Manual FTLA2000 PDF

FTLA2000 Series Laboratory FT-IR Spectrometers
User's Guide
This manual contains: Basic information on using your FTLA2000 Series spectrometer, as well as
safety, maintenance, and troubleshooting information.
IMZ8252
Revision 1-3 December 2002
ABB

FTLA2000 Series Laboratory FT-IR Spectrometers Users Guide iii
WARNING! All servicing of the equipment is to be performed by
Qualified Service Personnel only.
No user/operator adjustments inside the equipment are
necessary or recommended by the manufacturer.
2002 ABB Bomem Inc. All Rights Reserved. No information contained in
this document may be reproduced in any form, in full or in part, without prior
written permission from ABB Inc.
This document contains product specifications and performance statements that
may be in conflict with other ABB Inc. published literature, such as product
flyers and product catalogs. All specifications, product characteristics, and
performance statements included in this document are given as suggestive
specifications only. In case of conflict between product characteristics given in
this document and specifications given in the official ABB Inc. product catalogs,
the latter take precedence.
ABB Inc. reserves the right to make changes to the specifications of all
equipment and software, and to the contents of this document, without
obligation to notify any person or organization of such changes. Every effort has
been made to insure that the information contained in this document is current
and accurate. However, no guarantee is given or implied that the document is
error-free or that the information is accurate.
ABB Inc. provides product support services throughout the world. To receive
product support, either in or out of warranty, contact the ABB Inc. office that
serves your geographical area, or the office shown below:
ABB Inc.
Analytical and Advanced Solutions
585 Charest Blvd. East, Suite 300
Qubec, QC G1K 9H4
CANADA
Phone: 418-877-2944
North America: 800-858-3847
France: 0810 020 000
Fax: 418-877-2834
bomem_service@ca.abb.com
Important: Please be prepared to provide the serial numbers of all units.
You can also consult ABBs web site at www.abb.com/analytical
Copyright
Disclaimer
Customer support

FTLA2000 Series Laboratory FT-IR Spectrometers Users Guide v
TABLE OF CONTENTS
About this Manual ............................................................................................................................................ ix
1. FTLA2000 Series Laboratory FT-IR Spectrometers............................................................................. 1
1.1 Description.................................................................................................................................... 1
1.1.1 Arid-Zone sample station ................................................................................................. 2
1.1.2 Detector assemblies.......................................................................................................... 3
1.1.3 Purging ............................................................................................................................. 3
1.1.4 FT-IR Ethernet Interface .................................................................................................. 3
1.2 Options.......................................................................................................................................... 4
1.2.1 Optical side port ............................................................................................................... 4
1.2.2 External source module .................................................................................................... 6
1.3 Sampling accessories .................................................................................................................... 7
1.4 Computer ...................................................................................................................................... 7
2. Safety.......................................................................................................................................................... 9
2.1 Class of equipment........................................................................................................................ 9
2.2 Certification .................................................................................................................................. 9
2.3 Power connections ........................................................................................................................ 9
2.4 Fuse type....................................................................................................................................... 9
2.5 Moisture and dust........................................................................................................................ 10
2.6 Symbols ...................................................................................................................................... 10
2.7 Laser and high voltage................................................................................................................ 10
2.7.1 Laser specifications ........................................................................................................ 11
2.7.2 Laser labels..................................................................................................................... 11
2.8 Precautions.................................................................................................................................. 14
3. Operation................................................................................................................................................. 17
3.1 Control panel .............................................................................................................................. 17
3.1.1 Line voltage configuration ............................................................................................. 17
3.1.2 Ethernet cable, connector and indicators........................................................................ 18
3.1.3 Setting the resolution...................................................................................................... 18
3.2 Purge gas connections................................................................................................................. 18
3.3 Start up........................................................................................................................................ 19
3.3.1 Checking the status LEDs .............................................................................................. 19
3.3.2 Turning on the source..................................................................................................... 19
3.3.3 Warm up......................................................................................................................... 19
3.4 Avoiding detector saturation....................................................................................................... 19

vi FTLA2000 Series Laboratory FT-IR Spectrometers Users Guide
3.4.1 Setting the preamplifier gain........................................................................................... 20
3.5 Humidity ..................................................................................................................................... 21
4. Acquiring a Spectrum............................................................................................................................. 23
4.1 Check the signal .......................................................................................................................... 23
4.2 Acquire a background (reference) spectrum ............................................................................... 25
4.3 Acquire a sample spectrum......................................................................................................... 25
5. Validating the Spectrometer................................................................................................................... 27
5.1 Required tests .............................................................................................................................. 27
5.2 Validating for quantitative analysis............................................................................................. 27
6. Tips on Using your Spectrometer........................................................................................................... 29
6.1 Power .......................................................................................................................................... 29
6.2 Humidity ..................................................................................................................................... 29
6.2.1 Precautions for humidity-sensitive spectrometers .......................................................... 29
6.2.2 Humidity-insensitive spectrometers................................................................................ 30
6.2.3 Dry air generators ........................................................................................................... 30
6.3 Factors affecting the quality of spectra ....................................................................................... 30
6.3.1 Signal averaging versus time .......................................................................................... 31
6.3.2 Variation of external conditions during acquisition........................................................ 31
6.3.3 Local environment .......................................................................................................... 32
6.4 Using sampling accessories......................................................................................................... 32
6.5 Background (reference) spectra................................................................................................... 33
7. Maintenance............................................................................................................................................. 35
7.1 Preventive maintenance schedule................................................................................................ 35
7.2 Replacing the desiccant module .................................................................................................. 35
7.3 Replacing the internal source ...................................................................................................... 36
7.4 Replacing the laser ...................................................................................................................... 36
7.5 Replacing the fuse ....................................................................................................................... 37
7.6 Cleaning or replacing windows................................................................................................... 37
7.6.1 Optical side port windows .............................................................................................. 37
7.6.1.1 Cleaning the windows................................................................................... 37
7.6.1.2 Replacing the windows ................................................................................. 38
7.6.2 Other windows................................................................................................................ 38
7.6.2.1 Cleaning the windows................................................................................... 38

FTLA2000 Series Laboratory FT-IR Spectrometers Users Guide vii
8. Troubleshooting ...................................................................................................................................... 39
8.1 After power-up............................................................................................................................ 39
8.2 During use................................................................................................................................... 40
8.2.1 Software messages about hardware problems ................................................................ 42
8.2.1.1 On selecting a function in the Collect menu................................................. 42
8.2.1.2 After acquiring a spectrum........................................................................... 42
8.2.1.3 Other messages............................................................................................. 42
8.3 Contacting ABB.......................................................................................................................... 43
8.4 Examples of normal spectra........................................................................................................ 44
A Technical Information ............................................................................................................................ 47
A.1 Specifications.............................................................................................................................. 47
A.1.1 Electrical ...................................................................................................................... 47
A.1.2 Mechanical ..................................................................................................................... 47
A.1.3 Environmental ................................................................................................................ 47
A.1.4 Spectrometer................................................................................................................... 48
A.1.5 Interferometer................................................................................................................. 48
B Installing your MB Series Spectrometer ............................................................................................... 49
Purpose .................................................................................................................................................... 49
Site preparation......................................................................................................................................... 49
Line voltage configuration........................................................................................................................ 49
Main controls and connections ................................................................................................................. 50
Purge gas connections (if used) ................................................................................................................ 51
Safety .................................................................................................................................................... 52
Start up .................................................................................................................................................... 52
Ethernet configuration .............................................................................................................................. 52
Validation ................................................................................................................................................. 52
C Replacing the NIR Source in your MB Series Spectrometer............................................................... 53
Purpose .................................................................................................................................................... 53
Safety .................................................................................................................................................... 53
Removing the NIR source ........................................................................................................................ 53
Replacing the NIR source......................................................................................................................... 56
Aligning the NIR source........................................................................................................................... 56
Validation ................................................................................................................................................. 57

viii FTLA2000 Series Laboratory FT-IR Spectrometers Users Guide
D Replacing the MIR Source...................................................................................................................... 59
D.1 Purpose........................................................................................................................................ 59
D.2 Safety .......................................................................................................................................... 59
D.3 Removing the MIR source .......................................................................................................... 59
D.4 Replacing the MIR source........................................................................................................... 60
D.5 Validation.................................................................................................................................... 62
E Glossary.................................................................................................................................................... 63
F Index ......................................................................................................................................................... 77

FTLA2000 Series Laboratory FT-IR Spectrometers Users Guide ix
ABOUT THI S MANUAL
This manual is intended for personnel using an FTLA2000 Series spectrometer
for routine analysis, as well as personnel responsible for maintaining and
troubleshooting the analyzer.
For information on: Refer to Chapter/Appendix:
Installation App. B Installing your FTLA2000 Series
Laboratory FT-IR Spectrometer
The FTLA2000 Series Spectrometers Chap. 1 FTLA2000 Series Laboratory FT-
IR Spectrometers
Routine analysis Chap. 2 Safety
Chap. 3 Operation
Chap. 4 Acquiring a Spectrum
Getting the most out of your
spectrometer
Chap. 5 Validating the Spectrometer
Chap. 6 Tips on Using your Spectrometer
Maintenance and troubleshooting Chap. 7 Maintenance
Chap. 8 Troubleshooting
Software commands and dialog box names and are shown in boldface type.
Text to be entered into software is in sans serif type.

This symbol refers you to another manual or document.
Note: Supplemental information to help the reader.
Important: Information that is important, but that does not concern the safe use
of the equipment.
This symbol shows that Caution is required. Follow
the instructions carefully to avoid damage to the equipment.
WARNING! Failure to comply with warnings can result in serious injury
or loss of life.
Audience
Conventions used
in ABB manuals
C H A P T E R 1
FTLA2000 Series Laboratory FT-IR Spectrometers Users Guide 1
FTLA2000 SERI ES LABORATORY FT-I R
SPECTROMETERS
FTLA2000 Laboratory FT-IR Series spectrometers are powerful and reliable
Fourier Transform Infrared (FT-IR) spectrometers designed for a wide range of
IR analyses in a variety of environments, including factories, field locations,
educational institutions, and quality control laboratories.
The FTLA2000 Series of FT-IR spectrometers includes the following models
covering both the mid infrared (MIR) and near infrared (NIR) spectral ranges:
Model Typical Spectral Range
(cm
-1
)

Humidity Sensitive
(hygroscopic optics)
FTLA2000-100 6500 350 MIR Yes
FTLA2000-102 5000 200 MIR Yes
FTLA2000-104 6500 500 MIR No
FTLA2000-154 12 000 500 NIR/MIR No
FTLA2000-155 12 000 450 NIR/MIR Yes
FTLA2000-160 14 000 - 3800 NIR No
Note: These spectral ranges are approximate. Refer to published specifications
for the exact spectral range of each model. The detector and/or other
devices may reduce the spectral range.
These spectrometers provide exceptionally high stability, sensitivity and
photometric accuracy. When the necessary measures are taken, the repeatability
(the precision of repeated measurements on the same instrument) and
reproducibility (the precision of repeated measurements on the different
instruments) are outstanding. Refer to Chapter 5 Validating the Spectrometer on
page 27 for further information.
The interferometer and the input/output optics of these instruments are factory
prealigned. There are no routine adjustments required.
FTLA2000 Series spectrometers are controlled by acquisition software running
on an external PC computer running under the Microsoft Windows
2000 or
Windows
NT. ABB can supply the FTLA2000 Series spectrometers with or

without a computer. The computer requires an Ethernet network adapter.
1.1 Description
S e c t i o n 1 . 1 De s c r i p t i o n
2 FTLA2000 Series Laboratory FT-IR Spectrometers Users Guide
All FTLA2000 Series spectrometers can be used with various optional sampling
accessories that come with their own manuals. Several additional features are
also available as options.
The following items are included with each FTLA2000 Series spectrometer:
Arid-Zone sample station
a
(see Section 1.1.1)
One detector assembly (see Section 1.1.2)
Acquisition software (refer to the software manuals provided)
The Arid-Zone sample station comes as a standard accessory (see Figure 1-1
below). It eliminates waiting for purge without compromising spectrometer
performance. It also eliminates the need for water vapor compensation routines
for quantitative analysis applications.

