MIL-STD-105 Sampling Procedures and Tables for

Inspection by Attributes
Subject/Scope:
This publication establishes lot or batch sampling plans and procedures for inspection
by attributes. This publication shall not be "interpreted to supersede or conflict with any
contractual requirements. The words "accept", "acceptance", "acceptable", etc, refer
only to the contractor's use of the sampling plans contained in this standard and do not
imply an agreement by the Government to accept any product. Determination of
acceptability by the Government shall be as described in contractual documents. The
sampling plans described in this standard are applicable to AQL's of .01 percent or
higher and are therefore not suitable for applications where quality levels in the
defective parts per million range can be realized.
Keywords:
Inspection, plan, defect, product, defective, curve, percent, multiple, quality, acceptance, average, std,
procedure, mil, chart, sampling, process, size, standard, level, reject, critical, requirement, publication,
major, minor, acceptability, accepted, drawn, protection, special, specified, production, requirement,
defense, quality, military
Published:
5/10/1989

Text in blue boxes such as this one is instructional and is intended to assist you in understanding the document.
Text in red boxes such as this explains changes made to the document by The Wooden Crates Organization.
Red text has been added to the document or modifies the document since its final version was officially published.
Soft Conversion of Imperial to Metric
Conversions, when made, consider materials that are available in metric or imperial sizes rather than converting
sizes exactly. For example: Panelboard (plywood) in the US is typically 4 feet X 8 feet (1220 x 2440 mm) while
panelboard in metric countries is typically 1200 X 2400 mm. Since the standard was developed based on readily
available materials these variations in material sizes could not have been practically considered.
The content of the document below has not been modified.
K
NOT MEASUREMENT
SENSITIVE
MIL-STD-105E
10 MAY 1989
SUPERSEDING
MIL-STD-105D
29 APRIL 1963
MILITARY STANDARD
SAMPLING PROCEDURES AND TABLES
FOR INSPECTION BY ATTRIBUTES
AMSC N/A AREA QCIC
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unl i mi ted.
MI L- STD- 105E
DEPARTMENT OF DEFENSE
Washi ngt on, DC 20301
SAMPLI NG PROCEDURES AND TABLES FOR I NSPECTI ON BY ATTRI BUTES
1. Thi s mi l i t ar y st andar d i s appr oved f or use by al l Depar t ment s and Agenci es
of t he Depar t ment of Def ense.
2. Benef i ci al comment s ( r ecommendat i ons, addi t i ons, del et i ons) and any
per t i nent dat a whi ch may be of use i n i mpr ovi ng t hi s document shoul d be
addr essed t o:
Commander
U. S. Ar my Ar mament Resear ch, Devel opment and
Engi neer i ng Cent er
ATTN: SMCAR^BAC- S/ Bl dg. 6
Pi cat i nny Ar senal , NJ 07806- 5000
by usi ng t he sel f - addr essed St andar di zat i on Document I mpr ovement Pr oposal
(DD For m1426) appear i ng at t he end of t hi s document or l et t er .
l i
MTL- STD- 105E
FOREWORD
Thi s publ i cat i on pr ovi des sampl i ng pr ocedur es and r ef er ence t abl es f or use i n
pl anni ng and conduct i ng i nspect i on by at t r i but es. The sampl i ng concept i s based
on t he pr obabi l i st i c r ecur r ence of event s when a ser i es of l ot s or bat ches ar e
pr oduced i n a st abl e envi r onment .
Thi s publ i cat i on shoul d be used t o gui de t he user i n t he devel opment of an
i nspect i on st r at egy t hat pr ovi des a cost ef f ect i ve appr oach t o at t ai ni ng
conf i dence i n pr oduct conpl i ance wi t h cont r act ual t echni cal r equi r ement s. The
user i s war ned of t he assumed r i sks r el at i ve t o t he chosen sampl e si ze and
AQL.
Mi l i t ar y speci f i cat i ons shoul d not cont ai n r equi r ement s f or use of speci f i c
sampl i ng pl ans, nor shoul d t hey pr ovi de AQL' s or LTPD' s as a r equi r ement .
Sampl i ng pl ans f or cont i nuous, r at her t han l ot i nspect i on, ar e cont ai ned i n
Mf L- STD- 1235, "Si ngl e and Mul t i - Level Cont i nuous Sampl i ng Pr ocedur es and Tabl es
f or I nspect i on by At t r i but es".
i i i
MIL-STD-105E
MIL-STD-105E
COtTTEJTTS - Continued.
Page
Paragraph
4. 5 Sanpl i ng 5
4. 5. 1 Repr esent at i ve Sanpl i ng 5
4. 5. 2 Ti me of Sanpl i ng 5
4. 5. 3 Doubl e or Mul t i pl e Sanpl i ng 5
4. 6 I nspect i on Pr ocedur es : . 6
4. 7 Swi t chi ng Pr ocedur es 6
4. 7. 1 Nor mal t o Ti ght ened 6
4. 7. 2 Ti ght ened t o Nor mal 6
4. 7. 3 Nor mal t o Reduced 6
4. 7. 4 Reduced t o Nor mal 6
4. 8 Di scont i nuat i on of I nspect i on 7
4. 9 Sanpl i ng Pl ans 7
4. 9. 1 I nspect i on Level 7
4. 9. 2 Code Let t er s 7
4. 9. 3 Obt ai ni ng Sampl i ng Pl an 7
4. 9. 4 Types of Sampl i ng Pl ans 8
4. 10 Det er mi nat i on of Accept abi l i t y 8
4. 10. 1 Per cent Def ect i ve I nspect i on 8
4. 10. 1. 1 Si ngl e Sampl i ng Pl an 8
4. 10. 1. 2 Doubl e Sampl i ng Pl an 8
4. 10. 1. 3 Mul t i pl e Sampl i ng Pl an 8
4. 10. 1. 4 Speci al Pr ocedur e f or Reduced I nspect i on 8
4. 10. 2 Def ect s Per Hundr ed Uni t s I nspect i on 9
4. 11 Li mi t i ng Owal i t y Pr ot ect i on 9
4. 12 Cur ves 9
4. 12. 1 Oper at i ng Char act er i st i c Cur ves 9
4. 12. 2 Aver age Sampl e Si ze Cur ves. . 9
5. TABLES 11
Tabl e
I . Sampl e Si 2e Code Let t er s 13
I I - A. Si ngl e Sanpl i ng Pl ans f or Nor mal
i nspect i on ( Mast er t abl e) 14
I I - B. Si ngl e Sanpl i ng Pl ans f or Ti ght ened
i nspect i on ( Mast er t abl e) 15
I I - C. Si ngl e Sanpl i ng Pl ans f or Reduced
i nspect i on ( Mast er t abl e) 16
I I I - A. Doubl e Sampl i ng Pl ans f or Nor mal
i nspect i on ( Mast er t abl e) 17
I I I - B. Doubl e Sanpl i ng Pl ans f or Ti ght ened
I nspect i on ( Mast er t abl e) 18
I I I - C. Doubl e Sampl i ng Pl ans f or Reduced
I nspect i on ( Mast er t abl e) 19
v
MI L- STD- 105E
, CONTENTS - Cont i nued.
