Training Notes

BoardMaster 8000 PLUS

BoardMaster 8000 PLUS Training

Contents
Section 1: Using the BoardMaster Premier Software ................................................................................4
Using Premier Software...................................................................................................................5
Section 2: SYSTEM 8 Modules ..............................................................................................................10
SYSTEM 8 Modules ......................................................................................................................11
Board Fault Locator .........................................................................................................12
Analogue Test Station .....................................................................................................16
Analogue IC Tester..........................................................................................................17
Multiple Instrument Station ..............................................................................................18
Variable Power Supply ....................................................................................................22
Section 3: Testing with the BoardMaster 8000 PLUS .............................................................................23
Design Mode .................................................................................................................................24
Section 4: Test Principles ......................................................................................................................27
ABI Digital Test Philosophy ...........................................................................................................28
The digital IC test fails................................................................................................................34
How do ABI test Digital ICs?..........................................................................................................36
Section 5: Technical Articles...................................................................................................................45
V-I Test Techniques ......................................................................................................................46
Graphical Test Generator .................................................................Error! Bookmark not defined.
SYSTEM 8 Analogue IC Testing ...................................................................................................54
NOTES...................................................................................................................................................56

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Section 1:
Using the BoardMaster Premier Software

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Using Premier Software

Premier software

Advanced control software

Utility management systems
Custom instrument design
Automatic test procedures
User definable logging,
comparison and control facility

Setup Module Interface

Methods
Add or remove interfaces
Setup installed modules
View interface diagnostics
PCI, ISA, Parallel and Serial

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Scan for New Modules

Automatically detects modules
Shows interface card settings and
attached modules

Self Test Diagnostics

Manually run diagnostics for
individual or all installed modules
Extended results

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User Access Manager

Add, remove and edit users
Assign user passwords
Configure user access
Restrict access to instrument
design, automated test procedures,
instrument menus and user
configurations

Restricted access avoids confusion, giving the operator

only the controls necessary for the test
Operators can be given access that is appropriate to their
skill levels

Instrument Menu Manager

Configure speedbar and
instruments menu for easy access
Include custom instruments on
Speedbar and instrument menu
Instrument menu settings can be
saved for each user

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Standard TestFlow
Action buttons control the edit and
run processes
Change the order of items in the
step list by dragging and dropping
Instructions can be given for each
step
Pass/Fail flag gives a status for the
whole test
Instrument layouts settings and
positions are saved in the TestFlow

Custom TestFlow
One custom instrument can be
created and used in one, some or
all steps
Controls can be added or removed
between steps
Access to controls can be
restricted
Edit mode allows restricted
controls to be altered by
mirroring standard
instruments

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Calculator
User programmable calculators each with
readout display, comparison and statistics
functions
Use basic instrument measurements to
perform further calculations and display
or log the results
Simple to use, but flexible
FormulaPlus control
language allows user to
develop application
specific equations

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Section 2:
SYSTEM 8 Modules

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SYSTEM 8 Modules
SYSTEM 8 modules
The SYSTEM 8 range contains 4
different modules offering both
analogue and digital testing:
Multiple Instrument Station (MIS)
Board Fault Locator (BFL)
Analogue IC Test (AICT)
Power Supply Unit (VPS)

The BoardMaster 8000 PLUS

contains all of SYSTEM 8 modules
in a stand alone case

SYSTEM 8 Modules

Analogue IC test
Digital IC test
Library based test
Varied test types
Analogue and digital V-I test
Moving reference V-I test
Built-in power supplies
Integral scope, function generator,
counter, DMM, I/O
Advanced software

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Board Fault Locator

Board Fault Locator
Digital IC Tester

64 test channels per module

4 bus disable outputs per module
2 5 V/5 A power supplies
Truth table, voltage, connections, thermal and V-I tests

Live Comparison

Compare characteristics from good and bad boards

simultaneously
Alter board conditions and track changes in results
through automatic comparison
2 Board Fault Locator modules required

Graphical Test Generator

128 channels
Graphically programmable for PCB setup and test
Vectors can be saved, loaded and compared

Board Fault Locator

Digital IC Identifier

Unknown, illegible or house coded ICs

Full library search by size
In-circuit
Out-of-circuit with adapter

Short Locator

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3 resistance ranges
Audible and visual indications of proximity to short
Audible continuity checker

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Digital IC Tester
Expandable to 256 test channels in 64
channel steps
4 bus disable outputs for guarding
signals
Loop modes for intermittent faults
Programmable logic thresholds
Logic trace mode to analyse test wavefk
waveforms
Automatic clip positioning
Circuit compensation allows
as wired testing for fast faultfinding

Board Fault Locator

Digital IC Identifier

Unknown, illegible or house coded ICs

Full library search by size
In-circuit
Out-of-circuit with adapter

Short Locator

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3 resistance ranges
Audible and visual indications of proximity to short
Audible continuity checker

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Live Comparison
Compare a faulty PCB with a known
good board for both digital and
analogue devices
Compare results from a suspect PCB
and a known good PCB at the same
time
Vary conditions on the good PCB and
track changes against the faulty PCB
Quickly identify a wide range of faults
by comparing both power-on and
power-off results

Graphical Test Generator

Allows a direct graphical interface with
available test channels
User programmable test vectors
through use of the mouse
Auto-learn simplifies the test generation
process
Vectors can be saved to file, loaded
and run in TestFlows

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Digital IC Identifier
Full library search by size
In-circuit, accounting for all logical
connections
Out-of-circuit with adapter
Equivalent devices listed (where
available) for unknown or illegible ICs
House coded ICs are normally standard
types and easily found within the library

Short Locator
3 resistance ranges
Audible indication of proximity to short
Audible continuity checker
Visual indication of proximity to short
Automatic probe calibration

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Analogue Test Station

Analogue Test Station
Analogue V-I Tester

16 channels
2 probes for live comparison
Variable test signal parameters
Variable pulse output

Analogue IC Tester

24 analogue channels
3 discrete channels
Optimized for analogue components

Matrix V-I

16 channels
Rotating reference
Multi-plot display
Charge voltage protection

Analogue V-I Tester

Provides optimum settings for each
component
Dual probe mode for live comparison
Audible tone, trace overlay and
percentage comparison readout for all
channel combinations
Pulse facility with variable start position,
pulse width and amplitude

