NEW

Image Dimension Measurement System IM-6500 Series Wide-field Model

Place, Press, Process

Instant Measurement
Totally new dimension analysis system

PLACE, PRESS, PROCESS

Instant Measurement
Instant measurement is provided by a totally new dimension analysis system which defies traditional metrology techniques. Data is obtained using a system based on the same optical technology that provides digital microscopes with the industryhighest resolution, the image processing technology that gives overwhelming power of problem solving to vision systems, and now with the reliability that is needed for factory automation environments.

Incomparable with Conventional Systems

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Strength 1

Optical Technology
Optical design technology

The power of quality imaging optics and optical design technology used in digital microscopes has achieved a revolutionary lens system which captures the precise shape of a target.

Strength 2

Image Processing Technology

Pattern matching algorithm used by vision systems

Precise shape recognition and the detection of fine features. The image processing technology cultivated through vision system development has achieved high-precision dimensional

measurement.

Image processing technology for recognizing fine features

Strength 3

Support System
Reliability perfected in factory automation environments

Direct support

Direct sales from the manufacturer without using agents or distributors. Technically-knowledgeable sales representatives offer careful support to solve customers' problems quickly. Delivering an essential product when the customer needs it most. The policy established in factory automation environments will also be applied to measurement systems. Any issues encountered by the customer will receive our full backing.

Same day shipment

A Totally New Dimension Measurement System Born from A New Concept which Eliminates the need for X-Y stages with the IM-6500 Series Wide-field Model

Vernier caliper/ micrometer

Optical Comparator

Measuring microscope

Optical CMM

Instant Measurement will answer existing issues associated with conventional methods.
A completely new concept of measuring the dimension of an entire target simultaneously by eliminating the XY stage has been achieved with place-and-press measurement. It greatly improves the efficiency of measurement inspections.
Vernier caliper/ micrometer Optical Comparator Measuring microscope Optical CMM

IM Series

Reduced measurement time No individual user differences Easy operation Easy data management

X X

X X X

X X X

X X

Drastically Reduced Measurement Time

Just place and press: 99 features are measured in seconds.
Just place a target and press the button. Ninety-nine points are measured in seconds. The system automatically finds and measures targets even when they are placed in a different location or orientation, which significantly reduces measurement time.

Eliminating Individual Differences

High-precision automatic measurement using the latest image processing technology
Since the shape of a target is automatically recognized before measurement, the result is not affected by individual differences such as alignment errors or variations in the skill level of equipment users. The same results can be obtained consistently no matter who is taking the measurements.

Easy Setup for Wider Applications

Easy setup by checking the entire image of a target
Even the initial setup is easy, just specify points with the mouse while checking the entire image of a target. You can easily complete the setup procedure for a wider range of measurements from outer diameter, circular pitch, and angle measurements to measurements using virtual lines or points.

Easy Data Management

Statistics/analysis function for easy trend checking or reporting
All measurement results will be saved automatically. The included statistics/ analysis function allows easy checking of the points for improvement and preparation of inspection records. Of course, measurement data can be imported to and used on spreadsheet software.

Imp r o v e d q u a l i t y

Cost efficiency

Shorter lead time

Four Features will Support your QCD Improvement.

Advanced Lens Technology Drastically Reduces Inspection Time and Provides One Step Measurement

Advanced Telecentric Lens System Captures the Entire Target in One Image
Most targets have surfaces which are not flat but uneven with height differences. The most important component to capturing the entire image of a target for simultaneous measurement was the development of a lens which accurately generated target images regardless of height differences in the field of view. For the IM Series, advanced technologies pioneered by the digital microscope industry were applied to the development of a lens which maintained a clear focus and constant size even for targets with height differences and which did not cause distortion along the circumference even in a wide field of view.

Clear Focus not Affected by Height Differences [High depth of field]

A lens providing high depth of field has been developed to ensure clear focus even for targets with height differences. This achieves not only the ability to measure dimensions of the entire target simultaneously, but also easy setup which does not require focus adjustment for each measurement point.
Normal camera lens
The image is out of focus due to height differences.

IM Series
The image is in focus regardless of height differences.