Page
Tabl e
I V- A. Mul t i pl e Sampl i ng Pl ans f or Nor mal
I nspect i on ( Mast er t abl e) 20
r v- B. Mul t i pl e Sampl i ng Pl ans f or Ti ght ened
I nspect i on ( Mast er t abl e) 22
I V- C. Mul t i pl e Sai rpl i ng Pl ans f or Reduced
I nspect i on ( Mast er t abl e) 24
V- A. Aver age Out goi ng Qual i t y Li mi t Fact or s f or
Nor mal I nspect i on ( Si ngl e Sampl i ng) 26
V- B. Aver age Out goi ng Qual i t y Li mi t Fact or s f or
Ti ght ened I nspect i on ( Si ngl e Sampl i ng) 27
VT- A. l i mi t i ng Qual i t y ( i n Per cent Def ect i ve) f or
whi ch a Pa = 10% ( f or Nor mal I nspect i on,
Si ngl e Sampl i ng) 28
VI - B. Li mi t i ng Qual i t y (i n Def ect s per Hundr ed
Uni t s) f or whi ch t he Pa = 10% ( f or Nor mal
I nspect i on, Si ngl e Sampl i ng) 29
VTI - A. Li mi t i ng Qual i t y ( i n Per cent Def ect i ve) f or /
whi ch t he Pa = 5% ( f or Nor mal I nspect i on,
Si ngl e Sampl i ng) 30
VI I - B. Li mi t i ng Qual i t y ( i n Def ect s per Hundr ed'
Uni t s) f or whi ch t he Pa = 5% ( f or Nor mal /
I nspect i on, Si ngl e Sampl i ng) .' 31 /
VTI I . Li mi t Number s f or Reduced I nspect i on 32
I X. Aver age Sampl e Si ze Cur ves f or Doubl e and
Mul t i pl e Sampl i ng. 33
Sampl i ng Pl ans and Oper at i ng Char act er i st i c
Cur ves ( and Dat a) f or :
X- A. Sampl e Si ze Code Let t er A ' 34
X- B. Sampl e Si ze Code Let t er B 36
X- C. Sampl e Si ze Code Let t er C. . . : 38
X- D. Sampl e Si ze Code Let t er D 40
X- E. Sampl e Si ze Code Let t er E 42
X- F. Sampl e Si ze Code Let t er F 44
X- G. Sampl e Si ze Code Let t er G -46
X- H. Sampl e Si ze Code Let t er H 48
X- J . Sampl e Si ze Code Let t er J 50
X- K. Sampl e Si ze Code Let t er K 52
X- L. Sampl e Si ze Code Let t er L 54
X- M. Sampl e Si ze Code Let t er M 56
X- N. Sampl e Si ze Code Let t er N 58
X- P. Sampl e Si ze Code Let t er P 60
X- Q. Sampl e Si ze Code Let t er Q 62
X- R. Sampl e Si ze Code Let t er R 64
vi
MCL-STD-105E
)
CONTENTS - Continued.
Page
X-S. Sanple Size Code Letter S 66
Paragraph
6. NOTES 67
6.1 I ntended Use 67
6.2 Subject Term (keyword) Li sti ng 67
6.3 Changes from Previous I ssue.. 67
OONOJUDING hftTERIAL 68
vi i
MI L-STD-105E
SAMPLING PROCEDURES AND TABLES
FOR INSPECTION BY ATTRIBUTES
1. SCOPE
1. 1 Pur pose. Thi s publ i cat i on est abl i shes l ot or bat ch sampl i ng pl ans and
pr ocedur es f or i nspect i on by at t r i but es. Thi s publ i cat i on shal l not be "i nter-
pr et ed t o super cede or conf l i ct wi t h any cont r act ual r equi r ement s. The wor ds
"accept ", "accept ance", "accept abl e", et c, r ef er onl y t o t he cont r act or ' s use of
t he sampl i ng pl ans cont ai ned i n t hi s st andar d and do not i mpl y an agr eement by
t he Gover nment t o accept any pr oduct . Det er mi nat i on of accept abi l i t y by t he
Gover r - ent shal l be as descr i bed i n cont r act ual document s. The sampl i ng pl ans
descr i bed i n t hi s st andar d ar e appl i cabl e t o AQL' s of . 01 per cent or hi gher and
ar e t her ef or e not sui t abl e f or appl i cat i ons wher e qual i t y l evel s i n t he def ect i ve
par t s per mi l l i on r ange can be r eal i zed.
1. 2 Appl i cat i on. Sampl i ng pl ans desi gnat ed i n t hi s publ i cat i on ar e appl i cabl e,
but not l i mi t ed, t o i nspect i on of t he f ol l owi ng:
a. End i tems.
b. Components and raw materi al s.
c. Operations or servi ces.
d. Materi al s in process.
e. Supplies i n storage.
f. Maintenance operati ons.
g. Data or records.
h. Admi ni st r at i ve pr ocedur es.
These pl ans ar e i nt ended pr i mar i l y t o be used f or a cont i nui ng ser i es of l ot s
or bat ches. The pl ans may al so be used f or t he i nspect i on of i sol at ed l ot s or
bat ches, but , i n t hi s l at t er case, t he user i s caut i oned t o consul t t he oper at i ng
char act er i st i c cur ves t o f i nd a pl an whi ch wi l l yi el d t he desi r ed pr ot ect i on
( See 4. 11) .
2. REFERENCED DOCUMENTS
2. 1 Not appl i cabl e.
3. DEFI NI TI ONS
*
1
MI L- STD- 105E
3. 1 Accept abl e Qual i t y Level (AQL) . When a cont i nuous ser i es of l ot s i s
consi der ed, t he AQL i s t he qual i t y l evel whi ch, f or t he pur poses of sampl i ng
i nspect i on, i s t he l i mi t of a sat i sf act ory pr ocess aver age (See 3. 19) .
NOTE: A sampl i ng pl an and an AQL ar e chosen i n accor dance wi t h t he r i sk assumed.
Use of a val ue of AQL f or a cert ai n def ect or gr oup of def ect s i ndi cat es t hat t he
sampl i ng pl an wi l l accept t he great maj or i t y of t he l ot s or bat ches pr ovi ded t he
pr ocess aver age l evel of per cent def ect i ve (or def ect s per hundr ed uni t s) i n t hese
l ot s or bat ches be no gr eat er t han t he desi gnat ed val ue of AQL. Thus, t he AQL i s
a desi gnat ed val ue of per cent def ect i ve (or def ect s per hundr ed uni t s) f or whi ch
l ot s wi l l be accept ed most of t he t i me by t he sampl i ng pr ocedur e bei ng used. The
sampl i ng pl ans pr ovi ded her ei n ar e so ar r anged t hat t he pr obabi l i t y of accept ance
at t he desi gnat ed AQL val ue depends upon t he sampl e si ze, bei ng gener al l y hi ^i er
f or l ar ge sampl es t han f or smal l ones, f or a gi ven AQL. The AQL al one does not
i dent i f y t he chances of accept i ng or r ej ect i ng i ndi vi dual l ot s or bat ches but mor e
di r ect l y r el at es t o what mi ght be expect ed f r oma ser i es of l ot s or bat ches,
pr ovi ded t he st eps i ndi cat ed i n t hi s publ i cat i on ar e t aken. I t i s necessar y t o
r ef er t o t he oper at i ng char act er i st i c cur ve of t he pl an t o det er mi ne t he rel at i ve
r i sks.
3. 2 Aver age Out goi ng Qual i t y (AOQ) . For a par t i cul ar pr ocess aver age, t he AOQ i s
t he aver age qual i t y of out goi ng pr oduct i ncl udi ng al l accept ed l ot s or bat ches,
pl us al l r ej ect ed l ot s or bat ches af t er t he rej ect ed" l ot s or bat ches have been
ef f ect i vel y 100 per cent i nspect ed and al l def ect i ves r epl aced by non- def ect i ves.