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Analogue IC Tester
Analogue IC Tester
24 channels for voltage and current
drive/sense
3 special channels for transistor and
diode testing
Library driven tests for op amps,
transistors, comparators, optos, diodes
and special function devices
Automatic clip positioning
Circuit compensation allows as wired
testing for fast fault-finding
Simple pass/fail indication and more
complex analysis for each test

Matrix V-I
Performs a V-I test between every pair of
pins on a device and in every single
combination
Data for each pin is collated and
displayed in a graphical format to
greatly improve fault coverage
Up to 256 characteristics per device
compared with 16 on standard V-I test
No ground reference required
Finds faults that could be missed with
standard V-I test

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Multiple
Multiple Instrument Station
Multiple Instrument Station
Digital Storage Oscilloscope

2 channels
2 MHz to 150 MHz
Frequency, period, RPM and gate-width
Event Counter
Minimum, maximum and average

Function Generator

4 analogue channels
Voltages from -9 V to +9 V
Sinking and sourcing up to 20 mA
4 digital channels
Output and read back TTL logic levels

Digital Floating Multimeter

5 V output at 0.5 A
+9 V output at 100 mA
-9 V output at 100 mA
Current monitoring

Multiple Instrument Station

Frequency Counter

2 channels plus 2 maths

100 MHz bandwidth
5 GS/s maximum sample rate
26 automatic measurement functions

Universal I/O

0.1 Hz to 10 MHz
Sine, square and triangle waveforms
Single-shot pulse
AM, FM and pulse width modulation

Fixed Power Supply

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2 channels
DC and AC current up to 2 A
Ohms up to 20 MOhm
Auto-ranging
Minimum, maximum and average

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Digital Storage Oscilloscope

Auto measurement
Independent measurement for each channel
Over 20 measurements to select from

Trigger
100% pre- and post trigger delay
Edge and level adjustment

Trace comparison
One click comparison
Quick set-up or user defined tolerance

Function Generator
Range, frequency & shape select
Simple controls and clear display
Sine, square, triangle and single shot pulse

Sweep Mode
User defined start and stop frequency
Variable steps (log. or linear) variable interval

Modulation
Amplitude, Frequency and Pulse width
modulation
Variable level

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Digital Floating Multimeter

Channel mode
DC/AC volts & amps and resistance
Floating ground
Auto-ranging

Tolerance
Visual indication of comparison
Quick set-up or user defined tolerance

Statistics
Highest, lowest and average
measurements
Sample count reset

Built in Calculator

Frequency Counter
Tolerance
Visual indication of comparison
Quick set-up or user defined tolerance

Event Counter
Trigger level or pulse setting
Positive or negative polarity trigger
3 gate range to optimise for expected gate
width

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Universal I/O
Analogue
Variable +/-9 V output or input measurement
Variable 20 ma current output

Digital
Individually set for logic Low or High
TTL input detection displayed on LED

Auxiliary Power Supply

Triple outputs
Clear display of 5 V, +9 V & -9 V
Current readout for each supply

Control
Simple On/Off with status LED

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Variable Power Supply

Power Supply Unit
Variable Logic Supply

Negative voltage output for analogue circuits

0 V to -24 V programmable in 10 mV steps
Maximum 1.5 A in 10 mA steps

Variable Positive Supply

Positive voltage output for analogue circuits

0 V to 24 V programmable in 10 mV steps
Maximum 1.5 A in 10 mA steps

Variable Negative Supply

Low voltage output for digital circuits

2.5 V to 6 V programmable in 10 mV steps
5 A in 10 mA steps

Power Supplies
Auto measurements for voltage
and current
Variable current limit for +/- 24 V
supplies
Over voltage protection on Logic
Supply
Adjustable current trip
Short circuit protection with
unlimited duration and auto
recovery

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Section 3:
Testing with the BoardMaster 8000 PLUS

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Design Mode
What Is Design Mode?

Custom controls
Text changes
Create new instruments
Size and positional changes

The Benefits
Simplified instruments for
operators
Limit number of errors through
incorrect settings
Save time by having all relevant
displays in view
Emphasise important controls by
enlarging or by descriptive text

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Adapting Standard
Instruments
Remove display elements
Delete tolerance bars and statistics if not used

Remove control elements

Channels and their controls can be removed
if not used

Change text
Alter existing group box or control text
Add text to aid in the use of instrument

Create New Instruments

Select Design New Instrument from
Instruments menu
In our example we will start by adding
a DSO display
Add some controls to the DSO from
the DSO tab
Add text labels to the controls from
the Generic tab
Group boxes keep instrument controls
together
Build other instruments such as a
Power Supply, Function Generator
and Multimeter

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Instrument Design Manager

Access IDM via the Instrument
menu or right click on an empty
area of an instrument window
Use the IDM window to change
or add new instrument features
Selecting an instrument tab
shows the controls and displays
available
Callout descriptions are
available for Speedbar buttons

Instrument Design Manager

Alter the instrument display
properties from a drop down
menu
Size and position can be
changed by entering new values
or by using the mouse
Calibration access controlled
through IDM

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Section 4:
Test Principles

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ABI Digital Test Philosophy

What actually happens in a digital IC test? (Or what really happens when you press START)
When performing a digital IC test with SYSTEM 8, a complex procedure of tests takes place, of which
the truth table test is just one. We are often asked What actually happens during a digital IC test, and
what is the meaning of all the different pin conditions and faults? We have been using the same basic
procedure since 1983, but with so many new customers, it is now time to have another look at it and
clarify some points.
ABI digital IC tests are designed to find faults on boards. To do this, the following principles are used:

Confirm that the IC is correctly wired, correctly driven and correctly powered.

Confirm that the input and output pins are not damaged, and the IC is not
overloaded.

Confirm that the IC functions according to its truth table.

