Beruflich Dokumente
Kultur Dokumente
of Mahatma Gandhi
Some
S
Som
e Appl
Application
ppllica
i tion o
off IInstrumentation
nstrum
ment
en
n ati
a on E
Eng
Engg.
ngg.
g /
A ati
Avi
a on
Aviation
Page 1 of
Some
Som
eA
Application
ppllica
icatio
ca
ation
ttio
on o
off IInstrumentation
nstrumentati
ati
ation
tiion
o Eng
E
Engg.
g. /
Atomic Energy
Some
Som
S
ome Appl
A
Application
pp ica
pp
ic tio
t n off Inst
ti
IInstrumentation
ns rumentation
o Engg.
g /
g.
Furnace
Gathered
EC 0
E
010
10 704
ELECTRONIC
ELE
ECTR
C ONIIC IINSTRUMENTATION
NST
TR
RU
RUM
U ENTATION
((Syl
(S
(Sy
(Syllabus)
y labu
abu
bu
us)
EC
C 0010
10
0 704
704
0
ELECTRONIC INST
INSTRUMENTATION
NSTRUM
NST
MENT
EN
NTA
N
ATIION
(Syllabus)
3 hours
hour
urrs lecture
lect
llec
ec ure
ree and
a 1 hour tutorial per week
References
nces
nc
References
1
1.
of Mahatma Gandhi
6.
Me
asurement Systems:
Syyystems::
Measurement
Electr
Electronic
ec ronic Instrumentation and Measurements
ectr
Measurements
men
en
nt
Davi
v d A Bell
B
DavidABell
Er st Doeblin &
Ern
Erne
Dhanesh
esh
e
sh
hN
Manik
ErnestDoeblin
&Dhanesh
NManik
2.
7.
7
El
ectronic
ctr
Instrumentat
ntati
tation:
io
Electronic
Instrumentation:
HSKalsi
H
S Kals
lsii
3.
In
strrrumen
ment
n ationDevices and System
tem
ems:
s
InstrumentationDevices
Systems:
CSRangan,GRSarma
C
S Rang
R
an, G R Sarma &VSVMani,
&V S V Mani
Ma ,
Modern Electronic
Elecctron
t ic Instrumentation
In
I stru
strument
str
m ation and Measurement techniques:
technique
ues:
ues:
8.
Electronic
Electtron
onic Measurements
Measurem
ments
e and
an Instrumentation:
Instrumentation:
9.
9.
Measurements
Me
assurreme
emen
en
nts and Instrumentation:
Instrumentation
tion
ion:
n:
RKRajput,
R K Rajput,
AlbertDHelfrick
&WilliamDCooper
Albert
D Helfrick &
William
liam
i DCooperr
4.
Measurement
Me
asu
urementt & Instrumentation
Instrumentation Principles:
UABakshi,AVBakshi,
U
A Bakshi, A V Bakshi,
AlanSMorris
Alan
A
Al
S Morris
5.
Transducers
Transducers & Instrumentation:
In
Instrument
n
m atio
ment
t n:
tio
ti
D.V.SMurthy
D.V.
S Murt
M hy
EC 010 704
AKSawhney,
A
K Sawh
S
Sa
ney
ne
ney,
ey
ELECTRONIC
ELE
CTR
TRONI
NIIC IINSTRUMENTATION
NSTRUM
TR
ENTATI
ATION
AT
ATI
O
(Sy
(Syl
(Syllabus)
Sy
y labus)
E 010
EC
010 704
704
ELECTRONIC
E
ELE
CTR
CTRONIC
TR
R
INST
INSTRUMENTATION
NS RU
UMENTATI
A ON
(Syllabus)
(Syllabus)
3 hours lecture
lectu and 1 hour tutorial per week
Module
Module
e 1(12
1(12 hrs)
References
IntroductiontoElectronicInstrumentation
Introduction
to Ele
E ctr
trroni
o c Instrumentat
t ion
ta
ObjectivesofEngineeringMeasurement
Objectives off Engineeri
erring Mea
ea
asur
s ement
BasicMeasuringSystem
Basic Measu
uring System
BlockDiagramandDescription
Blo
ckk Dia
Diagram and Description
PerformanceCharacteristicsofInstruments
Per
P formance Characteristics of Instruments
StaticandDynamic.
ErrorsinMeasurement
ErrorAnalysis.
Units
Dimensions
Standards.
InstrumentCalibration
Page 2 of
Gathered
EC 010 704
ELECTRONIC INSTRUMENTATION
(Syllabus)
3 hours lecture and 1 hour tutorial per week
Module 2 (12 hrs)
EC 010 704
LVDT,
Transducers
of Mahatma Gandhi
ELECTRONIC INSTRUMENTATION
(Syllabus)
3 hours lecture and 1 hour tutorial per week
Module 3(12 hrs)
IntermediateElements
ParametersofElectricalTransducers
HallEffectSensor,
Types
ThinFilmSensor,
InstrumentationAmplifier,
WagnerGroundConnection.
ActiveandPassive
ProximitySensor,
IsolationAmplifier,
DataTransmissionElements
AnalogueandDigital
DisplacementSensor,
Opto Couplers.
BlockDiagramofTelemetrySystem
ElectromechanicalType
LoadCell,
DCandACBridges
ElectricalTelemeteringSystem
Potentiometric,
Potentiometric,
NanoSensorsAnd
Inductive,
Inductive,
Ultrasonic
Transduc
sducers.
sduc
ers
rs
UltrasonicTransducers.
Thermocouple,
Opto ElectricalTypephotoEmissive
Ele
lectrical Typephoto Emiss
E
ivee,,
Capacitive,
Capacitive,
Photo
C
Cond
uctive and
PhotoConductiveand
Resistive,
Resistive,
Photo
V aic Type.
Volt
PhotoVoltaicType.
Piezo
Electric,
PiezoElectric,
Digitall Enco
E ders
DigitalEncoders
Strain
Gauge,
StrainGauge,
Opti
Opti
p ical
pti
cal Encoder
OpticalEncoder
Ionization
Gauge,
ge
IonizationGauge,
EC 010 704
Wheatstone Bridge
WheatstoneBridge
Guar
Guarded
Gua
Gu
d Wheatstone Bridge
GuardedWheatstoneBridge
Owen's Brridge
Owen'sBridge
Bridge
d
Wein Bridge
R ordin
Rec
ng Tec
ecchni
hnique
hn
qu s
RecordingTechniques
Pulse
Telemetry
PulseTelemetry
(Analogue
and Digital).
(AnalogueandDigital).
FDMTDM.
M
Selectio
ion Crit
riteria
ria for Tran
ran
an
a
n
nsduc
sd ers.
sduc
s
SelectionCriteriaforTransducers.
(Syl
(Syllabus)
yllla
yllabu
labus)
labu
s
s)
3 hours lecture and 1 hour tutorial per
peer
er week
week
Modu
le 4(12
4(12
( 2 hrs)
Module
DigitalVoltmeterandAmmeter.
Diiig
Dig
gita
itall Vol
Vo tme
meeter
er and
a Ammeter.
RFTelemetry
RF
Telemetry
Shering Br
Bridge
SheringBridge
ELECTRONIC
ELE
ECTR
C ONI
NIIC IINSTRUMENTATION
N
NST
TRUM
RUMENTATION
RU
N
Enddevices
End devices
e
Voltage,CurrentandPositionType
EC
C 0010
110 704
704
ELECTRONIC
EL
ELE
LECTR
C ONIC
C IINST
INSTRUMENTATION
N RUM
NS
NST
UM
MENT
NTATI
ATION
(Syllabus)
3 hours
hour
our
urrs lecture
u
lect
ec uree and
ec
a 1 hour tutorial per week
Module
e 5(12
5(12
( hrs)
Module
Basicmeasurements
Basic
ic mea
ic
m surements
Spectrum
Analyzer,
SpectrumAnalyzer,
DSO.
DSO.
Co
on
o
ntro
t l System
tr
ControlSystem
Pressure,
Pressure
su
u ,
ure
Resistance,
Resi
Reeess stance,
Flow,
Flow,
Capacitance,
Capa
C
p citance,
pa
Temperature,
Temperat
r ture,
ra
rat
Inductance,
Indu
nd
d ctan
ta
a ce,
an
c
ce
Force,
Force,
StripChartRecorders
Str
ip Chart Record
ip
cor
o ers
Ele
E ctr
Ele
ctroni
ro c Con
on
ntrol
tro
ro
ElectronicControl
Voltage,
Vo
olttage,
ta
Torque,
Torque,
XTandXYRecorders.
XT
a X
and
XY
Y Rec
Record
or ers.
Ana
loguedig
og
g digital
ig
Analoguedigital
Current,
Curr
urrr
r ent,
mass,
mass,
BasicPrinciplesofDigitalRecording.
Basic
c Principles off Digi
D tal Recording.
Bas
asic
ic Pri
P nci
Pr
ciiple
less of
o PLC
C.
BasicPrinciplesofPLC.
Power,
Powe
ow
w r,
conductivity,
conductivity,
Strain,
Stra
tra
ain,
n,,
pH.
H
BasicPrinciplesof
Basic
Bas
ic Pr
Principles of
Signa
na
al Analyzers
SignalAnalyzers
Basic
asiicc Pri
as
P nciples of
BasicPrinciplesof
DataAcquisitionSystem
Data Acq
quissition
t on
ti
n Sys
S tem
e
em
DistortionAnalyzer,
Dis
torrtio
t n Analyzer,
yzer
e
WaveAnalyzer,
Wave
A lyz
Ana
yzer,
yz
er
Page 3 of
Gathered
of Mahatma Gandhi
ELECTRONIC INSTRUMENTATION
EC 010 704
(Syllabus)
References
1.
Measurement Systems:
2.
Electronic Instrumentation:
HSKalsi
3.
4.
Measurement
Instrumentation
M
Measurement & Instru
st mentation Principles:
5.
AlbertDHelfrick
&WilliamDCooper
Albert
D Helfrick &
WilliamDCooper
AlanSMorris
Alan S Morris
D.V.SMurthy
D.V.
S Murthy
1
EC 010 704
ELECTRONIC
ELE
ECTR
C ONIIC IINSTRUMENTATION
NST
TR
RU
RUM
U ENTATION
(Sy
(Syl
(Syllabus)
lab
labu
la
a s)
References
6.
ELECTRONIC INST
INSTRUMENTATION
NSTRUM
NST
MENT
EN
NTA
N
ATIION
EC
C 0010
10
0 704
704
0
(Syllabus)
Electronic Instrumentation
Instru
u nta
ume
ta ion and
tat
tation
and
d Measurements
M
Measurements
11. A Course
Co se in Electrical and Electronic Measurements
Cou
Cour
Measu
su
ureeem
ments and
and Instrumentation:
Instru
nstr
strumentatio
tr
a n::
David A Bell
DavidABell
7.
3 hours
hour
urrs lecture
lect
llec
ec ure
ree and
a 1 hour tutorial per week
References
nces
nc
J B Gupt
G
Gu
a
a,
JBGupta,
Instrument
u
atiiio
onDevicess a
n Sy
nd
stems:
InstrumentationDevices
and
Systems:
CSRangan,SGRarma
C
S Rangan,SG R arma &VSVMani,
&V S V Ma
Mani
a ,
8.
Electronic Measurements
Meeasurem
reem
ments
ntts and
d Instrumentation:
Instrumentation:
9.
Measurements
Me
M asur
assu ements
asu
ts and
and Instrumentation:
RKRajput,
R K Rajp
R utt,
t
UABakshi,AVBakshi,
U
A Ba
Bak
akshi, A V Baks
aks
ksh
hi,
i,
i
10 A Course in Electrical
10.
Elecctric
t all and
and Electronic
E
Electr
El
trro
r nic Measurements
Measureeme
ments and
and Instrumentation:
In
nstr
stttru
r mentation:
AKSawhney,
A
K Sawhney,
EC 010 704
Introduction
Inttrod
roduct
ro
od
du
uct
ction
i to
t Me
Measurement
asssu
asurement
u
and
d IInstrumentation
nsttrum
rumentation
ru
n
ELECTRONIC
ELE
CT
TRONIC
C IINSTRUMENTATION
NSTRUM
TR
ENT
TATI
AT ON
AT
N
(Syllabu
(Sy
(Syl
(Syllabus)
l
s)
3 hours lecture and 1 hour
hou tutorial per week
Module
Module
e 1(12
1(12 hrs)
oMeasurement
oMeas
urement
men
ent
nt
o
IntroductiontoElectronicInstrumentation
Introduction
to Electronic Instrumen
m tation
me
oresult
t of
oresultof
ObjectivesofEngineeringMeasurement
Objectives of Engineering Measureme
men
ment
oquantitative
t comparrison betw
bet
betw
oquantitativecomparison
BasicMeasuringSystem
Basic
Measuring System
opredetermined
d
standard
opredeterminedstandard
ounknown
magnitude
ounknownmagnitude
BlockDiagramandDescription
Block
Diagram and Description
oproc
ocedur
oc
edure
dur apparatus
oprocedure
PerformanceCharacteristicsofInstruments
Performance
Characteristics of Instruments
ofor comparison
StaticandDynamic.
omustbeprovable
ErrorsinMeasurement
o
ErrorAnalysis.
ocalibration
Units
Dimensions
Standards.
InstrumentCalibration
5
Page 1 of
Gathered
Measurand
of Mahatma Gandhi
Measurement Process
ophysicalquantity
ocharacteristiccondition
oobjectof
omeasurement instrumentationsystem
o
o"measurand"
omeasurementvariable"
o measurement
t variable
o"instrumentationvariable"
o"instrumentation
variable"
o"processvariable"
o"process
variable"
Measurand
M
Me
asur
urran
a d
Basic
Bas
asic
asic
ic Requirements
R uirements
Re
Req
t for
fo
orr Getting
Getting
ing
ng
g
Mea
M
ningful Result of Mea
eaasur
s eme
m ntt
ment
me
Meaningful
Measurement
standard
sta
s ndard for
forcompariso
compa
arriso
a
is
o mus
m
t be accurately defined and
nd
d
mustbeaccuratelydefinedand
o common
commonlyacceptable.
ly
y acc
accept
cce able.
standard
sta
sta
t nd
ta
da
d
ard
samecharacterasthemeasurand
and
o
sam
me cha
ch racter
err as
a the measurand and
usually,butnot
definedby
o us
usu
sually, but no
ot
o
def
ined
n d byy
ne
recognizedagency
o
rec
r ogn
gnize
gn
ized agency
ize
e.g.,BureauofIndianStandards(BIS)or
o e.g.,
Bureau of
of
f Ind
In ian Standards (BIS
( S) or
o the
ttheInternationalOrganisationofStandards(ISO)
he Int
In ernationall Org
O ani
anisation
i
of Standards (ISO
O)
Theapparatus
usedandmethod
adopted
3. The
apparatus used
and
nd
d met
m tho
hod ad
ado
dopted
d
comparison purposes
purpos
urrp es
thecomparison
o for the
mustbeprovable.
o must
be provable..