Figure 1-1. FTLA2000 Series spectrometer with Arid-Zone sample station
For MIR analysis, the telescopic purge tubes of the Arid-Zone sample
compartment adjust to the sample cell and insure continuous purge right up to
the sample. This allows purging, yet leaves a wide, open space around
the IR beam for immediate access to the sample without breaking purge, as well
as sufficient space for all standard sample accessories. The Arid-Zone sample
station is compatible with all industry-standard accessories such as ATR,
DRIFT, and Liquid Cells.
a
A different sample station,
such as the HOval, may be
supplied instead of, or in
addition to, the Arid-Zone.
1.1.1 Arid-Zone
sample station
Output beam
cover
Humidity indicator /
Desiccant module
Source adjustment
access plug
(remove to adjust
source power)
Telescopic
purge tube (for
MIR analysis)
Detector cover
Control panel
C h a p t e r 1 F T L A 2 0 0 0 S e r i e s L a b o r a t o r y F T - I R S p e c t r o me t e r s
For NIR analyses, where purge is not required, the telescopic purge tubes are not
used. In their place, protective windows are installed to prevent contaminant
liquids or vapors from entering the spectrometer and causing damage.
ABB can supply the FTLA2000 Series spectrometers with detector assemblies
of different types and sensing element sizes, interchangeable by the user.
The power must be turned off when detector assemblies are
being interchanged.
FTLA2000 Series spectrometers are equipped with purge inlets. Purging is
recommended for spectrometers which have hygroscopic optical components
(models FTLA2000-100, FTLA2000-102, and FTLA2000-155) or if ambient
water vapor may interfere with measurements.
Purging should be done using dry nitrogen or CO
2
and H
2
O free air when
an application is sensitive to changes in air humidity, or when the sensitivity of
the analyzer is compromised by the absorption of CO
2
and H
2
O found in normal
concentrations in the ambient air. When water vapor alone is to be eliminated,
dry, oil-free instrumentation air can be used for purging.
The recommended purge flow rate into the spectrometer is 5 L/min. Once
the spectrometer is purged, a continuous flow rate of 1 L/min is normally
sufficient to maintain the purged condition. An automatic relief valve is installed
to prevent accidental over-pressurization of the spectrometer. This relief valve
opens if the internal pressure exceeds 1/3 psi.
The FT-IR Ethernet Interface is built into the FTLA2000 Series. It allows
communication between the FTLA Series and a computer over an Ethernet link
using standard network protocols. Communication is possible through a private
connection between the instrument and the computer, over a local area network,
or over the Internet. The computer must be equipped with a standard Ethernet
network adapter.
An Ethernet link offers many advantages over a serial or parallel link. For
example, an Ethernet link:
works over standard office and plant networks
1.1.2 Detector
assemblies
Detector assemblies can be
procured at the time of the
initial sale or later on.
1.1.3 Purging
1.1.4 FT-IR Ethernet
Interface
S e c t i o n 1 . 2 Op t i o n s
allows sharing of FT-IR instruments by multiple computers over
the network
allows control of multiple FT-IR instruments by a single computer over
the network
simplifies cabling and allows greater distances between the FT-IR
instrument and the computer
does not require special hardware in the computer
can be upgraded by loading a new version of the firmware
The following are some of the features of the FT-IR Ethernet Interface:
Uses a standard RJ45 phone type connector and twisted pair wiring
(10Base-T or 100Base-T)
Automatically detects network speed (10 Mbps or 100 Mbps)
Maximum network load of approximately 2 Mbps
Network traffic is not encrypted
Network traffic will not cross firewalls
Instruments are addressed by a unique name

Refer to the FT-IR Ethernet Interface and External Ethernet Interface
User's Guide for complete information on the FT-IR Ethernet Interface.
The following sections describe the principle options available for the
FTLA2000 Series spectrometers.
As an option, ABB can install one optical side port on the FTLA2000 Series
spectrometer. The different types are described below:
Optical outport (Figure 1-2 on page 5). This option allows the easy
interfacing of the spectrometer to accessories mounted on the side of
the spectrometer.
Once installed, the side accessory is selected by placing the position of
a manually operated flip mirror in the appropriate position. This directs
the IR beam from the interferometer through the side port, assures that
the spectrometer selects the signal coming from the detector located on
1.2 Options
1.2.1 Optical side port
the side, and also assures that the interferometer adjusts to the optimum
scanning speed for the type of detector used at that location.
When the flip mirror is in the normal position, the IR beam goes to the top
sampling station, and the detector located on the top is selected.

Figure 1-2. Optical outport
Optical inport (Figure 1-3 on page 6). This option allows you to install
an external source module on the spectrometer.
Once the external source is installed, you can select the external or internal
source simply by turning one source on and turning the other off.
S e c t i o n 1 . 2 Op t i o n s

Figure 1-3. Optical inport
Note: After switching a source on or off, allow a temperature stabilization time
from 10 minutes to 2 hours, depending on the need for stability, before
performing analyses.
ABB offers optional external source modules that mount on the optional optical
side inport (or emission port) on the left side of the FTLA2000 Series
spectrometer. The optional external source module has an external regulated
power supply and optical filter holder (a filter may be useful to prevent detector
saturation under certain conditions).
Note: The optional external source modules are not compatible with
the optional optical side outport.

For complete instructions on installing (or replacing), testing, and using
a particular external source module, refer to the documentation supplied
with that external source module.
Specifications for the optional external sources are given in the following tables.
All values are nominal. (No user settings are required.)
1.2.2 External source
module
External NIR source External MIR source
Rated line voltage: 90-265 VAC 90-265 VAC
Rated frequency: 50-60 Hz 50-60 Hz
Radiation source (absorption
spectroscopy)
Quartz-halogen lamp
(collimated to a 2.5 cm diameter beam)
SiC Globar
(collimated to a 2.5 cm diameter beam)
Range near IR range (15 000 cm
-1
to 4000 cm
-1
) mid IR range (7000 cm
-1
to 200 cm
-1
)
FTLA2000 Series spectrometers are compatible with industry-standard sampling
accessories from ABB and from other manufacturers. The following list shows
some accessories available from ABB.
Raw Material Identification FT-NIR Analyzer
Bag Sampling
Powder Sampling
Tablet Sampling
Vial Holder

For complete instructions on installing, testing, and using a particular
sampling accessory, refer to the documentation supplied with that
sampling accessory.
ABB can supply the FTLA2000 Series spectrometer with or without a computer.
If the computer is supplied by ABB, all software will be preinstalled and
configured.

The minimum configuration requirements for the computer depend on the
software you intend to use. Refer to your software manuals.

1.3 Sampling
accessories
1.4 Computer
C H A P T E R 2
SAFETY
The FTLA2000 Series spectrometer has an exposed metal chassis that is
connected directly to earth via a power supply cord and are therefore classified
as Safety Class I equipment.
WARNING! To avoid electrical shock, do not operate this equipment if it
bears any sign of damage to any portion of its exterior
surface.
Do not expose this equipment to any source of excessive
moisture.
Do not use this equipment in an explosive atmosphere.
ABB instruments receive the following safety certifications:
Canadian Standards Association (for Canada and the US)
Conformit europenne (European conformity)
In accordance with international safety standards, each powered unit uses a
three-wire power cord. When connected to an appropriate AC power receptacle,
this power cord grounds the chassis.
WARNING! To avoid the risk of injury or death:
Use only a power cord with a protective earthing
terminal. Never use an extension cord that is not
equipped with this feature.
Connect the power cord to a power outlet of the correct
voltage and that has a protective earth contact.
Disconnect all power cords before servicing any unit.
The main power fuse(s) are rated as follows:
T2A/250V (115 V line)
T1A/250V (230 V line)
2.1 Class of
equipment
2.2 Certification
2.3 Power
connections
2.4 Fuse type
S e c t i o n 2 . 5 Mo i s t u r e a n d d u s t
The FTLA2000 Series spectrometer is designed for indoor use in a laboratory-
type environment. It should not be exposed to excessive moisture and dust.
The following symbols may be used in documentation or on the instrument:
Symbol Meaning
WARNING!
or
WARNING

Failure to comply with warnings can result in
serious injury or loss of life.
Ensure that all conditions necessary for safe
handling and operation are met before
proceeding.

Danger: High voltage

Warning: Hot surface

Caution: Follow instructions carefully to
avoid damage to the equipment.

Protective earth conductor terminal

On (power)

Off (power)
Under normal conditions, the FTLA2000 Series spectrometer can be operated in
complete safety. However, since the instrument contains a laser and uses high
voltages (accessible only when the enclosure is open), observe the following
warnings:
2.5 Moisture and
dust
2.6 Symbols
2.7 Laser and
high voltage
Ch a p t e r 2 S a f e t y
WARNING! Opening the enclosure of the FTLA2000 Series
spectrometer may result in exposure to laser radiation and
high voltages. The enclosure is to be opened only by
authorized ABB Service Personnel.
Laser type: He-Ne
Laser class: 3B as per IEC-60825-1 and
Class IIIa as per 21 CFR 1040.10
Output power: 3.2 mW (maximum)
Wavelength: 632.8 nm

CAUTION: Use of controls or adjustments, or performance of
procedures other than those specified herein may result in
hazardous radiation exposure.

WARNING! High voltage is present at the red wire connected to
the laser tube inside the enclosure.
The voltage is approximately 7 kV at startup, and between
1200 V and 1400 V under normal operating conditions.
Because of the capacitors in the laser power supply,
the high voltage may be present even when the power is off.
The following table gives the specifications of the laser used in the FTLA2000
Series spectrometer.
Wavelength: 632.8 nm (vacuum)
Beam diameter: 0.75 mm 0.05 mm
Beam divergence: 1.2 mrad
Power output (at laser tube): 2 to 5 mW (TEM
oo
)
Class 3B
The following information describes the laser radiation warnings on
the equipment along with their location.
2.7.1 Laser
specifications
2.7.2 Laser labels
S e c t i o n 2 . 7 L a s e r a n d h i g h v o l t a g e
CAUTION
CLASS 3B LASER, RADIATION WHEN OPEN
AVOID EXPOSURE TO BEAM
IMZ6426

Figure 2-1. Laser caution label

Figure 2-2. Locations of laser caution labels
Under the spectrometer
On top plate, under
access cover
On access cover
Next to side port
(if installed)

MANUFACTURE DATE:
SERIAL NO.:
MODEL:
CLASS 1
LASER PRODUCT
ABB Inc.
Qubec, QC G1K 9H4 CANADA
Phone: 418-877-2944
C US
COMPLIES WITH FDA
RADIATION PERFORMANCE
STANDARDS.
21 CFR CHAPTER 1
SUBCHAPTER J.