Apparent Feature Size not Affected by Height Differences [Telecentric lens]

A telecentric lens maintains a constant feature size on the projected image regardless of the height differences of the target. This is essential for accurate measurement of targets with uneven surfaces. The development of a large diameter lens with a 100 mm (3.94") field of view has brought a completely new measurement system which captures the entire target in one image for simultaneous measurement.
Normal camera lens
The recessed features appear smaller.

IM Series
The top and recessed surfaces are displayed correctly.

Less Distortion Along Circumference [Low distortion lens]

A low distortion lens plays a vital role to achieve accurate measurement throughout the field of view by satisfying the measurement accuracy even for the area along the outer edge of the field of view. Our optical technology accumulated in the digital microscope industry has achieved a system providing both a wide field of view and low distortion.
Normal camera lens
The area along the outer edge is shown distorted.

IM Series
The image is less distorted throughout the field of view.

SIGNIFICANTLY REDUCED INSPECTION TIME

Just Place and Press to Measure 99 Features in Seconds.

Conventional method (optical comparator)

IM Series

Positioning

Just place a target

Focus adjustment

Measurement

And press the button.

Repeated for the number of measurement points

Filling out the inspection record

Moving to the next point

All points are measured in seconds.

Every measurement requires more time

In addition to initial positioning of the target, you needed to move the stage to measure each point. The measurement time increases in proportion to the number of measurement points. The time further increases when focus adjustment is required.

99 features are measured in seconds.

Just place a target on the stage and press the button. The location, orientation and focus are automatically adjusted. Simple place-and-press operation measures 99 features in seconds. Anyone can easily complete measurement in an incredibly short period of time.

ADVANCED TECHNOLOGIES FOR ACHIEVING "PLACE-AND-PRESS" MEASUREMENT

Pattern search for automatic orientation correction

The location and orientation of the target placed on the stage are automatically adjusted based on the recorded shape of the target. There is no need for positioning of a target or preparation of a jig at the beginning of measurement. This is literally place-and-press measurement.

Industry first

The location and orientation of the target placed in the field of view are automatically adjusted for measurement.

Simultaneous measurement of 99 features by capturing an entire part

This is a completely new measurement system which measures by capturing the entire image of a target within the field of view. It does not require time for alignment of the stage and completes the measurement of 99 features in seconds. Measurement time can be reduced significantly compared with conventional optical comparators, measuring microscopes and optical CMMs.
Even when many feature are specified on a dimension drawing, all features can be measured within a few seconds.

Industry first

Batch measurement for further reduction in measurement time

The dimensions of all targets on the stage are measured simultaneously. Even when the targets are placed randomly, it is unnecessary to align them in a jig because the location and orientation of each target is automatically adjusted before measurement. This further reduces measurement time.
Even targets placed randomly are measured simultaneously. Clicking each target shows its measurement result.

Industry first

SIGNIFICANT TIME REDUCTION

In addition to the inspection time, the standby time during product changeover is also reduced. This helps improve the facility utilization ratio and reduce costs.

Example: When 5 or more minutes are required to measure 10 points with an optical comparator

Projector IM Series

Positioning time

Focus adjustment time

Measurement time

5 minutes or more

5 seconds or less

No need for positioning, focus adjustment, and stage movement

ELIMINATING INDIVIDUAL VARIATIONS

Same Results no Matter who Carried Out the Measurement

Conventional method (Vernier caliper, Digital micrometer, projector)

IM Series

Conventional measurement was susceptible to individual user differences.

Setting differences

With the IM Series, everyone's an expert.

Pressure differences

Measurement point selection differences

Alignment differences

Just place and press

Focus adjustment differences

Virtual point calculation differences

To reliably measure an exact dimensions.

Different results caused by individual operator habits or skill levels

The results varied not only among individual users but also among measurements performed by the same user depending on the measured features, specified target edge and focus adjustment.

Latest image processing technology for stable measurement

Just place a target and press the button. The location and orientation of the target are automatically adjusted and measurement is performed using the specified points. The measurement is not affected by individual differences in alignment, measurement points, and focus adjustment.