If the results of all these types of test are in order, you can be confident that the IC works and is correctly
wired. If only part of this sequence is possible, you can still be reasonably confident. This is a very
important point, and it is one that many of our customers and distributors still do not understand, even
after many years. To illustrate this, our customers often ask us:

Im getting a pass result for an IC, but I know its faulty because Ive done a
digital V-I test on it. What is wrong with my system?
This question shows a complete lack of understanding of the way the system works. The overall aim is
to repair the board, not to perform detailed IC failure analysis. So, if the digital V-I test shows a fault,
change the IC. The truth table test is not the only way of finding a fault, as this example shows. The
following diagram shows a simple digital NAND gate IC with an internal low resistance to ground on one
input.
This is quite a common fault (often caused by a faulty static protection
or clamping diode on the input), but it is almost impossible to detect
with a truth table test. The reason is that the outputs of the system
have a high current capability, and are easily capable of driving the
40R load to generate the correct logic levels, resulting in the IC passing the truth table test. With the
digital V-I test however, the 40R load shows up easily as a near vertical digital V-I curve.
Now we have the answer to the above question - nothing is wrong with the system; the system has
found the fault using the digital V-I test. Do not attach too much importance to the truth table test - it is
only one of five types of test that can find faults on boards.
So, now back to the original question What actually happens
during a digital IC test? We will now describe in detail what
happens, starting when you click the Start button. The
procedure is slightly different depending on whether the IC is
being tested in in-circuit or out-of-circuit mode.

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Step 1 - high voltage test: (in-circuit only)

The output drivers and BDO signals are isolated by relays, and the 5V power supply is switched on. All
pins, including the BDO signals, are checked for voltages outside the range -0.5V to +5.5V, which could
damage the drivers. If any are found, the test will be aborted and an error display will be shown.

Step 2 - automatic clip positioning: (in-circuit only)

Assuming no high voltages are found, the output isolation relays are switched on and the BDO signals
are enabled. The system then locates the position of the IC within the test clip by locating the power
supply pins (note that this only works for DIL or SOIC packages - the other types of clip must be applied
the correct way round).
For this step, the VCC voltage must be greater than 4.2V and the ground voltage must be less than 0.6V
when under load. The system attempts to backdrive the power pins to ensure that the IC has solid
power supply connections. Only when the correct power supplies are found on the correct pins can the
test continue. Otherwise the error message NO VCC or NO GND will be displayed and the test will be
aborted. During subsequent tests, the pin numbers within the test program are converted to the correct
physical channel numbers according to the position of the IC within the clip.

Step 3 - pin impedance test

This test checks how the pins of the IC are driven. In a normal situation, all pins of the IC under test will
be outputs, either of the IC itself or of other ICs that are connected to the inputs of the IC under test.
They will therefore have fairly low impedance. However, some inputs on the IC may come from
connectors or from ICs which are missing or disabled. In these cases the only impedance present at the
pins will be the input impedance of the IC under test, which can be moderate for TTL ICs with significant
input currents, or extremely high for CMOS ICs with no measurable input current. A broken track or dry
joint on the board can be detected by checking the impedance of the pin, as can a dirty test clip
connection.
This test works by driving the pin with various
voltages through a 10K resistor, and
measuring the resulting voltage at the pin.
Each pin is classified at this stage either as an
output (displayed as blank on the result
display), an undriven TTL type input
(displayed as FLOATING), or a high
impedance (CMOS) input (displayed as OPEN CIRCUIT). The FLOATING and OPEN CIRCUIT
conditions can overlap, so you can choose to regard them as equivalent to simplify the comparison of
results. Note that OPEN CIRCUIT can also mean that the test clip is not making proper contact with the
IC pin, due to dirt, corrosion or conformal coatings.

Step 4 - shorted pin test

This test discovers pins that are connected to either the 5V or 0V supply rails, by attempting to drive the
pin to the opposite level and measuring the resulting voltage. For example, a short to 5V is detected by
momentarily driving the pin low and measuring the voltage. If it is greater than 4.4V, a short to 5V is
indicated. A short to 0V is indicated by a voltage of less than 0.6V when the pin is momentarily driven
high.

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This information is stored, both for later display and also to provide information for the automatic circuit
compensation function, which will modify the subsequent test according to the pattern of shorts found.
Certain types of fault, for example solder bridges, are detected by this test.

Step 5 - link detection

This test detects pins that are connected to other pins on the IC by the following complex procedure. Pin
1 on the IC is driven high, and pin 2 is driven low. If pin 1 is linked to pin 2, the system will be
backdriving itself. This is detected by measuring the voltage on pin 2 - if it is higher than 1V, a possible
link condition has been detected. However, it could also be caused by a short to 5V on pin 2, which is
eliminated by driving pin 1 low. If pin 2 is now below 1V, it is probable that a link is present. This is then
confirmed by repeating the above procedure with pins 1 and 2 reversed.
The entire procedure is then repeated for all possible pairs of pins on the IC, so that all possible links are
discovered. The process of detecting links on a powered board, which has various different voltages
present, means that this complex procedure is necessary to eliminate the effect of the surrounding
circuitry. Nevertheless, strange link indications sometimes occur (for example LINK 1 and LINK 2 on the
same pin!).
This usually indicates changing signals or oscillation on the board, and is best confirmed by performing a
power down connections test on the board to remove the interfering signals. The presence of links can
indicate faults such as solder bridges or track shorts, and they are stored for use by the automatic circuit
compensation feature later.

Step 6 - input mid level test for inputs: (in-circuit only)

The voltages at the IC inputs are measured and compared against the threshold voltages for this IC.
Voltages above the low threshold and below the high threshold are classified as INPUT MID LOW or
MID HIGH, depending on whether they are above or below the SWITCHING threshold. This result can
indicate a fault in the IC driving the IC under test. This test is not performed in out of circuit mode
because input mid levels are normal in this situation.

Step 7 - signal detection for inputs: (in-circuit only)

Changing signals on the board under test will seriously interfere with the tests, making valid results
almost impossible to obtain. Therefore the system attempts to detect changing signals by checking the
level on each pin 256 times, with a varying delay between checks to ensure that the check is
asynchronous. If different levels are found, this pin will be identified on the display with the word
SIGNAL. Signals above 4MHz cannot be detected with this method, owing to the limited speed of the
analogue inputs of the IC Test Solution. This test is not performed in out of circuit mode because there
is no external signal source.

Step 8 - backdrive check for inputs

A valid truth table test can only be performed if the inputs of the IC under test can be driven with valid
low and high logic levels. Therefore the system checks each input of the IC, by driving low and high and
measuring the resulting voltages. For an in-circuit test, a low drive must be less than 0.9V, and a high
drive must be greater than 1.9V, otherwise the warning messages LOAD 0V or LOAD 5V appear on the
result display.
For an out of circuit test these levels are tightened to 0.5V (low) and 2.5V (high), and in this case the
LOAD messages are not warnings but actually cause the IC test to fail. In addition, in out of circuit mode
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only, a check is made of the high input current of the IC by driving it high with a 10 K resistor and
checking that the high input voltage is greater than 2.5V. This identifies resistively loaded inputs in a
similar way to the digital V-I test. Note that the backdrive test is not performed if the input is shorted to
either 0V or 5V, since we already know we cannot drive the pin.