3. 3 Aver age Out goi ng Qual i t y Li mi t ( AOQL) . The AOQL i s t he maxi mumAOQ f or a
gi ven accept ance sampl i ng pl an. Fact or s f or comput i ng AOQL val ues ar e gi ven i n
Tabl e V- A f or each of t he si ngl e sampl i ng pl ans f or nor mal i nspect i on and i n
Tabl e V- B f or each of t he si ngl e sampl i ng pl ans f or t i ght ened i nspect i on.
3. 4 Cl assi f i cat i on of Def ect s. A cl assi f i cat i on of def ect s i s t he enumer at i on of
possi bl e def ect s of t he uni t of pr oduct cl assi f i ed accor di ng t o t hei r ser i ousness.
3. 5 Cr i t i cal Def ect . A cr i t i cal def ect i s a def ect t hat j udgement and exper i ence
i ndi cat e woul d r esul t i n hazar dous or unsaf e condi t i ons f or i ndi vi dual s usi ng,
nai nt ai ni ng, or dependi ng upon t he pr oduct , or a def ect t hat j udgement and
exper i ence i ndi cat e i s l i kel y t o pr event per f or mance of t he t act i cal f unct i on of a
maj or end i t emsuch as a shi p, ai r cr af t , t ank, mi ssi l e, or space vehi cl e.
3. 6 Cr i t i cal Def ect i ve. A cr i t i cal def ect i ve i s a uni t of pr oduct whi ch
cont ai ns one or mor e cr i t i cal def ect s and may al so cont ai n maj or and/ or mi nor
def ect s.
3. 7 Def ect . A def ect i s any nonconf or mance of t he uni t of pr oduct wi t h
speci f i ed r equi r ement s.
2
MI L- STD- 105E
3. 8 Def ect i ve. A def ect i ve i s a uni t of pr oduct whi ch cont ai ns one or mor e
def ect s.
3. 9 Def ect s per Hundr ed Uni t s. The number of def ect s per hundr ed uni t s of any
gi ven quant i t y of uni t s of pr oduct i s one hundr ed t unes t he number of def ect s
cont ai ned t her ei n (one or mor e def ect s bei ng possi bl e i n any uni t of pr oduct )
di vi ded by t he t ot al number of uni t s of pr oduct , i . e. :
Def ect s per = Number of def ect s x 100
hundr ed uni t s Number of uni t s i nspect ed
*
3. 10 I nspect i on. I nspect i on i s t he pr ocess of measur i ng, exami ni ng, t est i ng,
or ot her wi se compar i ng t he uni t of pr oduct wi t h t he r equi r ement s.
3. 11 i npect i on by At t r i but es. I nspect i on by at t r i but es i s i nspect i on wher eby
ei t her t he uni t of pr oduct i s cl assi f i ed si npl y as def ect i ve or non- def ect i ve, or
t he number of def ect s i n t he uni t of pr oduct i s count ed, wi t h r espect t o a gi ven
r equi r ement or set or r equi r ement s.
3. 12 Lot or Bat ch. The t erml ot or bat ch shal l mean "i nspect i on l ot " or
"i nspect i on bat ch", i . e. , a col l ect i on of uni t s of pr oduct f r omwhi ch a sampl e
i s t o be dr awn and i nspect ed and may di f f er f r oma col l ect i on of uni t s desi gnat ed
as a l ot or bat ch f or ot her pur poses ( e. g. , pr oduct i on, shi pment , et c. ) .
3. 13 Lot or Bat ch Si ze. The l ot or bat ch si ze i s t he number of uni t s of pr oduct
i n a l ot or bat ch.
3. 14 Maj or Def ect . A maj or def ect i s a def ect , ot her t han cr i t i cal , t hat i s
l i kel y t o r esul t i n f ai l ur e, or t o r educe mat er i al l y t he usabi l i t y of t he uni t
of pr oduct f or i t s i nt ended pur pose.
3. 15 Maj or Def ect i ve. A maj or def ect i ve i s a uni t of pr oduct whi ch cont ai ns one
or mor e ma^or def ect s, and may al so cont ai n mi nor def ect s but cont ai ns no cr i t i cal
def ect .
3. 16 Mi nor Def ect . A mi nor def ect i s a def ect t hat i s not l i kel y t o r educe
mat er i al l y t he usabi l i t y of t he uni t of pr oduct f or i t s i nt ended pur pose, or i s a
depar t ur e f r omest abl i shed st andar ds havi ng l i t t l e bear i ng on t he ef f ect i ve use or
oper at i on of t he uni t .
3.1"? Mi nor Def ect i ve. A mi nor def ect i ve i s a uni t of pr oduct whi ch cont ai ns one
or mor e mi nor def ect s but cont ai ns no cr i t i cal or maj or def ect .
3
MI L- STD- 105E
3. 18 Per cent Def ect i ve. ' The per cent def ect i ve of any gi ven quant i t y of uni t s
of pr oduct i s one hundr ed t i mes t he number of def ect i ve uni t s of pr oduct cont ai ned
t her ei n di vi ded by t he t ot al number of uni t s of pr oduct , i . e. :
Per cent Def ect i ve = Number of def ect i ves x 100
Number of uni t s i nspect ed
3. 19 Pr ocess Aver age. The pr ocess aver age i s t he aver age per cent def ect i ve or
aver age number of def ect s per hundr ed uni t s ( whi chever i s appl i cabl e) of pr oduct
submi t t ed by t he suppl i er f or or i gi nal i nspect i on. Or i gi nal i nspect i on i s t he
f i rst i nspect i on of a par t i cul ar quant i t y of pr oduct as di st i ngui shed f r omt he
i nspect i on of pr oduct whi ch has been resuf cmi tted af t er pr i or r ej ect i on.
3. 20 Sampl e. A sampl e consi st s of one or mor e uni t s of pr oduct dr awn f roma l ot
or bat ch, t he uni t s of t he sampl e bei ng sel ect ed at r andomwi t hout r egar d t o t hei r ,
qual i t y. The number of uni t s of pr oduct i n t he sampl e i s t he sampl e si ze.
3. 21 Sampl e Si ze Code Let t er . The sampl e si ze code l et t er i s a devi ce used
al ong wi t h t he AQL f or l ocat i ng a sampl i ng pl an on a t abl e of sampl i ng pl ans.
3. 22 Sampl i ng Pl an. A sampl i ng pl an i ndi cat es t he number of uni t s of pr oduct
f romeach l ot or bat ch whi ch ar e t o be i nspect ed ( sampl e si ze or ser i es of
sampl e si zes) and t he cr i t er i a f or o^t er mi ni ng t he accept abi l i t y of t he l ot or
bat ch ( accept ance and r ej ect i on number s) .
3. 23 Uni t of Pr oduct . The uni t of pr oduct i s t he t hi ng i nspect ed i n or der t o
det er mi ne i t s cl assi f i cat i on as def ect i ve or non- def ect i ve or t o count t he number
of def ect s. I t may be a si ngl e ar t i cl e, a pai r , a set , a l engt h, an ar ea, an
oper at i on, a vol ume, a component of an end pr oduct , or t he end pr oduct i t sel f .
The uni t of pr oduct may or may not be t he same as t he uni t of pur chase, suppl y,
pr oduct i on, or shi pment .
4. t ENERAL REQUI REMENTS
4. 1 Wr i t t en Pr ocedur es. Wr i t t en pr ocedur es ar e or di nar i l y devel oped and made
avai l abl e f or t he Gover nment r epr esent at i ve' s r evi ew, upon r equest . When t he
wr i t t en pr ocedur es i ndi cat e use of t hi s st andar d, t hey shal l compl y wi t h t he
r equi r ement s of t hi s st andar d and r ef er ence appr opr i at e par t s as necessar y.
