OMICRON PTL

RET 670 Transformer Differential Protection Test Template User Manual

OMICRON PTL
Protection Test Template PTT
Transformer Differential Protection
ABB RET 670 V1.1 A32
User Manual

V1.000

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RET 670 Transformer Differential Protection Test Template User Manual

Contents

1 General Information ..................................................................................................................................3

2 Minimum Hardware Requirements..........................................................................................................4
3 Quick Start Information ............................................................................................................................4
4 Using the Template ...................................................................................................................................5
4.1 Test Object ...........................................................................................................................................5
4.2 Hardware Configuration .......................................................................................................................5
5 Required Test Modules and Test Universe Version ..............................................................................9
6 Functional Range ......................................................................................................................................9
7 Not Supported Functions .......................................................................................................................10
8 OMICRON Test Strategy .........................................................................................................................10
9 Template Structure .................................................................................................................................11
9.1 Wiring Test .........................................................................................................................................11
9.2 Initial Test ...........................................................................................................................................12
9.3 87 Configuration Test Primary............................................................................................................12
9.4 87 Configuration Test Secondary.......................................................................................................12
9.5 87 Diff Pickup and Drop-off Test Primary...........................................................................................13
9.6 87 Diff Pickup and Drop-off Test Secondary......................................................................................14
9.7 87 Diff Characteristic Test Primary.....................................................................................................14
9.8 87 Diff Harmonics Blocking Test ........................................................................................................15
9.9 50/51 (50N/51N) Overcurrent Pickup Tests .......................................................................................16
9.10 50/51 (50N/51N) Trip Times Test.....................................................................................................16
9.11 Thermal Overload Trip Time and Thermal Overload Warning Signal Test......................................17
9.12 CB Test.............................................................................................................................................17
9.13 Reset of Trip Command Test ...........................................................................................................17
9.14 Tertiary Side Tests ...........................................................................................................................18
9.15 Using the RET 670 Transformer Differential Template for Two Winding Tests ...............................18

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1 General Information
The RET 670 transformer differential template is used for testing the current differential, overcurrent and
thermal overload protection functions of the RET 670 relays. This template comprehends different
modules for testing the main protection functions and the most important backup protection functions. The
template is used for testing 3-winding or 2-winding transformer differential protection function. It is
designed and configured for use with the ABB RET 670 V1.1 XRIO converter which is included in this
template. For more information about the converter, see the ABB RET 670 XRIO Converter User Manual.
Note: The template is designed and built for use with the Test Universe 2.22 SR2 software.
The template is tested on the following relay:
Manufacturer: ABB
Serial no: T0802056
Firmware Version: V 1.1
Notes:
The OMICRON PTTs are designed for an experienced OMICRON user. The user should be
familiar with the Test Universe software and the XRIO technology (see
http://www.omicron.at/products/training/ for training information).

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2 Minimum Hardware Requirements

For working with this template, you need a CMC test set with six current outputs for the differential
protection tests. To use the template with 5A relays, a CMC356 or a CMC 256 together with a CMA 156
current amplifier may be required. The development tests were performed with a CMC256plus.

3 Quick Start Information

To test with the RET 670 transformer differential template:
1.
2.
3.
4.

Double click the file RET 670.occ to start the template-based procedure.
Open the test object.
Load (Import) the latest XRIO converter version for the RET 670.
Enter your relay settings in the Relay Parameter Section, Additional Information General
Information Hardware Configuration Analog modules Transformer Configuration Side1
(Side2 and Side3), and then click OK.

Figure 1: Relay settings in the XRIO converter

5. Open the Hardware Configuration.
6. Enter all necessary information for:

7.
8.
9.
10.

General

Analog Outputs

Binary / Analog Inputs

Binary Outputs

DC Analog Inputs
Click OK.
Follow the wiring instructions.
Start testing.
Evaluate and archive the results.