Step 9 - output short check for outputs

For a normal digital output, a short to either 0V or 5V indicates a
fail condition. Therefore the system checks the outputs of the IC
for shorts, and sets the result to fail if any are found. Note that tristate, open-collector or open-emitter outputs could have shorts if
they are connected to switches or jumpers, in a wired or
configuration for example, therefore a short on such a pin is not
considered to be a fail.

Step 10 - output configuration

The channels connected to the inputs of the IC under test will now be enabled, so that the truth table test
can begin. The test program controls the exact pattern of pins to be enabled. Usually, all inputs are
enabled, but in cases where there are multiple gates in a pack (e.g. 7400) or where there are bidirectional pins (e.g. 74LS245) the system may not enable all the inputs at the beginning. Note that pins
that have been discovered to be shorted to either 0V or 5V will not be enabled, since they cannot be
driven. This reduces power dissipation in the output drivers.

Step 11 - output conflict test for tri-state ICs

For in-circuit testing of tri-state ICs, it is important to ensure that other ICs connected to it are disabled
(using the BDO signals) so that they do not interfere with the test. Therefore, the IC under test is
disabled and the impedance of the output pins is checked using a similar method to that outlined in Step
3 above. If this indicates that one or more pins are being driven by some other component, the warning
CONFLICT will appear on the result display and the test result should be regarded with suspicion.

Step 12 - truth table test

At this point the truth table test begins. The IC is stimulated
by signals from the system, backdriving the other signals (in
in-circuit mode) present to isolate the IC from the
surrounding circuitry. The output voltages from the IC are
measured and compared with the programmed logic
thresholds to check that the IC is producing correct and
valid logic levels according to the truth table. If it does not,
the error messages HIGH, LOW, MID HIGH or MID LOW
are displayed on the result diagram and the test fails.

The exact sequence of stimuli and checks is controlled by the IC test program, which is loaded when the
IC number is selected from the library. It is also modified automatically in in-circuit mode to allow for the
pattern of shorts and links discovered in steps 4 and 5. This automatic circuit compensation feature,

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invented by ABI in 1985, ensures that the IC is tested as wired without user modifications to the
program.

Step 13 - voltage test

After the truth table test has finished, the system measures the voltage on each pin of the IC as an aid to
fault-finding. At this stage, each pin of the IC is connected to 0V via a 10K resistor in the system. The
voltages are stored and displayed on the result display.
They are also converted to logic levels (low, mid low, mid high or high) by comparing with the
programmed thresholds, and these levels are also displayed if no truth table test is performed.

Step 14 - thermal test

An indication of the internal temperature of an IC can be measured by examining the characteristic curve
of certain internal semiconductor junctions in the IC with the power supply off. Therefore the power
supply is turned off at this point in the sequence, and the system extracts the required data by
performing a modified form of the digital V-I test (see below).
From the resulting curve, the forward junction voltage is obtained, which is a function of temperature.
Unfortunately, ICs from different manufacturers have slightly different characteristics; therefore a direct
read-out of temperature in degrees is not possible.
However, comparison of the thermal results between good and bad boards can indicate ICs which are
over-loaded and consuming too much current, even though they are otherwise still functional. The
results of this test are presented as a unitless number on the display.
Note that on some pins the required semiconductor characteristic may not be present, because of the
effect of parallel components on the board. No thermal result is possible for such pins, but only 1 pin per
IC is necessary to check the IC internal temperature. None of our competitors have this powerful
feature.

Step 15 - digital V-I test

This is a powerful power-off test technique that examines the
current against voltage characteristic for each pin of the IC
under test. Each pin is driven through a 10K source resistor
and is swept linearly between 2 programmable voltages,
normally -10V and +10V.
The resultant pin voltage is measured and the current is
calculated using Ohms law. The current is then plotted on a
graph against the applied voltage, and the resultant curve
can be used to detect faults such as input leakage (see
example above), voltage breakdown, open circuit or short
circuit pins.
For a fuller description of the digital V-I test, please refer to the operators manual, the system help text
and the training board manual. Note that the digital V-I test is optimised for digital ICs - for analogue
components the Analogue V-I Solution provides a wider range of test parameters.

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That completes the sequence of events for a typical IC test, assuming that all test types are available
and that they are all enabled. For many ICs, certain test types cannot be performed; for example the
truth table test cannot be performed on some ICs.
This does not prevent the other test types from being performed, and does not affect the integrity of the
results from the other tests. Please remember that the different types of tests complement each other,
and that certain types of fault cannot be found by a truth table test alone, as in the example above.
We hope we have improved your understanding of the system. If you do not understand all the technical
details given above, do not worry, but please remember just one important point:

There are five different test types provided by SYSTEM 8.

For the best possible fault coverage,
you MUST use ALL of them.

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The digital IC test fails

What happens next?

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How do ABI test Digital ICs?

ICs?

Test Principles
ABI digital tests are designed to find faults
on boards. To do this the following
principles are used:
Confirm that the IC is correctly wired,
correctly driven and correctly powered
Confirm that the input and output pins
are not damaged and that the IC is not
overloaded
Confirm that the IC functions according
to its truth table

1. High Voltage Test

Output drivers and BDO signals
isolated by relays
5V power supply switched on
Check all pins voltages within
-0.5V to +5.5V range

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2. Auto Clip Positioning

Output isolation relays switched on

BDO signals enabled

VCC voltage must be >4.6V
Ground voltage must be <0.6V
Locates position of IC using
supplies

3. Pin Impedance Test

Checks how pins of IC are driven
Drives pin with various voltages
through 10K resistor
Pins classified as:
Output (displays blank)
Undriven TTL input FLOT
High impedance CMOS input
OPCT

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4. Shorted Pin Test

Shows pins connected to supply
rails (5V or 0V)
Drives pins to opposite levels
>4.4V indicates short to 5V
<0.6V indicates short to 0V

5. Link Detection
Identifies links between pins on
same IC
Shorted pins are ignored
Pin pairs analysed to identify
matching change when driven
Procedure repeated for all possible
pairs in both directions
Results stored for use by circuit
compensation feature later