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LATEST TECHNOLOGIES TO ELIMINATE INDIVIDUAL DIFFERENCES

Sub-pixel processing for measurement down to one hundredth or less of one pixel
One pixel of the light receiving element is divided into 100 or more squares and used as a unit for shape recognition. This allows high-resolution measurement in a wider field of view. The optical system is also taken into consideration to improve accuracy.
Without sub-pixel processing
The target is measured by one pixel of the light receiving element. One pixel of the light receiving element

Industry first

One pixel is divided into 100 or more squares

With sub-pixel processing
The target is measured by one hundredth or less of a pixel of the light receiving element.

A line or circle is recognized using 100 or more points*

The shape of a line or circle used for measurement is recognized by the least square fit algorithm using approximately 100 points detected automatically. Using many points ensures stable measurement.
* The exact number of points is user adjustable for optimal detection.

About 100 points are detected automatically.

The shape is recognized by the least square method using the detected points.

Eliminating discrepancies in results caused by burrs and chips

During the extraction of a line or circle, the system eliminates the influence of burrs or chips by ignoring points at abnormal locations in comparison with other points. It is also possible to set the system to interrupt measurement when burrs or chips are found.

Options for processing abnormal points, burrs, and chips

Abnormal points (red points) are ignored during shape recognition.

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EASY SETUP FOR WIDER APPLICATIONS

Easy Setup by Checking the Entire Target

Just click the points to be measured with the mouse

To set up feature inspections, just select the desired tool from the menu and roughly specify the measurement points on the screen with the mouse. Since the entire image of a target is displayed, you can set details intuitively through simple mouse operations.
Select a desired measurement type from the menu. Roughly specify the measurement points with the mouse.

Easy measurement using midlines or virtual points

Various options are available for facilitating the measurement using midlines or virtual points for which complicated setup was required. Moreover, a special menu is available for measuring small rounded corners, curved surfaces, and geometric tolerances such as position or concentricity.
Various options including a midline and intersection. Various options from basic measurement to geometric dimensioning and tolerancing

Profile comparison & perimeter measurement functions included

The profile tolerance (difference from the reference dimension) or perimeter of a target can be measured. The reference dimension for the profile tolerance measurement can be created from CAD data*. The statistics result can be displayed as an image for easy trend checking.
* Optional software required
Just specifying the points along the perimeter of the target will allow profile tolerance and perimeter measurements. The profile statistics function shows a color-coded image to indicate differences from the reference dimension. Industry first

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SUPPORT TOOLS FOR INCREASING FUNCTIONALITY

Automatic element extraction function

Just specify the points along the perimeter of the target, and the element required for measurement such as a line , circle or arc is automatically extracted. All you have to do now is select an option for measurement and click the extracted element.
Highlight the target area.

Industry first

Any lines, circles, or arcs are extracted automatically.

Measurement Guide and animated navigation for further ease of use

Each inspection tool built into the onboard software comes with a step by step Measurement Guide displayed at the upper right corner of the screen. Clicking the Play button starts a simple video guide which illustrates the procedure in a few easy steps.
Animation replay

Industry first

Measurement complete
The Measurement Guide displays the next operation. Animated navigation illustrates the procedure in a few easy to follow steps.

Linking to a PC/CAD for further convenience

Various application software is available including editor software which allows setup on a PC in the same way as on the IM Series, and import software for loading CAD diagrams. These applications allow smooth setup without interrupting normal inspection schedules.
Editor software for enabling setup on a PC

*Optional

NEW

Import software for loading CAD diagrams

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EASY DATA MANAGEMENT

Automatic Saving of Measurement Values. Statistics/Analysis Function for Further Use.

Conventional method (Vernier caliper, Digital micrometer, optical comparator)

IM Series

Measurement complete Measurement complete

Repeated for the number of measurement points

Fill out an inspection Log

Just click the menu option.

Input Data to a PC

Process with spreadsheet software

Analysis/ inspection Report

Inspection Report Data list Trend graph

Considerable time and effort required for recording and processing

Manual recording of results was necessary every time the operator completed measurement of one point. There were other tasks such as PC data entry and processing which required considerable time and effort. In addition, manual data recording and input sometimes produced additional errors.