9
10
Instrumentation
Ins
stru
tr mentat
tation
tat
i
Process
P
Pro
r cesss IInst
Instrumentation
n rumenttati
a on
n
oinstrumentused
oinstru
tru
r me
m ntus
u ed
otech
o instrument
omeasurement
r
t an
and
d control of
of
omeasurementandcontrol
omeasure control
oindustrialmanufacturing,
oindu
ndu
dust
s rial manufacturing,
g
oconversion ortreatmentprocess,
ophycheprop
omaterials
otheterm
o
o"processinstrumentation
o"instrumentation".
o
11
Page 2 of
12
Gathered
Control System
of Mahatma Gandhi
Modes of Measurement
omeasuring
oPrimary
ocontrollinginstrument
o
oSecondary .
omeasurprovide
oimpulses
oT
Tertiiary .
oTertiary.
oremoteautomation
oremote automa
matiion
ma
o
o
o
ocontrolsystem
ocontrol
t
system
13
14
Primary
Primar
maa y Meas
m
Measurement
assure
u men
ur
nt
Secondary
S
Se
Sec
econd
ond
dary Measu
Measurement
urem
r ent
o
o
oIndirect
oInd
I ir
ire
reect
o
comparrin
co
i g directly
di
diire
r ctly with
ocomparing
with
'one translati
ati
to
ti
tion
on
n'
o'onetranslation'
o
reff
st
stan
a dard
orefstandard
o
oNo
converrsi
s on me
m asurand
oNoconversionmeasurand
osecond
ondary
ond
n ary
a measurements
ar
osecondarymeasurements
ote
rm
ms off leng
leeng
ngth
otermsoflength
E.g.
E.g
g :
E.g.:
o
E.g.
g:
oE.g.:
o
Pre
reessu
sssure
oPressure
o
time
ountin
ing
ng
o
timeounting
o
man
anome
om
meters.
manometers.
o
strokes of
o
cl
clock
cl
k
strokesofclock
oTemperature
o
de
d te
termining
e
length
odetermining
omercury
thermo
er metters
ers
er
omercurythermometers
o
wi
w th ruler
wi
r
owith
ruler
15
16
Tertiary
Tertia
ary Measurement
Measur
su
urement
n
oIndirect
oIndirect
Generalised
Gen
ne
era
ralis
lised Measurement
li
Me
Mea
e surementt System
ea
te and
tem
ts Fu
F
nctional Ele
ments
me
its
Functional
Elements
o'twoconversions
o'two
conversions
o tertiary
tertiary
o
otemperature
othermocouple
h
l
17
Page 3 of
18
Gathered
of Mahatma Gandhi
osensitive
omeasuredvariable
oSense the
ocondition,
ostate or
ovalue of the
oprocessvariable by
t
a small part of energy
oextracting
asmallpartofenergy
owithoutchanging
o
w thout changing
wi
o
ofrom
the measurand,
d and
and
ofromthemeasurand,
an output
oproduces anoutput
o
in
nfo
f rmat
ation
t
content signal
oinformationcontent
19
20
Manipulation
Man
nipu
i lation
ion
on
n el
eelement
ement
nt
nt
Datatransmissionelement
D
Dat
Da
ata tra
t nsmission
on ele
e men
m t
oOperateon
oOper
e ateeo
on signal
signal
oTransmitsignal
oT
Transmitssignal
oaccordingtomathrule
oaccord
or in
ing
g to
t math
ru
ru
ule
oonelocationanother
oo
one location anotheer
owithoutchangingphysicalnature
owi
withou
i out
ou
ut ch
c anging phys
yssic
ical
al na
n ture
re
re
owithoutchanging
owithou
ut changing
ovariable
ovariable
oinformationcontents
oiinforma
atio
on contentts
21
22
Data presentation
pres
essent
e ation
on element
elemen
m t
Data
D
Da
Dat
ap
presentation
res
essent
e ation el
en
element
lemen
nt
oProvide
oProvide
indication
i dicati
in
t on
oProvide
o
P ovide
Pr
indication
indication
ooutput from
ooutputfrom
o
ou
outp
ou
tput from
tp
ooutputfrom
omanipulationelements
omanipulationelements
23
Page 4 of
24
Gathered
Performance Characteristics
of Mahatma Gandhi
Static Characteristics
oCharashow
oAccuracy
operformanceofinstrument
odegreeofexactnessmeasur
oE.g.
ocomparedtoexpected )value
oaccuracy,
oprecision,
oResolution
o resolution,
osmallestchangemeasurvariable
o sensitivity
otowhichinstrument
oto which instrument respond
oAllowuserselect
oAllow userselect
oPrecis
reecision
ion
oPrecision
omostsuitableinstrument
omost suitable instrument
omea
m surco
onsistency
ncy
omeasurconsistency
ospecific job
osuccessiv
s e rea
re ding not
ot differ
osuccessivereadingnotdiffer
obasiccharacteristics
obasic characteristics
oStatic
oDynamic
Static
Sta
atic Characteristics
Ch
hara
racte
acte
c ris
r tics
ri
Error
Err
E
Er
r or
o in Measurement
Measur
urem
ur
eme
m nt
n
o Mea
M
Me
Measurintroduceerror
surintroducee err
e or
oError
o
Error
o
expressed
expressed
odeviation
off ttru
ru
ue val
v ue
odeviationoftruevalue
a olperc
abs
err
e or
o absolpercerror
ofrom
ofr
fro
rom desiredvalue
des
esire
es
i d value
ire
Abssolu
olute
lute
te error
o Absoluteerror
oSen
Sensit
s ivity
si
sit
y
oSensitivity
o
oratio changein
ch
hange
h
ge in
in output
output
ch
ha
h
ange
inp
in ut
in
oto changeinput
Y expectedvalue
exp
xp
pect
e ed value
n expect
ed
d va
val
a ue
measuredvalue
X measured
n
o
o %
error
%error
8
Errorr in
i Mea
Measurement
sureme
re ntt
oRelativeaccuracy
y A
o%Accuracya
o%
Accuracy
y a
Yn X n
Yn
oRelaccuracy
o
Rel
Re
eel
accuracy
y A
o%Accuracya
o%
% Accuracy
y a
Xn Xn
Xn
Xn
Yn X n
Yn
Xn Xn
Xn
o
o X n val nth measur
o
average measure
10
Page 5 of
HUURU A u
oPrecisionP
o
o X n value nth measur
o
Y X
n n u
Y
n
Error
E
Err
or in
n Measurement
M surement
Mea
e
HUURU A u
oPrecisionP
Y X
n
n
Xn
averagesetofmeasur
11
Gathered
Example 1.1
Givenexpectedvalue80V
absoluteerror
% error
relativeaccuracy
relative accuracy
% accuracy
Y X
Yn
n
A n
Relativeaccuracy,0.9875
Relative accuracy,0.9875
A u
%accuracya0.9875x100%=98.75%
%
% accuracy
y a
0.9875 x 100%=98.75%
Significant
Signif
fican
iccan
a t Figures
Fiigu
gure
res
Example
Exam
Ex
a plle 1.2
12
1.
o
o
thmea
precisionof6
prrreecissio
ion
on
n off 6th
measur
su
ur
u
Solution
S ution
Sol
o
average
measurvalue
averag
rag
age
a
measurvalue
ue
ue
o
o
o
Xn
6
6thh
Xn Xn
Xn
readingPrecision
reading
Precision
No
Xn
9
98
10
101
0
102
10
97
1
101
1
100
1
103
98
1
106
0
10
99
Significantfigure
Significant figure
Sig
actualinformationreg
o
actual
information reg
o
magprec
magprec
Mo
Mor
M
Moresignificantfigure
o e significant figure
.
.
X2
Fiin
nd precision
pre
pr cision X
pr
X
X1 X
Find
.
X
X
X
Precision=
Page 6 of
===>>2s.f
===
=>>
> 2 s.ff
===
===>>3s.f
>>
>
> 3 s.f
Significant
Si
ign
gnif
i icant Fi
if
F
Figures
gure
res (con
re
(cont)
o t)
===>> 2 s.f
===>>2s.f
===>> 3 s.f
===>>3s.f
Precision
X
Rulesforsignificantfigures
Rules
Ru
lee for significant figu
g res
X
Xn
X
Solution
So
olution
ion
o (Example
(Ex
xam
a ple 1.3)
3)
Xn
greaterprecision
grreeate
gre
a r precision
on
Example1.3
Exxxa
ample
le 1.3
.
.
80V 79V=1V
Yn X n
u
u
%error1.25%
Yn
measurement79V
Calculate,
9
9
9
9
measurementvalue79V
Absoluteerrore=Yn X n
expectedvoltage80V
of Mahatma Gandhi
Allnonzerosig
All non
nzero
o
sig
g
Zeros bet
ettwo non
n zero sig
Zerosbettwononzerosig
Leadingzeros
Leadin
ng zeros notsig
not sig
Trailingzerossig
T ili
i
===>moreprecise
Gathered
Example
1) Gross human
2) Systematic
3) Random
123.45 5sig
1001 4sig
100.02 5
sig
5sig
5sig
0.00001 5
sig
2sig
1.100 2
sig
3sig
0.00100 3
sig
GrossError
o
humanmistakesreadinginstruments
cannoteliminatecanminimize
ca not eliminate can minimize
can
Types
T
Ty
pes off Static
Sta
S
tati
ta
tati
tic Error
Errro
or (Cont)
(Con
(C
Con
ont)
t
Types
Ty
pes
pe
e of Static
Sta
taati
t c Error
Erro
ror (Cont)
ror
SystematicError
Systematic
Err
E
Er
r orr
Instrumental
Instrumentalerror
error
sho
s rtc
rtcomi
om
miings
m
n of instrument
insstrrument
shortcomings
o
defective
deeeffecttiive
ve wornparts
worn parts
of Mahatma Gandhi
o mechanicalstructure
mechan
ha
anica
niicc l structure
3types
3
types
e
o bearingfrictionirregularspringtensionstretchingofspring
bea
arin
riing fri
fricti
ricti
c onirregular
ct
ula
lar
ar spring tensionstretc
tchin
tc
hing
hin
g of
o sp
prring
p
r
Instru
nstru
trumen
tr
m tal
me
Instrumental
o
avoidedby
avoided
d by
by
Environme
n ntal
Environmental
Observational
selectsuitableinstrument
select
ellec
e
ect
sui
suitab
sui
t le instrument
appli
particular
appli
correctionfactor
cor
cor
orrre
orrec
r tion fac
f tor
calibrateinstrument
calibrate instru
ns ment
en
nt
Types of Static
Static
ic Er
E
Error
ro
or (Cont)
t))
Types
Typ
Ty
pes off Static
Sta
S
t tic Error
Erro
r r (Cont)
ro
(C
Con
o t)
Environmentalerror
Environmental error
o externalcondition
external condition
Observationalerror
Observat
vat
atio
i nal erro
or
oby
byy
observer
obyobserver
inclsurroundingareacondition
o inclsurrounding
area condit
d ion
dit
i
suchastemperature,humidity,
o such
as temperature, humidity,
y
ob
barometerpressure
mostcommon
m
mo
ost common
o parallaxerrorestimation error
o to avoiderror
airconditioner
o
sealing componentinstrument
magneticshields
Page 7 of
Gathered
of Mahatma Gandhi
Dynamic Characteristics
o Instrrarelyrespondinstantaneously
o unknowncauses
o changes in measuredvariables
o allsystematicerroraccounted
o
o accumulationofsmalleffect
o mass,
thermalcapacitance,
capacitance,
o thermal
avoided by
o avoidedby
fl id
flu
i capacitance
o fluidcapacitance
electricalcapacitance
ec ical cap
capaci
apac
aci
c tance
o electr
statistical means
o statisticalmeans
best approximationoff true value
o bestapproximationoftruevalue
Dynamic
D
ynamiic Characteristics
Ch
haracteeristiics
Dynamic
D
ynamic Characteristics
Ch
hara
acteriistics
omostcommonvariations
omost com
mmon variation
ns
oS
Step change
oStepchange
o
o
oprimaryelementsubj
opr
prrim
i ary elem
men
e t subjj
oS
Step
p change
oStepchange
oinstfinite
oin
nsstt
fi
fini
fi
n te change
ni
h
oLi
inear change
oLinearchange
omeasuredvariable
omeassur
ured
e variable
oSin
nussoidal ch
hang
ge
oSinusoidalchange
Dynamic Characteristics
Cha
aracteeristicss
Dynamic
D
ynamic Characteristics
Characcterristicss
oLinear
change
oLinearchange
oSinusoidalchange
oSinusoi
idal changee
o primary
primaryelementfollow
y elemen
nt fo
f llow
omeasuredvariable
o
measured variable
omeasuredvariable
omagchange
ochanglinearly time
oaccordancewith
osinusoidalfunction
oconstamplitude
Page 8 of
Gathered
Dynamic Characteristics
of Mahatma Gandhi
Dynamic Characteristics
o dynamiccharacteristicsofinstrument
o Dynamicerror
o Speedofresponse
odiffbetw
o rapidity
otrue measuredvalue
oinstrumentrespond
onostaticerror
ochanges
in measured quan
anti
nti
tity
ty
ty
ochangesinmeasuredquantity
Dynamic
D
ynamiic Characteristics
Ch
haracteeristiics
Dynamic
D
ynamic Characteristics
Ch
hara
acteriistics
o Lag
o Fid
F
Fidelity
elity
o delayresponse
delay
y
re
r sponse
o degree
degreetowhichinstr
to which
instr
o indicates
ch
cha
changein
h
changein
o
inst
nstru
stru
rume
m nt to
oinstrumentto
o me
mea
eea
asur
s ed variable
measuredvariable
och
han
ange
g s in measured
ed
d vari
var able
va
e
ochangesinmeasuredvariable
o wit
w
hout dynamic error
withoutdynamicerror
o ((fai
aithf
thful
hffu reproduction).
n
(faithfulreproduction).