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6. Input Mid Level Test

Measures IC input voltages
Compares with threshold voltages
Voltages above the low threshold
and below the switching voltage
are displayed as INPUT MID LOW
IPML
Voltages below the high threshold
and above switch are displayed as
INPUT MID HIGH IPMH

7. Input Signal Detection

Detects changing signals by
checking levels on each pin
Checks each pin 256 times
asynchronously
Different levels show as SIGNAL
Detects signals below 4MHz

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8. Input Backdrive Check

Checks for valid low and high logic
levels to allow truth table test
Checks each output by driving low
and high
In-circuit low drive should be
<0.9V and high drive >1.9V
Out-of-circuit low drive should be
<0.5V and high drive >2.5V
Ignores pins shorted to rails

9. Output Short Check

Checks IC outputs for shorts
Displays SH0V for short to 0V
Displays SH5V for short to 5V
Open-collector and open-emitter in
wired-OR design are logical
therefore will not fail outputs

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10. Output Configuration

Enables input channels
Shorted pins not enabled
For bi-directional or multiple gates,
pins enabled only as required to
reduce power dissipation
Output pin position given by auto
clip positioning

11. Output Conflict Test

In-circuit testing of tri-state ics
Disables IC
Measures impedance of output pins
(high impedance expected)
Displays CFLT on driven pins if not
high impedance

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12. Truth Table Test

Stimulates IC whilst backdriving
other signals in-circuit
Compares output voltages with
programmed logic thresholds
Invalid logic levels displayed
Automatic circuit compensation
allows as wired testing by altering
IC test program

13. Voltage Test

Measures voltages on each pin
Pins connected to 0V via 10K
resistor
Displays results
Compares to programmed
thresholds for logic levels

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14. Thermal Test

Power-off test
Performs modified digital V-I test
Uses forward junction voltage as
function of temperature
Indicates overloaded ICs

15. Digital V-I Test

Power-off test
Examines current against voltage
for each pin
Pins driven through 10K resistor
Linear voltage sweep between -10V
and +10V
Input leakage voltage breakdown
and shorts identified
Optimised for digital ICs

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Device Fails
Loop or fail loop selected?

Select LOOP test.

Repeat test.

Open circuits present?

Suspect clip connection.

Move clip to remove invalid open circuits.

Signal indicated on pins?

Does device have a clock pin?

Is signal present?
Is origin and IC gate?

Are conflicts identified?

Stop clock or processor to stabilise BUS.

Locate other devices on BUS and check enable pins.
Are BUS devices enabled?
Use BDO to disable devices.

Summary
Truth table testing is just a small part
of the ABI test philosophy.
To get the best results all of the test
types should be utilised as much as
possible.
Understanding how the equipment
gets the information speeds up the
success in fault-finding.

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Section 5:
Technical Articles

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V-I Test Techniques

The truth about V-I testing
Why do we have only 16 V-I test channels? Why do we have two types of V-I test?
The technique of V-I testing, or analogue signature analysis (ASA), has been around for a long time but
it is still little known or understood. Many of our potential customers have never heard of V-I testing, and
as a result they become very confused as to why ABI products have two separate V-I tests? Why do we
only have 16 test channels? How can we simplify the position, and what is the truth about V-I testing?
The truth about V-I testing is that it is not really a TEST, it is a
MEASUREMENT! It applies a suitable voltage waveform to the
component under test, and measures the resulting current. A
graph is then plotted of current against voltage, and the operator
then examines the shape of the curve to deduce information
about the component. For simple components the operator can
say with some confidence whether the component is faulty or
not. For more complex components it is more difficult, because
the V-I test only measures the response of the pins, not the
internal circuitry.
For years, manufacturers of V-I testing equipment have claimed that they can test all types of
components with the V-I test technique, but this is simply not true. Indeed, they have invested a great
deal of time in money in researching how to overcome the deficiencies of their V-I testing, but they have
made as yet little or no progress.
If V-I testing has these limitations, why does ABI use it, and why do we have two V-I tests? To answer
these questions, consider a typical board. The components on the board can be divided into two basic
types, discrete components such as resistors, capacitors, diodes, transistors, inductors and thyristors,
and integrated components (ICs) which contain many thousands of discrete components in a single
package.
A fault diagnosis system must have facilities and test techniques to cope with both these situations. The
V-I test is a valuable fault-finding technique when used on discrete analogue components, but it is more
limited with complex ICs because there are many internal
components that have no direct connection to a pin.
In this case, the V-I test still provides valuable information
when combined with other techniques such as truth table,
voltage, thermal and connections testing. Furthermore, the
test requirements of discrete components are totally different
to those for ICs, and any attempt to provided a suitable V-I
test for both types must include in our opinion too many
compromises, and can be dangerous.
Testing discrete components, which come in a wide range of values and ratings, requires a wide range
of V-I test parameters such as voltage, frequency, waveform and maximum current. These parameters
must be easily selectable in a wide range if reliable results are to be achieved. The input and output pins
of digital ICs, on the other hand, are very consistent in the types of components used and their values.

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Therefore the parameters of a V-I test can be optimised to

simplify the procedure for the operator and eliminate the chance
of damaging the IC by the application of high currents and/or
voltages, which can happen with other types of V-I testers. To
avoid these types of problems and risks, the ABI BoardMaster
8000 and SYSTEM 8 have two separate V-I tests, which we will
now describe.
The analogue V-I test is included in both the Analogue V-I
Solution and Analogue IC Test Solution. This test is designed for
discrete components, and its test current and voltage are adjustable over a wide range to cater for
sensitive RF transistors and low current Schottky diodes right up to rugged power devices such as power
transistors, thyristors and triacs. The maximum allowable current can be set from +/-1mA for
measurements in high impedance circuits, right up to +/-150mA for power devices.
Many discrete circuits contain frequency dependent components such as capacitors and inductors,
therefore the frequency of the analogue V-I test waveform can be adjusted from 37.5Hz to 12kHz to
ensure that a suitable curve can be obtained. This is important for high speed analogue circuitry
containing capacitors as low as a few tens of pF, as well as for example switching power supplies
containing much larger capacitors and inductors. Some components, for example thyristors, transistors
and triacs, may need to be biased during the test so that their characteristics in both the off and on
states can be measured. A programmable pulse generator is included in the analogue test module to
achieve this. In summary, the range of parameters provided by the Analogue V-I Solution and Analogue
IC Test Solution is far wider than V-I testers from other suppliers, which is why the two modules have a
far wider range of applications.
To get the best results from the analogue V-I test it is often only necessary to compare nodes on good
and bad boards, therefore the module is provided with two independent probes and pulse outputs to
allow simultaneous testing of two boards. Often analogue circuitry is implemented with analogue ICs
such as operational amplifiers or comparators surrounded by discrete components. To speed up the
probing of such analogue circuits, IC test clips with up to 16 pins can be used with an analogue test
cable. We are often asked, Why do we have only 16 V-I test channels? The answer is simple. We do
have 16 analogue V-I test channels, but we have a massive 256 digital V-I test channels!
The vast majority of analogue circuits consist of discrete components with only two or three pins,
together with small pin count ICs such as operational amplifiers, and as a result more than 16 analogue
channels are not necessary and only add extra cost, not extra value. This is the reason why the
Analogue V-I Solution from ABI is a much lower cost than competing products. ICs with more than 16
pins are usually digital ICs that should not be tested with an analogue V-I test because of the risk of
damage.
The digital V-I test is part of the IC Test Solution. This is an optimised form of
the V-I test that is designed specifically for digital ICs. These types of IC have
a number of features that are important to consider in the design of a suitable
V-I test. Firstly, the inputs and outputs of digital ICs have only stray
capacitance (which is too small to measure using a V-I test) as a frequency
dependent component, because they consist entirely of transistors, diodes and
resistors.