4. 2 Nonconf or mance. The ext ent of nonconf or mance of pr oduct shal l be expr essed
ei t her i n t er ms of per cent def ect i ve or i n t er ms of def ect s per hundr ed uni t s.
4
MI L- STD- 105E
4. 3 For mat i on and I dent i f i cat i on of Lot s or Bat ches. The pr oduct shal l be
assembl ed i nt o i dent i f i abl e l ot s, subl et s, bat ches, or i n such ot her manner as
may be pr escr i bed. ' Each l ot or bat ch shal l , as f ar as i s pr act i cabl e, consi st
of uni t s of pr oduct of a si ngl e t ype, gr ade, cl ass, si ze, and composi t i on,
manuf act ur ed under essent i al l y t he same condi t i ons, and at essent i al l y t he same
t i me. The l ot s or bat ches shal l be i dent i f i ed by t he cont r act or and shal l be kept
i nt act i n adequat e and sui t abl e st or age space.
4. 4 AQL.
4. 4. 1 AQL Use. The AQL, t oget her wi t h t he Sampl e Si ze Code Let t er , i s used f or
i ndexi ng t he sampl i ng pl ans pr ovi ded her ei n.
c
4. 4. 2 Li mi t at i on. The sel ect i on or use of an AQL shal l not i mpl y t hat t he
cont r act or has t he r i ght t o suppl y any def ect i ve- uni t of pr oduct .
4. 4. 3 Choosi ng' AQLs. Di f f er ent AQLs may be chosen f or gr oups of def ect s
consi der ed col l ect i vel y, or f or i ndi vi dual def ect s. An AQL f or a gr oup of def ect s
may be chosen i n addi t i on t o AQLs f or i ndi vi dual def ect s, or subgr oups, wi t hi n
t hat gr oup. AQL val ues of 10. 0 or l ess may be expr essed ei t her i n per cent
def ect i ve or i n def ect s per hundr ed uni t s; t hose over 10. 0 shal l be expr essed i n
def ect s per hundr ed uni t s onl y.
4. 5 Sampl i ng.
4; 5. 1 Repr esent at i ve {St rat i f i ed) Sampl i ng. When appr opr i at e, t he number of
uni t s i n t he sanpl e shal l be sel ect ed i n pr opor t i on t o t he si ze of subl et s or
sub- bat ches, or par t s of t he l ot or bat ch, i dent i f i ed by some r at i onal cr i t er i on.
When r epr esent at i ve sampl i ng i s used, t he uni t s f r omeach subl et , sub- bat ch or
par t of t he l ot or bat ch shal l be sel ect ed at r andan.
4. 5. 2 Ti me of Sampl i ng. A sampl e may be dr awn af t er al l t he uni t s compr i si ng
t he l ot or bat ch have been assembl ed, or sampl e uni t s may be dr awn dur i ng assembl y
of t he l ot or bat ch, i n whi ch case t he si ze of t he l ot or bat ch wi l l be det er mi ned
bef or e any sampl e uni t s are dr awn. I f t he sampl e uni t s ar e dr awn dur i ng assembl y
of t he l ot or bat ch, and i f t he r ej ect i on number i s r eached bef or e t he l ot i s
compl et ed, t hat por t i on of t he l ot al r eady compl et ed shal l be r ej ect ed. The cause
of t he def ect i ve pr oduct shal l be det er mi ned and cor r ect i ve act i on t aken, af t er
whi ch a new l ot or bat ch shal l be begun.
4. 5. 3 Doubl e or Mul t i pl e Sampl i ng. When doubl e or mul t i pl e sampl i ng i s t o be
used, each sampl e shal l be sel ect ed over t he ent i r e l ot or bat ch.
5
MTL- STD- 105E
4. 6 I nspect i on Pr ocedur es. Nor mal i nspect i on wi l l be used at t he st ar t of
i nspect i on. Nor mal , t i ght ened or r educed i nspect i on shal l cont i nue unchanged f or
each cl ass of def ect s or def ect i ves on successi ve l ot s or bat ches except wher e t he
swi t chi ng pr ocedur es gi ven bel ow r equi r e change. The swi t chi ng pr ocedur es shal l
be appl i ed t o each cl ass of def ect s or def ect i ves i ndependent l y.
4. 7 Swi t chi ng Pr ocedur es.
4. 7. 1 Nor mal t o Ti ght ened. When nor mal i nspect i on i s i n ef f ect , t i ght ened
i nspect i on shal l be i nst i t ut ed when 2 out of 2, 3, 4, or 5 consecut i ve l ot s or
bat ches have been r ej ect ed on or i gi nal i nspect i on ( i . e. , i gnor i ng r esubmi t t ed l ot s
or bat ches f or t hi s pr ocedur e) .
4. 7. 2 Ti ght ened t o Nor mal . When t i ght ened i nspect i on i s i n ef f ect , nor mal
i nspect i on shal l be i nst i t ut ed when 5 consecut i ve l ot s or bat ches have been
consi der ed accept abl e on or i gi nal i nspect i on.
4. 7. 3 Nor mal t o Reduced. When nor mal i nspect i on i s i n ef f ect , r educed i nspect i on
shal l be i nst i t ut ed pr ovi ded t hat al l of t he f ol l owi ng condi t i ons ar e sat i sf i ed:
a. The pr ecedi ng 10 l ot s or bat ches ' (or mor e, as i ndi cat ed by t he not e t o
Tabl e VTI I ) have been on nor mal i nspect i on and al l have been accept ed on or i gi nal
i nspect i on; and
b. The t ot al number of def ect i ves (or def ect s) i n t he sampl es f r omt he
pr ecedi ng 10 l ot s or bat ches (or such ot her number as was used f or condi t i on "a"
above) i s equal t o or l ess t han t he appl i cabl e number gi ven i n Tabl e VI I I . I f
doubl e or mul t i pl e sampl i ng i s i n use, al l sampl es i nspect ed shoul d be i ncl uded,
not "f i r st " sampl es onl y; and
c. Pr oduct i on i s at a st eady r at e; and
d. ' Reduced i nspect i on i s consi der ed desi r abl e.
4. 7. 4 Reduced t o Nor mal . When r educed i nspect i on i s i n ef f ect , nor mal i nspect i on
shal l be i nst i t ut ed i f any of t he f ol l owi ng occur on or i gi nal i nspect i on:
a. A l ot or bat ch i s r ej ect ed; or
b. A l ot or bat ch i s consi der ed accept abl e under t he pr ocedur es of
4. 10, 1. 4, or
c. Pr oduct i on becomes i r r egul ar or del ayed; or
d. Ot her condi t i ons war r ant t hat nor mal i nspect i on shal l be i nst i t ut ed.
6
MEL- STD- 105E
4. 8 Di scont i nuat i on of I nspect i on. I f t he curmi ul ati ve number of l ot s not
accept ed i n a sequence of consecut i ve l ot s on or i gi nal t i ght ened i nspect i on
r eaches f i ve, t he accept ance pr ocedur es of t hi s st andar d shal l be di scont i nued.
I nspect i on under t he pr ovi si ons of t hi s st andar d shal l not be r esumed unt i l
cor r ect i ve act i on has been t aken. Ti gt hened i nspect i on shal l t hen be used as i f
4. 7. 1 had been i nvoked.
4. 9 Sampl i ng Pl ans.