Easy data analysis and report preparation

The measurement values are saved automatically and can be easily organized and processed with the statistics/ analysis function to create analysis of a statistical index, trend, variations or to prepare inspection records.

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STATISTICS/ANALYSIS FUNCTIONS

Automatic calculation of major statistical values. Group extraction is also easy.

Critical statistical values required for inspection reports are automatically calculated and displayed, including maximum, minimum, average, , 3 and CPK. You can also set various conditions for group extraction for statistical, analysis, and inspection records.
Critical statistical values required for inspection reports are provided by default. Groups can be extracted on various conditions.

Trend graph/histogram functions for on-site analysis of product trends and variations
The trend graph/histogram function allows on site analysis of production trends and variations. Quick feedback helps quality management prevent defective production.

The trend graph shows tendencies of a product at a quick glance.

Histogram settings can be adjusted as required.

Data can be used easily in reports or spreadsheet software.

Inspection records and analysis reports can be prepared with the press of a button. No additional work is required such as data transcription or input to a PC. It is also easy to import measurement data to spreadsheet software for processing.

Inspection records and reports can be prepared easily.

Measurement data can also be used easily on spreadsheet software.

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Performance and Reliability for Field Use

Highly rigid body and temperature sensor ensures practical installation anywhere.
The highly rigid body and built-in temperature sensor have enabled "installation anywhere". Deformation can be prevented to limits and temperature compensation ensures accurate measurement in the field.
Built-in temperature sensor

Frame strength analysis diagram

Temperature sensor ensures more stable measurement.

Space-saving design small footprint

In addition to the compact body, the built-in monitor saves significant space in the installation process. It can be installed anywhere. These important features allow you to take your lab to the production line for immediate part feedback.
Projector Image Measure IM Series Measuring microscope

small footprint

Traceability system
The reference scales used for manufacturing, inspection, and calibration conform to the reference scale of JCSS accredited calibration laboratories to establish traceability back to the national standard.

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Two Types of Illumination for a Wide Range of Measurements

One target can be measured with different illumination types.

Backlighting
A high intensity green LED light is mounted at the bottom of the head unit.Uniform, parallel light has been achieved through KEYENCEs accumulated expertise in lens development. Optimized illumination ensures a wide field of view and stable measurement of targets even with significant height differences.
Torsion spring Lead frame

IC

Gear

Ring epi-illumination
A high intensity white LED ring light surrounds the image pickup lens. The light is divided into four parts along the circumference. These can be turned on/off individually. These settings are then retained as part of the inspection routine, allowing each individual feature to have individually optimized lighting settings.
Plastic cap Molded connector

Ceramic capacitor

Keypad

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CONVENIENT PC BASED DATA MANAGEMENT

Central data management

A LAN connection allows you to easily obtain measurement data or setting files for IM Series units located in remote locations. You can also send the setting files created on a PC or one IM Series unit to another IM Series unit. Managing data centrally on a server reduces the risk of data loss.
Measurement data Measurement data Setting file Internal LAN

NEW

Remote factory PC Server

Setting file

PC applications
Special PC software is available: A statistics/ analysis viewer for measurement data browsing, statistics/analysis processing, and report preparation; a measurement setup editor for measurement setup; and a CAD import module for converting CAD diagrams into IM measurement data.
Statistics/analysis viewer Measurement setup editor IM-H11E Optional
Coming soon

NEW

CAD import module IM-H1C Optional

Coming soon

Operating system environment

Windows XP Professional/Home Edition SP3 or later (32-bit version), Windows Vista Ultimate/Business/Home Premium/Home Basic SP2 or later (32-bit version), Windows 7 Ultimate/Professional/Home Premium (32/64-bit version), preinstalled version CPU Memory capacity HDD free space Display color

Applicable OS

Intel Core 2 Duo 1.6 GHz or higher 1 GB or more (2 GB or more recommended for Windows Vista/7) 1 GB or more 32 bits or more

System configuration

Head IM-6010/6020

Controller IM-6501E

RGB

Monitor

LAN

PC

Indicator, buzzer, etc.