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This means that the digital V-I test does not require variable frequencies in use, because the same curve
would be obtained regardless of the test frequency. Therefore the ABI digital V-I test uses a fixed
frequency to simplify the test and reduce the system learning curve for the operator.
Secondly, and very important, they usually contain static protection networks which use reverse biased
diodes to protect the inputs. These diodes can be easily damaged by even small values (a few mA) of
reverse current, therefore the output stages of a suitable V-I tester must be carefully designed to avoid
this problem. This is a major problem when using some analogue V-I testers with digital ICs - if the
wrong range is inadvertently selected the ICs can be damaged very easily.
At ABI we do not recommend that an analogue V-I tester be used on digital ICs, because the risk of
damage is too great. The output current of the ABI digital V-I test is limited to +/-1mA for all voltage
settings, eliminating the risk of damage regardless of the settings used.
Thirdly, the impedance of the input/output pins of digital ICs is very consistent, even with ICs from
different manufacturers, because the ICs are all trying to meet the same specification. This means that
the source impedance of the digital V-I tester and with it the maximum test current can be preset to the
correct level. This simplifies the setup procedure and makes the test safer in use.
The digital V-I test is combined with the digital truth table, connections, voltage and thermal tests using
the same test clip. This means that it is readily available without switching to another clip or probe, and
furthermore the analogue V-I test can then be used simultaneously on another area of the board. We
believe that the combination of the two tests, when correctly used on all types of components gives the
most optimum solution to the requirements of safe, reliable and easy to use V-I testing.
Finally, do not forget that V-I testing is only one of many test and fault diagnosis functions provided by
our products. 75% of PCB faults can be found by simple connections testing. General purpose test
instruments such as an oscilloscope, voltmeter, short locator, IC tester, frequency counter and function
generator are also included. Our products can also be used for complete board test and setup and for
out of circuit analogue IC testing.
Matrix V-I testing is a powerful extension to the normal Analogue V-I technique. The Matrix V-I test
performs a V-I test between every pair of pins on the device under test (DUT) and in every single
combination. This provides a much more comprehensive test than the standard V-I test. This technique
also allows ICs to be tested out-of-circuit as well as finding shorts between pins that would otherwise not
have been found.

What advantages does Matrix V-I have?

One immediate advantage is that there is no need to search around on the board under test for an
appropriate ground reference point. Simply clip on an IC and away you go.
Many of the V-I characteristics for a particular IC will look almost identical, often dominated by input
protection diodes. If two such pins were linked together on one board but not on the other, there would
be very little difference between the two respective V-I characteristics. With Matrix V-I a very obvious
difference in characteristics will be displayed, greatly improving fault coverage.
A normal V-I test only displays the V-I characteristics of a pin with respect to the board ground reference.
If an analogue IC has a feedback resistor between two pins with a relatively high impedance path back
to ground, the effect of the resistor may have little bearing on the resultant V-I characteristic. Contrast
this with a V-I characteristic obtained directly between the two pins of the device. Now a change in the
resistor value (due to a manufacturing error, for example) will cause a difference in the Matrix V-I
characteristic.

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A standard V-I test on a 16 pin IC will only have 16 sets of V-I characteristics. An equivalent Matrix test
will have 256 characteristics to compare with a good board! So if you have a problem with a pin of an
IC, or a board connection to that pin, the Matrix test is much more likely to highlight this, because up to
32 traces will be effected. Whats more, the information is collated and indicated in graphical form next
to the relevant pin, greatly improving fault coverage!

How does it work?

Initially pin 1 is switched to ground to provide the V-I reference, and the V-I characteristic of pin 1 is then
captured. Then pin 2 is switched to ground and again the V-I characteristic for pin 1 is captured. This is
repeated until all of the pins on the DUT have been switched to ground to provide the reference. The
whole process is then repeated by switching each pin in turn to ground and capturing the V-I
characteristic of pin 2 relative to the reference pin. When the V-I characteristics for all pins on the DUT
have been captured, the test begins once again at pin 1. As an example, an 8-pin test would result in 64
(8 x 8) V-I characteristics being captured.
The test displays all of the V-I characteristics associated with the selected pin, by clicking on the
comparison bar graph next to that pin. Obviously if the characteristics for pin 1 are displayed, the
characteristic for pin 1 with reference to pin 1 will be a short circuit, indicated by a vertical line. An
individual characteristic can be inspected by clicking on that trace.
Note: The Matrix V-I test is only available when an Analogue IC Test Solution is installed.