Figure 2-3. Nameplate with Class 1 laser label
S e c t i o n 2 . 8 P r e c a u t i o n s

Figure 2-4. Location of nameplate with Class 1 laser label and laser caution label
WARNING! Failing to comply with any of the instructions, precautions
or warnings contained in this manual is in direct violation of
the standards of design, manufacture, and intended use of
the equipment.
ABB Inc. assumes no liability for the users failure to
comply with any of these safety requirements.
The following precautions must be observed whenever the equipment is
operated, serviced, or repaired.
Before operating the equipment:
Inspect the equipment for any signs of damage, and read this manual
thoroughly.
Install the equipment as specified in the documentation provided.
2.8 Precautions
Make sure the system is configured to use the available line voltage and that
the correct fuse(s) for that voltage is (are) installed. Use only the fuse(s)
specified as appropriate for this equipment (see Section 2.4 on page 9).
Ensure that equipment and any devices or power cords connected to it are
properly earthed.
While operating the equipment:
Do not operate the equipment in the presence of flammable gases, fumes,
or dust.
Do not operate the equipment when its covers or panels have been removed.
Do not interrupt the protective earthing connection. Any such action can
lead to a potential shock hazard that could result in serious personnel injury.
Do not operate the equipment if an interruption to the protective earthing is
suspected. Ensure that the equipment remains inoperative.
Do not use repaired fuses and avoid any situations that could short-circuit
the fuse.
Unless absolutely necessary, do not attempt to adjust or perform any
maintenance or repair procedure when the equipment is opened and
connected to a power source at the same time. Any such procedure should
only be carried out by a qualified service professional.
Do not attempt any adjustment, maintenance, or repair procedure to
the equipment if immediate first aid is not accessible.
WARNING! High voltages may be present inside the enclosure even
when the equipment is not connected to the power source
because some of the capacitors may be charged.

C H A P T E R 3
OPERATI ON
Figure 3-1 shows the spectrometer control panel. All controls and connections,
except for the preamplifier gain adjustment, are located on this panel.

Figure 3-1. Control panel
The FTLA2000 Series spectrometer is delivered preconfigured for the line
voltage of your country. This voltage should be visible on the voltage
configuration plate behind the sliding fuse cover. Should it be necessary to
change the line voltage configuration, unplug the spectrometer, and remove the
fuse. Then pull out the voltage configuration plate using pliers and reinsert it so
that the correct line voltage is showing.

Be sure to use the fuse type specified for the actual line
voltage. Refer to Section 2.4 on page 9.
3.1 Control panel
3.1.1 Line voltage
configuration
Power switch
1 or 2 Source
breaker-switches
Power connector
Resolution switch
Status LEDs
Fuse and voltage
configuration plate
(behind sliding fuse cover)
Ethernet cable connector
S e c t i o n 3 . 2 P u r g e g a s c o n n e c t i o n s
Two Ethernet cables are supplied (see Figure 3-2), a crossover cable for making
a private (direct) connection to the computer and a straight-pinned cable for
connecting the instrument to a network. Be sure to use the correct type of cable.

Figure 3-2. Ethernet cables for private and network connection
The Ethernet cable must be connected to the RJ45 connector identified as
10/100 BASE T on the control panel. The MAC address of the FT-IR Ethernet
Interface is indicated on the panel.
Two LEDs are associated with the Ethernet connector:
LINK is on when the instrument is properly connected.
ACT is on when there is activity on the link.

Refer to the FT-IR Ethernet Interface and External Ethernet Interface
User's Guide for complete information on making the Ethernet
connection and configuring the FT-IR Ethernet Interface.
The resolution can be changed at any time before making a new spectroscopic
measurement.
Make sure the same resolution setting is used for both the reference spectrum
and the sample spectra.

Refer to the Installing manual (reproduced on page 51) for instructions
on connecting the purge gas, if used.
3.1.2 Ethernet cable,
connector and
indicators
3.1.3 Setting
the resolution
3.2 Purge gas
connections
For private (direct) connection
to computer
For network connection
Ch a p t e r 3 Op e r a t i o n
Turn on the spectrometer, the computer, and all other powered components.
After turning on the spectrometer, the status LED sequence should be:
LED Normal State
POWER ON
SCAN OFF (a few seconds after power on)
ZPD OFF (a few seconds after power on)
DATA Flashing (usually within one minute after power on)
This sequence confirms the correct operation of the spectrometer. During
operation, the POWER LED should be ON and the DATA LED should be
flashing. If you encounter problems, refer to Chapter 8 on page 39.
Set the source breaker-switch to ON. Dual source models such as the
FTLA2000-154 or the FTLA2000-155 can have an IR (MIR) and an NIR
source, each of which can be turned on or off independently.
Note: After switching on a source, allow a temperature stabilization time from
10 minutes to 2 hours, depending on the need for stability, before
performing analyses.
When turned on at room temperature, the spectrometer will need about 4 hours
to allow its infrared source and internal temperature to stabilize; for critical
measurements, more time may be required. The spectrometer can be used
immediately after being turned on but the resulting spectra may not be within
published specifications.
Important: The spectrometer should be left ON at all times.
Each time it is turned OFF then back ON, it will take several hours
for the internal temperature to stabilize.
Some sensitive near-IR detectors are provided with selectable preamplifier gain.
After installing a sampling accessory, the preamplifier gain must be set so that
sufficient signal amplitude is obtained and detector saturation is avoided
(see Section 3.4.1 on page 20).
3.3 Start up
3.3.1 Checking
the status LEDs
3.3.2 Turning on
the source
3.3.3 Warm up
3.4 Avoiding
detector
saturation
S e c t i o n 3 . 4 A v o i d i n g d e t e c t o r s a t u r a t i o n
When performing quantitative analysis without normalization, a new reference
spectrum must be taken when the preamplifier gain is changed. Make sure
the same preamplifier gain setting is selected for both the reference spectrum
and the sample spectrum.
For qualitative analysis, or quantitative analysis with normalization, it is
possible to use different gain settings for reference and sample spectra.
The preamplifier gain must be set so that detector saturation is avoided.
The preamplifier gain is set using a rotary switch located on the preamplifier
box that is part of the detector assembly.

Refer to the manual of your acquisition software for instructions on
checking for detector saturation before carrying out this procedure.
Note: A neutral density filter may be required to attenuate the optical beam if
saturation cannot be eliminated by reducing the preamplifier gain.
To set the preamplifier gain, use the following procedure:
1. If you are using a sampling accessory, make sure the accessory is in place,
but that it contains no sample.
2. Turn the two screws holding the detector cover of the Arid-Zone sample
station (see Figure 3-3 on page 21) turn counterclockwise, and remove
the cover.
3. Set the gain using the rotary switch (see Figure 3-4 on page 21).
The following table shows the available settings:
Setting Gain
A 1
B 2
C 4
D 8
E 16
4. Replace the detector cover, and turn the two screws turn clockwise to
secure the cover.
3.4.1 Setting the
preamplifier gain
Ch a p t e r 3 Op e r a t i o n

Figure 3-3. Arid-Zone sample station

Figure 3-4. Rotary switch used to set the preamplifier gain
The spectrometer may require protection from humidity.
Refer to Section 6.2 on page 29.
3.5 Humidity
Detector cover
screws (2)
C H A P T E R 4
ACQUI RI NG A SPECTRUM
This chapter guides you in acquiring the transmittance spectrum of a sample
using any Windows-based acquisition software program supplied by ABB Inc. It
assumes that the software is installed and configured.
Note: The commands used in this section are in the Collect menu of
the acquisition program.

For detailed information on using a particular acquisition program, refer
to the manual supplied with that program.
1. Make sure there are no objects in the sampling area and that the sample
holder is in position. (This condition is called open beam.)
2. Using the Setup command, select the FTLA2000 Series spectrometer and
make sure all parameters are set correctly.
3. Set the spectrometer resolution to 4 cm
-1
.
4. Select the alignment command to display the alignment dialog box.
Set the parameters as follows:
Spectral Range:
for MIR: 4000 to 400 cm
-1

for NIR: 14 000 to 1000 cm
-1

Data type: Single-Beam (or Raw spectrum)
5. Click OK Align to begin data acquisition. During data acquisition,
the display will be continuously updated until the halt command is selected.
6. Observe the displayed spectrum. The word Align, followed by a percentage,
indicates the interferogram amplitude as a percentage of the maximum
allowed. This percentage should be between 40% and 90%.
7. Check for any unusual spectral features such as a strong signal below
the detector cut-off frequency (usually caused by detector saturation).
Figure 4-1 on page 24 shows typical spectra for MIR and NIR. Figure 4-2
on page 24 presents MIR spectra showing detector saturation.
4.1 Check the signal
S e c t i o n 4 . 1 Ch e c k t h e s i g n a l

Figure 4-1. Typical open-beam spectra

Figure 4-2. MIR spectra showing detector saturation
Refer to Section 8.4 on page 44 for more examples of normal open-beam
spectra for different system configurations.
8. Select the halt command to stop data acquisition.
Normal
Saturated
Highly
saturated
Ch a p t e r 4 A c q u i r i n g a S p e c t r u m
1. Select the command for acquiring a background spectrum (Background
Scanning or Collect).
In the dialog box, set the parameters as follows:
Spectral Range (if available):
for MIR: 4000 to 400 cm
-1

for NIR: 14000 to 4000 cm
-1

Number of Scans: 10
File Name: (enter a file name)
If available, select the Background acquisition type.
2. Click the OK button to begin data acquisition. During data acquisition
the spectrum of each individual scan will be displayed on the page. When
all the spectra are acquired, the coadded spectrum is displayed and saved.
1. When the background spectrum has been acquired, insert the sample in
the sample holder.
For MIR, use the polystyrene sample supplied with the spectrometer
(see Figure 4-3 below).

Figure 4-3. Inserting the polystyrene sample into the sample holder
For NIR, do not use the polystyrene sample. Instead, place an ordinary
plastic bag over the sample holder.
4.2 Acquire
a background
(reference)
spectrum
4.3 Acquire
a sample
spectrum
S e c t i o n 4 . 3 A c q u i r e a s a mp l e s p e c t r u m
2. Select the command for acquiring a normal spectrum. (Scanning or
Collect).
In the dialog box, set the parameters as follows:
Spectral Range: (same as for background spectrum)
Number of Scans: 10
File Name: (enter a file name)
Data type: %Trans
If available, select the Normal acquisition type.
3. Click the OK button to begin data acquisition. During data acquisition
the spectrum of each individual scan will be displayed on the page. When
all the spectra are acquired, the coadded spectrum is displayed and saved.
4. Observe the acquired spectrum.
Figure 4-4 shows an example of the transmittance spectrum of a polystyrene
sample in the MIR range and the transmittance spectrum of a plastic bag in
the NIR range.

