Warranty: Contact your Micron sales representative for further information regarding the product, including product warranties.
Products and specifications discussed herein are subject to change by Micron without notice.
Micron Technology, Inc. reserves the right to change products or specifications without notice. 2007 Micron Technology, Inc. All rights reserved.
AC xxx M AE - 1
ES Production Status
Blank = Production ES = Engineering sample MS = Mechanical sample
Drive Interface
B = SATA 3.0 Gb/s
BOM Revision
1 = 1st generation
Drive Density
Revision Control
1 = 1st generation
Product Family
AE = x200
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General Description
Microns solid state drive (SSD) uses a single-chip controller with a SATA interface on the system side and n-channels of Micron NAND Flash internally. Packaged in an HDD replacement enclosure, the SSD integrates easily in existing storage infrastructures. The SSD is designed to use the SATA interface efficiently during both READs and WRITEs while delivering bandwidth-focused performance. SSD technology enables enhanced boot times, faster application load times, reduced power consumption, and extended reliability. Figure 2: Functional Block Diagram
NAND SATA
SSD controller
NAND NAND
NAND NAND
DRAM buffer
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Architecture
The 200-series SSD is a NAND Flash storage device. A SATA 3 Gb/s interface connects to the SSD externally and communicates with the controller. The controller manages data transfers to and from the NAND Flash array. Table 1: C200 Configurations
Unformatted Disk Density 30GB 60GB 120GB NAND Flash Process NAND Flash Density 50nm 50nm 50nm 16Gb 16Gb 16Gb Package Count 16 16 16 Die per TSOP Package 1 2 4
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1. The DAS signal may be optionally connected to GND if an LED is not being used.
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P1
S1
Power segment
Signal segment
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Device ID
Table 6: IDENTIFY Device ID
F = The content of the word is fixed and does not change V = The content of the word is variable and may change depending on the state of the device or the commands executed by the device X = The content of the word may be fixed or variable R = The content of the word is reserved and shall be zero Word Bit(s) Setting Default Value Description 0 15 148 7 63 2 1 0 1 2 3 45 6 78 9 150 150 150 310 150 310 150 F X F X V X F X V X X X V X F X F F F F F R F R F F F F X 0b X 0b X 0/1b X 0b X X X X X X X Varies X Varies Varies 80h 10h 0h 00b 1b 0b 1b 1b 1b 1b X 0 = ATA device Retired 0 = Non-removable media device Dont Care 1 = IDENTIFY DEVICE data incomplete Retired Reserved Number of logical cylinders (obsolete) Specific configuration (obsolete) Number of logical heads (obsolete) Number of logical sectors per logical track (obsolete) Reserved Reserved Retired Serial number (20 ASCII characters) Dont Care Firmware revision (8 ASCII characters) Model number (40 ASCII characters) 80h 00h = Reserved 01h-FFh = Number of sectors transfered per interrupt on R/W MULTIPLE cmds Reserved Reserved for IDENTIFY PACKET DEVICE cmd 1 = Standby timer values as specified in ATA/ATAPI - 7 support 0 = Standby timer values shall be managed by the device Reserved for IDENTIFY PACKET DEVICE cmd 1 = IORDY support 0 = IORDY may be supported 1 = IORDY may be disabled 1 = LBA support 1 = DMA support Retired
1019 1590 2022 470 2326 630 2746 3190 47 158 70 48 49 150 1514 13 12 11 10 9 8 70
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5758 310
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6974 950
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10
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104 3670 126 127 128 150 159 8 76 5 4 3 2 1 0 129 2015 254 0 255 158 70
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Commands
Table 7: Supported ATA Command Set