Graphical Test Generator

Create your own tests without programming!
The Graphical Test Generator instrument, part of the SYSTEM 8 software, has long been used for
generating digital stimuli, particularly when using the SYSTEM 8 Test Solution to test complete boards.
It can be used for stimulus and measurements as well as integrating with other instruments such as the
voltage probes, frequency counters or oscilloscope. The number of available channels and depth of test
patterns can be varied. So how does this new instrument work, what are its applications, and how do
you program it? Read on to find out.
The instrument can be used to measure digital response from the unit under test as well as generating
stimuli. The expected response can be drawn with the mouse in the usual way, or it can be learned from
the unit under test using a known good component.
This means that a complete test for a board or an individual IC can be generated, without any
programming. Each channel can now be defined as an output to the unit under test, input from the unit
under test, or bi-directional. The three types of signal are configured as follows:
Output - Each cell can be configured as a low (0) output or a high (1) output by a double-click on the
desired cell. When the pattern is run, the configured signal is output to the appropriate channel, thereby
stimulating the unit under test.
Input - Each cell can be configured as an expected low (L) input, an expected high (H) input, or a dont
care (X) input by a double click on the desired cell. When the pattern is run, the response of the unit
under test is compared with the configured pattern and any errors will be highlighted. The response of a
known good unit can be learned if required.

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Bi-directional - Each cell can be configured in the sequence expected low input (L), expected high input
(H), dont care input (X), low output (0), high output (1). When the pattern is run, the system will either
output signals or compare responses depending on the way the channel has been configured.
As an example, we will generate a test for a simple logic gate, the 7400 quad NAND gate IC. This will
show how the system works. Before we start, a word of warning. The Graphical Test Generator is
normally used for generating tests for complete boards. It can also be used for generating IC tests, but it
has no automatic clip positioning or automatic circuit compensation features. Therefore you must always
use the test clip in the pin 1 position, and you must generate the test pattern according to the way the IC
is wired in circuit.
The first step is to set up the Graphical Test Generator for the
component or board you wish to test. Click the Setup button
and enter the required number of channels, in this case 14
because the IC has 14 pins. The pattern depth can be set to a
maximum of 230 steps, but in this case we only require 16
because there are 4 possible test stimuli for each of the 4 gates
in the IC. The thresholds that are used to compare the
response from the unit under test can be set, but here we will use the default TTL values of 0.5V, 1.2V
and 2.4V.
Now we need to configure the individual channels by double clicking on the channel name on the left of
the display window. Here you can enter the name of the pin and the channel number, and you can also
define whether the pin is an input, output or bi-directional pin. We will define the channel numbers so
that the IC can be tested using a 64 way test cable with the clip in the pin 1 position (there is no
automatic clip positioning when using the Graphical Test Generator).

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This means that pins 1 to 7 of the IC correspond to channels 1 to 7 of the system, and pins 8 to 14
correspond to channels 58 to 64 of the system.
Now we can enter the test data. By double-clicking on the grid, you
can enter the correct stimulus for each gate in the IC in turn, using
the four available states 00, 01, 10 and 11. You can enter the output
response if you like, or you can learn it using a known good IC. The
output response should be high (H) for the first three states, and low
(L) for the last state. We do this first for gate number 1, setting the
expected outputs from the other gates to dont care (X). For
completeness, we have also configured the system to check that the
GND rail is always low and the VCC rail is always high.
Now you can run the test by attaching the test clip to an IC. The PCB under test should be powered
from the power supply in the IC Test Solution module in the usual way. There are two ways to run the
test pattern. If you click Run the system will output the test stimuli to the output channels and check the
response from the input channels, indicating failures by highlighting the display in red. Invalid logic
levels are also indicated. If you click Learn the system will output the stimuli as before, but this time the
response will be learned and added to the test pattern, which can then be saved as a basis for further
tests. This is a very powerful timesaving feature that means that you only need to concern yourself with
the stimuli when generating a test pattern.
We will now describe in detail what happens when you run a test pattern. This is necessary to
understand exactly what is happening. The first point to make is that the channels are controlled by
software, not by hardware. This means that the exact timing relationship between channels cannot be
defined, although it can be measured.
The channels on the Graphical Test Generator timing diagram are processed one at a time, so there is a
small delay between each successive output. For example, consider the first two channels on the 7400
test pattern we entered earlier.
The signals are defined as follows:
1

1A

1B

When this pattern is run, the following signals appear on channels 1 and 2:
1

1A

1B

You will see that there is a small timing difference between the signals caused by the software execution
time. This makes no difference to the test, because an important rule of test programming is that you
should never change two signals at the same time because of problems caused by timing skew between
channels. This built-in delay means that it is impossible to change signals at the same time, eliminating
the problems caused by timing skew and making your tests more reliable.
The actual magnitude of this delay is of the order of a few milliseconds, but can be measured if required
with the oscilloscope. Note that it may vary if other instruments are open and running at the same time,
depending on the speed of the PC used and the number of other instruments. Please bear this delay in
mind when generating test patterns, particularly for clocked systems.
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So what are the usual applications for the Graphical Test Generator?
Its main application is in the field of complete board test. To test an assembled unit, which could be a
complete product or just one PCB, you have to stimulate it. For example, a PCB from an intruder alarm
has inputs from various sensors and switches to activate the alarm, inputs from a keypad to control it,
and outputs to sounders and flashing lights, and possibly to a telephone dialler.
To test such a PCB, you cant just power it up and measure voltages. You have to drive the inputs to
simulate opening a door or breaking a window, or enabling/disabling the alarm from the keypad.
You then have to check the response to ensure that the alarm signal appears and the correct warning
lights flash. This is where you use the Graphical Test Generator. Depending on the specifications of the
inputs/outputs of the board under test, an interface may be required to convert the digital output levels to
the correct voltages.
The inputs can be converted to digital levels if possible, or they can be measured with the SYSTEM 8
voltage probes which together with the Multiplexer give up to 16 voltage test points.
As a further example, consider the programmable power supply that is used in the Measurement
Solution module. This is controlled by a serial interface, which programs DACs to set the output
voltages and current limits. If you just power the board up, the outputs will do nothing because there is
no way of controlling them.
A test pattern is required to generate the correct serial signals to program the board, so that the outputs
can then be measured with the voltage probes via the multiplexer. We use this principle in conjunction
with a custom made test fixture with built-in Multiplexer to demonstrate the operation of the SYSTEM 8
Test Solution with our Measurement Solution power supply board. The complete system, including test
fixture, multiplexer, test sequence with pre-defined test patterns and a power supply board is available
from ABI.