Figure 4-4. Transmittance spectra
C H A P T E R 5
VALI DATI NG THE SPECTROMETER
FTLA2000 Series spectrometers can be used in many different applications.
However, there are three broad categories of spectrometers users, and each
category has its own requirements concerning the tests necessary to ensure
proper performance.
The following table shows the validation tests required for each type of user:
Tests required
Type of user
Check for detector
saturation
*

Frequency validation
Spectral quality
All other available
validation tests
Users performing qualitative analysis only
Users of an ABB dedicated analyzer
(e.g. PROTA)

Users performing quantitative analyses
or who may do so in the future

*
Check for detector saturation before using the spectrometer and each time you install a different sampling accessory.
Adjust the preamplifier gain if necessary (see Section 3.4 on page 19).
With ABB spectrometers, models (calibrations) for quantitative analysis can be
developed using one spectrometer (e.g. in a laboratory), and then transferred to
other spectrometers (e.g. in a plant), without having to adjust the model for each
spectrometer. However, a complete performance validation of each spectrometer
is necessary to guarantee transferability of models.
Before using a spectrometer for quantitative analysis, it is recommended that
you perform all of the available validation tests.
We strongly recommend that all validation tests be performed when
the spectrometer is first installed, and afterwards on a regular basis, even if
you do not foresee the need to transfer models to another spectrometer.

For information on performing the validation tests, refer to the SpecTest
Users Guide.

For further information on transferability of models, refer to the chapter
entitled Quantitative Analysis and Calibration Transfer of the FT-IR
Reference Manual.
5.1 Required tests
5.2 Validating for
quantitative
analysis
C H A P T E R 6
TI PS ON USI NG YOUR SPECTROMETER
Leave the spectrometer ON at all times. This not only ensures thermal stability,
but also helps protect the spectrometer from humidity. However, it is possible to
turn the source off when the spectrometer is not in use. After switching a source
on or off, allow a temperature stabilization time from 10 minutes to 2 hours,
depending on the need for stability, before performing analyses.
The average source life when left on continuously is:
MIR source: 4 years
NIR source: 1 year
Your FTLA2000 Series spectrometer
b
may contain some hygroscopic
components (components that can be damaged by humidity). Although the
spectrometer is sealed, it is not vacuum tight; there will always be some
exchange of air between the interferometer cavity and the outside. For this
reason, a number of precautions must be taken to ensure minimal long-term
damage due to humidity. These are described below.

For more specific information on hygroscopic materials, refer to
the Chapter Handling and Care of Hygroscopic Materials of the FT-IR
Reference Manual.
To assure maximum life for humidity-sensitive spectrometers
(models FTLA2000-100, FTLA2000-102, and FTLA2000-155), the following
precautions should be taken:
Leave the spectrometer ON at all times.
If possible, purge the spectrometer at all times using dry, oil-free
instrumentation air or dry nitrogen. Before interrupting the purging gas,
make sure the internal desiccant module is installed and that the desiccant is
fresh.
If the spectrometer is not left ON at all times, or if the relative humidity is
extremely high:
Put external desiccant around exposed hygroscopic windows where
possible. Use as much desiccant as possible without partially blocking
6.1 Power
6.2 Humidity
b
Models FTLA2000-100,
FTLA2000-102, and
FTLA2000-155, are
sensitive to humidity,
others models are not.
6.2.1 Precautions for
humidity-
sensitive
spectrometers
S e c t i o n 6 . 3 F a c t o r s a f f e c t i n g t h e q u a l i t y o f s p e c t r a
the beam. Note however that if the ambient humidity decreases rapidly,
the desiccant will release absorbed moisture that could damage
the windows.
If the spectrometer is not purged continuously:
Change the internal desiccant module regularly. Exhausted desiccant
will release substantial quantities of water when warmed by
the elevated temperature inside the spectrometer, causing rapid failure
of the beamsplitter.
Where humidity is a potential problem, we recommend the use of the
FTLA2000-104 (mid IR region) and FTLA2000-154 (mid and near IR region)
spectrometers, if either of these spectrometers meets the requirements of your
application.
If a supply of dry nitrogen is not available, the spectrometer can be purged with
dry, oil-free instrumentation air. For this, ABB recommends the use of a dry air
generator.
Whatman Inc. manufactures excellent dry air generators that either work from
plant compressed air (model 75-45 is recommended) or from its own compressor
(model 74-5021 is recommended). Both units can deliver up to 14 liters per
minute of water free (-73
o
C dew point) and CO
2
free (<1 ppm) purging gas.
These dryers have proven to be a good, cost-effective alternative to the use of
nitrogen.

For installation, operation and maintenance of Whatman dry air generator
model 75-45, refer to the chapter entitled Purging in the FT-IR Reference
Manual.
The results obtained with a FTLA2000 Series spectrometer will depend on
several different factors:
signal averaging versus time
variation of external conditions during acquisition
local environment
6.2.2 Humidity-
insensitive
spectrometers
6.2.3 Dry air
generators
6.3 Factors affecting
the quality of
spectra
C h a p t e r 6 T i p s o n Us i n g y o u r S p e c t r o me t e r
Understanding the effect of these factors on the resulting spectra should help to
optimize and improve the quality of acquired spectra.
The spectra acquired by all spectrometers are more or less affected by noise,
or random error introduced by variations in light and electrical signals.
The noisy signal appears as random fluctuations in the spectral response.
The amount of noise present in a spectrum is inversely proportional to the square
root of the signal averaging time, or the number of scans. For example, spectra
acquiring using 50 scans will have approximately one fifth the noise level of
spectra acquired using 2 scans.
The number of scans required will depend on various factors such as how much
energy the sample transmits and the spectral range of interest. However,
the same number of scans should usually be used to acquire the reference and
sample spectra.
Interferograms are not obtained instantaneously because of the necessity of
averaging to improve spectral quality. Unfortunately, this makes the results
dependent on variations of the instrument, sample or other conditions during
the scans.
Some examples of variations are:
A change in the fraction of water vapor or carbon dioxide in the air in
the sample path of the instrument. This can occur if you breathe or talk
near an unprotected sample during the scan.
A significant change in temperature (more than 10
o
C) during the scan.
This can cause a change in dimensions and cause temporary optical
misalignment.
A sudden displacement or mechanical shock. This will cause a change
of scan velocity that could yield a distorted spectrum. If the shock is
severe enough, the instrument will reject the scan and thereby waste
measurement time.
Even gradual changes of conditions can cause problems when
the background and sample spectra are acquired too far apart in time.
6.3.1 Signal averaging
versus time
6.3.2 Variation of
external
conditions during
acquisition
S e c t i o n 6 . 4 Us i n g s a mp l i n g a c c e s s o r i e s
If conditions may vary, acquire the sample spectrum immediately after
the reference spectrum.
The FTLA2000 Series spectrometer is designed for harsh environments. There
are nevertheless limits to its adaptability.
The following conditions have a direct effect on performance:
Vibration: Excessive vibration will cause degradation of the highly
precise scanning of the instrument, increasing the noise in
spectra. Built-in vibration isolators shield the instrument
from normal levels of vibration. However, the instrument
must not be in contact with vibrating surfaces except
through its base.
Temperature: The detector of the instrument produces more electrical
noise as the ambient temperature increases. To achieve
optimal performance, the temperature must be maintained
within 5C.
c

All FTLA2000 Series spectrometers can be used with various optional sampling
accessories that come with their own manuals. Some sensitive near-IR detectors
are provided with selectable preamplifier gain. After installing or removing
an accessory, it may be necessary to adjust the preamplifier gain to obtain a
strong signal while avoiding detector saturation. Refer to Section 3.4 on page 19.
When performing quantitative analysis without normalization, a new reference
spectrum must be taken when the preamplifier gain is changed. Make sure
the same preamplifier gain setting is selected for both the reference spectrum
and the sample spectrum.
For qualitative analysis, or quantitative analysis with normalization, it is
possible to use different gain settings for reference and sample spectra.

For complete instructions on installing, testing, and using a particular
sampling accessory, refer to the documentation supplied with that
sampling accessory.
6.3.3 Local
environment
c
For example, the spectrometer
should not be located near an
outside door, a fan, or a heat
source such as an oven.
6.4 Using sampling
accessories
C h a p t e r 6 T i p s o n Us i n g y o u r S p e c t r o me t e r
It is good practice to acquire a new background spectrum at least every two
hours of operation. Make sure the same resolution setting is used for both
the background spectrum and the sample spectrum. For quantitative analysis
without normalization, the same gain setting must be used for both
the background and the sample spectra.
A new background spectrum must be acquired every time the IR beam geometry
is changed, such as when a different sample accessory is used, or when
the position of the sample accessory is changed or realigned.
The background spectrum should be acquired using the same number of scans
(coaddition) as will be used for the sample spectrum. It is important to acquire
the background spectrum first by running the spectrometer with the cell, or
sample accessory, in place, but without the sample.
6.5 Background
(reference)
spectra
C H A P T E R 7
MAI NTENANCE
WARNING! Maintenance must be done by trained and qualified
personnel only.
WARNING! Laser replacement must be done by an ABB-trained Service
Engineer only.
Note: The replacement of consumables (other than the laser assembly) does not
require opening the spectrometer.
ABB Bomem recommends that an ABB Bomem trained Service Engineer
perform all servicing of the instrument. The spectrometer is permanently aligned
and should not require optical realignment during its life span. The following
items should be replaced periodically for preventive maintenance:
Item Expected life
Recommended
replacement frequency
Laser 4 years 2 years
NIR source (if installed)

1year 6 months
MIR source (if installed)

4 years 2 years
Desiccant module
(if spectrometer is not
purged)
Depends
on use
6 to 12 months
(3 months in very humid
environment)
Instruments use either a NIR (near infrared) or a MIR (mid infrared) source, or both.
To replace the desiccant module (standard model desiccant assembly
SPL6300G), proceed as follows:
1. Leave the spectrometer on. This will keep the internal optics warm and
gives added protection against humidity.
2. Unscrew the desiccant module (SPL6300G) on the side of the spectrometer
(see Figure 7-1 on page 36).
3. Remove the desiccant module and replace it with a new desiccant module
(SPL6300G).
7.1 Preventive
maintenance
schedule
7.2 Replacing the
desiccant module
S e c t i o n 7 . 3 R e p l a c i n g t h e i n t e r n a l s o u r c e
4. Install the new desiccant module.

Figure 7-1. Location of the SPL6300G desiccant module
The FTLA2000 Series Spectrometer uses different types of internal sources;
make sure you replace the source with the correct replacement model (usually
the same source model as was originally installed in the spectrometer). Contact
your ABB representative for information.
Attempting to install an incompatible source in your
spectrometer may damage both the source and the
spectrometer. It will also result in poor reproducibility.