Limiting
Limi
miti
mi
t ng
ti
g Error
Limiting
L
Li
imi
m ting Error
E orr (Cont)
((Co
C nt
nt))
Example1.6
Exampl
mplee 1
mpl
mp
1.6
6
o accuracy
accuracyofinstr
of
instr
o
600Vvoltmeteraccuracy
600 V voltme
tm ter accura
u cy r2
2%fullscale
2%
full scale
o Calclimitingerrorwheninstru
Calclim
l iting
g err
error
rro when instru
o full
fullscalereading
scale reading
o usedtomeasur250V
used to
o measur250V
V
o manuf
manufspecify
f
specify instr
instr
r
o accurateatr2%
o magoflimitingerror
o withfullscaledeflection
o 0.02x600=12V
o readinglessthanfullscale
o limitingerrorfor250V
o limitingerrorincreases
Page 9 of
o (12/250)x100=4.8%
Gathered
of Mahatma Gandhi
Standard
o standard
o
o knownaccuratemeasure
o limitingerrorvoltmeterat70V2.143%
o limitingerrorammeter80mA 2.813%.
o
o Determine limitingerrorofthepower
used to determine
o usedtodetermine
o limitingerrorforthepower
limiting error for the power
o va
lues
u other
physical quantities
values
otherphysicalquantities
o 2.143%
2.143%+2.813%
+ 2.813%
o=
4.956%
=4.956%
o
comp
om arisson method
ocomparisonmethod
Standard
S
tand
da rd
Standard
S
tandarrd
o All
Allstandards
standa
ards
preserved
pr
p eserved
veed
o Fo
Fourcategoriesofstandard
our
u categories of standa
da
ard
o Bureau
a Inte
tern
te
ern
rnational de
es Po
P ids et Mesures
BureauInternationaldesPoidsetMesures
IInternationalStandard
ternational Standa
d rd
da
r
o In
o(
(BIIPM
M)
o(BIPM)
Prim
imary Standa
im
ard
rd
o Pr
PrimaryStandard
o Intern
r at
atio
tiona
nal
al Bureau of Weightt an
and Me
and
M asurres
es
InternationalBureauofWeightandMeasures
o Se
Second
e
dar
ary
y St
S
andard
an
Secondary
Standard
o
o
o Wo
W
rk
kin
ing Stan
anda
an
dard
da
Working
Standard
International
Internat
tio n a l S
Standard
tandard
d
Primary
P
rimary Stan
Standard
n dard
o PrimaryStd
Primary
Pr
Prim
im
Std
o International
InternationalStd
Std
Maintained
n NationalStdLab
Nation
nal
a Std Lab
o Maintained
Definternation
nal
a Agreem
ementt
em
o DefinternationalAgreement
o
o Rep
o Fu
Func
uncti
nccti
tion
Function
oclosest
possible accuracy attainable
oclosestpossibleaccuracyattainable
ocalibrationandverification
ocurrentscience technology.
osecondarystd
o Eachlab ownsecondarystd
operiodicallychecked certified
oNationalStdLab
Page 10 of
Gathered
Secondary Standard
of Mahatma Gandhi
Working Standard
o SecondaryStd
o WorkingStd
o basicrefstdusedby
o
o measurement calibrationlab
o inindustries
ocheckcalibratelabinstrument
o maintainedby
y
o
o accuracyperformance.
accuracy performance.
o particular
particularindustry
industry
o .
Eachindustry
o Each
industry
ownsecondarystandard
o own
secondary standa
ard
r
Calibration
C
allibration
n
Calibration
C
allibrattion
o stddevice
stddevi
vice
vi
oproc
oproc
ocomparison
made
o
c mparison ma
co
m de
odetcorrectvalues
o
dettccorrect va
alues
ostandard
instrument
o
st
stan
st
a da
ard
rd instrume
nt
t
o
m
measurand
omeasurand
oinstrument
isunknown
o
in
nstru
stru
st
rume
m nt is
unkn
un
k ow
o n
o
compariso
on
ocomparison
otobecalibrated
oto
be cali
ca
a ibr
bra
atted
o
standa
ard o
ones
nes
ostandard
otestinstrument
otest
inst
stru
tr ment
mee
Calibration
C
alib
bration
n
Direct
D
ire
ect Comparison
Comp
pariison
o
generatorapplies
generator appl
pllie
i s
o two
methodologies
methodologies
o knowninputthemeter
known in
i putt
the mete
ete
terr under
test
undertest
o obtaining comp
mparison
mp
n be
tw
tw
comparison
betw
o
ratio of
otest
t standard
d
otest instrument
instrumentstandard
o me
mete
terr
te
indicat
indicat
meter
instrument
oknown generatorvalues
oDirect comparisons
ogives meter'serror
oIndirect comparisons
o meter testinstrument
o
ogenerator standardinstrument
Page 11 of
Gathered
Direct Comparison
of Mahatma Gandhi
Direct Comparison
oWith ofdirectcomparison
ogenerator also can becalibrated
o
othemeter standard instrument
othegenerator
otest instrument
otestinstrument
Direct
D
ire
ect C
Comparison
omparrison
IIndirect
ndirect Comparison
Com
mpariison
ocomparedwith
o
compar
arred
e with
th
oresponse
standardinstrument
o
rreesponse stand
ard
rd in
i strumen
en t
en
o
same type
osametype
o
o
o
iff te
t st in
nst
st
t
meter
r
oiftestinstmeter
o
sttan
a dard
also ge
gene
ene
nera
ato
t r
alsogenerator
Indirect
Indirec
ct Comparison
Compaarison
Units
Uniits (Fundamental
(Fundamentaal & S
Supplementary)
upplementary)
ounits
ounits
oindependently
y chosen
n
oindependentlychosen
onot dependen
n
t
otherunits
other
the
he units
onotdependent
Page 12 of
Gathered
Units
(Derived)
of Mahatma Gandhi
Units (Derived)
oderivedfrom
ofundamentalsupplementaryunits.
Units
U
nits (D
(Derived)
Derived)
SII Prefixes
S
Prefiixes
opowersoften
o
powers
r of ten
osimplifies
specification
o
siimp
m lifies spec
iffic
i at
a ion
o
any quantity
ity
y
oanyquantity
o
o
o
furt
fu
r herr si
s mp
mpli
l fi
li
fied
ofurthersimplified
o
use
of pref
effix
ixes
x
o
useofprefixes
SII Prefixes
S
Preefixes
Page 13 of
SI Prefixes
Preffixes
Gathered
o Selection,careuse instrument
o
o Beforeusing
Beforeusing
o do inspectionfor
othoroughlyfamiliarize
o physicalproblem
o Beforeconnecting
oitsoperation
o to circuit
t
o makesurefunctionswitch
makesur
s e function switch
o rangeselectorswitch
range sel
se ecttor
or swi
s tch
odegree of accuracy
y re
r quired
d
odegreeofaccuracyrequired
setup
o
setup
o(accuracy + resolutiion
o + cost)
o(accuracy+resolution+cost)
Page 14 of
of Mahatma Gandhi
o properfunctionrange
proper function
io range
ge
Gathered
ELECTRONIC INSTRUMENTATION
EC 010 704
(Syllabus)
References
1.
Measurement Systems:
2.
Electronic Instrumentation:
HSKalsi
3.
4.
M
Measurement & In
stttrumentation Principles:
ri
Measurement
Instrumentation
5.
AlbertDHelfrick
&WilliamDCooper
Albert
D Helfrick &
WilliamDCooper
AlanSMorris
Alan S Morris
D.V.SMurthy
D.V.
S Murthy
EC 010 704
ELECTRONIC
ELE
LECTRONIIC IINSTRUMENTATION
LE
NST
TRUM
R
ENTATION
(Syllabus)
(Syl
ylllabu
l
s)
EC 0010
100 7704
0
04
(Syllabus)
3 hours lecture
lecc uree and
lect
an
n 1 hour
hooour tutorial per week
References
Refer
ence
es
e
References
6.
ELECTRONIC INSTRUMENTATION
INST
ST
TRUM
MEN
ENT
NTATI
A ON
O
11. A Course
Cour
o se in Electrical and Electronic Measurements
our
Measureme
rem nts and Instrumentation:
rem
Instru
rument
ru
m atio
io
on:
Electronic Instrumentation
Insttrumentat
ntation
ntat
iion
o and
an
nd Measurements
Measurements
David A Bell
DavidABell
7.
InstrumentationDevices
and
Instru
st mentatio
a nDevices
ices
e a
nd Systems:
8.
Electronic Measurements
M urem
Meas
rements
men
n and Instrumentation:
9.
Me
Measur
a emen
nts and Instrumentation:
Measurements
J B Gup
Gupt
p a,
JBGupta,
CSRangan,SGSharma&VSVMani,
C
S Rangan,SG Sharma&V S V Mani
M ,
Ma
R
K Rajputtt,
RKRajput,
U A Ba
Baks
B
a hi, A V Baks
ak
aks
kshi,
hi
UABakshi,AVBakshi,
10. A Course in Electrical
Ele
leeectriccal and
a
and Electronic
Ele
Electro
lec nic Measurements
Measureme
r
nts and
an
nd Instrumentation:
In
nstru
str mentation:
A
K Sawhney,
AKSawhney,
EC 010 704
(Syllabus)
(Syl
ylllabu
y
lab
b s)
3 hours lecture and
a 1 hour tutorial
an
tuto
torial
to
rial
ria
a per
pe week
Module
e 2 (12 hrs)
Module
Transducers
HallEffectSensor,
Hall Eff
ffect Sensor,
ff
Types
ThinFilmSensor,
Thin
Fiiilm Sensor,
ActiveandPassive
Active
and Passive
ProximitySensor,
Prox
im
mity Sensor,
m
AnalogueandDigital
Analogue
and Digital
DisplacementSensor,
Disp
la
acement Sensor,
a
ElectromechanicalType
Electromechanical
Type
LoadCell,
Load
Cell
l,
ll
Potentiometric,
Potentiometric,
transformsenergy
o
tran
nsf
sforms energy
ofromoneformanother
ofrom
o
one form another
NanoSensorsAnd
Nano
Sensors
s And
Inductive,
UltrasonicTransducers.
Thermocouple,
Opto ElectricalTypephotoEmissive,
Capacitive,
PhotoConductiveand
Resistive,
PhotoVoltaicType.
PiezoElectric,
DigitalEncoders
StrainGauge,
OpticalEncoder
IonizationGauge,
o Tr
Tran
Transducer
an
nsd
sducer
LVDT,
ParametersofElectricalTransducers
Parameters
of Electrical Transducerrrs
Page 1 of
Transducers
T
Tr
ran
nsd
sducerrs
ELECTRONIC
ELE
ECTR
C ONIC
C IINST
INSTRUMENTATION
NSTRUMENT
NST
EN ATI
ENT
TIION
O
o
o
omechanicalforceinto
SelectionCriteriaforTransducers.
oelectricalsignal
Gathered
Electrical Transducers
o tomeasurenonelectricalquantities
o
o detector used
o massinertiaeffectsminimised
oconverts
o effectsoffrictionminimised
Controlledwith
smallpowerlevel
o Controlled
with small
power level
o displacement
actuates
displacementactuates
output
o
output
transducer
r
o electric
electrictransducer
usedtransmitted
processed
o used
d transm
n itted
d
pro
p cessed
pr
o acting
as seco
eco
condary transducer
transduc
tr
u er
r
actingassecondary
Miniaturizationeasily.
o Miniaturi
zattion eassily
i .
ooutput
o ellec
e trical
al innature
al
in na
atu
t re
oelectrical
Transducer
Transduc
uc (General
ucer
uc
(Gene
era
r l St
Structure)
tru
ucture)
Transducer
Tran
Tr
a sducer (Classifi
(Classification)
ffiica
ation
n)
o transducer
transduce
u r
twoparts:
two
parrtss:
o
Sensiiing orDetectorElement
orr Det
Detect
De
e or Elemen
nt
o Sensing
basisoftransductionformused
basis
of trran
a sduction
on fo
form
rm used
d
reeespon
onds
on
ds to
o respondsto
asprimaryandsecondarytransducers,
ii. a
s pr
prim
i aryy a
an
n
nd
d secondary ttrran
ran
ansd
s uc
u ers,
s
cha
change
cha
nge in physical phenom
meeno
en
n n&
o changeinphysicalphenomenon&
iii. aspassive
a pass
as
sssiv
ive
ve andactivetransducers,
and active transd
duc
ucer
e s,
er
s
o Tra
nsduction
d ion
on Ele
El ment
TransductionElement
o transf
n orms
output of sensing
eleemen
mee t
t
transformsoutput
sensingelement
to
o electrical output
t
o toelectricaloutput
iv.. a
asanalogue
anddigital
transducers,and
iv
s an
a alogue an
a
d digital transducer
e s,
s an
and
d
andinverse
transducers
v. astransducers
as transd
sd
duc
ucer
ce s and
d inversee tr
tran
ansd
ducers
Classification
Cla
lassi
la
s fication based
basedd upon
upon
Princi
iple
pl of Tr
rans
an ductio
io
on
Principle
Transduction
Classification
C
Cla
ssific
ficati
fic
at on as
P
Pri
m y aand
mar
nd
d Sec
S
Se
ondary Trans
a ducers
rss
Primary
Secondary
Transducers
o transducers
classified
clas
cl sified
cla
basisof
basis
of
o principleoftransduction
principle of transduction
o resistive,
resistive,
e
o inductive,
inductive,
e
o capacitive
o how convert input quantity
o intoresistance,inductance
into resistance inductance capacitancerespectively
capacitance respectively
o also classifiedas
o piezoelectric,
o Thermoelectric,
o magnetorestrictive,
o electrokinetic and
o optical.
Page 2 of
Gathered
Classification as
Primary and Secondary Transducers
Classification as
Passive and Active Transducers
o PassiveTransducers
o Bourdontube
o senses pressure converts
o "externallypoweredtransducers".
o displacementmovescore ofL.V.D.T
o Active
Activetransducers
transducers
s
o donotrequireauxiliarypowersourceproduce
do not req
do
eq
quir
u e auxiliary power source produce output
Bourdontube
o Bourdon
tube
o
self gen
enerating type
en
selfgeneratingtype
PrimaryTransducer
o Primary
Transducer
o L.V.D.T
T
SecondaryTransducer
o Secondary
Transd
n ucer
Classification
Classific
ficati
fic
atiion as
ation
Analog
gue and Di
D
gital
git
a Transd
nsd
ns
sducers
d
Analogue
Digital
Transducers
Classification ass
T nsducers and Inverse Transducers
Tra
Traans
nsd
s ucerss
Transducers
o Analog
AnalogueTransducers.
uee Tran
nsd
sduc
u ers.
o Tran
Transducer.
an
nsducer.
o convert
converrt input
in
inpu
in
p t into
in
i to
converts
nonelectrical
quantity
o
converrts
t nonelec
ectr
ec
tric
tr
ical
ic
a qu
q
antity
ty
y
oanalogue
oanal
alog
al
ogue
og
u output
output
ointo
electricalquantity
o
into
in
t electr
to
iccal
a qu
q antity
o In
IInverseTransducer.
vers
rse
rs
s Tran
an
a
nsd
s uc
ucer
e r.
ocontinuousfunctionoftime
o
continuous functi
tiion
tion
n off ttiime
o Digital
DigitalTransducers.
