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. With all these data, we can plot the samples attenuation and the
resolution of the system as functions of the carrier wave frequency. In the same g-
ure, we can also plot the dynamic range of the inspection system (Fig. 8.4). Such
plot will tell us the frequency range in which a good measurement is possible. In
Fig. 8.4, the shaded area indicates this range. For instance, the useful range is that
in which the dynamic range of the system is above the sample attenuation. Within
that range we can estimate the resolution of the system and compare it with the size
of the defect. Often, the best frequency is where the difference between dynamic
range and sample attenuation is highest. The selection criterion is similar. Usually,
CW system works better for imaging purposes while TD system is best suited for
chemical analysis and depth information in which time of ight is important. If
broadband spectrum is not required for the inspection, then CW imaging system
is the most applicable choice. On the other hand, if spectroscopic or broadband
spectral information is needed, then, TD system can be the only choice.
Fig. 8.4 Properties of THz
wave inspection system
Attenuation of THz Wave The Physics Behind Reorganization
In order for THz wave to see an object, the object has to inuence THz wave in
propagation. Interaction between THz wave and material can be precisely described
using Maxwell equations. In most common cases however, it can be simplied to
solve a problem of a monochromatic plane wave penetration through a (locally)
homogenous material. The electric eld is
E = E
0
t
1
t
2
e
ik nl
1 + r
1
r
2
e
2ik nl
+( r
1
r
2
e
2ik nl
)
2
+
=
t
1
t
2
e
ik nl
1 r
1
r
2
e
2ik nl
E
0
,
(1)
where E
0
is the incident electric eld, n =
is the complex refractive index of
the material,
t
1
,
t
2
are transmission coefcient of EM wave through both surfaces
of the target, r
1
, r
2
are reection coefcient of EM wave at both surfaces of the
180 8 THz Technology in Nondestructive Evaluation
target, k = 2/
air
is the wave vector in the air, respectively. The transmission and
reection coefcient is governed by Fresnel principle,
r
//
=
n
2
cos
i
+n
1
cos
t
n
2
cos
i
+n
1
cos
t
, t
//
=
2n
1
cos
i
n
2
cos
i
+n
1
cos
t
r
=
n
1
cos
i
n
2
cos
t
n
1
cos
i
+n
2
cos
t
, t
=
2n
1
cos
i
n
1
cos
i
+n
2
cos
t
(2)
Here r
//
and r
one way
(transmission), or 6
, which will determine the design of the optics. Figure 8.10 shows an example
of testing panels, where the defects are articially made by introducing a circular
polyurethane slice on the substrate or solid foam before spraying another layer on
the top. Some of the defects are also made by injecting air into the foam while it
is curing. The size of the panels is typically 2 2 feet and their thickness ranges
from 1
to 9
. When pulsed THz imaging system is used for the inspection of the
foam, the existence of defects results in distortion of THz waveforms. One example
of THz waveform distortion is shown in Fig. 8.11. Image of defect can be extracted
by following peak amplitude of THz waveforms or it can be retrieved by variation
of time delay. While most effectively, the distortion of THz waves can be calcu-
lated using cross correlation between THz waveforms as presented in the following
equation.
Fig. 8.10 Photo of a SOFI testing sample
Fig. 8.11 The modulation of
THz waveforms by presenting
of defect in SOFI sample.
Inset shows defects imaged
according to the modulation
Space Shuttle Foam Inspection 187
r
d
=
X
i
X
Y
id
X
i
Y
id
Y
2
, (3)
where X and Y are signal and reference waveforms, which are two array of numbers.
By using cross correlation, each pixel in the image is presented by the entire THz
waveform rather than just a single value of peak amplitude or time delay. As a result,
it dramatically increases the imaging dynamic range. Using time-of-ight imaging
technique, pulsed THz wave image is able to tell depth of the defect.
On the other hand, a CWTHz wave imaging systemcould be simpler in construc-
tion, more compact, more exible in operation and easier to analyze the result. In
the evaluation of the optical design, a high frequency will provide a better resolution
than a low frequency. However, the attenuation (extinction coefcient) grows expo-
nentially as the frequency increases, thus the thickness of the panel has to decrease
because the setup has a constant dynamic range. After several studies at different
frequencies (200, 400, and 600 GHz), the best trade-off between resolution and
panel thickness was found to be 200 GHz. For example, when a 30 dB measurement
dynamic range is considered, the maximum thickness of the panel at 200 GHz could
be 6
resolution
target, the result is a minimum aperture of 45 mm. Figure 8.12 shows experimen-
tal setup of a CW THz wave imager, which uses a Gunn diode as the source and a
Schottky diode as the detector. The experimental setup additionally comprises two
focusing lenses, and a beam splitter and everything is designed to work in reec-
tion geometry, which could be collinear or with a deection angle, or pitch-catch.
The second reector is used to relieve the standing wave interference problem. In
Fig. 8.12 Setup of CW THz wave imaging system
188 8 THz Technology in Nondestructive Evaluation
Fig. 8.13 (a) Optical photo of a 2 2 panel sample and (b) its THz wave image
the THz images, the defects appear as dark boundaries with light interiors, corre-
sponding to the scattering and interference at the edge of the defect and enhanced
transmission due to the lack of material in the interior. Figure 8.13 shows a THz
wave image of defects in a testing panel and a photo of the testing panel as com-
parison. It has been observed that most of the defects appear in the vicinities of
structural features such as stringers, stiffeners, and rivets. The sample in Fig. 8.13
shows it has six stringers and the foam is sprayed following the resulting geometry
with an average thickness of 2
)
and medium (0.25
0.5
. (7)
Here is standard deviation of THz signal within a testing area, indicates the
mean of standard deviation of the reference samples, and