See ATA-7 standard for command details Command Name CHECK POWER MODE DEVICE CONFIGURATION RESTORE DEVICE CONFIGURATION FREEZE LOCK DEVICE CONFIGURATION IDENTIFY DEVICE CONFIGURATION SET DOWNLOAD MICROCODE EXECUTE DEVICE DIAGNOSTIC FLUSH CACHE FLUSH CACHE EXT IDENTIFY DEVICE IDLE IDLE IMMEDIATE INITIALIZE DEVICE PARAMETERS NOP READ BUFFER READ DMA (with retry) READ DMA (without retry) READ DMA EXT READ FPDMA QUEUED READ LOG EXT READ MULTIPLE READ MULTIPLE EXT READ NATIVE MAX ADDRESS READ NATIVE MAX ADDRESS EXT READ SECTOR(S) EXT READ SECTOR(S) (with retry) READ SECTOR(S) (without retry) READ VERIFY SECTOR EXT READ VERIFY SECTOR(S) (with retry) SECURITY DISABLE PASSWORD SECURITY ERASE PREPARE SECURITY ERASE UNIT SECURITY FREEZE LOCK SECURITY SET PASSWORD SECURITY UNLOCK SEEK Command Code (hex) 98h or E5h B1h/C0h B1h/C1h B1h/C2h B1h/C3h 92h 90h E7h EAh ECh E3h or 97h E1h or 95h 91h 00h E4h C8h C9h 25h 60h 2Fh C4h 29h F8h 27h 24h 20h 21h 42h 40h F6h F3h F4h F5h F1h F2h 7xh
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Reliability
Microns SSDs incorporate advanced technology for defect and error management. They use various combinations of hardware-based error correction algorithms and firmware-based static and dynamic wear-leveling algorithms. Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is defined as data that is reported as successfully programmed to the SSD but when it is read out of the SSD, the data differs from what was programmed. Table 8: Uncorrectable Bit Error Rate
Uncorrectable Bit Error Rate <1 sector per 1015 bits read Operation READ
Endurance
Endurance for the SSD can be predicted based on the usage conditons applied to the device, the internal NAND component cycles, the write amplification factor, and the wear-leveling efficency of the drive. The table below shows the drive lifetime for each SSD density based on predefined usage conditions. Table 10: Drive Lifetime
Density 30GB 60GB 120GB Notes: Drive Lifetime (Total Bytes Written) 21TB 42TB 85TB
1. Total bytes written calculated with the drive 90% full. 2. Access patterns consist of the following: 5% are 4k; 5% are 8k; 10% are 16k; 10% are 32k; 35% are 64K; and 35% are 128k. 3. GB/day can be calculated by dividing the total bytes written value by (365 number of years).
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Electrical Characteristics
Table 11: SATA Typical Power Consumption1
Density 30GB 60GB 120GB Idle3 0.116 0.116 0.116 Notes: Sleep3 0.116 0.116 0.116 Standby3 0.116 0.116 0.116 Erase 2.5 2.5 2.5 Read2 1.6 1.6 1.6 Write2 2.5 2.5 2.5 Unit W W W
1. Data taken at 25C. 2. IOMETER MAX transfer rate with 128KB transfer size. 3. DIPM enabled.
Stresses greater than those listed may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. Table 13: Shock and Vibration
Parameter/Condition Operating shock Operating vibration Specification 1500 G/1.0ms 2500Hz at 3.1G
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Compliance
Micron SSDs comply with the following: RoHS green CE (Europe): EN55022, 2006 Class B and EN55024, 1998 + A1: 2001 + A2:2003 FCC: CFR Title 47, Part 15, ICES-003, all Class B UL (US): approval to UL-60950-1, 2nd Edition, 2007-03-27, IEC 60950-1:2005, 2nd Edition BSMI (Taiwan): Appproval to CNS 13438 TUV/GS (Germany): Approval to IEC60950/EN6095 VCCI W.E.E.E.
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Package Dimensions
Figure 4: 2.5-Inch Package (Preliminary)
69.85mm 0.25 2.750in 0.010 61.72mm 2.430in bottom side
Detail B
0.30mm 0.012in
14.00mm 0.551in
90.60mm 3.567in
3.00mm 0.118in
Note:
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References
Serial ATA: High-speed serialized AT attachment, Serial ATA working group, available at www.sata-io.org SATA 3.0 GOLD ATA-8 ACS2
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900 www.micron.com/productsupport Customer Comment Line: 800-932-4992 Micron and the Micron logo are trademarks of Micron Technology, Inc. All other trademarks are the property of their respective owners. This data sheet contains minimum and maximum limits specified over the power supply and temperature range set forth herein. Although considered final, these specifications are subject to change, as further product development and data characterization sometimes occur.
PDF: 09005aef836873c9 c200_2_5.pdf - Rev. C 9/09 EN
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Micron Technology, Inc. reserves the right to change products or specifications without notice. 2007 Micron Technology, Inc. All rights reserved.