Transducers.
converts
electricalquantity
o
co
converts electrical
co
quan
ntity
into
o co
cconvert
nver
e t input in
into
in
to
ononelectricalquantity
o
nonelectrriccal qu
q antity
E.g.;Piezobuzzer
o E.g.;
Piezobuzzerr
oelectricaloutput
oel
e ecctrric
ical
al outputt
oformofpulses
o
form
m of pu
p lses
Page 3 of
Gathered
Basic
B
Ba
sic
si
ic Requirements
Requirements of a Transducer
Re
T ansd
Tr
duc
ucer
e
er
Ruggedness
Rugged
ged
e ness
oAbility
o
A llit
Abi
ity withstandoverloads
withstand overloads
ads
ds
ds
osafetystopsoverloadprotection
o
safety stops ove
ove
verlo
er ad protectio
ion
io
n
Linearity
Li
Lin
L
i earrity
tty
y
oAbility
o
A litty reproduce
Abi
reprod
rod
od
du
ucee inputoutputchara
i utoutput chara
inp
osymmetrically
osym
y mettric
ym
ri all
a y
al
linearly
9 Overalllinearityisthemainfactorconsidered.
Overal
ral
ra
a l lin
linearity is the
hee mai
h
m n factor considered.
Basic Requirements
Requir
irrem
e ents of
of a Transducer
T ansduc
Tr
uccer
ucer
e
Basic
Ba
asi
s c Requirements
Requ
Re
quir
qu
i em
men
en of a Transducer
ents
T ansd
Tr
an
ns ucer
Repeatability:
Repeatability:
Highstabilityandreliability:
Hig
gh sta
stta
abi
bi ity and reliability:
bil
output
signal
oAbility reproduce
outtput
p signal
measurement
oMinerror
o mea
m surementt
samemeasurandapplied
owhen same
measur
u and
ur
d applieed
temperature,vibration
ounaffected
d temper
p atu
per
ature, vibration
orepeatedly sameenvironmentalconditions
same environmental conditions
oenvironmentalvariations
o
en
nvironmental variations
n
Convenientinstrumentation:
Convenient
instrumentation:
GoodDynamicresponse:
Good
Dynamic response:
Dyn
ohigh signaltonoiseratio
otakenas functionoftime
9Digitaloutputpreferredinmanycases.
Page 4 of
9Theeffectisanalysedasthefrequencyresponse.
Gathered
ExcellentMechanicalCharacteristics:
Viscousfloworcreep
oaffect performance
oduetoviscousflow material
oof sensingelement
ostaticquasistaticdynamicstates
oMagnitude increases
majoreffects
oincreasingload
oincreasing
load temperature
Mechanicalhysteresis
Mechanical
hysteresis
Materials
lowmeltingpointlargercreepvalues
9 Mat
ateriials
at
ls
oimperfectresponse
oimperfect
response
osensingelements
osensing
elements
oIntegratedoverdimensions
oIntegrated
over dimens
nsion
ns
i s
io
ostrainedtransducer
ostrained
transducer
sd
9Effectdependsontherawmaterialused,ageing,etc.
9Effect
depends on th
the
h raw ma
aterial used, ageing
a
ing
ng, etc
e .
Basic Requirements
R qu
Re
uir
i ements
tss of
o a Transducer
Trran
T
a sducer
Basic
B
Ba
sic
si
ic Requirements
Requirements of a Transducer
Re
T ansd
Tr
duc
ucer
e
er
Elasticaftereffect
Elastic
after
e effectt
Builtinintegrateddevice
Built
tin
in integrated device
ocontinueddeformation
ocontinueeed defform
ormation
onoise,
o
noise,
o
load
loa
ad appliedkeptconstant
app
ap lie
app
li d kept con
nsta
stant
st
a
oasymmetry
o
a mmetry
asy
y
9decreaseswithtime
9
dec
decrea
dec
reases
rea
s with time
ootherdefectsminimized
ooth
otther defect
ctss min
ct
m imized
oLikecreepsimilarrelaxationtowards
oLike
creep
e
similar relaxation tow
ward
ardss
ooriginal
o
orrriginal position
posi
o tion
owhen
removed.
o
wh
hen load removed.
h
d
9Virtuallynoresidualdeformationisobserved.
9Vir
Virrtua
t lly no residual deformati
tio
tion
on
n is
i observ
rved.
rv
ved.
ed
Resistive
Resist
sttiv
i e Tr
Transducers
an
nsd
sduc
duc
ucers
c
Resistive
Resi
Re
siistiv
ve Transducers
T ansduc
Tr
u erss
o Resistance
Res
esisttanc
esist
a e metal
metalconductor
conducto
or
o
o
omeasurement
omea
asur
s ement
ochange resistance preferred
prefeeerred
oAC DC voltages
vo
oltages
o
osuitable resistancemeasurements
resistance measurements
Page 5 of
Gathered
Potentiometric Transducers
Linear POT
o POT
o
oresistive elementwith
osliding contact (wiper)
ofslidingcontact
omotion of
sliding contact
otranslatory rotational
Rotational
R
Ro
tational
al P
POT
OT
T
Helipots
ocombination
o
combination
of
oi.e.,, translational aswellasrotational.
as well as rotati
tati
a ona
o l.
oi.e.,translational
oTheir
oThe
Their
The
irr resistiveelement
reeesistive element formof
for
for
orm
m of
ohelix
oheeelix
ohelipots.
o
hel
elipo
el
p ts.
ohelicalelements
o
heeelica
i l
ele
ele
l men
m ts
omultiturn
omul
u titurn
ul
ocanbeusedfor
o
can
be used
d forr
otranslational
o
translationa
na
al orrotary
or rot
ro ary motion
Helical
H
He
lical PO
POT
OT
Page 6 of
Diagrammatic
D
Di
ag
gramm
raamm
mmat
attic
i Representations
Rep
epre
ep
r sentattio
i nss of
o POTs
Ts
Gathered
Construction of POTs
oresistivebody
owirewound
othin
oplatinum nickelalloy
owound insulated former
oresistance elements
also made
elementsalsomade
ocermet
t
o(precious
metal particles fused into ceramicc bas
b e)
e
o(preciousmetalparticlesfusedintoceramicbase)
omoulded
carbon
omouldedcarbon
o(mixture
of carbon andathermosettingplasticbinder)
and a thermo
moset
mo
s ting pla
astic binder)
r
o(mixtureofcarbon
ocarbon film,
ocarbonfilm,
o(thin
film of carbon dep
posited on a
non
nconduc
nd tive base)
e
o(thinfilmofcarbon
depositedon
anonconductivebase)
othin metal
t
othinmetal
o(thin,vapourdepositedlayerofmetalonglassorceramicbase)
o(thin,
vapour dep
deposi
o ted layer
e of metal on glass or ce
er
ce amic bas
cer
a e))
Electrical
El
lectriccal Analy
Analysis
lly
ysi
s s of a P
POT
Electrical
E
Elec
El
lec
e tr
t ical Analysis of a POT
OT
T
o
o
ooutputvoltage
oout
outtput
p voltage
pu
ounderidealconditions
ound
nder ideal
nd
ide
dea condit
diition
dit
io
o s
oIf dist
distribof
trib
of resistance
resistance
owrttranslationalmovement
linear
o
w r t tran
nslational movement l
inea
ar
o
reeesista
ance
ce perr unit length
h
oresistanceperunitlength
R p xt
Electrical
al Ana
Analysis
ly
ysi
siss off a POT
Electrical
Elec
El
ectr
ec
ttrric
ical A
Ana
Analysis
na y of a P
nalysis
na
POT
O
ounderidealcircumstances
ounder
ideal circumstances
voltagevaries
o output voltage
varies
es
withdisplacement
olinearly with
displacemen
ent
en
nt
Page 7 of
Gathered
ounderidealconditions
oun
un
u
nder ideal conditio
ons
n
sensit
i ivitty constant
consta
ant
n
o sensitivity
o
output faithfullyreproduced
faithfully re
r produced
ooutput
neear
a relatio
ons
n hip
p wi
w th in
inpu
p t
oh
ha
as linearrelationshipwithinput
liin
ohas
Electrical
El
lectriccal Analy
Analysis
lly
ysi
s s of a P
POT
Potential Divide
Divider
d r
de
oFor rotatio
i nall mo
moti
t on;
oForrotationalmotion;
oTrue forSingleTurnPOTsonly;
fo
or Single Turn POTs only;
opotentialdivider
opotential
divider
odividing
potential
all rattio
o
odividingpotentialratio
o
d ermined po
det
osition off sliding con
o
on
ntac
t t.
t.
odeterminedpositionofsliding
contact.
Potential
Pote
tential Divider
te
Divi
Di
v de
er
Loading
L
Lo
ad
din
in Effect
ing
ct
oIfresistance
oIf
resistance across
across
ss
oresistanceof
o
res
res
esist
iist
stance off
o
par
p allel combination
oparallelcombination
relationship
olinear relationship
oload
resisttanc
a e
oloadresistance
o
portion
r
of
resisttanc
a e of
oportionofresistanceof
(eo)
voltage
ooutput voltage
oinput voltage
oinputvoltage
o
potentiometer
opotentiometer
(ei)
oactualconditions m isnotinfinite,
ocausesanonlinearrelationshipbetween
ooutput inputvoltages
Page 8 of
Gathered
Loading Effect
Loading Effect
oTotalresistance
oTherefore,
oseenbyy source
oCurrent,
oCurrent,
t
Loading
L
Lo
ading Ef
E
Effect
fectt
Loading Effect
cctt
oRatioof
oRatio
o
of
oOutput
voltageto
o
Ou
utput
u
p voltage
to
oOutputvoltageunder
oOu
Ou
O
utput
tp
p vo
oltag
agee un
ag
u der
oinput
voltage,
o
in ut voltage,
inp
LoadCondition,
Co
ond
nd
ndition,
n
ounder
o
un er Load
und
oLoadCondition,
oLo
L ad
d Co
Cond
ndition,
nd
n
Loading
Load
Lo
a ing Ef
Effe
Effect
ffeectt
Error
Er
rror
oAs ratio
ratio Rm/R
Rp decreases,
s
othe nonlinearity goesonincreasing.
goes on increa
asing.
othenonlinearity
keep linearity
y
oto keeplinearity
Rp should
shouldbe
be
ovalue Rm/R
oaslarge
aspossible
oas
large as
s possible
o
omeasureoutputvoltage
owith meter,
oRp
oshouldbeassmallaspossible
Page 9 of
Gathered
Percentage Error
Error Analysis
Maximum % Error
Ma
Erro
or
Advantages
A
Ad
vaant
nt
ntages
of using Resi
Resistive
sist
si
s ive PO
st
P
POTs
T
Ts
oInexpensive
oInex
exxpensive
o
Simp
m le tooperate
mp
to operate .
oSimple
oUs
Ussef
U
eu
ull fo
f r measuremen
nt off
oUsefulformeasurementof
ola
largee am
la
amplitud
m
ud
des
es displacement
nt
nt
olargeamplitudesdisplacement
o
efffiiciien
e cy very
high
oefficiency
veryhigh
o(N
(N
No fu
furt
r he
rt
h r ampl
pliffication needed)
pl
o(Nofurtheramplificationneeded)
oEx
E ce
cell
lllen
nt Fr
Freq
Freq
equency
q
Reesp
R
pon
o se
oExcellentFrequencyResponse
o(Except
Wirewo
wo
oun
u d tyype
p )
o(ExceptWirewoundtype)
o
Excellent
t Resolution
on (Exccep
pt Wire
rewo
re
woun
wo
u d type)
oExcellentResolution(ExceptWirewoundtype)
Disadvantagess of using
ng Resistive
Ressistive POTs
POT
P
OT
O
Ts
Strain
S
St
raain Gaugee
oLinearpotentiometer
oLinear
potentiometerr
oIfmetalconductorstretched
oIf
metal
al ccon
al
co
o ductor stretched
h ompressed
he
omp
mpressed
mp
d
o resistanc
resistancechanges
anc
ncee cha
c nges
oSliding
contacts
oSlidingcontacts
o(bothlengthanddiameterofconductorchange)
o(both
leeength and
an diamet
eter
et
e of conductor change)
ocontaminated
d
ochangeinvalueof
o
change in value of
owear
out
t
owearout
oresistivity
o
r ist
res
stivi
stivi
ivity
iv
t
ty
omisaligned
ogenerate
noise
ogeneratenoise
strained
owhen strained
o(thelifeofthetransducerislimited).
o(piezoresistiveeffect)
oresistancestraingaugesalsoknown
oPiezoresistivegauges
Page 10 of
Gathered
Strain Gauge
oStraingaugesmeasur
ostrain associatedstress
oin stressanalysis
ootherdetectorstransducers
oloadcells,
otorque meters,
otorquemeters,
odiaphragm type pressure gauges,
odiaphragmtypepressuregauges,
otemperature sensors,
otemperaturesensors,
oaccelerometers
oaccelerometers
o
oflow
meters
oflowmeters
oemploy strain
ng
ga
gau
a ges sec
ecc
econdary
transducerss
oemploystraingaugessecondarytransducers
Principle
P
Pr
inciipl
p e of Strain
Str
S
trra n Gauge
trai
Ga
G
aug
u e
Principle
P
Pr
Prin
ri ciple of Strain Gauge
Ga e
Ga
ogauge
o
gauge
o
su
ubjto positive
u
strain
osubjto
positivestrain
o
length incr
olengthincr
o
o
o
area
a
cro
c ss
ssec
se tio
t n decreases
oarea
crosssection
o
resist
sist
isstan
istanc
n e
oresistance
o
pro
prro
p
pro
ropto length
th
opropto
length
oinvpro
op
to
t
arre
r a crosssection,
n,,
oinvpropto
areacrosssection,
oresistance gauge
oincreases positive
sttr
train
positivestrain
Peizo-resistive
Peizoo-resistiv
ove Ef
Effect
ffe
fe
fect
Strain
S
St
raain Gaugee
ochange
re
r sistance
resistance
o Resistance
Res
esisttanc
esist
a e UnStrained (Strain)Gauge
(S rain)Gauge
(St
ostrained conducto
or
ostrainedconductor
than
omore than
oincrease
r
in resistance
oincreaseinresistance
odue todimensionalchanges.
oextrachangevalueofresistance
oattribto change value
oresistivityof conductor strained
Page 11 of
Gathered
oWeknowforaCylinder,
o
o L =changeinlength,
oA =changeinarea
o D=
change in diameter and
D=changeindiameter
and
oR=changeinresistance
oR=
change in resistance
oDifferentiate
stress s,,weget:
we get:
OnSubstitution
On
n Substitution
i
Working
W
Wo
rk
kin
i g of Strain
Str
S
trrai
a n Gauge
G ug
Ga
u e
Working
W
Wo
rking of Strain Gauge
Ga
augee
o:.Equation25.60
o:.