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4 Using the Template

The RET 670 transformer differential template is divided into three object groups: the test object, the
hardware configuration and the list of OMICRON test modules used for testing the relay's protection
functions. The OMICRON test mosules are classified in different main groups, which are set in a tree
structure to create a better overview. The following test parts are available to test the RET 670 protection
functions:
Pre-test structure with wiring and initial tests
Primary-Secondary Side structure This group contains all necessary sub-groups to test the
transformer differential main- and back-up protection functions and the CB functionality at the two
sides of a 2-winding transformer or the fault side primary to secondary for a 3-winding
transformer. The CB Test in the Primary-Secondary Side structure is deactivated, if a 3-winding
transformer is used.
Primary-Tertiary Side structure: This group contains all necessary sub-groups to test the
transformer differential main- and back-up protection functions and the CB functionality at the fault
side primary to tertiary for a 3-winding transformer. This part is deactivated, if a 2-winding
transformer is used.
The template can be used for testing the following protection functions:
87 Current differential protection
50, 50N, 51, 51N Definite time and instantaneous phase overcurrent
49 Thermal overload protection
CB auxiliary contacts

4.1 Test Object

The test object already contains the RET 670 XRIO converter which includes all setting parameters of the
modeled RET 670 protection functions. The setting parameters are built as an image of the
PCM 600 software. For more information, see the ABB RET 670 XRIO Converter User Manual.

4.2 Hardware Configuration

The global hardware configuration offers different configuration options for voltage and current outputs.
For testing the RET 670 relay with the RET 670 differential test template, the standard configuration
shown in the following figure is required.

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Figure 2: Configuration of the voltage and current outputs

Note: If higher currents are needed for testing (e.g. relays with Inom = 5 A), the current output
configuration can be adapted (e.g. set to 3x25A).
The following pictures show the connection of the CMC 256 to the relay. Figure 3 shows the connection
diagram for primary to secondary tests and Figure 14 shows the connection for primary to tertiary tests.

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Figure 3: Connection diagram for primary to secondary tests

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In the Analog Outputs dialog box, the current outputs have to be routed to the name variables. Figure 4
shows the Analog Output configuration.

Figure 4: Analog Output configuration

In the Binary / Analog Inputs dialog box, configure the signals as follows:
1 trigger signal set to Relay TRIP W1
1 trigger signal set to Relay TRIP W2
1 trigger signal set to Relay TRIP W3
1 trigger signal set to Start
1 trigger signal set to Thermal Overload Warning
1 signals for the circuit breaker auxiliary contacts set to CB aux. W1 (52a)
1 signals for the circuit breaker auxiliary contacts set to CB aux. W2 (52a)
1 signals for the circuit breaker auxiliary contacts set to CB aux. W3 (52a)
The following figure shows the Binary / Analog Inputs configuration.
Note: The binary inputs are preset to potential free. Change these predefined settings to the values
needed at the test site.

Figure 5: Binary / Analogue Inputs configuration

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The necessary signals, trip signal, starting signal and circuit breaker auxiliary contacts (CB aux.), have to
be routed to the following binary inputs:
Relay TRIP W1 to:
binary input 1
Relay TRIP W2 to:
binary input 2
Relay TRIP W3 to:
binary input 3
Relay Start General to:
binary input 5
Thermal Overload Warning to:
binary input 6
CB aux. W1 to:
binary input 7
CB aux. W2 to:
binary input 8
CB aux. W3 to:
binary input 9
Note: The circuit breaker auxiliary contact is required for the trip test with the circuit breaker. If the circuit
breaker auxiliary contact cannot be connected to the binary inputs, the trip test with the circuit breaker
cannot be performed.

5 Required Test Modules and Test Universe Version

To use this template, you must have a valid test license for the OMICRON Test Universe 2.22 SR2 or
higher and the following test modules:

Control Center
Ramping
State Sequencer
Advanced Differential (Diff Configuration, Diff Operating and Diff Trip Time Charactreistic)
Overcurrent

6 Functional Range
The test modules are grouped according to the protection function to be tested. The template includes test
modules for the following protection functions:

Diff Configuration primary (87)

Diff Configuration secondary (87)
Diff pickup and drop-off primary (87)
Diff pickup and drop-off secondary (87)
Diff Operating Characteristic primary to secondary (87)
Diff Trip Time Characteristic primary to secondary (87)
5th Harmonic blocking
Overcurrent primary (50, 50N, 51, ,51N)
Overcurrent secondary (50, 50N, 51, 51N)
Thermal overload warning primary (49)
Thermal overload trip primary (49)
Thermal overload warning secondary (49)
Thermal overload trip secondary (49)
Diff Configuration tertiary (87)
Diff pickup and drop-off tertiary (87)
Diff Operating Characteristic primary to tertiary (87)
Diff Trip Time Characteristic primary to tertiary (87)
Overcurrent tertiary (50, 50N, 51, 51N)
Thermal overload warning tertiary (49)
Thermal overload trip tertiary (49)
Trip time with circuit breaker contacts
Reset of trip command

The test modules are activated and deactivated automatically according to the corresponding protection
function status in the test object.

