
film and film–substrate, as shown in the inset. The scan was performed with the roots of an LSO island was selected enabling direct
from 1 to 2. comparison between both phases. Figure 4b and c presents the
conventional elastic-electron image corresponding to the analyzed
area, and the La-M5,4-edge distribution map, respectively. Clearly,
size and concentration of the polyhedral nanodots. For instance, the island appears La-rich while the inclusion exhibits a contrast
the equivalent diameter (D), mean height (h), concentration (N) of even darker than the surrounding LSMO matrix, as expected from
the nanodots, and total volume of outcropped nanodots per stoichiometric balance considerations.
unit surface (V) seen in Figure 2a–c were estimated to evolve In the analyzed LSMO [010] zone axis images, such inclusions
as follows: a) D 60 20 nm, h 4 3 nm, N ¼ 14 dots mm2, typically exhibit either cubic-like or tetragonal-like structural
V 0.45 103 nm3 mm2; b) D 336 56 nm, h 40 10 nm, projections. As an example, Figure 4d and e shows a high
N ¼ 2 dots mm2, V 45.2 103 nm3 mm2; c) D 270 60 nm, resolution TEM image of an [100] oriented inclusion and its
h 50 20 nm, N ¼ 8 dots mm2, V 114.5 103 nm3 mm2. corresponding FFT spectrum, respectively. Figure 4f is a [001]
The increase of the nanodot volume with annealing time suggests zone axis FFT spectrum corresponding to a different inclusion.
that the outcropping process is kinetically limited while the This indicates that these inclusions hold an epitaxial relationship
reduction of the nanodot concentration N with the annealing with the surrounding LSMO matrix. Considering that the observed
time indicates that coarsening occurs simultaneously and so two types of projection correspond to two major zone axis, namely
surface diffusion is important. On the other hand, the strong [001] and [100] or [010], the lattice parameters derived from the FFT
increase of nanoisland volume in samples with La excess Figure 2c spectra yield lattice parameters 3.8 and 19.7 Å, which
clearly demonstrates that the nanodot size and concentration can interestingly fit with the n ¼ 2 R–P structure[25] (S.G. I4/mmm,
be tuned through the initial composition and annealing process. A a b ap, c 20 Å).[26] Thus, the epitaxial relation is given by
high resolution TEM cross-section investigation was therefore (001)[100]R–P//(001)[100]LSMO. This structure is formed by the
carried out to investigate the structural response of the LSMO film insertion of a rock-salt-like unit, SrO, every n (¼2) perovskite-type
to the phase segregation process as well as its consequences on the blocks, SrMnO3. The Sr cations can in fact be replaced by La,
physical properties. resulting in an increase of the lattice parameters.[26] As a general
A typical low magnification image of a 12 h annealed behavior, [001] images exhibit rather perfect crystallinity,
stoichiometric film, viewed along [010] is shown in Figure 3a. while [100] or [010] ones feature strong disorder, both in the
The LSMO film thickness was found to change smoothly from one stacking sequence and in the lateral continuity of atomic layers. In
observed area to another with values comprised between 20 and fact, stacking disorder is a common feature in these phases.[27]
26 nm. The image clearly shows flat islands with lateral facets Thus, it is likely that both, structural mismatch and cationic
and sizes in the range 20–55 nm in height and 90–280 nm in balance are further accommodated through structural and
length. Nanodots facets are found to form an apparent angle of chemical disorder (mostly in the form of stacking faults and
about 45 8 with the substrate surface. It is furthermore observed lateral discontinuity of atomic layers) in addition to elastic strains
that the nanodots penetrate into the LSMO film, thus thinning the within the inclusions.
LSMO film below the nanodots which in some cases reduce Figure 5a and c compares high resolution cross-sectional TEM
considerably its thickness. images corresponding to an island partly embedded in the film,
Adv. Funct. Mater. 2009, 19, 2139–2146 ß 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim 2141
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2142 ß 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim Adv. Funct. Mater. 2009, 19, 2139–2146
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above, and with respective surface occupancies
(1 x)/x, the total elastic strain energy per unit
area Eelnc could be written as:
Adv. Funct. Mater. 2009, 19, 2139–2146 ß 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim 2143
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2144 ß 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim Adv. Funct. Mater. 2009, 19, 2139–2146
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generation of the surface nanodots is a
partial release of the elastic energy when
the nanodots are formed at the surface.
This is the same driving force of island
formation that is in the Stranski–Krastanov
mechanism and hence the new mechan-
ism reported here can be considered as a
generalized case, though the problem is
considerably more complex because it also
involves compositional separation of two
phases. The spontaneous outcropping of
self-assembled nanodots on top of an
epitaxial wetting layer with a different
composition appear then as a new oppor-
tunity to modulate at the nanoscale the
physical properties of the underlying
wetting film or to generate nanotemplates
in a film surface.