Equation
n 25
5.6
60 ca
ccanbewrittenas:
n be wrrittten as :
o:.
o:.
o
o
o
o
oNow,PoissonsRatio():
oNow,
Poissonss Ra
R tio (
():
oOr,
oOr,
Working
Workin
ng of Strain
Strrai
a n Gauge
G uge
Ga
Working
W
Wo
ork
rk
kin
i g of
of Strain
S
Gauge
G ug
Ga
ugee
o:.
o:.
o:.
o:.
o
o
o
oor
owhere
Page 12 of
Gathered
ostrain expressed
omicrostrain.
o1microstrain1m/m.
ochangeinvalueresistivity material
owhenstrainedisneglected,
gauge factor
othe gaugefactor
Types
Type
pes of Strain
pe
Strai
ain Gauge
ai
Ga
au
ug
ge
Major
M
Ma
ajo
ajo
jorr Applications
A plications of S
Ap
St
Strain
traain G
Gau
Gauge
a ge
au
oStraingaugesused
for
o
St ain
St
Str
in
n gauges used ffor
r
Unbo
nd
ded
e meta
tall
ta
Unbondedmetal
otwomajorapplications
otwo
wo
w
o major applicati
t ons
ti
o
Bonded
d meta
al wi
w re
Bondedmetalwire
(i) Expstressanalysis
(i)
Exp
p
stress analys
ysis
ys
i
is
Bo
ond
n ed
d meta
tall fo
ta
foil
Bondedmetalfoil
machines
mac
m
achin
ach es
Vacu
um
m de
d po
p si
sited thin metal film
m
Vacuumdepositedthinmetalfilm
structures
st
ttructtures
ure
res
Sputterr depo
osi
sited thin metal
Sputterdepositedthinmetal
Construction
Constr
st uct
st
ction
ct
ion
o
on
Bo
B nded
d semiconductor
Bondedsemiconductor
o for
fforce
orce
c
Di
Diff
Di
ffused
ff
d metal
Diffusedmetal
o torque
o pressureflow
o accelerationtransducers
a eleration transduce
acc
du rs
Unbounded
Unboun
nde
d d Stra
Strain
rain
ra
i G
in
Gauge
Page 13 of
Unbounded
U
Un
boun
bo
u de
ed Strain G
Gau
Gauge
ug
gee
Gathered
ounbounded straingauge
owirestretchedbetweentwopoints
oinsulatingmedium
o wires madeof
ocoppernickel
ochromenickel
ochrome nickel
onickeliron
onickel iron alloys
connectedviarodtoadiaphragm
oelement connected
via rod to a diaphragm
oused sensing
sensing pressure
pre
ressu
re
ss re
owires tensioned avoidbuckling
avoid
d buckling
o
o
Bounded
Bo
un
nded Stra
Strain
ain
i Gau
Gauge
aau
uge
g
Bounded
B
Bo
unded Strain G
Gau
Gauge
au
uge
g
Bounded
Bounde
ded St
de
Strain
raain G
Gau
Gauge
a ge
Bounded
Bo
ou
un
nded
d St
S
Strain
train G
Gau
Gauge
a gee
obonded
o
bonded
d
straingaugesused
strain gau
uges
g use
seed
sed
ostressanalysis
ostress ana
nalys
ly is
oconstructionoftransducers
ocon
stttruction
on
n of transduce
uc rs
uce
oconsistsofgridof
ocon
c sists of g
grrrid of
ofineresistancewire
ofin
o
f e resistan
fi
nce wire
ogrid
ogriid cemented carrier
carrier
othinsheet
opaperBakelite Teflon
owire coveredtop
othinsheetmaterial prevent from mechanicaldamage
ospreading wirepermits
ouniformdistributionstress
Page 14 of
Gathered
oForexcellentreproducibleresults
straingauge
o high gaugefactor
Gf
resistance
oashigh
oas high aspossible
as possible
Bounded
Bounde
d d Me
M
Metal
tal (Foi
(Foil)
oiil)
l S
Strain
trraaiin Gauge
Metal
Me
Meta
eta
tall (F
(Foil)
Foil) Strain Gaug
Gauge
ug
ge (Spi
(Spiral)
pira
pi
ira
r l)
l
Hookes
Ho
oo
ok
k La
kes
Law
aw
Metall (Foil)
(F
(F
Str
S
Strain
tr
train
tr
Gauge
Ele
l me
m nts of an
a Acceleromete
terr
te
(X, Y & Z Axes Elements
Accelerometer
Page 15 of
Gathered
Rosette
R
Ro
sette
se
(Application
((Appliccatioon Specific
Sppec
e ific
iff Strain
Strrai
a n Gauge)
Rosette
Rosett
tte
tt
(Application
(Application Specific Strain
Strrai
a n Gauge)
Gaauge)
ugge))
Rosette
Rose
ttte
(Application
((Applicatioon Specific
Sppecif
ecif
ec
ific Strain
Strrain Gauge))
Rosette
Ro
(Application
(Ap
A plicattio
ion
n Specific Strain
Str
t ain Gauge)
Gaug
Ga
u e))
ug
Page 16 of
Gathered
Capacitive Transducers
Capacitive Transducers
o
oProximity Transducers.
oparallelplatecapacitor
oDisplacement Transducer.
H H r A
d
owhere,
o0 ==absolutepermittivityoffreespace
absolu
abs
o te permittivity off free space
oNonloading,
oNonloading,
g
or ==dielectricconstantofthemedium
o
dielectricc constant off the medium between
betweentheplates
the plates
oNoncontact,and
oNoncontact,
t, and
((relati
vee permittiv
tiv
i ity)
y
(relativepermittivity)
oA==area
oA
area of
oftheplates
the
hee pla
pl tes
t
oNoninvasive
oNoninvvasive
od==distance
distance
ce ofseparationbetweentheplates
of separation betweeen
of
e the plates
es
Properties
Properti
ies off Some Dielectric
Die
D
ielectri
ie
ricc Materials
ri
Capacitive
C
Ca
paci
pa
citi
ci
tive Thickness T
ti
Transducer
raansdu
uce
cerr
oplates
o
pla
p tes arranged
arranged
d
sheet
o
sheet
t
between
opassed bet
bet
e wee
et
w n plates
tes
owithouttouchingthem
o
w hout tou
wit
uchi
h ng them
hi
Capacitive T
Thick
Thickness
ne
ess
ss T
Tra
Transducer
r nsduce
ra
er
Capacitive
C
Ca
paci
pa
c ttiive
ci
v Thi
Thickness
hiick
ckness T
Tra
Transducer
r ns
nsdu
sd cer
oincrease
o
inc
increase in
inc
in
oCapacitanceoftheSystem:
oCapacitance
of the Sys
Sy tem:
othickness sheet
sheet
ocauses an
n increa
increase
ase
s of
of
othecapacitance
by
othe
capacccitance by
C,,and
andhence
hence
owhere:
oa totalseparationbetween plates
oSolving forC/C0
owhere:
oN=SensitivityFactor
Page 17 of
Gathered
owhere,
Capacitive
C
Ca
pacitivee Displacem
Displacement
em
ment Tr
T
Transducer
ran
ansducer
an
(Using
Movable
Dielectric
(Usingg M
o ab
ov
a lee D
ielectriic Core)
Capacitive
Capa
Ca
ap citive Proximity T
Tra
Transducer
r ns
ra
n du
uce
c r
Capacitive P
Pro
Proximity
r ximi
mity
mi
t Tra
ty
Transducer
ra
ransducer
ra
Capacitive
Capa
Ca
paci
pa
ciitive
vee S
Str
Strain
t ain Tran
Transducer
a sduc
an
ucer
uc
e
oTheOutputSignal,
oThe
Output Signal,
l
where:
Page 18 of
Gathered
where:
Variable Area
Are
A
r a Capacitive
Capa
p ciitive T
pa
Tra
Transducer
r nsducer
Variable
V
Va
riab
ri
iab
able Area Capacitive T
Transducer
ransdu
d ce
du
cerr
Whenall
When
all th
theteeth
he te
t eth are
areinalignment
in alignmeentt
Whentheteeth
Wh
hen
e the teeet
e ha
alignmentchanges&
l gnment changess &
li
oef
effe
ef
f ctive co
cont
ont
ntac
a t length
becomess l
oeffectivecontact
lengthbecomesl
where:
where:
w
wh
whe
h re::
Variable Area
a Capacitive
C pa
Ca
aci
citi
t ve T
Transduce
Transducer
er
Capacitive
Ca
Capa
apa
paci
citi
ci
t ve Pressure
ti
Pre
P
r ssure Tr
Transducer
ransd
duc
ucer
where:
Page 19 of
Gathered
Capacitive Microphone
Capacitive
Capa
ciiti
t vee Lev
Level
evell Transducer
ev
Trans
nssd cer
n
nsdu
Capacitive
C
Ca
apacitive Level Trans
Transducer
n duce
ns
er
oCapacitance
oCapa
pacitance
pa
odu
du to twocolumns
due
du
two column
mn
ns
odueto
olliiqu
q id and vapour
vapo
va
p ur
oliquid
Capacitive M
Moi
Moisture
sttur
ure Tran
Transducer
a sducer
Page 20 of
Capacitive
C
Ca
paciiti
tive
v Hygrome
Hygrometer
m terr
Gathered
Peizo-Electric Transducers
Peizo-Electric Transducers
osymmetricalcrystallinematerials
oQuartzRochellesaltBariumtitanate
oproduce emf
owhen placed understress
opeizo electrictransducers
oacrystalplacedbetweensolidbase
oa crystal placed between solid base
oforcesummingmember
o
for
forcesumming member
for
oconversely
o
con
on
o
nversely
y
varyingpotential
varying potential
oproperaxisofcrystal
opropeeer axis off cryysta
st l
l
ocha
hange
gee dimens
ion
ns
ochange
dimensions
oof
o
of crystal
odeformingit
odef
def
effo
orr ing it
orm
Desirable
De
esi
sirable Properties
Prop
per
erti
t es
of Piezoelectric Mate
Materials
teri
te
r als
Peizo-Electric
P
Pe
izo--El
E ectric Transducers
Tra
T
r nsdu
du
ucers
otwo
tw
w maingroups
main
mai
aingro
g ups piezoelectriccrystals
pie
p zoelectric
c crystals
oNaturalcrystals
oNatura
ra
al cryysta
stals
lss
9Stability.
9
S ab
St
bility.
o (quartzandtourmaline).
(q
quart
q
rtzz and tourmaline).
rt
9High
g ou
gh
output.
9Highoutput.
oSyntheticcrystals
oSynth
hetic
h
ic cry
crysta
st ls
st
9
Inseens
n itivvitty to te
t mp
m erature and hu
umi
midi
dity.
di
9Insensitivitytotemperatureandhumidity.
o(Rochellesalt,lithiumsulphate,
o(R
Roche
R
heellee sal
s t, lithium sulphate,
sa
9
Thee ab
a ilityy to
o bee fo
f rmed into most desirablee shape
9Theabilitytobeformedintomostdesirableshape
odipotassium
odipotassi
ss um tartrate etc).
Natu
Natural
ura
ral vs. Synthetic
Synt
Sy
ntthe
h tic
Piezoelectric
Piezoelect
ctri
ct
ricc Materials
ri
Mateeri
r als
Working
Work
Wo
rkin
rk
ng Principle
P inciipl
Pr
plee
iezo
ie
zoelectric M
atterials
off Pie
Piezoelectric
Materials
Advantages
oThemagnitude
oThe
magnittu
ude andpolarity
a d polarityy of
an
of
Natural
crystals :
Naturalcrystals:
othe induce
c d charrge
g on
o the
crystal surface is
otheinducedchargeon
thecrystalsurface
opr
op
por
ortional to
oproportionalto
othe
magnitude and
direction
r
of
othemagnitude
anddirectionof
otheappliedforce.
(iv)Goodfrequencyresponse.
Syntheticmaterials
ohaveahighervoltagesensitivity.
Page 21 of
Gathered
Working Principle
of Piezoelectric Materials
oThecharge at theelectrode
ogivesrisetovoltage(E),givenby,
oWhere;
Proximity
Pr
rox
o imity Se
S
Sensors
nsor
orrs
Proximity
P
Pr
oximity Sensor
Sensors
orrs
oproximitysensorconsistsof
oproxim
ity
y sensorr con
co sists of
ophotoemitterdetectorpairrepresentsanotherapproach,
opho
h to emitterdetector pair rep
ho
representts an
a the
ano
th r app
a roach,
oanelementthatchanges
oan elemen
m t th
tha
at ch
ch nges eitheritsstate
cha
either
er its
er
i state
owhereinterruptionorreflectionofabeamoflight
owhe
wh
h re interruption or reflecctio
iion of a bea
am of
o lig
l htt
oorananaloguesignal
oor
a ana
an
an log
logue signal
oisusedtodetectanobjectinanoncontactmanner.
o
is used to detect an obj
bject
e in a noncon
ntac
actt m
ac
man
n
nner.
owhen
owhe
hen
he
n itisclose
it is
is close toanobject.
to an object.
t
o(oftennotactuallytouching)
o(often
ften not
no
o actually touching)
oE.g.,(LED&phototransistor/photodiodecombination
oE.g
E ., ((LED
LE
E & pho
ho
otot
t ran
ra
ansistor / photodiode com
co bin
inatiion
oMagnetic,
oMagnetic,
oCommonapplicationsforproximity:
o
C mon
Com
on app
a lications ffor
ap
fo
o pro
p ximity :
ocapacitance
o
capacitance
oinductance
oind
in ucttanc
a e
oCountingmovingobjects
oCounti
nti
ting
ng mov
moving
in object
ec s
oeddycurrent
oeddy cu
urren
u
nt
oLimitingttraverseofmechanism
oLimiting
ttraver
errse
s of
mec
m hanism
o
o
Eddy Cur
Current
rre
r nt Prox
Proximity
oxim
ox
i itty Sensor
im
Eddy
Ed
ddy C
Cur
Current
u rent
nt Pr
nt
P
Proximity
oximit
ity Sensor
it
Sens
Se
n or
ocoil
o
coil suppliedwithac
su
sup
su plied with a
c
oalternating
magnetic field pro
mag
oduc
d ed
oalternatingmagneticfieldproduced
oIf
metal
in
n closeproximity
close proxim
mity
oIfmetalin
o
to
magnetic
ic fie
field
ld
ld
d
oto
magneticfield
oeddy
curreeents induced in it
oeddycurrentsinducedinit
oedd
ddyy cur
dd
urren
re ts produce amagneticfield
a magnetic field
oeddycurrentsproduce
odistortsthemagneticresponsiblefortheirproduction
odistorts the magnetic responsible for their production
oimpedanceofthecoilchangesandso
otheamplitudeofthealternatingcurrent.