4. 9. 1 I nspect i on Level . ' The i nspect i on l evel det er mi nes t he r el at i onshi p bet ween
t he l ot or bat ch si ze and t he sampl e si ze. The i nspect i on l evel t o be used f or
any par t i cul ar r equi r ement wi l l be as pr escr i bed by t he cont r act or ' s wr i t t en
pr ocedur es. Thr ee i nspect i on l evel s: I , I I , and I I I , ar e gi ven i n Tabl e I f or
gener al use (see 4. 1) . Nor mal l y, I nspect i on Level I I i s used. However ,
I nspect i on Level I may be used when l ess di scr i mi nat i on i s needed, or Level I I I
may be used f or gr eat er di scr i mi nat i on. Four addi t i onal speci al l evel s:
S- 1, S- 2, S- 3, and S- 4, ar e gi ven i n t he sane t abl e and may be used wher e
r el at i vel y smal l sampl e si zes ar e necessar y and l ar ge sampl i ng r i sks can or must
be t ol er at ed.
NOTE: I n t he sel ect i on of i nspect i on l evel s S- 1, t o S- 4, car e must be exer ci sed t o
avoi d AQLs i nconsi st ent wi t h t hese i nspect i on l evel s. I n ot her wor ds, t he pur pose
of t he speci al i nspect i on l evel s i s t o keep sampl es smal l when necessar y. For
i nst ance, t he code l et t er s under S- 1 go no f ur t her t han D, equi val ent t o a si ngl e
sampl e of si ze 8, but i t i s of no use t o choose S- 1 i f t he AQL i s 0. 10 percent f or
whi ch t he mi ni mumsampl e i s 125.
4. 9. 2 Code Let t er s. Sanpl e si zes ar e desi gnat ed by- code l et t er s. Tabl e I shal l
be used t o f i nd t he appl i cabl e code l et t er f or t he par t i cul ar l ot or bat ch si ze
and t he pr escr i bed i nspect i on l evel .
4. 9. 3 Obt ai ni ng Sampl i ng Pl an. The AQL and t he code l et t er shal l be used t o
obt ai n t he sampl i ng pl an f romTabl es I I , I I I , or I V. When no sampl i ng pl an i s
avai l abl e f or a gi ven combi nat i on of AQL and code l et t er , t he t abl es di r ect t he
user t o a di f f er ent l et t er . The sampl e si ze t o be used i s gi ven by t he new code
l et t er , not by t he or i gi nal l et t er , i f t hi s pr ocedur e l eads t o di f f er ent sampl e
si zes f or di f f er ent cl asses of def ect s, t he code l et t er cor r espondi ng t o t he
l ar gest sampl e si ze der i ved may be used f or al l cl asses of def ect s. As an
al t er nat i ve t o a si ngl e sampl i ng pl an wi t h an accept ance number of 0, t he pl an
wi t h an accept ance number of 1 wi t h i t s cx^r ^spondi ngl y l ar ger sampl e si ze f or a
desi gnat ed AQL ( where avai l abl e) , may be used.
7
MEL- STD- 105E
4. 9. 4 Types of Sampl i ng Pl ans. Thr ee t ypes of sampl i ng pl ans: Si ngl e, Doubl e,
and Mul t i pl e, ar e gi ven i n Tabl es I I , I I I , and I V, r espect i vel y. When sever al
t ypes of pl ans ar e avai l abl e f or a gi ven AQL and code l et t er , any one may be used.
A deci si on as t o t ype of pl an, ei t her si ngl e, doubl e, or mul t i pl e, when avai l abl e
f or a gi ven AQL and code l et t er , wi l l usual l y be based upon t he compar i son bet ween
t he admi ni st r at i ve di f f i cul t y and t he aver age sampl e si zes of t he avai l abl e pl ans.
The aver age sampl e si ze of mul t i pl e pl ans i s l ess t han f or doubl e ( except i n. t he
case cor r espondi ng t o si ngl e accept ance number 1) and bot h of t hese ar e al ways
l ess t han a si ngl e sampl e si ze (see Tabl e I X) . Usual l y t he admi ni st r at i ve
di f f i cul t y f or si ngl e sampl i ng and t he cost per uni t of t he sampl e ar e l ess t han
f or doubl e or mul t i pl e.
4. 10 Det er mi nat i on of Accept abi l i t y.
4. 10. 1 Per cent Def ect i ve I nspect i on. To det er mi ne accept abi l i t y of a l ot or
bat ch under per cent def ect i ve i nspect i on, t he appl i cabl e sampl i ng pl an shal l be
used i n accor dance wi t h 4. 10. 1. 1, 4. 10. 1. 2, 4. 10. 1. 3, and 4. 10. 1. 4.
4. 10. 1. 1 Si ngl e Sampl i ng Pl an. The number of sampl e uni t s i nspect ed shal l be
equal t o t he sampl e si ze gi ven by t he pl an. I f t he number of def ect i ves f ound i n
t he sampl e i s equal t o or l ess t han t he accept ance number , t he l ot or bat ch shal l
be consi der ed accept abl e. I f t he number of def ect i ves i s equal t o or gr eat er t han
t he r ej ect i on number , t he l ot or bat ch shal l be r ej ect ed.
4. 10. 1. 2 Doubl e Sampl i ng Pl an. A number of sampl e uni t s equal t o t he f i r st
sampl e si ze gi ven by t he pl an shal l be i nspect ed. I f t he number of def ect i ves
f ound i n t he f i r st sampl e i s equal t o or l ess t han t he f i r st accept ance number ,
t he l ot or bat ch shal l be consi dered accept abl e. I f t he number of def ect i ves
f ound i n t he f i r st sampl e i s equal t o or gr eat er t han t he f i r st r ej ect i on number ,
t he l ot or bat ch shal l be rej ect ed. I f t he number of def ect i ves f ound i n t he
f i rst sampl e i s bet ween t he f i r st accept ance and r ej ect i on number s^ a second
sampl e of t he same si ze shal l be i nspect ed. The number of def ect i ves f ound i n
t he f i rst and second sampl es shal l be accumul at ed. ' I f t he cumul at i ve number of .
def ect i ves i s equal t o or l ess t han t he second accept ance number , t he l ot or bat ch
shal l be consi der ed accept abl e. I f t he cumul at i ve number of def ect i ves i s equal
t o or gr eat er t han t he second r ej ect i on number , t he l ot or bat ch shal l be
r ej ect ed.
4. 10. 1. 3 Mul t i pl e Sampl e Pl an. Under mul t i pl e sampl i ng, t he pr ocedur e shal l be
si mi l ar t o t hat speci f i ed i n 4. 10. 1. 2, except t hat t he number of successi ve
sampl es r equi r ed t o r each a deci si on may be as many as seven.
4. 10. 1. 4 Speci al Pr ocedur e f or Reduced I nspect i on. Under r educed i nspect i on, t he
sampl i ng pr ocedur e may t er mi nat e wi t hout ei t her accept ance or r ej ect i on cr i t er i a
havi ng been met . I n t hese ci r cumst ances, t he l ot or bat ch wi l l be consi der ed
accept abl e, but nor mal i nspect i on wi l l be r ei nst at ed st ar t i ng wi t h t he next l ot or
bat ch ( see 4. 7. 4. b) .
8
MI L- STD- 105E
4. 10. 2 Def ect s per Hundr ed Uni t s I nspect i on. To det er mi ne t he accept abi l i t y of a
l ot or bat ch under def ect s per hundr ed uni t s i nspect i on, t he pr ocedur e speci f i ed
f or per cent def ect i ve i nspect i on above shal l be used, except t hat t he wor d
"def ect s" shal l be subst i t ut ed f or "def ect i ves".