4. Experimental
LSMO films with superficial Sr–La oxide nano-
dots were deposited on (100) SrTiO3 (STO)
substrates by spin coating at 6000 rpm for 2 min
Figure 7. a) AFM topography image of an LSMO thin film grown on an STO substrate at 1000 8C and annealed at temperatures in the range 900–
during 12 h with the nonmagnetic-insulating (La,Sr)Ox nanodots imaged on the surface; b) CSAFM 1000 8C under flowing oxygen gas for different
image corresponding to the same surface displayed in (a); c) profile following the lines indicated in (a) annealing times up to 12 h [17]. Final film
and (b) of the topography and the current measured with CSAFM. thickness was estimated to be in the range 20–
26 nm by AFM and cross-sectional TEM. X-Ray
humidity-induced electrochemical reactions. Figure 7a shows a diffraction reciprocal space maps were obtained using a Bruker D8
typical topography image with its corresponding current map Advance difractometer equipped with a four-angle goniometer and a
general angle diffraction detection system (GADDS) 2D detector (Cu Ka
(Fig. 6b) obtained with a bias of 2.7 V scanning the biased tip from
1 radiation, no monochromator). The films surface morphology was
left to right at a speed of 0.5 mm s and with 50 nN load. The investigated with a PicoSPM AFM from Molecular Imaging, using
current measured on the LSMO film reach 5 nA, the maximum intermittent contact mode at room temperature which allowed to evidence
current measurable by the detector. different evolution stages of the nanostructures. Statistical analyses of the
Moreover, the current recorded on the LSO islands drastically AFM images were carried out by the software Mountains (Digital Surf).
drops to zero, which accounts for their insulating nature. In Additionally, current sensing AFM (CSAFM) measurements were
performed to analyze the metallic or insulating character of the
conclusion, these results confirm that while the LSMO film
nanostructured films with an Omicron Instruments UHV AFM/STM
preserves its conducting character the behavior of the LSO system by standard contact mode with a silicon AFM tip coated with a
nanodots is fully insulating. boron-doped diamond conducting film (CDT-FMR, Nanosensors). TEM
investigations were carried out with a 200 kV Jeol JEM-2010F field emission
gun microscope equipped with an electron energy loss spectrometer
(EELS) with a nominal energy resolution of 0.8 eV, and a Jeol JEM-2011
3. Conclusions microscope equipped with an EDS. Energy filtered images were obtained
using a 200 kV Cs corrected F20-SACTEM Tecnai microscope fitted with a
In conclusion, we have presented a new mechanism for the GIF-Tridiem energy filter. Cross-sectional samples for TEM examination
creation of self-assembled epitaxial nanostructures in a film were prepared by the conventional cutting, gluing and grinding procedure,
surface. When an epitaxial nanocomposite film is formed, based followed by a final Ar milling step down to perforation. Magnetic
on the phase separation of two crystallographic dissimilar measurements have been performed using a superconducting quantum
structures, diffusion towards the surface of the film of the interference device (SQUID) magnetometer provided with a 7T magnet to
check the properties of the LSMO layers. Electrical resistivity and
minoritary phase may occur spontaneously leading to the
magnetoresistance were obtained using a physical properties measure-
formation of self-assembled islands. The two crystalline phases ment system (PPMS, Quantum Design) equipped with a 9T magnet with a
investigated here have been LSMO and an unknown insulating standard four-point probe method.
LSO phase which appear by TEM to display a coherently strained
structure, even though the strain state and the lattice symmetry of
the LSMO film underneath the islands have been modified. We
have shown that the concentration and size of the insulating Acknowledgements
nanoislands can be tuned through modification of the initial We acknowledge the financial support from Spanish MEC (NANOARTIS,
composition of the chemical solution and growth kinetics control. MAT2005-02047; NANOFUNCIONA, NAN2004-09133-CO3-01; NANO-
Adv. Funct. Mater. 2009, 19, 2139–2146 ß 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim 2145
www.afm-journal.de
SELECT, CSD2007-00041 FPU, AP2005-4669 FPU), Generalitat de [18] J. Brous, I. Fankuchen, E. Banks, Acta Crystallogr. 1953, 6, 67.
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Catalunya (Catalan Pla de Recerca SGR-0029 and CeRMAE), CSIC (PIF- [19] A. Hammouche, E. Siebert, A. Hammou, Mater. Res. Bull. 1989, 24,
CANNAMUS) and EU (HIPERCHEM, NMP4-CT2005-516858). The Cs 367.
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