Page 22 of
Gathered
Advantages of
Eddy Current Proximity Sensor
9Smallinsize.
9Relativelyinexpensive.
g
y
9Highflexibility.
9High
sensitivity to small displace
ceeme
m nt
n s.
9Highsensitivitytosmalldisplacements.
Hall Eff
Effect
fect
ecct
Capacitance
Capa
ciita
t nce Prox
Proximity
ox
oximity
x
y Se
S
Sensor
ensor
oconsistsofsimpleplate
oconsis
tss of siim
mp
ple platee
o
o
owith
t
ob
obje
j ct (earthed)
owithobject
oas
a otherplate
other plate
oas
ob
bject ap
appr
p oaches sensorr
oAs objectapproachessensor
ose
s para
r tion betwplatee
oseparationbetwplate
o
and object ch
chan
anges
an
oandobjectchanges
o
siign
g iffic
ican
a t
an
osignificant
bject cl
c osee to
sensor.
sensor.
oass objectcloseto
ob
oas
Hall
H
Ha
lll V
Volta
Voltage
gee
Hall Effect Tr
Tran
Transducers
a sd
duc
u erss
o"Whenanyspecimen
o"When
any specim
men
e
oCurrent
oCurren
en
nt in
inNtype
Ntype spec
specimen
im
men
a current II
ocarrying acurrent
ocarried
by ellectrons
byelectrons
oisplacedinthe
ois
placed in the
o
electron
o s, as re
resu
re
s lt Hall effect,
oelectrons,asresultHalleffect,
oac
a cumula
ac
la
ate
t side
1
oaccumulate
side1
otransverse
magnetic field
otransversemagnetic
fieldB,,
ogets
negatively charged
ogetsnegativelycharged
orelativeto side2
oConsequentlypotentialdifferencedevelops
obetween 1 2
ThephenomenonisknownasHalleffect".
o called 'Hallvoltage'(VH).
Page 23 of
Gathered
Hall Voltage
Hall Voltage
omagnitudeHallvoltage(VH)
oHallvoltageinanNtype semiconductor
o ispositivesurface2
oOntheotherhand,,
oPtype
oWhere;
oWh
W ere;
Wh
o
o
opositivve surf
fac
acee 1
opositive
surface1
Uses
e of Hall
ll E
Effect
fffec
ec t
Halleffectmaybeusedfor:
Hall
effectt may
ay be
b us
use
u
s d for:
r
1. Determining
Determ
minin
m
ng
Halleffectmultiplier.
Hal
Ha l effect multiplier.
r
o Ntyp
NtypeorPtype
t e or
o Ptyp
t e
oTheinstrumentgivesanoutput
o
The instrument givves
es an
a output proportionalto
proport
rtion
rt
ion
onal
a to
o
2. Determining
D r nin
Determi
in
ng carrierconcentration
carrier concentra
tratio
tra
rat n
otheproductoftwosignals
othe
he pr
h
pr duct
pro
ctt of two signals
3. Calculating
Calcula
u ting mobility
mobility
oif
o
iff cur
ccurrent
cu
re t I is
ren
ismade
made proportionaltooneinputand
proportional to
t one inp
i ut and
o (h
(havingmeasuredtheconductivity).
having
h
g me
mea
e sured the conductivity).
4. Magneticfieldmeter.
Magn
netic field meter.
r
o
iiff B is
isproportionalto
proporttion
nal to secondinput
second input
t
oif
oTheHallvoltageV
oThe
e Hall voltage V H for a
agivencurrent
given
en cur
c rent
oHallvoltage
oHall
voltag
ag
ge V
VH isisproportionalto
s pro
p portion
nal to
o
oisproportionaltoB.
o
iss proportion
ti al to B
B..
oV
o
V
VH
otheproductofthetwoinputs
othe
prod
duct off th
he two inputs
h
tss
omeasures
o
mea
asurress themagneticfieldB.
the
hee magnet
etiicc field
et
ld B.
B
Hall
H
Ha
ll Eff
Effect
ffec
ff
ectt
ec
Displacement
Transducer
Displaceme
ment
me
ent Trans
nssducer
n
Hall
H
Ha
lll E
Eff
Effect
ffect
ff
Displacement
Transducer
Di
sp
pla
ace
eme
m nt Tra
nssducer
omeasure
o
measure
lin
lineardisplor
l ear displor
structuralelement
olocate str
s uctura
urr l elemen
nt
oincaseswhereitispossibleto
oin
cases whe
w re it is possible to
ochangethemagneticfieldstrength
o
change
ha
ang the magnetic field strength
byvariationin
thegeometryof
o by
variation in the
geometry of
oamagneticstructure.
Page 24 of
Gathered
Hall Effect
Displacement Transducer
oTheHalleffectelementlocatedingap
oadj topermanentmagnet
ofieldstrength ingap
oduetopermanentmember
odue to permanent member
ochanged bychanging
by changing
oposition offerromagneticplate
of ferromagnetic plate
oThe voltage output Hall effect element
nt
oThevoltageoutputHalleffectelement
to field strength
h
oprop tofieldstrength
gap function
n of the position
dis
diisplacement
dis
t
oin gapfunctionofthepositiondisplacement
ferrromagnetic plate
ooff ferromagneticplate
owithrespecttostructure.
owith res
r pectt to
re
t strruct
u ure.
Halll E
Eff
Effect
ffect Fl
ff
F
Fluid
uid Leve
Le
Level
ev l Tr
Tran
Transducer
ra sducer
Variable
Vari
Va
ari
riab
riab
able
l Inductance Transducers
Trran
T
nsduc
uccer
erss
omagnet
omagn
ett attachedtofloat
at
attta
tach
ched to flloa
ch
oat
o
o
leveel
change
gees
g
oas levelchanges
change
h
magn
gn
gnetic
n
charact
cter
ct
eris
er
isticc
is
o ch
magneticcharacteristic
o
fl
floa
fl
oat distance
oa
ofloatdistance
o
off electricalcircuit
electric
ical
ic
al circuit
al
oof
ofrrom Hallsensorchanges
o
Hall sensor chan
an
a
nges
ge
ge
ofrom
reesp
pon
o se to measure
oin responsetomeasure
result
s lt
Hall
Hallvoltage
voltage output
output
ut
oresu
o
o
oameasureof
oa measure of
odi
disp
di
spla
sp
l ce
la
ceme
m nt,
me
odisplacement,
o
distance of fl
floa
at fr
f om
odistanceoffloatfrom
o
se
sens
n or
ns
o he
h ncee level
level
osensorhence
ovelocity,
ovelocity,
oac
a celeration
oacceleration
oof
off th
he fu
f el in
tank
ta
ank
n
oofthefuelin
Types of Variable
Variab
able Inductance
ab
Inducttaanc
an
n eT
Transducers
ransdu
ucer
c s
ce
Types
Typ
ypess of
o Var
Variab
Variable
ia le Ind
Ind
Inductance
eT
Transducers
ran
an
ansducers
Pa
Passivetype
ssiv
siv
ive ttyype
ive
1. Self
Selfgeneratingtype.
fgenerating type.
o ofanobjectresults
of an object reesults in
in
omotion
t
is
generat
a ed becaus
use of
us
o voltage
isgenerated
becauseof
ochange
g s in th
he in
ndu
d ctance ofthecoils
of the coils
ochangesintheinductance
o the
relative motion between
b tween
be
therelativemotion
oof
of th
the transducer.
oofthetransducer.
o a
conductor and
a magnettic fi
fiel
e d.
d
aconductor
andamagneticfield.
classified
classified
Variablereluctance.
Electrodynamic type.
Mutualinductance.
Eddycurrent
Differentialtransfer
Page 25 of
Gathered
Electro-Dynamic
Electro-Dy
D namiic Ty
T
Type
pe
e (Active)
(A
A
Electro-Dynamic
El
lec
ectr
t o-Dynamic Type
tr
pe
e (A
((Active)
ctiv
ve))
Eddy C
Current
urrent T
ur
Type
ype (Active)
yp
(A
Eddy
Ed
E
ddy C
Current
urre
ur
r ntt T
Tac
Tachometer
a homeete
t r (A
(Active)
Page 26 of
Gathered
oUsedtoMeasure:
oUsed
to Measure:
Variable
Variab
ble Permeance
P
ce Type
pe
e (Passive)
(P
(P
Variable
V
Va
ariab
riab
ri
able
l Permeance Type
pe
e (Pas
(Passive)
ssi
s ve
ve))
Mutual Ind
Inductance
duc
u tancee Ty
T
Type
ype
e (Passive)
(Passive
vee)
ve)
LV
LVDT
VD Type
Typ
T
y e (Passi
(Passive)
sive))
si
Page 27 of
Gathered
Pressure M
Measureme
Measurement
ment usi
me
using
sing
si
n LVDT
Advantages
Ad
A
d
dvantages
of LVDT
LVDT
LV
D
Disadvantages
Disadv
dv
van
a tagess of
of LVDT
LVD
L
V T
Ultrasonic
U
Ul
tras
tr
a onic
nic
ic Transducers
Transdu
T
ducers
du
r
rs
oultrasonicdetectors
o
ultrasonic
nic detectors
r
opiezoelec
e tric cr
ccrystals
ysta
als
ls
opiezoelectric
o
Qu
uartz
commonly
y used
oQuartz
commonlyused
o(fr
(fr
freqrange 200
kHz 300 kHz)
z
o(freqrange
200kHz300kHz)
Page 28 of
Gathered
oTypicalapplication
o Flowmeasurement
oLevel measurement
oThickness measurement
testing material
alls.
oNondestructive testingmaterials.
Ultrasonic
Ul
trras
a onic Flow
Flo
F
lo
ow Meter
Meete
ter
oLetfluidvelocitybe
m/s.
o
Let
Let
flu
f id velocity be v m/
s.
oWhenultrasonicpulses
oWhen
ultras
a on
nic pu
pulses transmitted
t ansmitted
tr
o(assumethatthefluidisflowinginthepipefrom
o
(assssume
u that the fluid is flowing in the pipe
i from
ipe
oacrosss thefluid
the fl
flui
uiid
u
id
oacross
oleft
l hand side to right hand side)
le
olefthandsidetorighthandside)
oVelocityofultrasonic
oVel
Vel
elocit
elo
i y of
o ultrasonic signal
signalfrom
fro
ro
om transmitterAto
transmitter A to
othee velo
loci
lo
city
ci
ty
y of ultrason
o ic
on
i wavess
othevelocityofultrasonicwaves
oreceiverA
increasedto
avalue(c+vcos),
orec
eceiv
ec
ceeiv
i er A increas
iv
r
ed
d tto
oa
value (c
( + v cos
),,
o
is in
incr
crea
cr
rea
eased or
oisincreasedor
owhere
o
wheere
eerre :
oc
o
c is
isthevelocityofsoundthroughthefluidinthepipe,
the velocity
ci of soun
city
so d through the fluid in the pipe
pipe,, and
and
d
ode
decr
de
crea
cr
re sed by
odecreasedby
o
o
is
istheanglebetweenthepathofsoundandwallofthepipe.
the angl
ngle betw
ngle
b ween
en
n the path of sound and wall of the pipe.
othe
fluid velocity
othefluidvelocity
oLet
o
L l be
Le
Let
bethedistance(oblique),between
the
h dis
he
disttance (oblique)
e)) , bet
b ween transmitter
transmitterandreceiver
and recceiver
odepending
upon
n
odependingupon
otimetakenbypulse
o
tim
tim
timee tak
taken
ta
en by pulsee signaltogo
signal
al to go
o
ofrom
transmitter A to
toreceiver
o re
re eiv
rec
ver
e A wil
willbe
w
l be
ofromtransmitter
o
d rection
di
n of
th
he fl
fluid flow
odirection
ofthefluidflow
oThen,repetitionfrequencyofthereceivedpulse
atA,
oThen,
n repetition frequency off th
th
he receiv
i ed
iv
e pulse at
a
Ultrasonic
Ultras
son
o ic Flow
Flo
ow Meter
M ter
Me
Ultrasonic
Ultr
Ul
t as
tr
a on
onic
i Level
Lev
evel Measurement
ev
Measu
s reeme
su
m nt
o
ovelocity of ultrasonic sign
all transmitted by
signal
otransmitter
andreceived
receiveeed bythereceiver
by the receiverr B
otransmitterB and
o reduced by
by
fluidvelocity
fluid velocity
velo
o
oits
pulse repetition frequency, fB :
oitspulserepetitionfrequency,
oThedifferencein
oThe
difference
f
in frequency
frequencyisgivenby:
is given by:
Page 29 of
Gathered
oUltrasound propagated
oInsensitive to
ointo pieceunderinspection
oviscositypressure temperaturevariations
oBidirectional measuringcapacity
otransduceroutput constant
oGoodaccuracy
oFast response
oanyirregularity
oany
irregularity
oNondestructive
oNon
on des
ondes
de tructive measurement
suchasexistenceofacrackor
foreignobject
o such
as existence of a crack or fore
reig
re
ign object
ig
c
oWidefrequencyrange.
oWid
W e frequency
n range.
osomereflection
osome
reflectiion
n of
of
oSystemisversatile
oSystem is verrsatile
otransmittedultrasonicwave
otransmitted ultrras
a onic wavee
ocanbeusedforanypipesize
ocan be used for
fo any pipe siz
iizze
oDisadvantage:
o
Disa
Dis
ad
adv
d antage:
oCost is
ishigh.
high
h.