To replace a standard near-IR internal source, refer to the document
Replacing the NIR Source in your FTLA2000 Series Laboratory
Spectrometer. This document is reproduced in Appendix C of this manual
on page 53.
To replace a standard mid-IR internal source, refer to the Appendix D.
The laser assembly must be replaced by authorized ABB service personnel.
Please contact your ABB representative.
7.3 Replacing the
internal source
7.4 Replacing
the laser
Desiccant module
C h a p t e r 7 Ma i n t e n a n c e
To replace the fuse:
1. Turn the power off and unplug the spectrometer.
2. Move the sliding fuse cover on the control panel to the left.
3. Remove the fuse by pulling out the black plastic handle.
4. Replace the fuse with one of the same type (please refer to Section 2.4 on
page 9 for fuse types).
5. Move the sliding fuse cover back to the right.
6. Plug in the spectrometer and turn the power on.
The surfaces of optical windows can sometimes accumulate dust, grease or other
contaminants, leading to noisy spectra and undesired absorption bands. In this
case, the windows should be cleaned or replaced.
Never touch the windows surfaces with bare hands.
Avoid exhaling near window surfaces.
Never remove the mirror or the mirror support that is under
the left (output beam) cover of the spectrometer.

WARNING! Cleaning optical elements may result in an exposure of
Class II laser radiation, do not stare into the beam or view
with optical instruments.
7.6.1.1 Cleaning the windows
If dust is on the window surfaces:
gently blow dry, oil-free instrumentation air or dry nitrogen across
the surface. Do not use a high-pressure jet.
7.5 Replacing
the fuse
7.6 Cleaning
or replacing
windows
7.6.1 Optical side port
windows
S e c t i o n 7 . 6 Cl e a n i n g o r r e p l a c i n g wi n d o ws
If grease or other contaminants are on the window surfaces:
windows replacement may be necessary. Optical side port window
surfaces should never be wiped.
7.6.1.2 Replacing the windows
For spectrometers with hygroscopic beamsplitter (FTLA2000-
100, FTLA2000-102, and FTLA2000-155), do not replace
windows if the relative humidity is higher than 50%.

Windows are optical components and should be handled with
care. Never touch their optical surfaces with bare hands. Hold
them by the rim.
1. Leave the spectrometer on.
2. Unscrew the four screws holding the window ring.
3. Remove the window assembly from the side plate.
4. Install the new window assembly on the side plate.
5. Tighten the four screws holding the window ring.
7.6.2.1 Cleaning the windows
If dust is on the window surfaces:
Gently blow dry, oil-free instrumentation air or dry nitrogen across
the surface. Do not use a high-pressure jet.
If grease or other contaminants are on the window surfaces (except for
KBr, KCl, and CsI windows):
Clean dirt off with a cotton or optical cloth, or laboratory wiping tissue,
wetted with methanol or acetone.
Make sure to dry off the excess liquid.
7.6.2 Other windows
C H A P T E R 8
TROUBLESHOOTI NG

WARNING! Opening the enclosure may result in exposure to laser
radiation and high voltages.
The enclosure is to be opened only by authorized ABB Inc.
Service Personnel.
Laser type: He-Ne
Laser class: 3B as per IEC-60825-1 and
Class IIIa as per 21 CFR 1040.10
Output power: 3.2 mW (maximum)
Wavelength: 632.8 nm
High voltages are present inside the enclosure. Always
proceed with care when the enclosure is open.
This chapter describes the main problems that may be encountered immediately
after applying power to the spectrometer or during its use.
The following table provides troubleshooting information for problems that may
be encountered after applying power to the FTLA2000 Series spectrometer:
Problem Possible cause Solution
POWER LED not lit Spectrometer not plugged in or
not turned on
Plug in spectrometer and turn on.

Fuse blown Replace the fuse.
(See Section 7.5 on page 37.)

Power outlet dead Test outlet.
LED sequence incorrect
(on start up)
Internal problem Contact ABB Inc.
DATA LED not flashing
(after start up)
Internal problem Contact ABB Inc.
8.1 After power-up
S e c t i o n 8 . 2 Du r i n g u s e
The following table provides troubleshooting information for problems that may
be encountered during use of the FTLA2000 Series spectrometer:
Problem Possible cause Solution
No signal Ethernet cable not properly
connected
FT-IR Ethernet Interface or
computer network adapter not
properly configured
Connect Ethernet cable and configure devices
as shown in the FT-IR Ethernet Interface and
External Ethernet Interface User's Guide.
Instrument not selected Make sure the correct instrument is selected in
the software.
Network problem Check with network administrator.
Detector saturation Reduce preamplifier gain.
Install a neutral density filter to attenuate
the beam.
Preamplifier / detector failure Check detector status.
Check preamplifier connections.
Contact ABB (see Section 8.3).
Noise only Source breaker switch is OFF
or tripped
Set source breaker switch to ON.
Source failure Replace the source (see Section 7.3).
Weak signal IR beam blocked Remove obstacle.
Preamplifier / detector
malfunction
Check detector status.
Check preamplifier connections.
Contact ABB (see Section 8.3).
Low S/N Electromagnetic interference Observe raw spectra.
Separate from interfering equipment.
Mechanical vibration Isolate or remove vibration source.
Dirty windows Clean or replace windows (see Section 7.6).
Strong, undesired water lines in
spectra (in the region of 1500 cm
-1
and 3700 cm
-1
)
Exhausted desiccant or purge
gas failure
Replace desiccant (see Section 7.2).
Check supply of purge gas
Abnormal spectra
(see Figure 8-1 and Figure 8-2)
Source contamination Replace the source (see Section 7.3).
If problem persists, inspect to determine source
of contamination.
Detector saturation Adjust preamplifier gain
8.2 During use
C h a p t e r 8 T r o u b l e s h o o t i n g

Figure 8-1. MIR spectra showing source contamination

Figure 8-2. MIR spectra showing detector saturation
Highly
contaminated
Normal
Contaminated
Normal
Saturated
Highly
saturated
S e c t i o n 8 . 2 Du r i n g u s e
This section provides examples of typical warning and error messages that may
be displayed on the computer when a hardware problem is encountered.
Note: The actual messages may be somewhat different than those shown here,
depending on the software program and operating system you are using.
8.2.1.1 On selecting a function in the Collect menu

Possible cause Solution
No instruments were detected by the Ethernet
software.
Make sure the FT-IR Ethernet Interface of the spectrometer and
the Ethernet network adapter in the computer are properly
configured.

Refer to the FT-IR Ethernet Interface and External
Ethernet Interface User's Guide.
8.2.1.2 After acquiring a spectrum

Warning Possible cause Solution
Warning: background file is
saturated
The detector was saturated
during acquisition of the
reference spectrum.
Reduce the preamplifier gain (refer to Section 3.4 on
page 19).
Install a neutral density filter to attenuate the beam
Optical saturation detected The detector was saturated
during acquisition of the
reference spectrum.
Reduce the preamplifier gain (refer to Section 3.4 on
page 19).
Install a neutral density filter to attenuate the beam
8.2.1.3 Other messages

Refer to the manuals and release notes for your software program.
8.2.1 Software
messages about
hardware
problems
If you are unable to solve a problem, contact ABB (see Customer support on
page iii). Please be prepared to give the serial numbers of all units.
Before contacting ABB, please check the following:

Power is applied to each device check the power outlet, the power
cable(s), and the fuse(s).
The spectrometer POWER LED is ON and the DATA LED is flashing
(see Section 3.3.1 on page 19).
The spectrometer source breaker switch (if present) is turned ON.
There is light coming from the spectrometer output(s) (unless an optical
filter is installed).
All cables are properly installed (refer to the installation guide).
All pertinent troubleshooting steps in this manual have been followed.
Note down the serial number of the spectrometer and of each
instrument and accessory.
Using Bomem-GRAMS, try to acquire a reference spectrum, and
a transmittance spectrum. Acquire both spectra open beam (i.e. with no
sample present).
Perform the BASIC test sequence in SpecTest.
Send the following to your ABB representative:
The serial numbers
The two spectra
The BASIC test report file
The name, phone number, and e-mail address of the person to
contact
Indicate if a modem and pcAnywhere are installed on the
computer
See note on next page.
8.3 Contacting ABB
S e c t i o n 8 . 4 E x a mp l e s o f n o r ma l s p e c t r a

Note: SpecTest stores the instrument test reports in the subdirectories
INSTALL, EXTENDED, and BASIC. Each instrument configuration has
a separate subdirectory CONFIGn, within which is a subdirectory for the
current month YYYY_MM. The instrument test report file is named
YYYY MM DD hh mm ss.QAL:
where n is the configuration number
YYYY is the year
MM is the month
DD is the day
hh is the hour
mm is the minute
ss is the second
For example, the instrument test report file for the BASIC test of
configuration 1 performed on May 8, 2000 at 11:23:45 AM is:
C:\SPECTEST\INSTALL\CONFIG1\2000_05\2000 05 08 11 23 45.QAL
Figure 8-3 and Figure 8-4 show typical examples of normal open-beam spectra
for both MIR and NIR spectrometry using different configurations.
8.4 Examples of
normal spectra
MIR NIR

Figure 8-3. Examples of normal open-beam spectra
S e c t i o n 8 . 4 E x a mp l e s o f n o r ma l s p e c t r a
MIR NIR

Figure 8-4. Examples of normal open-beam spectra
A P P E ND I X A
TECHNI CAL I NFORMATI ON
The following information includes specifications and performance statements
that may be in conflict with other ABB published literature, such as product
flyers and product catalogs. In case of conflicts between information given
below and specifications given in the ABB official flyers and product catalogs,
the later take precedence.
Specifications common to all models are given in the following tables.
All values are nominal.

Refer to the test report provided with your analyzer for validated spectral
specifications.

Rated line voltage: 100-120 VAC or 220-240 VAC
(manually selectable)
Rated frequency: 50-60 Hz
Rated input current: 1 A max.
Rated power consumption: 150 VA
Fuse type:
T2A/250V (115 V line)
T1A/250V (230 V line)
Installation category II

Enclosure: Sealed and desiccated aluminum cast
Overall dimensions (WDH): 20 in. 22.25 in. 12 in.
(50.8 cm 56.5 cm 30.4 cm)
Weight: 96 lb. (44 kg)

Operating temperature range: 0C to 30C, stable within 5C
Storage temperature range: -15C to 50C
Relative humidity:
FTLA2000-104, FTLA2000-154,
and FTLA2000-160
0% to 95% noncondensing
FTLA2000-100, FTLA2000-102,
and FTLA2000-155
0% to 50% noncondensing (operating)
0% to 35% noncondensing (nonoperating)
Pollution degree 2

A.1 Specifications
A.1.1 Electrical
A.1.2 Mechanical
A.1.3 Environmental
A p p e n d i x A T e c h n i c a l I n f o r ma t i o n
Resolution:

1 to 128 cm
-1
in steps of 2
(2 to 128 cm
-1
in steps of 2 for NIR analysis)

Scanning speed: 1cm/sec OPD (typical)
(Speed may vary depending on detector used and
factory spectrometer configuration.)
Purge: Dry, oil-free instrumentation air or nitrogen
5 L/min
ADC: 16-bit with built-in sample and hold,
100 kHz maximum sampling rate
Stabilization time: approximately 4 hours after power-up
(8 hours, e.g. overnight, if possible)

Principle: Patented Michelson-type with 2 corner-cube
retroreflectors mounted on wish-bone scan arm
Retroreflectors precision: 2-arc sec corner-cubes (FTLA2000-154,
FTLA2000-155, FTLA2000-160)
5-arc sec corner-cubes (FTLA2000-100,
FTLA2000-102, FTLA2000-104)
Internal reference: Embedded He-Ne Laser (Class 3B)

A.1.4 Spectrometer
A.1.5 Interferometer
I nst al l i ng Your FTLA2000 Ser i es
Labor at or y FT- I R Spect r omet er s Appendi x B
This guide shows how to install your FTLA2000 Series Laboratory FT-IR
spectrometer and connect it to a computer using the built-in FT-IR Ethernet
Interface. It assumes that the computer is supplied by ABB Inc., in which case
the software and the Ethernet network adapter are preinstalled in the computer.

