Beruflich Dokumente
Kultur Dokumente
OIM scan data will be analyzed in form of Map, Chart, Plot and combined them. It will be analyze the texture or micro structure to know the relationship between these texture and properties of the sample. Information from OIM scan data analysis will depends on capability or knowledge of people who analyze the data.
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OIM School
OIM Analysis
OIM scan data is analyzed in form of Map, Chart, Plot and combined them.
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OIM School
Document Selector
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Project Tree
In OIM a project contains all of the documents created during an analysis session.
Project A chart that combines results from any partition in the project OIM Datasets Partitions. Essentially subsets of the data that meet some user prescribed criteria. A Chart e.g. grain size distribution, IQ distribution A map A discrete orientation plot such as a pole figure or an ODF I.e. discrete points plotted in Euler space. A Texture this contains all of the results for a given calculations. I.e. for a user prescribed set of parameters. Texture plots (of intensities) such as a Pole Figures or ODFs.
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OIM School
Project
[ Multi Chart ]
Dataset
Dataset
Dataset
Partition
Partition
Partition
Partition
Parameters which define properties of analysis for each partition. Grain size, boundaries, etc
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OIM School
OIM Analysis
Lets draw OIM map
Each scan data will be opened under Project. The scan data is called as Dataset. And partition, All data, will be created automatically. Map, Plot, or Chat will be drawn under partition.
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OIM School
Practice:
Lets draw OIM map using Alpha-Steel Open Alpha-Steel data and draw following maps using Quick Gen buttons Image Quality map (IQ map) Inverse Pole Figure map IPF map Grain map (Unique Grain Color map)
IQ map IPF map Grain map
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Maps
Gray Scale Image Quality Confidence Index Fit Detector Signal Grain Size Grain Shape Orientation Grain Shape Aspect Ratio Grain Average IQ Grain Average CI Grain Average Video Signal Kernel Average Misorientation Grain Orientation Spread Grain Average Misorientation Grain Reference Orientation Deviation Taylor Factor Schmid Factor Import Data Boundaries Rotation Angle Rotation Axis Axis/Angle Grain Phase CSL Shape Ellipses Reconstructed Reconstructed Twins Color Scale Image Quality Confidence Index Fit Detector Signal Phase EDS Inverse Pole Figure Crystal Direction Crystal Orientation Euler Angle RGB Unique Grain Color Grain Size Grain Shape Orientation Grain Shape Aspect Ratio Grain Average IQ Grain Average CI Grain Average Fit Grain Average Video Signal Kernel Average Misorientation Grain Orientation Spread Grain Average Misorientation Taylor Factor Schmid Factor Elastic Stiffness Twin Parent/Daughter Import Data
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Maps
Non-Orientation Scalar maps IQ, CI, fit, Other detectors (FSD, SED, X-Ray), phase Grain Based Maps size, shape, avg IQ, orientation spread Orientation based maps IPF map (2D), Euler Angle map, Component maps Misorientation Based Maps local misorientation (strain) Property Maps Taylor or Schmid Factor, Elastic Modulus
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84.9
21.6
IQ map is drawn based on the peak intensity of Hough transformation. If the pattern is clear which means the crystal has less distortion. If IQ value is low, that point has more distortion with crystal, or contaminated or damaged.
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OIM School
CI (Confidence Index) is a parameter which shows confidence of indexing which is calculated using above equation. The CI map is drawing using this parameter. Be careful that CI=0.4 and CI=0.8 has almost no difference. But CI=0.05 and CI=0.1 is a big difference. So the meaning is not liner scale. Confidence Index OIM-DC
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OIM School
Reference Direction
Transverse Direction
Normal Direction
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In case of IPF map, it should be first specified some sample plane, such as ND plane, then find which crystal plane becomes parallel to this specified sample plane. Then each pixel is pained depends on the crystal plane using right color key.
OIM School
(X)
ND
TD
RD Orientation map such as IPF map is made based on sample coordinate, not the sample surface. If ND sample plane is specified, the crystal plane which parallel to the ND normal plane for each pixel. It doesnt mean the same as sample surface. So it should be always careful about sample coordinate system.
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ND
TD
RD
If we select Map Data at Status bar text in Preference shown by red arrows, then after specifying the sample surface, the point data specify cursor will be shown as below. . RD
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ND
OIM School
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(10 0 3)
Pixels which has <10 0 3> crystal direction is nearly same as (11 0 1) plane normal, not (10 0 3).
Pick up the grains which (10 0 3) plane becomes normal to the sample ND plane.
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OIM School
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Practice:
Lets draw Crystal Direction Map using Sn-Solder scan data.
Put 1, 1, 2 either Crystal Direction(1) or Pole(Plane) (2) and see the difference.
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Practice
Lets paint in different color for following area in Crystal Direction Map. Specify (001) plane normal along with ND direction with following rejoin. 0 5 5 10 10 15 15 20
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Grains in OIM
Grains in OIM is defined by Tolerance Angle and Minimum Grain Size (number of grains). Neighbor pixels within this tolerance angle are considered to belong to the same grain and if pixels equal or more than Minimum Grain Size are connected within the Tolerance angle, they are considered as independent gain. This definition is same as connecting boundary more than Tolerance angle and make closed loop or touch to the scan boundary. Under this definition, we may see the boundary more than Tolerance Angle in grains as shown in below.
A B C
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Grains in OIM
Grains in Unique Grain Color map are very much depends on the grain definition (Tolerance Angle and Minimum Grain Size). As following example of Alpha-Steel, we can see big changes of grain size depending on the definition. Users need to think how they define the grain thinking about their objects of Analysis.
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Partitions Properties
Minimum angle to separate pixels into two grains Minimum number of pixels to consists of grains Specify that the edged grains are included or not in the analysis.
If we change some parameters in Partition Properties, all the maps, charts and plots under this partition are affected.
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Practice
Lets check the changes of grains by changing the definition of grain.
See the difference of grains by changing the parameter of Tolerance Angle and Minimum Grain Size in Partition Property .
Data :
Alpha_Steel
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Partitions Properties
Partition Properties
If we change some parameters in Partition Properties, all the maps, charts and plots under this partition are affected.
CI, IQ, Video Signal (SEM singnal)can be used to filter the scan data. Mathematical operant can be used to combine the filter condition. OIM School
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Partitions Properties
Clear difference of IQ between Cu line area and isolator area Cab be used to separate the scam data.
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OIM School
Partitions Properties
The condition specified in Partition/Formula will affect all data under this partition.
IQ > 50 is set in Partition/Formula. This means pixels which has IQ value more than 50 will be used for analysis.
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Partitions Properties
The data with pixels IQ < 50 are excluded from the analysis.
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Practice
Lets check how parameters in Formula in Partition Property will affects to the analysis of scan data.
Data :
Cu IC Line
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Cross section of Al ample under bending test was observed. Grain Average Misorientaion maps were made for each bended condition. We can see that the Grain Average Misorientation Value is increasing according to bending angle.
7.0mm
0.0mm
3.0mm
5.0mm
7.0mm
8.0mm
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Practice
Draw following 4 maps using Part-Rx Steel data and think the meaning of these maps.
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In case of multi phase data, All partition and partitions for each Phase will be made automatically.
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OIM School
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OIM School