Photo-Electric
Ph
hoto--El
E ectric T
Tra
Transducers
r nsdu
du
d
ucers
Photo
Ph
hoto Multiplier T
Tub
Tube
u e
oPhotoelectricdevicescategorisedas
oPhoto
electricc dev
vice
icess
catego
gorised as
go
ophoto em
missi
m
siive,
ve, pho
ve
photoconductiv
tiv
tive
ive photovoltaic.
c
ophotoemissive,photoconductive
photoemissive
ph
pho
p
h to em
missiive
m
o
orad
ra iation
i fal
allin
al
ling
lin
g on cathode causeselectrons
causeees ele
e ctrons tobeemitted
to be emi
miittteed
oradiationfallingoncathode
ofro
om thecathodesurface.
the
he cat
cathod
h e surface.
ofrom
ophoto co
onductiv
o
duc
uctiv
tivee devices
ophotoconductive
oressistance of material changed whenitisilluminated
whe
heen itt is
i ill
il uminat
ated
a
e
oresistanceofmaterial
oPhoto voltai
ta c cells generate
ta
t output volltag
t e
oPhotovoltaiccellsgenerateoutputvoltage
n ty
nsi
t
opro
p porrrtional to the
theradiationintensity
radiation intensi
oproportionalto
o
Th incident
The
n radiation
n may be
oTheincidentradiationmaybe
oinfrared
d, ulttrav
raviol
iolet
io
iol
et, gamma
a ray
s,, Xray
r s, or
ra
visible light.
t
oinfrared,ultraviolet,gamma
rays,Xrays,
orvisiblelight.
Photo
o Mu
M
Multiplier
ltip
pli
lier
e T
Tub
Tube
u e
Photo
Ph
hot
o o Co
C
Conductive
nd
duc
ucti
t ve Cel
Cell
elll (L
el
(LDR)
LDR
D )
oConsistsofevacuatedglassenvelope
oConsists
of evacuated glass envelope
ocontaining a photo cathode,
e an anode and
ocontainingaphotocathode,ananode
and
oseveral additional electrodes, termed Dynodes
oseveraladditionalelectrodes,termedDynodes
oWhenelectrons movingatahighvelocitystrikeanappropriatematerial
omaterialemitsagreaternumberofelectrons
othan itwasstruckwith
Page 30 of
Gathered
Photo Diode
oElectricalresistance ofthematerialvaries
owith theamountofincidentlight,
ophotoconductivematerial
oCadmiumsulphideCadmiumselenide
o Cadmium
sulphoselenide
Cadmiumsulphoselenide
odeposited
d in zig zag pattern
odepositedin
pattern
o(to
obtain a desired resistance value and power rating)
o(toobtainadesiredresistancevalueandpowerrating)
oseparating
two metal coated areas acting as electrodes
oseparatingtwometalcoatedareasactingaselectrodes
oA reversebiasedsemiconductordiodepasses
reeeverse biased sem
miconductor diode passes
m
oon
an insulating basee such
su as cera
oonaninsulatingbasesuchasceramic
c
mic
oonly
a very sma
all leakagee current
a
nt if the junction is exposed to light.
oonlyaverysmallleakagecurrentifthejunctionisexposedtolight.
oThe assembly
l is
enclosed in a
metal cassse
oTheassembly
isenclosedin
ametalcase
oUnder
illumination the cur
urr
rrrent rises
oUnderilluminationthecurrentrises
owith
a glass window
owithaglasswindow
o
i direct proportion to the
in
light intensi
ssity.
si
y
oindirectproportion
thelightintensity.
oover the
photo cond
nd
ducti
u ve mat
teri
rial.
ri
thephotoconductive
material.
Photo
P
Ph
hoto Tran
Transistor
an
nsistor
orr
Solar Cell
Digital
Di
ig
gital Enco
gi
Encoders
code
co
d rs
r
Digital
D
Di
gita
ta
al En
E
Encoders
code
ers
r
oemploysgratingprinciple
oemploys
grat
grat
rat
a ing
i principle
glass disks onefixed,theotherrotating
one
on fixed, the other ro
otating
o
otwo glassdisks
owith identica
t l opaq
a
aque/clear
aq
pattern
rns
rn
owithidenticalopaque/clearpatterns
ophotog
graphically
g
ly
y depo
osite
sited
sit
d
ophotographicallydeposited
oarrre mounted side by side with about
oaremountedsidebysidewithabout
o250mclearancebetweenthem
o250m clearance between them
oParallell light is projected through
the two disks
oParallellightisprojected
throughthetwodisks
d h
h f
id
otowardphotosensorsonthefarside.
oWhenopaquesegmentsarealigned,
oaminimum(logical0)signalisproduced,
owhile alignmentofclearsegments
ogivesamaximum(logical1)signal.
Page 31 of
Gathered
ELECTRONIC INSTRUMENTATION
EC 010 704
(Syllabus)
References
1.
Measurement Systems:
2.
Electronic Instrumentation:
HSKalsi
3.
4.
M
Measurement & In
stttrumentation Principles:
ri
Measurement
Instrumentation
5.
AlbertDHelfrick
&WilliamDCooper
Albert
D Helfrick &
WilliamDCooper
AlanSMorris
Alan S Morris
D.V.SMurthy
D.V.
S Murthy
EC 010 704
ELECTRONIC
ELE
LECTRONIIC IINSTRUMENTATION
LE
NST
TRUM
R
ENTATION
(Syllabus)
(Syl
ylllabu
l
s)
EC 0010
100 7704
0
04
(Syllabus)
3 hours lecture
lecc uree and
lect
an
n 1 hour
hooour tutorial per week
References
Refer
ence
es
e
References
6.
ELECTRONIC INSTRUMENTATION
INST
ST
TRUM
MEN
ENT
NTATI
A ON
O
11. A Course
Cour
o se in Electrical and Electronic Measurements
our
Measureme
rem nts and Instrumentation:
rem
Instru
rument
ru
m atio
io
on:
Electronic Instrumentation
Insttrumentat
ntation
ntat
iion
o and
an
nd Measurements
Measurements
David A Bell
DavidABell
7.
InstrumentationDevices
and
Instru
st mentatio
a nDevices
ices
e a
nd Systems:
8.
Electronic Measurements
M urem
Meas
rements
men
n and Instrumentation:
9.
Me
Measur
a emen
nts and Instrumentation:
Measurements
J B Gup
Gupt
p a,
JBGupta,
CSRangan,SGSharma&VSVMani,
C
S Rangan,SG Sharma&V S V Mani
M ,
Ma
R
K Rajputtt,
RKRajput,
U A Ba
Baks
B
a hi, A V Baks
ak
aks
kshi,
hi
UABakshi,AVBakshi,
10. A Course in Electrical
Ele
leeectriccal and
a
and Electronic
Ele
Electro
lec nic Measurements
Measureme
r
nts and
an
nd Instrumentation:
In
nstru
str mentation:
A
K Sawhney,
AKSawhney,
IInstrumentation
In
s ru
st
ume
me
mentatio
io
on Amplifiers
Ampl
plif
pl
ifie
if
i rs
ie
(Significance)
(Sig
(S
iggnificance)
ig
f
oInmostInstrumentationcases:
o
In most Ins
nsstru
trumentation casesss:
ELECTRONIC
ELECTR
CT ONI
NIIC IINSTRUMENTATION
NST
TRUMENT
TATI
A ON
AT
N
EC 010 704
(Syllabus)
(S labus)
(Syl
(S
oTransduceroutputsare;
oTransducer
er out
o puts are;
ou
e
Module
Mod
ulle
le 3(12 hrs)
IntermediateElements
Intermediate
Elements
InstrumentationAmplifier,
Instrumentation
Amplifier,
Couplers.
Opto Couplers.
9Not
signiiificant to
9Notsignificantto
DataTransmissionElements
Data Transmissio
ion Elements
io
IsolationAmplifier,
Isolation
Amplifier,
DCandACBridges:
9Verylowlevelsignal
9Very
low
w level signal
sig
ig l
WagnerGroundConnection.
Wagn
gn
ner
e Ground Conn
C
ection.
oTransducersare
oTra
Transducers are mountedremotefrom
Tra
mounted remote from control
controllocations
locations
9Longcablingneeded,
9L
bli
d d
(AnalogAndDigital).
Noise &AtmosphericInterference,
FDMTDM:
oBeforenextstageits necessaryto
9Amplifysignallevel,
Page 1 of
Gathered
Instrumentation Amplifiers
Instrumentation
Instrume
m ntation
n Ampl
Amplifiers
p if
pl
ifiers
Limitation
Limi
Li
mita
mi
mita
tati
tion
o of Instrumentation
Instrumentatio
i n Ampl
io
Amplifiers
plif
pl
ifie
if
iers
ie
rss
oRequires
iree areturnpathforbiascurrents.
a return path for bias currents.
s
oSince the
theopampinputscarrynocurrent
opamp inp
puts carr
p
ca y no
o curr
cu
u ent
t
oIff no
ot provided, they will charge stra
o
ay capa
c
citances
ces;
ces
s
oIfnotprovided,theywillchargestraycapacitances;
oa
single current
en i flow
flows
lowss
oasinglecurrent
o
causing output to
drift excessiv
siv
i ely
iv
ely/saturate.
ocausingoutput
todriftexcessively/saturate.
ofrom e01
o
toe02 thro
through
hrough
hro
ug
0 to
o when
whenfloatingsourceslikethermocoupleareamplified,
n fllloating sources like thermoco
ocouple
oco
u
are amplified
d,
oR
R2,,R1,,and
an R2,,giving:
and
giving:
oa
co
con
conn
onnecti
ec on to
amplifier grou
ro nd
rou
n mustbeprovided,
must be provided,
d
oaconnection
toamplifierground
o
which lead
whic
ea
a s to
excessiv
ssivve noise.
owhichleads
toexcessivenoise.
oIsolationamplifierdoesntrequiresuchagroundconnection
o
Iso
so
so
olation
n am
mplifier does
m
oe nt requ
oes
reequire
i such a ground connection
o(SignalisIsolatedfromGround)&
o
(Sig
gna
a is Isolated
al
d ffrom
rom
m Grou
Gr nd) &
Gro
oRejectionofInterferenceNoiseisImproved.
oReje
R cttion
on off Inte
on
I rference
ence Noise is Improved.
ence
d
oGainofanInstrumentationAmplifier:
oGain
G
of an Inst
nstrume
trum ntation Amplifier:
r
e
e e
Isolation
Isolat
atio
at
i n Am
Amplifiers
mpl
pliffie
iers
Coupling
Cou
oupli
ou
upli
pling
ng
n
g Tec
Techniques
e hni
hn quess u
hn
used in Is
Isolation
ola
laatio
t n Ampl
A
Amplifiers
m ifiers
oSpecial subclassofInstrumentationAmplifier:
subclass off Ins
In
n trumentat
t ion Amplifier:
r
oIntendedforusewhere:
oIntended
for use where:
9Low
level signal ride on
top
op
p of
9Lowlevelsignalride
ontopof
Transformer
Transformer
T
Tr
Coupling
C
Coup
ling
ohighcommonmodevoltage.
ohigh common mode voltage.
t
9Possibilities exists of
9Possibilitiesexistsof
otroublesome ground disturbances & ground loops.
s
otroublesomegrounddisturbances&groundloops.
circuitry must be protected from
9Processing circuitrymustbeprotectedfrom
ofaults &powertransients.
9Interference from
Optical
Coupling
omotor,powerline...etc.isheavy.
9Patientprotectionin
oBiomedicalapplications.
Page 2 of
Gathered
Telemetry
Measuringata Distance
oTelemetry technology
oallows collect information
o from inaccessible inconvenientlocations
otransmit to accessibleplaces
accessible places
oprocessrecord
o
processrecord display
opresentableform
opresseen
nt ble form
nta
Block
B
Bl
ock
k Diagram
m of T
Tel
Telemetry
ellemetry
Types
T
Ty
pes of Telemet
Telemetry
try
y Systems
Syste
tems
te
ms
I.
Acco
Accordingtolink
co
ording to link betw
betw
telemetertransmitter
telemeter transmitter
er and telemeterreceiver:
er
tel
eleme
el
emeter
eme
em
te rec
r eiver:
r
I.
Landline(D.C.)telemetrysystem
L
a line (D.C.) teleme
an
and
metry
me
t system
9Voltage
9
V tag
Vol
ge te
tel
telemeteringsystem.
elemeterring
ng system.
9
C rent teleme
Cur
leme
em ter
t ing system.
te
9Current
telemeteringsystem.
9
P iti
Pos
tion
n (or
( ratio)
o tel
teleme
e tering system.
9Position(orratio)telemeteringsystem.
II. Radiofrequency(RF)telemetrysystem
Radio
Rad
io fre
freque
quency
que
ue
(RF)) telem
metry system
m
9Frequency telemeter
telemeteringsystem
terring
in system
sys
yste
te
tem
9Pulse telemetering
sys
yst .
ystem
telemeteringsystem.
Typess of
o Tel
Telemetry
em
met
e ry
y Systems
ms
Voltage
Vo
olt
ltage Te
T
Telemetry
ele
l metry
y Sy
Systems
yst
s ems
II. Accordingtoform
According to form inwhich
in whiich
c
information
is transm
sm
smitted
informationistransmitted
I.
Analoguetelemetrysystem.
Analogue
telemetry system
m.
9 Information is
istransmitted
transmitted in
intheformof
the form of
Current,
t voltageposition frequency
II. Digitaltelemetrysystem.
9 Information istransmitted intheformpulses
oWith changeofpressure
obourdontubeactuates
oslider ofpotentiometer.
oConsequentlyvoltagechangesattransmittingend.