If you are supplying your own computer, refer to the software manuals to
install the software. The computer must have an Ethernet network
adapter. If necessary, refer to its manual for installation instructions.
Make sure the site meets the requirements shown below.
Condition Requirements
Ambient
temperature
Maintained within 5C
Humidity Models FTLA2000-100, FTLA2000-102, and FTLA2000-155:
0% to 50% noncondensing (operating)
0% to 35% noncondensing (nonoperating)
Other models:
0 to 95% noncondensing
Vibration Some small-amplitude vibration in the supporting table can be
accepted.
Electrical power 100-120 VAC (60 Hz) or 220-240 VAC (50 Hz),
150 VA
Clean and constant power source, without glitches or failures
(no large electrical motors on the same circuit).
Purge gas
(if used)
Dry, oil-free instrumentation air or nitrogen
Flow rate: 5 L/min
Tubing: -in (supplied by the customer)

Before plugging in any equipment, make sure that each
individual component is properly configured for the available
line voltage.
On the spectrometer, the currently selected line voltage is visible on the voltage
configuration plate (behind the sliding fuse cover in Figure B-1 on page 50).
Purpose
This symbol refers you to
another manual.
Site preparation
Line voltage
configuration
All controls and connections, except for the preamplifier gain adjustment, are
located on the control panel (see Figure B-1).

Figure B-1. Control panel
For a network connection, connect the Ethernet connector of the
spectrometer to a network using the supplied straight-pinned Ethernet cable.
For a private (direct) connection between the spectrometer and computer,
use the supplied crossover cable (see Figure B-2).
Plug the spectrometer power cord into a suitable electrical outlet.

Figure B-2. Private connection between spectrometer and computer
Main controls
and connections
Many different private and
network connection scenarios
are possible. Refer to the FT-
IR Ethernet Interface and
External Ethernet Interface
User's Guide for complete
information.
Ethernet connector
Resolution switch
Status LEDs
Fuse and voltage
configuration plate
(behind sliding
fuse cover)
Power switch
1 or 2 Source
breaker-switches
Power connector
The FTLA2000 Series spectrometers are equipped with purge inlets. Purging is
recommended for spectrometers that have hygroscopic optical components
(models FTLA2000-100, FTLA2000-102, and FTLA2000-155) or if ambient
water vapour may interfere with measurements.
Install the female Swagelok connector (included with the spectrometer) and
a T-connector on your source of purge gas.
Connect the female Swagelok connector to the main purge inlet connector
on the spectrometer (see Figure B-3).
Connect the purge inlets for the Arid-Zone sample station as shown.
When using a purged sampling accessory, connect the middle purge inlet
as well.
The recommended purge flow rate into the spectrometer is 5 L/min. Once
the spectrometer is purged, a continuous flow rate of 1 L/min is normally
sufficient to maintain the purged condition.
When a purged sampling accessory is not being used, disconnect the tubing from
this inlet, and block the tubing to prevent purge gas from escaping.

Figure B-3. Purge inlet connectors
Purge gas
connections (if used)
Before using the spectrometer, read the safety information
presented in the FTLA2000 Series Laboratory FT-IR
Spectrometers Users Guide.
Turn the power ON for the spectrometer, the computer and monitor, and
peripheral components, where applicable.
Note: Leave the spectrometer ON at all times. This not only ensures thermal
stability, but also helps protect the spectrometer from humidity.
Immediately after turning on the FTLA2000 Series spectrometer, check that
the sequence of status LEDs on the control panel is as follows:
POWER ON
SCAN ON then OFF (it may take a few minutes to turn OFF)
ZPD ON then OFF (it may take a few minutes to turn OFF)
DATA Flashing ON and OFF (usually after a few minutes).
Note: During operation, the POWER LED should be ON and the DATA LED
should be flashing.

If you encounter problems after applying power to the spectrometer, refer
to Troubleshooting in the FTLA2000 Series Laboratory FT-IR
Spectrometers Users Guide.
If the computer is supplied by ABB, the equipment is preconfigured for a private
connection between the spectrometer and computer (see Figure B-2).

For any other type of connection, or if you are supplying your own
computer, refer to the FT-IR Ethernet Interface and External Ethernet
Interface User's Guide for configuration information.
Before using the spectrometer for quantitative analysis, or as part of an ABB
dedicated analyzer (e.g. PROTA), you must validate it.

Refer to the section entitled Validation in the FTLA2000 Series
Laboratory FT-IR Spectrometers Users Guide for information on the
validation tests required.
Safety
Start up
Ethernet
configuration
Validation
REPLACI NG THE NI R SOURCE
I N YOUR FTLA2000 SERI ES
LABORATORY FT- I R SPECTROMETER APPENDI X C
This guide shows how to replace the internal NIR (near infrared) source of your
FTLA2000 Series Spectrometer.

Before proceeding, read the safety information presented in
the FTLA2000 Series Laboratory FT-IR Spectrometers Users
Guide.
Do not replace the source while the source power is on;
damage to electronic components may occur.
Note: Replacement of the source does not require opening the spectrometer.
To remove an internal NIR source assembly, proceed as follows:
1. Turn the source and the spectrometer power off (see Figure C-1 below).
Unplug the spectrometer.
2. Make sure no accessories are attached to the spectrometer.
3. Carefully lift up the front end of the spectrometer (see Figure C-1 below)
and place it on its heat sink (see Figure C-2 below).

Figure C-1. FTLA2000 spectrometer Figure C-2. Spectrometer resting on its heat sink
Purpose
Safety
Removing
the NIR source
Power and
source
switches
Source
assembly
support plate
Heat sink
Repl aci ng t he NI R Sour ce
i n Your FTLA2000 Ser i es
Labor at or y FT- I R Spect r omet er Appendi x C
4. Remove the source assembly holding screws located under the rear heat
sink portion of the spectrometer (see Figure C-3 below). Lift the source
assembly slightly out of the spectrometer.

Figure C-3. Bottom of source assembly
Remove only the four screws located toward the outside of
the support plate.
d
The screws located near the center of
the plate are used for the alignment of the source.
5. Loosen the two screws that fasten the electrical leads of the source assembly
(see Figure C-4 on page 55) and disconnect the two leads.
6. Unscrew the screws that hold down the shield on the source assembly
(see Figure C-4 on page 55). Remove the shield from the source assembly.
d
The source assembly comes
prealigned on its circular
support plate. However, fine-
tuning of the source is
required after installation.
To minimize the adjustment
required, do not move
the alignment screws until you
are ready to align the source.
Source assembly
holding screws (4)
Source
alignment
screws (4)
Support plate

Figure C-4. Removing the source assembly
7. Remove the NIR bulb from its socket. The bulb is held by two clips
(see Figure C-5 below).

Figure C-5. NIR bulb on the source assembly
Electrical lead
fastening
screws (2)
Shield holding screws (2)
Shield
Electrical leads (2)
NIR source bulb
Source holding clips (2)
To replace the internal NIR source, proceed as follows:
1. Insert a new NIR bulb in its socket (see Figure C-5 on page 55).
Do not touch the NIR bulb with your fingers as this shortens
the life span of the source.
2. Replace the shield on the source assembly. Tighten the screws that hold
down the shield on the source assembly (see Figure C-4 on page 55).
3. Connect the two electrical leads from the source assembly (see Figure C-4
on page 55) and tighten the two fastening screws.
4. Replace the source assembly support plate and tighten the screws that hold
it on the spectrometer (see Figure C-3 on page 54).
5. Move the spectrometer back on its feet but keep the source adjustment
screws accessible by having the spectrometer heat sink hang over the edge
of the table.
6. Plug in the spectrometer. Turn the spectrometer and the source on.
To align the NIR source, proceed as follows:
1. Insert the target
e
that comes with the NIR source assembly into the sample
holder of the spectrometer. The back side of the target has a countersink.
Make sure the front side of the target is facing the incoming visible beam
(see Figure C-6 on page 57).
2. Using the alignment screws on the NIR source assembly (see Figure C-3 on
page 54), move the image of the filament to the center of the pinhole. Make
sure the image is focused on the target (if not focused properly, the image
will be distorted and slanted to the left or right). Refer to Figure C-6 on
page 57.
Replacing
the NIR source
Aligning
the NIR source
e
The target (ABB part
number SPG5303G) is
a pinhole centered on a thin
plate.

Figure C-6. Aligning the NIR source (with enlargement of the target)
3. Once the NIR source is aligned, make sure the alignment screws are tight.
Check that the image has not moved and remove the target from the sample
holder of the spectrometer (see Figure C-6 above).
Validate the spectrometer and/or the application.

Refer to the Validation section of the FTLA2000 Series Laboratory FT-
IR Spectrometers Users Guide, and to your Operation Qualification
procedure.

Validation
Target
Repl aci ng t he MI R sour ce
I N YOUR FTLA2000 SERI ES
LABORATORY FT- I R SPECTROMETER APPENDI X D
Repl aci ng t he MI R Sour ce
This appendix shows how to replace the internal MIR (mid infrared) source of
your FTLA2000 Series Spectrometer.

Before proceeding, read the safety information presented in
the FTLA2000 Series Laboratory FT-IR Spectrometers Users
Guide.
Do not replace the source while the source power is on;
damage to electronic components may occur.
Note: Replacement of the source does not require opening the spectrometer.
To remove an internal MIR source assembly and install a new one, proceed as
follows:
1. Turn the source and the spectrometer power off (see Figure D-1 below
Figure D-1 below). Unplug the spectrometer.
2. Make sure no accessories are attached to the spectrometer.
3. Carefully lift up the front end of the spectrometer (see Figure D-1 below)
and place it on its heat sink (see Figure D-2 below).

Figure D-1. FTLA2000 spectrometer Figure D-2. Spectrometer resting on its heat sink
D.1 Purpose
D.2 Safety
D.3 Removing
the MIR source
Power and
source
switches
Source
assembly
support plate
Heat sink
Labor at or y FT- I R Spect r omet er Appendi x D
4. Remove the source assembly holding screws located under the rear heat
sink portion of the spectrometer (see Figure D-3 below). Lift the source
assembly slightly out of the spectrometer.

Figure D-3. Bottom of source assembly
Remove only the four screws located toward the outside of
the support plate.
f
The screws located near the center of
the plate are used for the alignment of the source.
5. Loosen the two screws that fasten the electrical leads of the source assembly
(see Figure D-4 below) and disconnect the two leads.