4. 11 Li mi t i ng Qual i t y Pr ot ect i on. The sampl i ng pl ans and associ at ed pr ocedur es
gi ven i n t hi s publ i cat i on wer e desi gned f or use wher e t he uni t s of pr oduct ar e
pr oduced i n a cont i nui ng ser i es of l ot s or bat ches over a per i od of t i me. However ,
i f t he l ot or bat ch i s of an i sol at ed nat ur e, i t i s desi r abl e t o l i mi t t he
sel ect i on of sanpl i ng pl ans t o t hose, associ at ed wi t h a desi gnat ed AQL val ue, t hat
pr ovi de not l ess t han a speci f i ed l i mi t i ng qual i t y pr ot ect i on. Sampl i ng pl ans f or
t hi s pur pose can be sel ect ed by choosi ng a Li mi t i ng Qual i t y (LQ) and a consumer ' s
r i sk t o be associ at ed wi t h i t . Tabl es VI and vr i gi ve val ues of LQ f or t he
t he commonl y used consumer ' s r i sks of 10 per cent and 5 per cent r espect i vel y. I f a
di f f er ent val ue of consumer ' s r i sk i s r equi r ed, t he O. C. cur ves and t hei r t abu-
l at ed val ues may be used. The concept of LQ may al so be usef ul i n speci f yi ng t he
AQL and I nspect i on Level s f or a- ser i es of l ot s or bat ches, t hus f i xi ng mi ni mum
sampl e si ze wher e t her e i s some r eason f or avoi di ng (wi th mor e t han a gi ven
consumer ' s r i sk) mor e t han a l i mi t i ng pr opor t i on of def ect i ves (or def ect s) i n any
si ngl e l ot or bat ch.
4. 12 Cur ves.
4. 12. 1 Oper at i ng Char act er i st i c Cur ves. The oper at i ng char act er i st i c cur ves f or
nor mal i nspect i on, shown i n Tabl e X, i ndi cat e t he per cent age of . l ots or bat ches
whi ch may be expect ed t o be accept ed under t he var i ous sampl i ng pl ans f or a gi ven
pr ocess qual i t y. The cur ves shown ar e f or si ngl e sampl i ng; cur ves f or doubl e and
mul t i pl e sampl i ng ar e mat ched as cl osel y as pr act i cabl e. The O. C. cur ves shown
f or AQLs gr eat er t han 10. 0 ar e based on t he Poi sson di st r i but i on and ar e appl i -
cabl e f or def ect s per hundred uni t s i nspect i on; t hose f or AQLs of 10. 0 or l ess and
sampl e si zes of 80 or l ess ar e based on t he bi nomi al di st r i but i on and ar e
appl i cabl e f or per cent def ect i ve i nspect i on; t hose f or AQLs of 10. 0 or l ess and
sampl e si zes l ar ger t han 80 ar e based t he Poi sson di st r i but i on and ar e appl i cabl e
ei t her f or def ect s per hundr ed uni t s i nspect i on, or f or per cent def ect i ve
i nspect i on (the Poi sson di st r i but i on bei ng an adequat e appr oxi mat i on t o t he
bi nomi al di st r i but i on under t hese condi t i ons) . Tabul at ed val ues, cor r espondi ng t o
sel ect ed val ues or pr obabi l i t i es of accept ance ( Pa, i n per cent ) ar e gi ven f or each
of t he cur ves shown, and, i n addi t i on, f or t i ght ened i nspect i on, and f or def ect s
per hundr ed uni t s f or AQLs of 10. 0 or l ess and sampl e si zes of 80 or l ess.
4. 12. 2 Aver age Sampl e Si ze Cur ves. Aver age sampl e si ze cur ves f or doubl e and
mul t i pl e sampl i ng ar e i n Tabl e I X. These show t he aver age sampl e si zes whi ch may
be expect ed t o occur under t he var i ous sampl i ng pl ans f or gi ven l evel s of pr ocess
qual i t y. The cur ves assume no cur t ai l ment of i nspect i on and ar e appr oxi mat e t o
t he ext ent t hat t hey ar e based upon t he Poi sson di st r i but i on, and t hat t he sampl e
si zes f or doubl e and mul t i pl e sampl i ng ar e assumed t o be 0. 631n and 0. 25n
r espect i vel y, wher e n i s t he equi val ent sampl e si ze.
9
MTL- STD- 105E
SECTI ON 5
TABLES AND CURVES
i
11
SINGLE
NORMAL
14
15
SINGLE
TIGHTENED
SINGLE
REDUCED
16
17
DOUBLE
NORAAAL
DOUBLE
TIGHTENED
18
m O
O O
MXL-SID-105E
MULTIPLE
NORMAL
20
ME>STD-105E
21
MULTIPLE
NORMAL
MULTIPLE
TIGHTENED
22
Mn^sn>-i05E
MULTIPLE
TIGHTENED
23
MULTIPLE
REDUCED
24
25
MULTIPLE
REDUCED
AOQl
NORMAL
26
27
AOQL
TIGHTENED
TABLE VI-A Limiting Quality (in percent defective) for tvhich P
t
(for Normal Inspection, Single sampling)
10 Percent
(see 4.11)
So
- n
m
<
m
TABLE Vl-BLimiting Quality (in defects per hundred units) for which P
a
= 10 Percent
(for Normal Inspection, Single sampling)
(see 4.11)
_* r
O o
m
m
r\
; -. O
o
m,
S
o
-H
<
m
TABLE VII-A Limiting Quality (in percent defective) for which P
a
~* 5 Percent
(for Normal Inspection, Single sampling)
(see 4.11)
TABLE Vll-B Limiting Quality (in defects per hundred units) for which P
a
= ) Percent
(for Normal Inspection, Single sampling)
(see 4.11)
L
O
m
- n
m
MTL-HID-105B
LIMIT
NUMBERS 32
1
A.
c
a
cc
v.
s
s
E
J_
in
- J
CQ
TABLE IX Average sample size curves for double and multiple sampling
(normal and tightened inspection)
(sec 4.12.2)
>
rrt m
TABLE X-A Tables for sample size code letter: A
3>
TABLE X-A-? - SAMPLING PUNS FOR SAMPLE SIZE CODE LETTERi A
^ U M * u w Wq a t a i i M * U ! * * cede I r l i cf (of *hi ch accr pt t i t et and nj r c t i oa aanbr r i ar t avai l abl e.
Ac Accr pl aace number
Re Mri rct i oM ob*r
* U M alftgle xpl i af t pi t a abat e (or al t t m*t l *el t at * code l at l D),
^ ^ ^ V (*t U M elae.1* I I W ^ I ' M (<M l t er aei l el i >r cade l at t af 0) .
TABLE XB Tables for. sample size code letter; B
TABLE X-B-2 - SAMPLING PLANS FOR SAMPLE SIZE CODE LETTER: B
^ ~ Ut e n r t l t uhi eqar m u mp l r i i i r code l et l r i for ohi cd accept ance ai d r ej ect i on numl i r ' l ar* l i ab l e.
4c a * pi l i t er numlirt
Me S l l r j ' Cl i na aumliPi
* = t .' i e t n t t > limiting p l m al n t t ( t r l l l t r a t t WHy * COM l al l t r C)
+*- = I . V doal i l e i i <n|Ji n p i t * l o . ( t r i l t ar Mt t u t l f coot Ut t er 0)
TABLE X'C Tables for sample size code letter: C
CHART C - OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLING PLANS
TABLE X-C-2 - SAMPLING PLANS FOR SAMPLE SIZE CODE LTTTIR: C
V 3 U* ** t 6<! l vpt * * l u * code t t t ( w wi nch Kc t pt anc t t * d t * i * ( t l o f t Mnf eet * u t * * r i t * b U.