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7 Not Supported Functions

The following functions of the RET 670 relay are not supported by the transformer differential test
template:
Restricted Ground Fault Protection
High impedance differential protection
Distance protection
Power Swing detection
Automatic switch onto fault
Breaker failure protection
Pole discordance protection
Overexcitation protection
Multipurpose protection
Synchrocheck and energizing check
Over- / underfrequency (f<>)
Over- / undervoltage (V<>)
Monitoring Functions

8 OMICRON Test Strategy

The RET 670 differential test template includes the pick-up and trip time value tests which are performed
in a standardized way. For the pick-up value testing, the setting value is evaluated by a ramp increasing
the variable under test until the pick-up value is reached. The drop-off value is tested with a second ramp
which decreases the variable under test until the starting signal drops off.
Trip times are tested by simulating a fault which exceeds the pick-up value and the specific tolerances.
This results in a trip command of the tested protection function. The time between the simulation of the
fault and the reception of the trip signal is measured and evaluated.
Note: Do not only rely on the automatic assessment of the test points in the test modules but check the
plausibility of all test results manually to achieve maximum reliability of the test results.

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9 Template Structure
The structure of the RET 670 differential test template is shown below.

Figure 6: RET 670 differential test template

Note If you want to use the RET 670 transformer differential template for testing the two-winding
transformers with a relay similar to the RET 670 relay, connect the "Relay Trip W3" signal to the "Relay
Trip W1" signal. This ensures that all trip signals routed in the test modules are available.

9.1 Wiring Test

The wiring test is used to check the connections between the CMC test set and the relay. Therefore the
OMICRON Diff Configuration test module is used to simulate a through fault condition with IFault = 1 Iref.
If the test set and the relay are connected correctly, the relay will not trip during this test. Check the output
values with the values measured by the relay. If both values match, the relay and the test set are wired
correctly and the test can be manually assigned as passed.

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9.2 Initial Test

The initial test is used to check whether the relay trips when a standard fault condition occurs. The
OMICRON Diff Trip Time Characteristic test module is used for the initial test. A three-phase fault is
simulated with Idiff = 2 Iref which has to be switched off by the differential protection function of the relay.

9.3 87 Configuration Test Primary

The configuration test is used to check the correct behaviour of the relay in a through fault condition, when
the fault occurring on the primary side gets supplied from the secondary side of the protected object.
Therefore the OMICRON Diff Configuration test module is used. The configuration test is executed for
phase-phase faults and for phase-ground faults, in order to check the correct removal of the zero
sequence components. The test is passed when no trip occurs and should be manually assigned.

Figure 7: Configuration test primary

9.4 87 Configuration Test Secondary

The configuration test secondary is similar to the configuration test primary described above, but the fault
location is on the secondary side of the protected object. The supply side is the primary side of the
protected object.

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Figure 8: Configuration test secondary

9.5 87 Diff Pickup and Drop-off Test Primary

This test is used to check the Idiff> setting of the relay. Therefore a ramp module is used to inject a three
phase current only on the primary side. This current is increased until the relay sends the pickup signal,
which should occur when the current reach the Idiff>.

Figure 9: Pickup and Drop-off test primary

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9.6 87 Diff Pickup and Drop-off Test Secondary

This test is similar to the pickup test realized for the primary side. In this case, a ramp module is used to
inject a three phase current only on the secondary side.

9.7 87 Diff Characteristic Test Primary

The diff characteristic test primary is designed for testing the relay's behaviour to internal fault conditions.
Therefore the OMICRON Diff Operating Characteristics and the Diff Trip Time Characteristic test modules
are used. The operating characteristic is tested with several search lines from 0.5 Iref to 4 Iref. The
predefined search lines can be modified by the user.

Figure 10: Diff operating characteristic test

Note: The predefined search lines are limited to 4 Iref due to the high currents needed for this test point,
as high currents may damage the relay's current inputs.
Note The diff operating characteristic is based on Iref values of the relay. It is not based on Inom as shown
in the test module.

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The diff trip time characteristic is tested with a single test shot at Idiff = 2 Iref.