Figure D-4. Removing the source assembly
To install a new source and adjust the source voltage, proceed as follows:
1. Connect the new source assembly and a voltmeter as shown in Figure D-5
on page 61.
f
The source assembly comes
prealigned on its circular
support plate.
D.4 Replacing
the MIR source
Electrical lead
fastening
screws (2)
Source assembly
holding screws (4)
Source
alignment
screws (4)
Support plate
Do not touch the MIR source filament with your fingers as this
shortens the life span of the source.

Figure D-5. MIR source voltage adjustment
Note: The electrical power applied to the source should be
13.0 W + 0.1 W.
Since the impedance varies from one source to another, a mark on
the circular plate holding the source assembly indicates the voltage
to apply to the source (typically 12.5 VDC).
2. Remove the source adjustment access plug to access the source power
adjustment. The access plug is located on the right side of the bottom
casting, near the control panel (see Figure D-6 on page 62).

Figure D-6. Location of source adjustment access plug
3. Plug in the spectrometer. Turn the source and the spectrometer power on.
4. Adjust the voltage to the level indicated on the packing of the new source
assembly.
Note: To adjust the voltage, adjust the potentiometer using a Trimpot
alignment tool or a small flat-head screwdriver inserted through
the adjustment hole. The potentiometer is hard to see through
the adjustment hole. A flashlight may be required to locate it.
5. Replace the source adjustment access plug.
6. Turn the source and the spectrometer power off. Unplug the spectrometer.
7. Disconnect the voltmeter.
8. Make sure the circular plate is clean. Replace the circular plate and tighten
the screws that hold it on the spectrometer (see Figure D-3 on page 60).
9. Move the spectrometer back on its feet.
10. Plug in the spectrometer. Turn the source and the spectrometer power on.
Validate the spectrometer and/or the application.

Refer to the Validation section of the FTLA2000 Series Laboratory FT-
IR Spectrometers Users Guide, and to your Operation Qualification
procedure.
D.5 Validation
Source adjustment
access plug
(remove to adjust
source power)
A P P E ND I X E
GLOSSARY
Note: The following terms are defined as they are used in ABB manuals.
absorbance (also called optical density or extinction)
A measure of the amount of light absorbed as it passes through a sample.
The absorbance A is the logarithm of the ratio of the intensity I
0
of the light
striking the sample to the intensity I of the light which passes through
the sample.
T I
I
A
1
log log
10
0
10
= =

The absorbance is equal to the logarithm of the reciprocal of
the transmittance T.
absorbance spectrum
The absorbance of a sample as a function of the frequency or wavelength
over a given spectral range.
The absorbance spectrum is calculated point-by-point from the sample and
reference spectra as follows:
=
reference
sample
Absorbance
10
log

ADC
Analog-to-digital converter
agreement
The error between the analyzer result and the result obtained with a
laboratory primary method. This is often expressed as accuracy.
analyzer
A complete system for FT-IR or FT-NIR analysis (see Figure E-1).
A p p e n d i x E Gl o s s a r y

Analyzer
Spectrometer
Source
Interferometer
modulates light from source
Detector
converts modulated light to electrical
signal after it passes through the sample
is in spectrometer or sampling accessory
Analyzer software
performs FFT calculation, analysis of
spectra, reporting, data archiving, etc.
may control the sampling system(s)
Sampling system (if required)
brings a sample of the process to the
sampling accessory
may include valves, filters, pumps, etc.,
controlled by the software
Sampling accessory
allows modulated light beam to interact
with the sample
is mounted on spectrometer or linked
by fiber-optic cable
Laser
provides precise, stable reference
for interferometer

Figure E-1. Analyzer
background spectrum (see reference spectrum)
beamsplitter
A semi-reflecting mirror in the interferometer used to divide the radiation
from the infrared source into two beams, and to recombine the two beams
into a single beam.
Beer-Lamberts law
An equation relating the absorption of light by a sample to the absorption
coefficient of the sample, the path length, and the concentration.
A
b C
where A
is the samples absorbance value at a specific wavelength ()

is the absorption coefficient of the material at that wavelength

(mol
-1
cm
-1
).
b is the path length through the sample (cm)
C is the concentration of the analyte (mol
-1
)
BK7
A high quality optical glass.
BK7 is not hygroscopic. Its refractive index is 1.50 at 8000 cm
-1
. Its spectral
range is from 25000 cm
-1
to 3700 cm
-1
.
blank sample
A sample that does not absorb infrared radiation within the spectral range
where the measurement is performed.
calibration
The process of aligning analyzer measurements to agree with reference
measurements obtained using a primary method.
calibration (or model or calibration model)
The set of equations that represents the relationship between the absorbance
spectra of a set of samples and the properties of the samples.
Some common types of models are peak height, peak ratio, PLS and
autosubtract models.
calibration set (or training set)
In spectrometer calibration, a set of standard samples used in calibration
model development. The calibration set covers the expected ranges of
property values, as well as any other variations that may affect the spectra,
such as temperature. When there is more than one property, the calibration
set must include independent variations of each property.
CAN (Controller Area Network)
CAN (Controller Area Network) is a local serial bus system especially
suited to interconnect smart devices such as sensors and actuators in
automated equipment.
CAN is used in ABB analyzers for distributed I/O. This is used for
controlling sampling system valves, accepting inputs from external sensors,
and for sending analysis results to control systems (4-20 mA current loop
analog outputs and open/close digital outputs).
CANopen
A network protocol that allows direct peer-to-peer data exchange between
nodes on a CAN network (CANbus).
channel
An optical channel on the spectrometer. Each channel is associated with one
sample accessory and one detector. Some spectrometers have only one
channel. This is typical of laboratory instruments.
Some spectrometers have multiple channels. This allows one instrument to
analyze several streams simultaneously.
If the sampling system is set up for stream switching, one channel can be
used to analyze two or more streams. In most cases, however, there is only
one stream (i.e. one sampling point) per channel.
channel spectrum
A spectral artifact caused by reflections in the gap between two optical
surfaces, for example, between parallel window surfaces or at the coupling
point between optical fiber ends. Also called Fabry-Perot interference.
To avoid channel spectrum in transmission cells with a small optical
pathlength, a wedge in the sample path is used to prevent parallelism of the
two windows.
coadded spectrum
The spectrum resulting from averaging, on a point-by-point basis, a number
of spectra or interferograms. Coaddition is used to increase the signal-to-
noise ratio of a spectrum.
DCS
Distributed control system, a system in which the control process is divided
between two or more units.
desiccant
A substance used as a drying agent.
detector
A device in a spectrometer that produces an electrical signal that is
proportional to the intensity of the light striking it.
detector cut-off
The frequency or wavelength at lower end of the spectral range.
detector saturation
A condition of the detector whereby an increase in the light intensity
striking it no longer produces a linearly proportional change in the output
signal. This is a nonlinear condition and can cause Fourier stray light.
D-star (D*)
A value used to designate the specific detectivity. This is a performance
measure independent of detector size. The higher is the D* value, the better
is the detector.
D ) f A ( * D
2
1
=
where A is the sensitive area
f is the bandwidth frequencies
D is the reciprocal of noise equivalent power (NEP)
factor
In analysis using the PLS algorithm, one of a series of synthetic spectra
which represent the most common variations in a given set of spectra
(also known as latent vectors, characteristic vectors, spectral loadings,
loading vectors, principal components, or variation spectra.).
Fast Fourier transform (FFT)
A mathematical algorithm for efficient calculation of the Fourier transform.
Fourier transform
A mathematical function that transforms the time-dependent information
contained in the interferogram into the corresponding optical spectrum.
F-ratio
An indicator of spectral residual after modeling that can help detect whether
an abnormal condition has occurred during analysis. The F-ratio should
normally be low (typically less than 10, depending on the application). An
F-ratio higher than average may indicate that the wrong material is being
analyzed or that there is a problem with the system.
FT-IR (or FTIR)
Fourier transform infrared.
FT-MIR
Fourier transform mid-infrared.
FT-NIR
Fourier transform near-infrared.
grab sample
A sample extracted from the process at the precise time that a spectrum is
recorded. Laboratory analysis of the grab sample using a primary method is
used to validate or improve the analyzer calibration.
hygroscopic
Able to absorb moisture from the atmosphere.
hygroscopic optical component
An optical component made of hygroscopic material. Such optical
components can be damaged if exposed to humidity because they can
absorb moisture from the atmosphere.
infrared
A region of the electromagnetic spectrum between visible light and radio
waves where the wavelengths are longer than those of red light.
initial (or first) reference (or zero)
The first reference spectrum collected when the system was commissioned.
This is used as a base to monitor changes in the analyzer response over time.
Installation Qualification (IQ)
A procedure used to ensure that an instrument has been correctly installed.
interferogram
A representation of the electrical signal from the detector of a FT-IR
spectrometer. The interferogram is a graph of the voltage at the output of
the detector as a function of the position of interferometer scan mechanism.
The spectrum is calculated from the interferogram using a Fourier transform.
interferometer
The device in an FT-IR spectrometer that modulates the infrared beam
coming from the source.
The interferometer splits the infrared beam into two beams, introduces
a continuously varying optical path difference (OPD) between the two
beams, and recombines the beams. When the beams are recombined,
interference caused by the OPD modulates the beam.
least-squares regression
A regression procedure used to establish a parameter value derived from
multiple absorbance values such that the sum of the squares of
the differences between the model absorbances and the actual absorbances
is minimized.
MODBUS