Ac a Ac c r p mc * Aw.
He a ni ct Jo* * * / .
^ ^ ^ o U M l i agt * * * I 1 N P I M & (r t l t t r Mt t v i l y I M cotf* Wt l w t)
^ ^ -+4- a Vm 4o*bU p1l t | pl i * i bo** (t r It i r mt l vt t y nu cedt l i t t i r 0)
TABLE X-D Tables for sample size code letter: D
O
C3
s

UJ
O
o
c j
UJ
f M
t o
s
Lb.
Z
5
&
o
a.

CM
<
TABLE X-E Tables for sample size code letter: E
CHART E - OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLING PLANS
r i ' t OAi nr i m>
(Ant H > i n " I
v i i i i nur, "
TABU X-E-2 - SAMPUNC PLANS FUR SAMPU SIZE CODE UTTER: E
57 . U w M d i ^ N ^ M r i t m r h . I t . ** l * i b - k i c k * ) t *l eU M * W * w* *al l >f t U.
Ac Aeecpt aac* * * ' .
( b - R*} *cUo Mf l wr .
\}m d aU I M ^ I I C ^ u b e t ( t f t u r n * ! ! l y i t * c * Wt l i r I )
I Ac c c pt uc * K * pwat c ud al tW Mp l * ! * * .
TABLE X-FTables for sample size code letter: F
CHART F - OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLING PUNS
[ Cu n r i fol doable and mi l l i pl i - i mpl i ng r ul r k f d cl oi cl f pf Ki i c i bl r )
TABU X-F-2 - SAMPLINC PWNS FOR SAMPLE SIZE CODE LETTER: F
A * U M t t i l pMCt di af aaa*pt i i eod t mr t Itw h.k *cc*pt **ct aad rrJFfttoa w * * r t tr i l i WIe.
^ s Ui * Mi l b t Mp r al a ample l i t e code I nt er (or hi ca at cept **cf *d rej ecl i oa weaVt a are avai l abl e.
Ac B Acceptance awabci
lie a l l tl tcti oa e*br i
' = U%t i i a| l t tawptinf, p|a aben' (or i Ht r Mt t n l v u CO* l at t i r <l)
i * Accept!*** M pttmUui at th.ll -!* l i t e.
TABLE X-G Tablet for sample size code letter: G
CHART G - OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLINC PLANS
o
M
TABLE X-C-2 - SAMPLING PLANS FOR SAMPLE SIZE CODE LETTER: G
A U pr Kdi Bf t t Mj .l l > l * I t l t t t (of *Mcf c ec epi uc e ad n\Kl\om M* b * t a v t l Ub l t .
^ . Uw M I I t>Mf|>MM *! >U cwl t t t t i . f l et whi ch wCCrpttac* two" r r [ r e I l ot M M W I * i f l t b t t .
Ac Acceptance awnbr t .
Ra * I U| c l l M t t t r nw*.
U M ai i i gl e * I M; 1 1 M; pl aa i bo* (or a l t i r mt l Ml r a l l CO* l l t Ur I )
t Ac t t punc t m* p t mi u ed el tfcle atai pl e i l t e.
o
w
? T^ TABLE X-H Tables for sample size code letter: H
CHART H - OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLING PLANS
i m V l l " n n t f c f Cune* (w double *) nal l i pl c M m p l i M *re matched * c l oi f l f practi cabl e)
ACCt PTl Di r . l
O
w
TABLE X-H-2 - SAMPLING PLANS FOR SAMPU SIZE CODE LETTER: H
a U* a t I I precedi ef amel * l i t e cixte l et t er lor * H acceptance t ad f r j cci t et aeofaera avai l abl e.
^ " Ue MM aahaeqarni a ample f i l e code l el i r r lor ai ca acceptance and rrj eet i oa mwmhrtt ate **ei l ael *.
Ac Acceptance awhri
(l e H| eci i wi itaatbef
* Ui f t i n * I t ampl i nt pl an above (or i l t t r i u t I vel r et a CO* U l l i r I )
Accepi Hc* MM or r ni t t ed el i Mi iMDple d i e
1 1 1 I * 7 I t IS I) I ] I ) I* I I t l 17 I I I* 10 11 I t 11 l l i 17 M | ] I t 11 M U M IT 11 M M
DUALITY OF 5UBVITTF.D LOTS (p. In prtrr nt drfocilre (at AOL' <10; in drfecu r*' timtdwd u l t i (or AQL' >10)
(J] N.ot Tl fWH H rarraa * Acopictt* 0>'tt*r L n i l * l Ct' <) ' - r ul j **r *t i l aa.
O
TABU X- J - l - TABULATED VALUES FOR OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLING PLANS
I-*
o
M
TABLE X- >2 - SAMPLING PLANS FOR SAMPLE SIZE CODE LETTER: J
A m V n i l pnei dl M f l i I I M * lWr fef !<: KCi f t i i e* ud n | Ki l o* i n f er * an n i l l i b l i .
n U M a tAtttfttm *>) t i l * c o * l i n n l w i l e nt pt n t wt r i j cci l e* mf avt t *r nt l l abU
Ac Act t pi uci umber
Ri a Rc|cci i M ni dwt
* a U H i i *' p l Ul pt** * * ( l Ut r n t l r l l r at * t o * l l t t i r R)
* m Acxt pl t Kf Mt pt ral t l i d i l lM t i af i * l l u .
PCiCciT or LOTI
cirtcrru TO
ACCEPTED i r . l
too
TABLE X-KTables for sample size code letter; K
CHART K - OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLING PIANS
(Oi r r ei for denbla u d Bi l ti pU upl l t f t r t Mcbad t i CI OMI I pnrtJcable)
r t ucr j i f or LOTS
ti rtcTTJ) ro FC
ACCEPTIO(P,i
too
ri'urrv'iK<r;niin'rn LOTS (p. u pmni iWri re* AUL't ^ I O; is-Vfn p*tf.**j miii for *yr > 10)
Nwi ri |W<* *a f " wi Artipufclf Qatltir l t *l * (AQL**) h M M I I n ; ml .
TA8LE X-K-l - TABULATED VALUES FOR OPERATING CHARACTERISTIC CURVES FOR SINGU SAMPLING PLANS
i
o
TABLE X-K-2 - SAMPLING PLANS FOR SAMPLE SIZE CODE LETTER: K
& > U u w n pRCFdi aj f*flt ! cad* l l i r f tot VkV Kc r punc c l ad ffjcctlo* " * t f I M I U W I .
O U Mi l b i t i j i mi I M ? I * t i end* l u l ki ck K t r p l i K t i *d r eu n i o n Hnf er r t re . . i l l i b l t .
Ac Ac c t p l t K* wusfan
I U t Wj eel l on b n
U u >**)< pl i ai pl i >bo (or 1 t t r ml l > t l | i u CO* Ut t i r * )
I i * Ant pMnc a u t pcmt el cd a ifci pl f ! * .
