Code No: RR411812 Set No.

1
IV B.Tech I Semester Supplementary Examinations, February 2007
X-RAY METALLOGRAPHY
(Metallurgy & Material Technology)
Time: 3 hours Max Marks: 80
Answer any FIVE Questions
All Questions carry equal marks
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1. (a) What is the frequency (per second) and energy per quantum (in joules) of
x-ray beams of wavelength 0.71A0 (Mo Kα ) and 1.54A0 (Cu Kα )? [7]
(b) Calculate the velocity and kinetic energy with which the electrons strike the
target of an X-ray tube operating at a voltage ‘V’. Determine the short-
wavelength limit of the continuous spectrum emitted and the maximum energy
per quantum of radiation? [9]

2. Write short notes on the following:

(a) Thomson equation [5]

(b) Polarisation factor [6]
(c) Compton effect. [5]

3. (a) Explain in detail the scattering of X-rays by an atom. [7]

(b) What is structure factor? Derive an expression for the structure factor. Cal-
culate the structure factor for NaCl. [9]

4. (a) Describe Debye-Scherrer method of X-ray diffraction.

(b) What does each intense point in Debye-Scherrer diffraction pattern represent?
Explain. [8+8]

5. Giving the principle, Describing the design and with a neat sketch explain the
working of focusing Cameras. [16]

6. (a) What is the principle involved in Diffractometre with monochromatic crystal.

(b) With a neat sketch explain the working of above Diffractometre.
[8+8]

7. With an example discuss the structure determination in detail. [16]

8. Compare and Contrast Coherent and Incoherent radiation. [16]

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Code No: RR411812 Set No. 2
IV B.Tech I Semester Supplementary Examinations, February 2007
X-RAY METALLOGRAPHY
(Metallurgy & Material Technology)
Time: 3 hours Max Marks: 80
Answer any FIVE Questions
All Questions carry equal marks
⋆⋆⋆⋆⋆

1. (a) Distinguish between continuous spectrum and characteristic spectrum with

neat sketches and examples.
(b) Explain methods for detecting of X-rays. [8+8]

2. (a) With sketches, explain the atomic scattering factor.

(b) With a neat sketch, explain the effects produced by the passage of x-rays
through matter. [8+8]

3. (a) Explain in detail the scattering of X-rays by an atom. [7]

(b) What is structure factor? Derive an expression for the structure factor. Cal-
culate the structure factor for NaCl. [9]

4. (a) How does Debye-Scherrer diffraction pattern look? [4]

(b) Where is Debye-Scherrer method useful? [6]
(c) Explain how a powder camera is superior to a Diffractometer with examples.
[6]

5. Given a square piece of X-ray film 10 Cm X 10 Cm radiation of λ =0.152 nm and

powdered NaCl with a lattice parameter 0.563 nm, devise a diffraction experiment
in such a fashion that the rays from (111) planes produce a circle of diameter 0.1m.
[16]

6. What is the principle involved in Diffractometre method (The texture of Sheet).

With neat sketch explain the working of Diffractometre method.
[16]

7. What is the basic principle involved in crystal structure determination? Explain

various steps involved in determination of unknown structures.
[16]

8. Explain in detail the steps involved in Determination of Phase Diagram by X-ray

diffraction methods. Clearly sketch and explain. [16]

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Code No: RR411812 Set No. 3
IV B.Tech I Semester Supplementary Examinations, February 2007
X-RAY METALLOGRAPHY
(Metallurgy & Material Technology)
Time: 3 hours Max Marks: 80
Answer any FIVE Questions
All Questions carry equal marks
⋆⋆⋆⋆⋆

1. (a) What is the frequency (per second) and energy per quantum (in joules) of
x-ray beams of wavelength 0.71A0 (Mo Kα ) and 1.54A0 (Cu Kα )? [7]
(b) Calculate the velocity and kinetic energy with which the electrons strike the
target of an X-ray tube operating at a voltage ‘V’. Determine the short-
wavelength limit of the continuous spectrum emitted and the maximum energy
per quantum of radiation? [9]

2. Write short notes on the following:

(a) Thomson equation [5]

(b) Polarisation factor [6]
(c) Compton effect. [5]

3. Explain the following:

(a) Measurement of X-ray intensity [6]

(b) Stereographic projection [5]
(c) Resolving power of a Camera. [5]

4. Define a powder photograph? How are powder photographs classified? Explain in

detail. [16]

5. (a) What are back reflection Focussing Cameras? What is the principle involved
in it? Draw a neat sketch.
(b) Explain the reasons for Background radiation in Powder Camera method.
[8+8]

6. What is the principle involved in transmission Laue method? With a neat sketch
explain the transmission Laue method? [16]

7. With an example discuss the structure determination in detail. [16]

8. Compare and Contrast Coherent and Incoherent radiation. [16]

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Code No: RR411812 Set No. 4
IV B.Tech I Semester Supplementary Examinations, February 2007
X-RAY METALLOGRAPHY
(Metallurgy & Material Technology)
Time: 3 hours Max Marks: 80
Answer any FIVE Questions
All Questions carry equal marks
⋆⋆⋆⋆⋆

1. With a neat sketch, describing the parts of X-ray tube, design a method for X-ray
production. [16]
2. Derive structure factor (F) for the following cases:
(a) Unit cell containing only one atom at the origin [6]
(b) Base centered cell [5]
(c) Body centered cell. [5]
3. (a) With a neat sketch, explain transmission Laue method.
(b) With a neat sketch, explain back-reflection Laue method. [8+8]
4. Write short notes on the following:
(a) High temperature Debye-Scherrer Camera.
(b) Low Temperature Debye-Scherrer Camera. [8+8]
5. (a) What are back reflection Focussing Cameras? What is the principle involved
in it? Draw a neat sketch.
(b) Explain the reasons for Background radiation in Powder Camera method.
[8+8]
6. A back reflection Laue photograph is made of an Aluminum crystal with a crys-
tal to film distance of 3 Cm. When viewed from the X-ray source, the Laue spots
have the following x, y coordinates, measured (in Inches) from the center to the film.

X Y
+0.13 -1.61
+0.28 -1.21
+0.51 -0.69
+074 -0.31
-0.76 -1.41
-0.79 -0.95
-0.92 -0.26

Plot these spots on a sheet of graph paper. By means of a Greninger chart, de-
termine the orientation of the crystal, plot all poles of the form {100}, {110} and
{111} , and give the coordinates of the {100} poles in terms of latitude and longi-
tude measured from the center of the projection. [16]

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Code No: RR411812 Set No. 4
7. What is the basic principle involved in crystal structure determination? Explain
various steps involved in determination of unknown structures.
[16]

8. Write short notes on the following:

(a) Measurement of line position

(b) Subsurface measurements. [8+8]

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