Beruflich Dokumente
Kultur Dokumente
Abstract
The influences of different Cr content to lead (Sn)Zn solder were investigated. Sn9ZnxCr shows finer and more uniform microstructure
than Sn9Zn. Thermal gravimetric analysis (TGA) and Auger electron spectroscopy (AES) results show that adding Cr significantly improves
the oxidation resistance of Sn9Zn solder, and reduces the thickness of oxidation film of Sn9ZnxCr solder. When Cr content is 0.1%, the
Sn9Zn0.1Cr solder have the best oxidation resistance. In addition, the effect of Cr addition on the wettability, melting point and mechanical
properties of Sn9Zn solder was discussed.
2007 Elsevier B.V. All rights reserved.
Keywords: Oxidation; Microstructure; Mechanical properties
1. Introduction
Leadtin (SnPb) solders are being widely employed in the
microelectronics industry due to their superior wetting properties, moderate melting temperatures and low-cost. However,
it has been pointed out that lead is harmful to human health
because it pollutes groundwater and causes lead poisoning [14].
Due to environmental and health concerns, efforts in replacing
conventional SnPb eutectic solder with lead-free alternatives
have begun [27]. Considering performance, reliability, cost
and resource, the SnAg and SnZn alloys have received the
most attentions. Compared with SnAg solder, SnZn solder
has many advantages, such as low melting point (198 C), adequate mechanical strength, low-cost and abundant supply, so it
has a bright development prospect and a great market potential
[813]; but because the Zn element is quite active, SnZn solder
is easy oxidation, poor wetting, and dross formation [1416]. It
is no doubt that the key issue is improving the oxidation resistance of SnZn solder. Recent researches [17] have shown that
oxidation is the major factor in poor wetting during soldering
to electrodes. In wave soldering process, oxidation will cause
excessive dross formation, it does not only waste solder, but also
causes solderability problem, which worsens reliability of solder
0925-8388/$ see front matter 2007 Elsevier B.V. All rights reserved.
doi:10.1016/j.jallcom.2007.05.087
479
Table 1
Chemical compositions of alloys used in this study (wt%)
Alloy
Zn
Cr
Sn
Sn9Zn
Sn9Zn0.05Cr
Sn9Zn0.1Cr
Sn9Zn0.3Cr
8.78
8.72
7.93
8.34
0
0.042
0.13
0.24
Bal.
Bal.
Bal.
Bal.
Fig. 1. Schematic illustration of sample for tensile test.
2. Experiment
Sn9ZnxCr alloys with x = 0, 0.05, 0.1, and 0.3, respectively,
were prepared from the pure metals (>99.99 wt%). The alloys
were melted within quartz tubes under nitrogen atmosphere, by
homogenizing and repeatedly shaking at 800 C over 8 h. During
this process, KCl/LiCl eutectic mixture served as a barrier layer
for oxidation. The compositions of alloys were investigated by
inductively-coupled plasma emission spectrometer (ICP-AES).
The chemical compositions of the alloys used in this study are
listed in Table 1.
Oxidation resistance of the alloys was investigated by thermal
gravimetric analysis (TGA), and brightness of surface compared
with each other after being oxidized at 250 C for different time.
Composition of the surface layers of different alloys were investigated by Auger electron spectroscopy (AES) after oxidation
at 250 C. Alloy microstructures were investigated using scanning electron microscopy (SEM). The spreading experiment was
carried out according to Chinas National Standard GB1136489 [25], the solder spheres were placed on Cu substrates and
the solderCu couples were heated at 250 C for 90 s. The
spreading areas were calculated by software, and the results are
average values from three measurements. The solidus and liquidus temperatures of the alloys were investigated by differential
scanning calorimetry (DSC). The tensile experiment was carried out according to Chinas National Standard GB/228-2002
[26]. Alloys with varying degrees of Cr content were machined
Table 2
Brightness distinction of alloys with different Cr content after heating at 250 C
Alloy
Heating time
Before
Sn9Zn
0.05
Sn9ZnCr
Cr content (wt%)
0.1
0.3
1h
2h
3h
480
Fig. 3. AES results of (a) Sn9Zn, (b) Sn9Zn0.05Cr, (c) Sn9Zn0.1Cr, and (d) Sn9Zn0.3Cr alloys.
3.3. Microstructure
Fig. 5 shows the SEM photographs of all specimens. Sn9Zn
alloy exhibits coarse dendrite structure and large and long rod or
needle-like Zn-rich precipitates [27]. While the microstructure
of Sn9ZnxCr alloys, which is dispersed rod or needle-like or
particle ZnCrrich phase in the -Sn matrix, is much finer and
481
Fig. 5. Microstructure of (a) Sn9Zn, (b) Sn9Zn0.05Cr, (c) Sn9Zn0.1Cr, and (d) Sn9Zn0.3Cr alloys.