TABLE X-LTables for sample size code letter: L
U1
ttncnon at
m
CHART L - OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLING PLANS
(Carre* for J M U I *ad nl i l pl i Maplinf art aat c M dt Ml r fraellethU)
r*
M
) . 1 I. . t .0 10.0 I I . * Il . tl.O
QI MUI T OF svevrnt D LOTS (*. i< pcii <hfi i n r* AOL' < 10; u <wru * & * J >!!> hr AQL* > IOJ
MI n f * i m t wi aUi OlkT Un k <*.*) ha M d I
M
r
1
i
VI
*-*
o
PI
TABLE X- l - 2 - SAMPLING PLANS FOR SAMPLE SIZE CODE LETTER: L
A a Uaa A M I p * l aaapt e i l t r co*a l et t er l ot accept * ace t ad ref ect i on aabr r e u r avai l abl e.
y a Ut e m n eabet queai i t at pic al i e coda l et t er toe - ' c l i acceptance a*d rcfect' i o* aambrta are avai l abl e.
Ac o Aectpttmct meter
Re 8 Rej ect i on avabef
* a U eiKHte t empi i at, pi t a above ( *r i t t t r Mt t v et y DM coda l et t er )
e a> Accept i net am permi tted el i ttl a i e*pl e i l t e.
TABLE X-M Tables for sample size code letter: M
rncoa or ton
Ei r t CTCD TO 9F.
A CCt n i n i r . i
no
CHART M - OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLING PLANS
(Car vei (or doable wid multiple Mai l i n g we watched cl oael j practi cabl e)
Ol MUTY OF SUBMITTED LOTS {p. in percent rfefectire for AQV* < 10: in def ect ! pri hundred uni t* for AOL' e > 10)
H.t i r r i f u r a t anaa Acrapi ahl t QtaJIrr Lat l a |AQL' 1 (*r Mn a l l aaaardaa.
TABLE X- M- l - TABULATED VALUES FOR OPERATING CHARACTERSTIC CURVES FOR SINGLE SAMPLING PUNS
s
TABLE X-M-2 - SAMPLING PLANS FOR SAMPLE SIZE CODE LETTER: M
fa m U w i t P K I I I I M xi l f i l i a cod I r i i n br U t h e * i n i M d i r j r ct l on mi bi t w* Ui bl r .
^ - U u u r n Hb K q HM ( Hi f l i i i i t cot )* I f l t r i l ot ' h i r l i c r r p l i x r md f r | r r .l i o n b r t i n> Di bi t .
Ac Ac c t p t u c t t n b t t .
M " Hr JKt l oa n n * .
K i t i l i f l t t Hi pt l i i ( p i n *bo* (or i Ht r n t l Wi l r * n c t * I t t l i r Q)
( Atcrpttwct Hi ptnmllri it ibii i i ^ t *
TiBLE X-NTables for sample size code letter: N
i n
renccut or LOW
[ i r ct r t o ft) Bt
At ci r TUi i r .i
CHART N - OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLING PLANS
( Ci f f r i (or oYnbl* d mil I pi t i Mp l l i f an ai i c k t i j cVanl p pnct i cobl t )
I.I 10 ).t 10 t . l 1.0
MI'ILIM (IK M'!ll ] rill) LnTS (p. iii pftrm! -Mii.r for AOL'i < 10; in M K I I prt hmwdrd mill far AQI.' i > 10)
Httll n p #f l M cr m r*r ActtrJibU OMKIV L h [AOl-'al ' * ! I*#r+f.
O
8
TABLE X-N-2 - SAMPLING PLANS FOR SAMPLE SIZE CODE UTTER. N
A a U H M I I pnc *di >( t t ap l * ! eo A l Uf for Mc KCt p l u ea t ad r t l l caj acaf cen * n l l b ! t .
^ 7 ai U H ><t l b * aai < ! * cada I M I R f alefc u n | i i *ad nj act l oa n a b t n > ( t i UaM* .
Ac a AetaptMc* tafatt
R* a flJiio i n t o
* a DM (i kf l * i mpl i t t pJ** abow ( I T Ht r Mt t nt r vi t cod* l l t t t r R)
a Aorcptaac* M ptnaillad a) t i l * I* i l i a.
TABLE X-P Tables for sample size code letter: P
CHART P - OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLING PUNS
r r i i ' Tl l ) ( r a ) ( u t n e i lor double and multiple mpling arc Hatched cl oi r l y i t practi cabl e)
OI MUTY OF 5UI1MITTED LOTS (p In r*>rf-*r oVret i f n- Tor AQL' a < 10. in <f ef H prr handred uafla for AOL' . > 10)
FM*I r i t wi * H c<ra * n Att^tmiim QMII>T L>1 l*(JL
-
>) w 1 l i f <l .
TABLE X- P- l - TABULATED VALUES FOR OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLING PLANS
g
w
1
P
61
! !
ii i
ft l i
siiii!
a.
t i j
o
o
s
*/
5
a.
u
ae
_ J
/>
CM
a.
171
mc t wr or LOT*
ci r t cTt D ro at
vxirrcDir,}
n -i
TABLE X-Q Tables for sample size code letter: Q
CHART Q - OPERATING CHARACTERISTIC CURVES FOR SI NCt f SAMPLING PLANS
(Cww' i for 4 MM tad mnllipla apllug art Batched doi el y pracHcabla)
D.I f t O.J 04 n OF at o.t i.o I.I i.t i .i i. i.i i. 17 l.l i. i.o i.l t .i I . I t* t .i
QUALITY OF SUUUirTRD LOTS (p, 1" percwi defectl** for AQl /i < 10; i> Mtt\m per hwroWd ui i u for AOL' i > 10)
DMI I r i f m H m an Acc**>afcl< OMI HT L m h IA0L'*> hi m l toapacika)
TABU X- 0- 1 TABULATED VALUES FOR OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLING PIANS
o
w
Q
63
9
O
J
bJ
s
u-
/
Z
&.
o
z
. J
CM
6
CO

\
m
1
I
t
*
a.
8
M
U
3
*
i I
t ?
i l i
i i 11
Nil
n i l ?
a n o u o
< 4 . -
TABLE X-R Tables for sample
t
size code letter: R
CHART R - OPERATING CHARACTERISTIC CURVES FOR SINGLE SAMPLING PLANS
r Mc m or LOTS
Li r r ci t ' . nTDOE (Cur t ei (or double nd multiple t npl i af l i r e m t i t hed cl oi el r practi cabl e)
( . I M. I TVCKMI I WI TTKDL OTSf r . In | w w l defective f or AQVi < 10; In o>f ect i per hundred ot i i l i for AOL' a > 10)
*Hi r i ( * * c m i n Acr*piihli QMI I I T L***b MOt-*) tw H m l l i >*t i l .a.
l -
o
w
TABU X-R-2 SAMPLING PUNS FOR SAMPU S t U CODE LETTER! R
A U M ** pr *cdl * aa^ t a d u coda l | ar tor kl ca accept t aca aa** *|TCti ea aaweere a n t t t i l ab l * .
Ac Aecayi aace aaaaW.
R R(| acl l oa aaatSar.
* U M ei al M * * " " * f l " & *
* * Accept t ac t ao* p c mt d t d at t ol a u ap l e * l u .
TABLE X-STables for sample size code letter: S
Ac = Acceptance eomber
Re = Rejection number
i is Acceptance tot petaitted m tkia aaapla ai u.
MTL-STD-105E
6. NOTES
6.1 I ntended Use. Sampling procedures and tabl es for inspection by
attri butes are intended to be used i n the acqui si ti on of Defense materi al .
6.2 Subject Term (Key Word) Li sti ng.
Acceptable Quality Level (AQL)
Average Outgoing Quality (AOQ)
Defect
Defective
Lot or Batch
Process Average
Sample
Sampling Plan
Unit of Product
6.3 Changes from Previous I ssue. Verti cal l i nes or asteri sks are not used in
thi s revi si on to i denti fy changes with respect to the previous i ssue due to
the extensiveness of the changes.
67
68