Common questions
1) How fast does the Graphical Test Generator run?
The outputs are controlled by software, therefore it is not possible to define exactly how fast they run,
because it varies from PC to PC depending on the number of other instruments running at the same
time. If the exact speed must be known for some reason, it can be measured with the Measurement
Solution digital storage oscilloscope. Tip - only use the number of channels required for your test
(configured with the Setup button). If you have other channels on the screen that are not being used,
time will be wasted in processing them.
2) Why is there a limit of 230 test steps?
This is done to conserve PC memory. The graphical programming method is very memory intensive,
and would be very slow if the disk were used. Therefore we have limited it to 230 steps. This is
normally no great limitation because in normal use with the Test Sequence Generator the test would be
broken down into several steps, each with its own pattern. Furthermore, it is almost impossible to
manipulate a pattern with more steps because the required scrolling makes understanding of the pattern
very difficult. If you require more steps, split your test into 2 or more separate patterns.

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3) What is the output specification?

The Graphical Test Generator uses the same outputs as the IC Tester, therefore the electrical
specifications are the same.
4) Can the Graphical Test Generator be used to learn an IC that is not in the library?
A salesman would say yes, an engineer would say no. The correct answer is somewhere in between,
depending on how much you know about the IC. To generate a test, you need to know at least which
pins on the unknown IC are inputs and which are outputs. Knowing this, you can generate a stimulus
pattern and learn the response of the IC. If you have access to IC data or board schematics, you can
more easily generate the correct stimulus.
If the IC is combinational (i.e. not clocked) then it will give the same response every time and the test will
be reliable provided you apply the correct stimuli. If the IC is sequential (i.e. clocked) then it may give a
different response each time, making the test difficult. In this case you need to control the stimulus to
ensure that the IC starts in a known state, by resetting it or clearing it. Even if the data sheet is not
available, clues may be gained from the board schematics as to how to do this.
5) Can the Graphical Test Generator accept analogue inputs?
Yes, provided they are in the range of 0 to 5V, but the results will give problems because mid-levels will
be indicated. If you know what voltages are expected, you may be able to improve the results by
changing the threshold voltages using the Setup button. The Graphical Test Generator is really
designed for digital signals, and the best way to measure an analogue response is to use the SYSTEM 8
voltage probes or oscilloscope.

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SYSTEM 8 Analogue IC Testing

What is the GENERIC library?
This is for instances when the user knows the nature of the part that they
wish to test but the specific part is not in the library. For example, if the
user knows the device is a quad operational amplifier they can browse
through the generic library and select the quad op amp test that matches
the pin out of the device they wish to test.
How does the SYSTEM 8 Analogue IC Test Solution (AICT) differ
from the SYSTEM 8 Analogue V-I Solution (ATS)?
The Analogue V-I Solution performs power off V-I testing which is proven to be effective for fault finding
on analogue boards. The Analogue IC Test Solution also offers the benefits of V-I testing and adds the
ability to functionally test analogue devices up to 24 pins. This obviously improves the fault coverage of
the product that means it offers more chance of finding faults quickly and efficiently.
How do I know what power supply voltages to use?
Unlike digital PCBs which are usually powered form 0V and +5V, analogue PCBs are powered from
many different supply voltages. If schematic diagrams or design information is available these should be
scrutinised to determine how to power the board up.
If this information is not available an educated guess is required to power the board (In some lucky
cases the PCB will have test points which indicate supply voltages). The first step is to deduce if the
board is powered by a single supply (0V, +V) or by split supplies (-V, 0V, +V). Checking the values of
any voltage regulators present can do this. The inputs to these regulators are the best points to apply
power. If regulators are not obvious, the next best method is to use the Analogue IC Test Solution as a
library to determine the pin out of analogue ICs on the board. Find the 0V reference pins first, check
they are all connected together and find the point on the board that they can be conveniently connected
to your power supply. Next check the negative (-V) pins and see if they are connected to the 0V net
(single supply) or all together to a separate net (split supply). Repeat for the positive power pins (+V).
Now the nature of the power supply for the board has been deduced, it is time to guess at what voltages
to use. Analogue boards use many different voltages but 0V, 12V or 0V, +15V or +/-12V or +/-15V are all
commonly used schemes. Do not exceed 15V unless you are sure the board requires a higher voltage.
Generally, analogue circuits will work at a whole range of voltages and the precise power supply
voltages are not critical. Therefore, it is often safer to set the power supply to a low current limit and set
voltages to low values such as 7V and increase the settings as required.
What is the analogue trace for?
The analogue trace simply displays samples of
the voltages/currents that are measured at the
device under test during the functional test. The
majority of users need take no note of the trace
which is why is can be disabled to speed up the
test.
Why isnt there an equivalent analogue IC identifier function?
Analogue devices are connected in many different configurations, far more than is the case with digital
ICs. Correspondingly it is far more difficult (and perhaps risky) to attempt to identify the device under
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test. There could also be hundreds of op amps in the same configuration that could be identified as the
same device without resorting to expensive parametric testing.
What type of functional test does the system perform?
This varies from device to device. Generally, the system attempts to perform simple GO/NO GO tests
that verify the basic functionality of the device under test. In repair applications, the most common
component failures will be catastrophic and will be easily found by simple tests. More complex tests
obviously demand more expensive hardware and are very unreliable when performed in-circuit.
Why are some tests power on and others power off tests?
If the AICT can perform a functional test without the need for powering the board then this is the
preferred option. Power-off tests have less interference from connecting circuitry and can use smaller
currents, which is obviously less risky. Unfortunately, when testing more complex devices such as
operational amplifiers a functional test must be performed with the power on.
What is the analysis information?
Many of the analogue tests display extended analysis information along
with a pass/fail result. Generally, information displayed in the analysis
window is extra information that the user can either ignore or use to find
out more about the board under test. For example, the operational
amplifier test will display gain values that are determined by the circuit
surrounding the device under test and therefore plays no part in the
pass/fail result. Some tests cannot be performed due to the way the
device is connected but do not indicate that the device itself is faulty. All
of this type of information is displayed in the analysis window.
What is the use of the voltage display and the tolerance setting for it?
The voltage test measures the voltages on all the pins of the device under test, at the beginning of the
functional test. The functional test itself uses this information to adjust the test to the way the device is
configured. This information can also be useful to users, especially the voltages on the supply pins.
The voltage results can be stored in a test sequence for comparison with another board at a later date.
Because the voltages can vary slightly from one board to another a comparison tolerance can also be
set. On some boards the voltages on some of the pins can be random, in which case they cannot
practically be used for comparison between boards and this test may be turned off?

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NOTES
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ABI Electronics Limited 2007

57

BoardMaster 8000 PLUS Training

NOTES
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ABI Electronics Limited 2007

58

BoardMaster 8000 PLUS Training

NOTES
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ABI Electronics Limited 2007

59