Alloy
Solidus ( C)
Liquidus ( C)
Melting range ( C)
Sn9Zn
Sn9Zn0.05Cr
Sn9Zn0.1Cr
Sn9Zn0.3Cr
198.18
198.10
198.26
198.04
202.69
202.70
202.75
202.54
4.51
4.60
4.49
4.50
482
Fig. 8. Subsurface layer of (a) Sn9Zn0.05Cr, (b) Sn9Zn0.1Cr, (c) and (d) Sn9Zn0.3Cr alloys.
483
5. Conclusion
The addition of Cr makes Sn9ZnxCr alloy form finer
microstructure than Sn9Zn alloy. Segregation of Cr in the subsurface layer of Sn9ZnxCr alloy can prevent further oxidation.
Sn9Zn0.1Cr alloy has the best oxidation resistance, while
Sn9Zn0.3Cr has the worst. We suppose that chromium-poor
zone and bad continuity of the solder, which caused by some
proportion of Cr addition precipitates as a third phase SnZnCr,
leads to lower oxidation resistance of Sn9Zn0.3Cr alloy. Small
addition of Cr has little influence on the wettability and thermal
properties of Sn9Zn alloy. Sn9ZnxCr alloy exhibits better
plasticity than Sn9Zn alloy.
Acknowledgments
This work is sponsored by Shanghai nano technology promotion center (Contact No. 05nm05043) and Shanghai pujiang
program (Contact No.05PJ14065). We thank the Instrumental
Analysis Center of Shanghai Jiaotong University, for the use of
the AES, SEM and ICP equipment.
References
[1] D.Q. Yu, H.P. Xie, L. Wang, J. Alloys Compd. 385 (2004) 119125.
[2] T. Ichitsubo, E. Matsubara, K. Fujiwara, M. Yamaguchi, H. Irie, S. Kumanoto, T. Anada, J. Alloys Compd. 392 (2005) 200205.
[3] S.K. Kang, J. Electron. Mater. 23 (1994) 701707.
[4] M. Miyaki, M. Kanai, S. Ogata, Soldering properties for lead-free. solders
of SnAgCu system solders, in: Proceedings of the third IEMT/IMC.
Symposium (International Electronic Manufacturing Symposium and the
International Microelectronics Conference), Omiya, Japan, 1999, pp.
125130.
[5] J.H. Vincent, G. Humpston, GEC-J. Res. 11 (1994) 7689.
[6] J.S. Hwang, Environment-Friendly Electronics: Lead-Free Technology,
Electrochemical Publications, New York, USA, 2001.
[7] A. Forsten, H. Steen, I. Wilding, J. Friedrich, Solder. Surf. Mt. Tech. 12
(2000) 2934.
[8] H. Mavoori, J. Chin, S. Vaynman, B. Moran, L. Keer, M. Fine, J. Electron.
Mater. 26 (1997) 783790.
[9] M. McCormack, S. Jin, G.W. Kammlott, 1995 IEEE International Symposium on Electronics and the Environment, ISEE, Orlando, FL, USA May
13, 1995, pp. 171176.
[10] K. Suganuma, Curr. Opin. Solid St. M. 5 (2001) 5564.
[11] M. Abtew, G. Selvaduray, Mater. Sci. Eng., R. 27 (2000) 95141.
[12] E.P. Wood, K.L. Nimmo, J. Electron. Mater. 23 (1994) 709713.
[13] M. McCormack, S. Jin, J. Electron. Mater. 23 (1994) 715719.
[14] F. Hua, J. Glaze, TMS Annual Meeting, Design and Reliability of Solders
and Solder Interconnections, ed. R. K. Mahidhara, S.M.L. Sastry, PK. Liaw,
Warrendale PA: TMS, 1997, pp. 65-73.
[15] S. Vaynman, M.E. Fine, Scripta Mater. 41 (1999) 12691271.
[16] M. McCormack, S. Jin, H.S. Chen, J. Electron. Mater. 23 (1994) 687690.
[17] M. Tadauchi, I. Komatsu, H. Tateishi, K. Teshima, Proceedings of the
second International Symposium on Environmentally Conscious Design
and Inverse Manufacturing (EcoDesign01), Tokyo Japan, 2001, pp.
10551058.
[18] H.Z. Huang, X.Q. Wei, L. Zhou, Electronic Components Materials 22 (4)
(2003) 3942 (Chinese).
[19] K.L. Lin, T.P. Liu, Oxid. Met. 50 (1998) 255267.
[20] K.L. Lin, K.J. Chen, H.M. Hsu, L. Shi, Proceedings of the fifty-third Electronic Components and Technology Conference, New Orleans, Louisiana,
USA, 2003, pp. 658663.
484