USB

Inkjet printer

Optional accessory Sapphire glass for the measurement stage OP-86986 (Normal glass:OP-86985) Foot switch

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Specifications
Model Image pickup device Display Light receiving lens Field of view Minimum display unit Repetition Accuracy Measurement accuracy External remote input External output Interface Record Resistance to environment Illumination system Z-axis stage Power supply Weight Wide-field measurement mode High-precision measurement mode Wide-field measurement mode High-precision measurement mode Comparator output (OK/NG/FAIL) LAN USB 2.0 series A Hard disk drive Operating ambient temperature Operating ambient humidity Coaxial transparent illumination Ring epi-illumination Moving range along Z axis Withstand load Power supply voltage Power consumption Controller Head Wide-field measurement mode High-precision measurement mode 100 mm 3.94" Controller Head IM-6501E IM-6010 1" 6.6 mega pixel CMOS 10.4" LCD monitor (XGA: 1024 x 768) Double telecentric lens 100 mm 3.94" 25 mm 0.98" IM-6020

0.1 m 0.004Mil 1 m 0.04Mil 1 m 0.04Mil 0.5 m 0.02Mil 5 m*1 0.2Mil 5 m*1 0.2Mil 2 m*2 0.08Mil No-voltage input (with and without contact) Relay output/rated load: 24 VDC 0.5A/ON resistance: 50 m or less RJ-45 (10BASE-T/100BASE-TX/1000BASE-T) 6 ports (Front: 2, Rear: 4) 160 GB +10 to 35C +50 F to 95F 20% to 80% RH (no condensation) Telecentric transparent illumination (green LED) Four division ring illumination (white LED) 30 mm 1.18" 3 kg AC100 to 240 V 50/60 Hz 180 VA max. Approx. 8 kg Approx. 24 kg Approx. 25 kg

*1 2 in the range of 80 mm 3.15" from the center of the stage at the operating temperature range of +231.0C +73.41.8F degrees at the focused focal point position *2 2 in the range of 20 mm 0.79" from the center of the stage at the operating temperature range of +231.0C +73.41.8F degrees at the focused focal point position

Measurement points Pattern search (Profile tracking function) Registration of measurement configuration Distance measurement Basic measurement function Angle measurement Calculation Point Conjunction edge Virtual line function Line Circle Pitch measurement Width measurement Application tool Thickness measurement Special tool Shape tolerance GD&T Orientation tolerance Position tolerance Point Line Element tool Circle Profile extraction Special tool Manual measurement Coordinate system configuration Batch configuration of tolerance Element list editing Measurement setting data binding function
*3 Depending on the measurement setting data and number of data pieces being stored

99 points max. (99 x 9 points possible when the measurement setting binding function is used) XY (with 360 rotary position compensation) 1000 or more*3 8 types (point-point/line-point/line-line/circle-point/circle-line/circle-circle/circle/arc) Provided Provided Middle point/intersection Line conjunction/circular conjunction 6 types (midline/perpendicular line/parallel lines/tangent line/line passing through the point/approximate line) Middle circle/approximate circle/auxiliary circle Line/circumference Edge width Thickness measurement/Gap measurement between inner and outer diameters Rounded corner/curved surface/oval/reticle/point position/perimeter Straightness/circularity/profile Squareness/parallelism Point position/concentricity Point (on a line or arc)/maximum/minimum (rectangle, circle, arc) Line/centerline Circle/arc Provided Automatic generation Provided Provided Provided Provided Provided

Dimensions
Head IM-6010/6020 Controller IM-6501E
Unit:mm inch

551 21.69"

343.3 13.52"

173 6.81"

322 12.68"

240 9.45" 264 10.39"

482 18.98"

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54 Million Pixel Digital Microscope Digital Microscope

Large depth-of-eld: 20x larger than conventional optics Free-angle observation for 360 degree inspection Observe, record and measure - all with a single system 2D & 3D Image Stitching expands viewing area up to 50 times View low-contrast and highly-reective targets 0.1x - 5000x magnication range: brighteld, darkeld, transmitted, DIC, polarized illumination

Copyright (c) 2011 KEYENCE CORPORATION. All rights reserved.

IM6500W-KA-C-E 1041-1 611566 Printed in Japan

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