Figure 11: Diff trip time characteristic test

Note: The test point can be modified by the user. If the test current is too low, remove it and set a new
test point.

9.8 87 Diff Harmonics Blocking Test

The blocking of the differential protection function by 5th harmonics is tested with OMICRON Diff Harmonic
Restraint test module. A search line is placed at Idiff = 1.5 Iref. Additional search lines can be added by
the user.

Figure 12: Diff harmonics blocking test

nd

Note: The 2

harmonic test for RET 670 is not supported.

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9.9 50/51 (50N/51N) Overcurrent Pickup Tests

These test modules are used to test the pickup signal of the 50/51 (50N/51N) overcurrent protection
function of each winding. These tests are repeated for each transformer winding and will not be described
again, as the other two tests are copies of the first one with different pickup values according to the
transformer sides. The OMICRON Ramping test module is used for the overcurrent pickup tests. The
current in the respective phase is increased until the 50/51 (50N/51N) pickup value is reached and the
relay starts. The drop-off value is measured until the start signal is reseted. The reset ratio is calculated
for each value.
Note: The differential function has to be blocked before testing the overcurrent functionality.
Note: The Overcurrent parameters InMult, INnMult and StVaIMult can be activated in Additional
Information -> Relay Information -> Configurations -> Overcurrent

9.10 50/51 (50N/51N) Trip Times Test

The 50/51 (50N/51N) overcurrent trip times are tested with OMICRON Overcurrent test module. The
modules are defined to test all the involved phases. The test shots are set at 1.15xI>, 0.9xI>>,
1.1xI>>, 0.9xI>>> and 1.1xI>>>. The trip time for each test point is measured and evaluated. Each
phase is tested separately. This test is repeated for each transformer winding as described here.

Figure 13: 50/51 trip times test

Note: The Overcurrent parameters InMult, INnMult and StVaIMult can be activated in Additional
Information -> Relay Information -> Configurations -> Overcurrent

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9.11 Thermal Overload Trip Time and Thermal Overload Warning Signal Test
The thermal overload warning and trip times signal of the relay is tested with the OMICRON Overcurrent
test modules by simulating a three-phase fault.
Generally the thermal overload warning and trip times tests start with the simulation of a cold start resetting the thermal overload memory, i.e. the fault begins without pre-fault state. The test shot for both
tests is set to 1.15 IN.
The only difference between the thermal overload warning and trip times test is the monitored binary
input. The trip times test is routed to the trip signal, while the warning input of the relay is triggerd in the
test of the thermal overload warning.
Note: The memory of the relay's thermal overload model has to be reset prior each thermal overload test.
For testing the thermal overload functionality behind the IHighTau threshold the OMICRON State
Sequencer test module is used by simulating a three-phase fault. For more information see the relay
manual.
Note: The thermal overload warning can only be tested if the warning signal of the thermal overload
function is routed to one of the relay's outputs.
Note: The Thermal Overload parameters ENMULTTTRn and FORCED COOL TTRn can be activated in
Additional Information -> Relay Information -> Configurations -> Thermal Overload. Also the side of TTRn
can be set there.

9.12 CB Test
For testing the trip time with circuit breaker contacts test, an OMICRON State Sequencer test module is
used. This test is divided into three sequencer states: pre-fault, fault and post-fault. The fault is a threepole fault with Idiff = 2 Inom. The time elapse between the trip command and the circuit breaker open is
evaluated.

9.13 Reset of Trip Command Test

The reset of the trip command is tested with an OMICRON State Sequencer test module. A sequence of
three states is used, beginning with a pre-fault state with nominal voltage and current. A fault with 2 Idiff>
is created, forcing the relay to trip. The time between the trip command and the reset of the trip command
is evaluated.

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9.14 Tertiary Side Tests

For testing the three-winding transformers, the connection between the CMC test set and the relay has to
be adapted as shown below.

Figure 14: Wiring information for primary to tertiary tests

After the wiring has been adapted, the primary to tertiary tests can be executed. The tertiary tests are
similar to the primary to secondary tests descrtibed above. For more information on the tests, see the
corresponding primary to secondary test description.

9.15 Using the RET 670 Transformer Differential Template for Two Winding Tests
If you want to use the RET 670 transformer differential template for testing two-winding transformers with
a relay similar to the RET 670 relay, connect the "Relay Trip W3" signal to the "Relay Trip W1" signal.
This ensures that all trip signals routed in the test modules are available.

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