A protocol widely used to establish master-slave communication between
intelligent devices. A MODBUS message sent from a master to a slave
contains the address of the slave, the command, the data, and a check sum.
The MODBUS protocol is independent of the underlying physical layer. It
is traditionally implemented using RS232, RS422, or RS485 serial link over
a variety of media (e.g. wire pair, fiber, radio, etc.). MODBUS TCP/IP uses
TCP/IP and Ethernet to carry the MODBUS messages.
model (see calibration model)
ModV
A proprietary protocol for communication with Dow DCS systems over a
serial link.
NEMA
National Electrical Manufacturers Association
nonlinearity
A deviation from the normally linear relation between the output and
the input of a device. Nonlinearity occurs when the output of a device does
not vary in direct proportion to the input, for example, when saturation
occurs.
OPC (OLE for Process Control)
OPC, or OLE (Object Linking and Embedding) for Process Control, is a
software standard for connecting Windows-based process control
applications to industrial programmable controllers and control systems.
Devices use OPC to exchange digital, analog, and text data.
OPC is based on Microsofts COM (Component Object Model) technology,
which defines how individual software components can interact and share
data under Windows.
open beam
A condition in which there is no sample in the sample accessory.
open-beam spectrum
A spectrum acquired in the open-beam condition.
Operation Qualification (OQ)
A test procedure used to ensure that an instrument is operating within
specifications.
optical density (see absorbance)
outlier (or outlier sample)
A sample in a set of samples for which a predicted property value or
spectral structure lies significantly outside the main cluster of
the corresponding property values or structures for that set.
Outliers can be caused by several different factors including unexpected
variations in the property value, inconsistent sample handling, or changes in
the performance of the instrument.
path length
The distance that light travels through the sample during analysis.
PLC
Programmable logic controller.
predict
In spectroscopy, to obtain the value for a specific property of a sample from
its spectrum by using one or more calibration models.
prediction
In spectroscopy, the value obtained from predicting a property.
preprocessing
Mathematical treatment applied to a spectrum before the calibration model
is applied to it. There are a number of standard preprocessing algorithms
commonly used in spectroscopy.
primary method
The accepted standard laboratory technique for measuring the properties of
samples. When developing a calibration model, the known property
values of the training set samples are determined by measurement using
the primary method.
property
A single, measurable characteristic of a sample, whether it be a physical
property such as temperature or a chemical property such as concentration.
raw spectrum
1. A spectrum that has not undergone any mathematical alterations.
2. A single-beam spectrum.
reference spectrum (also called background spectrum or zero spectrum)
A single-beam spectrum that only contains information about the analyzer,
including the sample accessory and the air present in any part of
the modulated beam optical path. This is required in order to obtain
a transmittance or absorbance spectrum of the sample.
A reference spectrum is obtained by removing the sample from the sample
accessory or by filling the sample accessory with a blank sample and
acquiring a spectrum.
repeatability
The precision of repeated measurements on the same instrument.
reproducibility
The precision of repeated measurements on different instruments.
resolution
The smallest frequency interval that can be distinguished over a spectral
range. The lower the resolution setting on the spectrometer, the more data
points there are in the spectrum.
Lowering the resolution setting on the spectrometer yields spectra with
a higher resolution, since there are more data points covering the same
spectral range.
sample accessory
A device that permits interaction of the modulated light beam from
the spectrometer with the sample, for the purpose of obtaining
a transmittance, absorbance, or reflectance spectrum of the sample.
Flow-through sample cells and immersion probes are commonly used
sample accessories.
sampling point
A sampling point is a point in a process stream where the material in the
process (the sample) is analyzed (see Channel).
sampling system
A system used to direct a sample from a process stream to the sample
accessory. The sampling system may include software-controlled valves,
pumps, and other devices.
saturation (see detector saturation)
scan
With the ABB FT-IR spectrometers, a forward and a reverse sweep of the
interferometer scan mechanism.
A single scan results in two interferograms, one for the forward sweep and
one for the reverse sweep (see Coadded spectrum).
sequence
In Enablir, a sequence defines the order in which streams are analyzed.
Although a number of different sequences can be defined, only one
sequence can run at a time.
single-beam spectrum
The spectrum that results from performing a Fourier transform on
the interferogram obtained from a spectrometer.
The single-beam spectrum contains information not only about any sample
present in the sample compartment or sample accessory, but also about the
instrument (the source, all the optical components, the ambient air, as well
as any contamination there may be in the optical path).
spectral range
The range of frequencies (or wavelengths) over which the amplitude of
a spectrum is above the acceptable noise level. It is application dependent.
spectrometer
An instrument for producing a spectrum and measuring the wavelengths,
energies, etc. involved.
An FT-IR spectrometer has a photoelectric detector and produces
a spectrum that shows how the transmittance, absorbance, or reflectance of
the sample varies with wavelength. Such instruments are also called
spectrophotometers.
spectrum
1. A range of electromagnetic energies arrayed in order of increasing or
decreasing wavelength.
2. A distribution of transmission or absorbance levels over a range of
wavelengths, arrayed in order of increasing or decreasing wavelength.
stray light
1. Apparent optical energy, caused by nonlinearity, in a spectral region where
no energy is expected (Fourier stray light).
2. Modulated light reaching the detector without having passed through the
sample.
stream
A current or flow of material in a process. A stream is analyzed using a
sample accessory, typically a flow-through sample cell, connected to the
analyzer. One sample cell is used for each analyzed stream unless the
sampling system is set up for stream switching.
training set (see calibration set)
transmittance
A measure of the amount of light that passes through the sample, often
expressed as a percentage.
The transmittance T is the ratio of the intensity I of the light which passes
through the sample to the intensity I
0
of the light striking the sample.
T T
I
I
T 100 %
0
= =

transmittance spectrum
The percent transmittance of a sample as a function of the frequency or
wavelength over a given spectral range.
The transmittance spectrum is calculated point-by-point from the sample
and reference spectra as follows:
100 =
reference
sample
ance %Transmitt

trigger
A trigger represents a signal (usually a digital input) used to activate
operations in Enablir. When a trigger is switched from off (0) to on (1), the
associated action is performed. Examples of triggers are an external signal
from a DCS or other device, a software parameter whose value can be
changed by the user, and a timer.
validation
Tests used to establish that an analyzer is operating correctly (instrument
validation) and is providing results within the expected degree of agreement
(calibration validation). Validation can include diagnostics on the reference
and sample spectra and predictions with known samples.
validation set
In spectrometer calibration, a set of standard samples similar to a training
set but used to validate a calibration model.
VistaNET
A Windows-based local area network that supports data interchange
between process analyzers and DCSs (distributed control systems).
wavelength
The distance () between successive points of equal phase in a wave.
In FT-IR spectrometry, wavelength is usually expressed in micrometers
(m) or nanometers (nm).
wavenumber
The number () of cycles of a wave in unit length. The wavenumber is
the reciprocal of the wavelength:
=
1

The unit of the wavenumber is
1
cm
or cm
-1
.
zero spectrum (see reference spectrum)
ZPD (Zero Path Difference)
The point where the scan mechanism of a Michelson interferometer is
positioned so that the two beams from the beamsplitter travel exactly
the same distance before being recombined.

AP P E N D I X F
FTLA2000 Series Laboratory FT-IR Spectrometers Users Guide
I NDEX
A
accessories
sampling.........................................2
acquisition software ........................1, 7
ADC..................................................54
air humidity.........................................3
Align .................................................23
alignment ..........................................23
analysis
qualitative ...................................29
quantitative............................... 2, 29
Arid-Zone...................................... 2, 21
and near-IR analyses ......................3
industry-standard accessories
compatibility..............................3
sample station.................................2
B
background spectrum........................25
Bag Samplir ........................................7
beam
IR 5
C
carbon dioxide...................................33
in ambient air ...............................32
CO
2
in ambient air ..............................3
coaddition..........................................35
computer
minimum configuration..................7
PC...................................................1
contamination....................................45
control panel .....................................67
D
data acquisition ..................... 23, 25, 26
data cable ..........................................44
desiccant................................ 31, 32, 45
module....................................37, 38
detector
saturation..................................6, 20
detector saturation
avoiding...................... 20, 34, 44, 47
example ..................................24, 46
using a neutral density filter .........20
dimensions (overall)..........................53
documentation.............................2, 6, 7
dry air generator ................................32
E
error message ....................................46
F
flammable gases................................16
flip mirror............................................5
frequency validation..........................29
fumes.................................................16
fuse........................................ 16, 39, 43
H
H
2
O in ambient air ..............................3
humidity............................................32
and purging ....................................3
relative..........................................40
hygroscopic components...............3, 31
I
input current ......................................53
instrumentation air .................. 3, 40, 41
interferogram.....................................33
amplitude......................................23
L
laser
A p p e n d i x F I n d e x
assembly...................................... 39
radiation....................................... 43
LED
DATA LED................................. 44
POWER LED.............................. 43
sequence ...................................... 44
line voltage ................................... 7, 53
M
main controls and connections.......... 17
MB Series
description ..................................... 1
models .............................................. 29
moisture.............................................. 9
N
neutral density filter.......................... 20
nitrogen (dry).......................... 3, 40, 41
noise ................................................. 34
from vibration.............................. 34
number of scans........................... 33
signal averaging time................... 33
O
open beam.................................. 23, 48
open-beam spectra.................24, 25, 49
optical misalignment ........................ 34
optical saturation
avoiding................................. 44, 47
optical side port .............................. 5, 6
P
performance validation..................... 29
polystyrene sample ..................... 25, 26
Powder Samplir.................................. 7
power connections.............................. 9
preamplifier gain
sampling accessory................ 20, 34
setting .......................................... 21
precautions ........................... 15, 16, 31
purge....................................... 3, 31, 57
flow rate................................... 3, 57
inlets .............................................. 3
over-pressurization ........................ 3
specifications ............................... 54
purge gas
instrumentation air................. 31, 32
nitrogen.................................. 31, 32
purging
using dry nitrogen.............. 3, 40, 41
using instrumentation air ... 3, 40, 41
R
random
error ............................................. 33
fluctuations .................................. 33
reference spectrum
acquiring regularly....................... 35
replacement
laser ............................................. 37
resolution.......................................... 54
checking the signal ...................... 23
using same for reference and sample
spectra..................................... 19
rotary switch..................................... 20
S
safety ................................................ 43
sample holder ....................... 23, 25, 26
sampling accessories .......................... 2
available from ABB....................... 7
industry-standard ........................... 7
information on using.................... 35
sampling area.................................... 23
scans
number of............................... 33, 35
A p p e n d i x F I n d e x
variation of the temperature during
.................................................33
shock hazard .....................................16
signal averaging ................................33
signal averaging time ........................33
signal-noise ratio...............................45
software
acquisition program......................23
source
breaker.................................... 19, 44
external.......................................5, 6
infrared.........................................19
mid-IR..........................................39
near-IR................................... 37, 38
temperature stabilization ..............31
turning on and off................... 19, 31
spectral quality..................................29
spectrometer
protection from humidity ....... 22, 31
purge ............................................54
resolution......................................54
scanning speed .............................54
stabilization time ..........................54
thermal stability............................31
spectrum
distorted........................................34
speed (scanning)................................54
stabilization time...............................54
start up
problems................................. 43, 44
T
temperature .......................................34
operating range.............................53
storage range ................................53
variation of during the scan..........33
transferability..............................29, 30
transmittance spectrum................23, 26
V
validation tests ............................29, 30
Vial Holder..........................................7
vibration............................................34
isolators........................................34
source of noise..............................34
W
water lines .........................................45
water vapour compensation.................2
window
surfaces ............................ 39, 40, 41
windows
hygroscopic ..................................32
Z
ZPD...................................................19

ABB
ABB Inc.
Qubec, QC G1K 9H4
CANADA
Phone: 418-877-2944
North America: 800-858-3847
France: 0810 020 000
E-mail: ftir@ca.abb.com
www.abb.com/analytical
Printed in Canada

Manual FTLA2000 PDF

Hochgeladen von

Dokumentinformationen

Originalbeschreibung:

Originaltitel

Copyright

Verfügbare Formate

Dieses Dokument teilen

Dokument teilen oder einbetten

Freigabeoptionen

Stufen Sie dieses Dokument als nützlich ein?

Sind diese Inhalte unangemessen?

Copyright:

Verfügbare Formate

Manual FTLA2000 PDF

Hochgeladen von

Copyright:

Verfügbare Formate

FTLA2000 Series Laboratory FT-IR Spectrometers

NT. ABB can supply the FTLA2000 Series spectrometers with or

is the samples absorbance value at a specific wavelength ()

is the absorption coefficient of the material at that wavelength

Das könnte Ihnen auch gefallen