Page 3 of
Gathered
Motion Balance
Current Telemetry Systems
ng
g ter
tee minal.
ochanging
Motion
Moti
tion
ti
on B
Balance
ce
ce
Current
C
Cu
rrren
e t Telemetry
Teleme
Te
m try Systems
Syystems
Force
F
Fo
rce Balance
B lla
Ba
ancce
Current Telemetry Systems
System
Sy
ms
opressure
on
on
o
on
bourdon
b
bour
o don tub
tube
be causes
causes
odisplacemen
m t
corre of
o
the LVDT
T
odisplacementcore
oftheLVDT
o
pro
r duci
cing
ci
ng
n
g voltage
t
output
put
ut
oproducingvoltageoutput
o
amp
amplified by an
amp
oamplifiedbyan
o
rectified.
orectified.
ovoltage
t
produc
duc
du
duces
uces
es D.C
D . current
ovoltageproducesD.C.current
oin
the tellemetering
ing
ng channel and
is measured byy
ointhetelemeteringchannel
andismeasuredby
o
D.C
C. milliammeter calibrated
d
oD.C.milliammetercalibrated
oin
in terms of pressure being measur
sur
ured
e
ointermsofpressurebeingmeasured
Force Balance
Bala
la
anc
n e
Current
Curr
en
nt Telemetry
Tele
eme
m try Systems
S stems
Sy
Position
Posi
Po
s ttiion
si
o ((Ratio)
Raati
tio)
o Tel
Telemetry
em
metry
yS
Sys
Systems
y tems
o(PointerShowingRatio/Position)
o(Pointer
Sh
Showi
ng Ratio / Posit
Posi
o ion)
obourdon tube
tube
orotates
feedback force coil
orotatesfeedbackforcecoil
oAs coil
rotatesflux linkages
bet
etw
et
w
coilrotatesflux
linkagesbetw
oprimary
and secondary windingscha
ha
h
ange
n
oprimaryandsecondarywindingschange
ochange varies
oamplitude
of amplifier.
oamplitudeofamplifier.
outputconnectedfeedbackforcecoil
d f db k f
il
o
oproduces forceopposing
obourdontubeinput
oWheatstones BridgePrinciple
Page 4 of
Gathered
oLinkbetweenthe transmittingendandthereceivingendisestablished
Types of Signals :
othroughthe"radiolinks"(therebeingnophysicallink).
I. Analoguesignals:
oRepresentedbyvoltage waveformsthathave
odifferentamplitudesatdifferentinstantsoftime.
odifferent
f
amplitudes at different
f
instants of time.
oMoresuitable
oMore
suitable for
fortransmission
transmissionof
ofdata
data over distances
distancesmorethan
more than 1
1km.
oPreferable RFspectrum
RF spectrumabove
above4 MHz
oE.g.:Atelephone,radiobroadcast,TerrestrialTVsignaletc.
o
E.g
g.:. A telephon
ne, radio broadcast, Terrestrial TV signal etc.
n
oTravel
Travelinstraightlineswithsome
in straight lines with some rep
repeaters
peat
ea
a ers
er
olocated every 30 km
kmto
to 60 km
k
oonhighbuildingsortowers.
oon
high buildings or towerrrs.
Radio Frequency
Freque
ency (RF)) Telemetry
Telemet
T
eettry
r Systems
Radio
Ra
adi
dio
o Frequency
Fre uency (RF) Telemetry
Fr
Freq
Telem
met
e ry Systems
Sys
yste
ys
te
emss
Types
T
Typ
es off Sig
S
Si
Signals
nals :
Transmission
i Paths:
io
Paths
hss:
h
Dig
ig
igital
g
sig
iig
gnal
alss :
al
II. Digitalsignals:
I. L
ine
nee Com
C munication:
LineCommunication:
o
pul
pulses
ses occurdiscrete
occurdiscreete
te
time
timee
tim
opulses
o
Uses ove
overhe
ov
rhead lines / pol
rhe
po
oles
e /UGCs (in HF ran
a ge)
an
ge)..
oUsesoverheadlines/poles/UGCs(inHFrange).
oOccur definiteperiodcodedgroup
def
definite period
def
de
cod
od
ded
d group
p
oUseswaveguides(inUHFrange).
oUse
U s wa
wav
a e gui
uides
ui
des
es (in
( n UHF
U range).
o(Opticalwaveguidescancarryover
o
((O
Opticcal
O
a wav
ve gui
gu d
gu
des
e can
c carry over 10THz
z)
oE.g.:Atelegraph,telex,SatelliteTVsignaletc.
oE.g
E .: A telegr
E.
e aph, telex, Satellite TV sig
ig
gnal
na etc.
na
oE.g.:ATelephonenetwork.
oE.g.:
A Teleph
honee net
n work.
ne
k
Major
M
Ma
jo
or RF
R Bands
ds
Radio Frequency
Frequenc
ncy
nc
y (RF) Telemetry
Tel
T
el met
elem
el
e ry Systems
Syste
te
tems
em
Transmission
Transm
iss
s ion Paths:
ss
II. Radio
Communication:
RadioCommunication:
oSignalpropagates
throughatmosphere.
oSignal
propagates through
atmosphere.
directionalantennasusedforbroadcast.
oNon directional
antennas used for broadcast.
t
oDirectionalantennasusedforpointtopointlinks.
Page 5 of
Gathered
Modulation
o
Modulation
Need forModulation:
oPulseModulation
oAnaloguePulseModulation
oTypes ofModulation
oPAM
oAnalogueModulation
oPPM
oAM
oPWM.
oDigitalPulseModulation
oDig
D ital Pul
Pulse
s Modulation
oFM
oPM.
oPCM
oDelta
Modulation
Modula
la
ati
t on
Modem
oDigitalModulation/Keying
oDigital
Mod
dulation / Key
K ing
oConventionalDigitalModulation
oConven
ntio
t nall Dig
Digital Modulatio
tion
ti
tio
n
oASK
oASK
K
oFSK
oFSK
K
oPSK
oPSK
SK
oSpecialDigitalModulation
oSpe
Sp cia
al Digital Modulation
oDPSK
oDPS
SK
oQPSK
K
FM Telemetry
Tel
T
e emetry
el
ry System
Sysste
S
t m
Page 6 of
PCM
P
PC
CM
M Tele
Telemetry
le
eme
m try Sy
System
ystem
em
m
Gathered
Rx(DeMUX)
PAMDataStream
Wheatstone Bridge
Bri
B
riidg
d e
FDM
M
Tx (MUX)
(MU
UX)
U
Rx(DeMUX)
Rx (DeMUX)
o
o
Unk
U
UnknownResistor
nown Resistor
o R3 is
iscalledthestandardarm
callled
d the
th stand
dard arrrm ofthebridge,
d
of the bridge,
oresistorsR
oresistors R2 and R
R 1 are
arecalledtheratioarms&
cal
alled
l the
th ra
rat
a io arms &
oR
oR4 is
iscalledtheUnknownarm(R
called the Unk
known arm
arr (R
R x)
Wheatstone
Wheats
Wh
to
one
n Bridge
Bri
B
r dge
ri
Thevenin
T
Th
hev
ev
venin
nE
Equivalen
Equivalent
e t Ci
C
Circuit
rcuit
obridge balanced
balancedwhen
d whe
hen
he
oUsed to determ
r in
ne
oUsedtodetermine
oIf galvanometer
current zerro
galvanometercurrentzero
o
o
whether the
th
h galvan
a om
an
o eter has
owhetherthegalvanometer
has
othe
requ
re
q ired sensitivity
otherequiredsensitivity
&
oto detect an
unbalance condition.
anunbalancecondition.
oForthis,itisnecessarytocalculate
oCombiningEqs.(51),(52),and(53)andsimplifying
othegalvanometercurrent.
I.e.;
Page 7 of
Gathered
oTheTheveninequivalentcircuitisdeterminedby
olooking intogalvanometerterminals candd.
oFirststep:
ofindingtheequivalentvoltage
9Thevenin
9
The
evenin Equivalent
EquivalentResistance
ResistanceSubstituted
Substituted
oappearingat
terminalsc and d
oappearing
at terminals
d
owhen thegalvanometer
the galvanometer isremoved
is removed fromthecircuit.
from
fro
m the cir
irr
ircuit.
oSecondstep
oSecond
step
ofindingtheequivalentresistance
ofind
o
ing the equivalent resist
sist
istance
olookingintoterminals
olooking
into terminals c and
andd,,
9Galva
9Galvanometer
vanometer is
isremoved
9Battery
9
Battteery internal
internal
l resistance
resistancesubstituted
substituted
owith the
eb
batttter
e y replac
la ed by its int
nter
ntern
e al resist
stta e.
stanc
thebatteryreplacedbyitsinternalresistance.
Thevenin
T
Th
ev
venin Equ
Equivalent
uiv
i alen
nt Circuit
Guarded
G
Gu
arded Wheatstone
Wheatsto
tto
one
n Bridge
Briidg
dgee
Theveninvoltage
Thevenin
voltag
tta
a e
where:
w re:
whe
Theveninresistance(lookingintoterminalscandd)
The
heeven
v in res
r istance (looking into termin
minals c and d)
min
Galvanometercurrent
Galvanometer
te cur
te
cu ren
ree t
oavoidleakagecurrents
oavoidleakag
ag
ge currren
rents
tss
where;
where;
w
Ig ::galvanometercurrent,
galvanometer current,
Rg ::galvanometerresistance
galvanometer res
resist
istanc
ist
an e
omeasuring
omeasuring
o(Insulationresistance)
o
(Insul
(In
s ation resistanc
nce)
nc
Guarded
Guarde
ded Wheatstone
de
Whea
eaats
ts n Bridge
tstone
Bridg
dg
ge
Guarded
Guar
Gu
a de
ar
d d Wheatstone
Wh
W
heatsto
one Bridge
Bri
B
r dge
g
oWithout guard
oIIL gets
getsadded
added toI
to IX
oCausinganerror
oCausing
an error
oAguardwirecompletelysurrounding
oA
guard wire completely surrounding
o surfaceoftheinsulatedpost&
oobstructleakagecurrent
o&returnsitbacktobattery
oTheguard aroundRxdoesnottouchanypartsofthebridge &
oisdirectly connectedto+ve ofthebattery.
Page 8 of
Gathered
oR
R1 and
andR2,,representtheleakagepathsfromthemainterminals
repres
r ent thee lea
l kag
kage
g paths from the main terminals
oalongthe
oalong the insulatingpoststothemetalplate,orguard.
inssulatin
ing posts to thee metal plate, or guard.
in
Three
Th
reee Terminal
Termin
in
nal Res
Resistance
eessis
i tance
AC Bridges
Bridg
gess
oThisconnectionputs
oThis
connection
n putss R1 |||
||
| RAA(ratio
(ratioarm),
arm
a
m), but
but
osince R1 is
osince
isverymuchlargerthan
v y mu
ve
ver
mu h larger tha
muc
an RA,,
oitsshuntingeffectisnegligible.
o
its
ttss shu
unti
n ng
nt
g eff
e ect is negligiblle.
oSimila
ila
ilarly
lar , lea
akage res
essist
i ance R2 isinparallelwith
is in parallell wit
with
oSimilarly,leakageresistance
othegalvanometer,buttheresistance
ofR2 is
othe galva
anometer,
a
r, but
b the resistance of
is
oso muc
m h hig
higher
he than that of the galvanometer
her
er tha
ha
at the only effectt
osomuchhigherthanthatofthegalvanometerthattheonlyeffect
o is
a slight reduction in galvanometer
er sen
se sitiviitty
se
y.
isaslightreductioningalvanometersensitivity.
oThe
The
he eff
ff
ffects
off external leakage paths are theref
ref
effore
o removed
oTheeffectsofexternalleakagepathsarethereforeremoved
oby
byy using theguardcircuitonthethreeterminalresistance.
t guard circuit on the threeeter
the
te minal res
essist
istanc
sttanc
a e.
obyusing
AC Bri
Bridges
ridg
ri
d es
A Bridges
AC
e
oGeneralBalancingConditionforACBridge:
oGeneral
Balancing Con
Condit
dition
dit
i for AC
C Bridge:
e:
oI.e.,thetwoconditionsare:
oI.e.,
thee two
two
w conditions are:
ZZ
ZZ
o(intermsofImpedance)
o(in
( terms of Impeda
eed
d nce)
e
ZZ
or
YY
Y Y
Z Z
oproductsofthemagnitudesofthe
o
p ducts of the
pro
t magnit
i udes of the
it
o(in
( terms of Admittance)
e
o(intermsofAdmittance)
ooppositearmsmustbeequal
o
opp
pposi
pposi
osite
os
t arms must be equal
oBut for AC,
C we have to consider thePhaseAnglealso:
the Phase Angle also:
oButforAC,wehavetoconsider
oI.e.,
Z T Z T
oI.e.,
Z Z T T
&
Z T Z T
T T
Z Z T T
T T
inmultiplication ofcomplexnumbers
ooppositearmsmustbeequal
othemagnitudes aremultipliedandthephaseanglesadded
Page 9 of
Gathered
oUsedfor:
Schering Bridge
oTheSolutionis:
Schering Bridge
oMeasurementof
9UnknownCapacitance
9Insulating Properties
oOnSubstitution;
o&Expansion
o&
Expansion
oEquatingReal
&ImaginaryParts;
oEquating
Real &
Imagina
nary Parts;
na
Weget:
W
e get:
Schering
Scheri
ing Bridg
Bridge
dg
d
ge
oUsedfor:
o
U
Us
Used
for:
o :
oPowerFactor(PF);
oPower
Facttor
o (PF
F) ;
&
Wien Bridge
Bridg
dg
d
ge
oMeasurementof
oMea
ea
easur
as ement of
9unk
u nown Frequency
9unknownFrequency
oDissipationFactor(D);
oDissipatio
i n Fa
Fact
ctor
ct
o (D
(D);
oTheSolutionis:
oThe
Solution is:
Wien Bridge
Bri
B
r dg
ri
ge
oUsedfor:
o
U
Used
for:
Owens
Ow
wen
e s Bridge
Briid
dg
ge
oMeasurementof
oMeasur
eme
ment
ment
me
nt of
9unknown Induct
u ance
9unknownInductance
oOn Expansion;
oOnExpansion;
oEquatingReal
oEquating Real Terms;
o&ImaginaryTerms;
o
oIfR1=R3 &C1=C3;then:
Page 10 of
Gathered
Owens Bridge
oAtBalance:
oEquatingReal &ImaginaryParts;
oWeget:
&
where;
Wagner
W
Wa
gner Groun
gn
Ground
und Co
un
Connection
on
nn
nection
oStraycapacitancesexist
oStray
capacitan
ancess exi
an
exist
st between
b
betweenthe
tthe
hee
ovariousbridgeelementsandground,and
ovarious
brrridge
ge ele
elemen
me ts and gro
me
ro
round
ou d, and
oalsobetweenthebridgearms
themselves.
o
a o betw
als
ween
n the bri
br dge arms the
emse
ms lves.
oThe
see stray
y capaci
aci
ciitan
tances shunt the
bridge
dge
dg
gee arm
g
a s and
oThesestraycapacitancesshunt
thebridgearmsand
measurementerrors,
ocause mea
m
sureme
sur
eme
ment errors,
r
oparticularlyat
thehigherfrequenciesor
opartic
t ularly
ula
larly at
a the
higher frequencies orr
owhensmallcapacitorsorlargeinductorsaremeasured.
owhen
sm
mall capacitors or large inductors
m
rs are
arr mea
ea
asur
ured.
d
oWagnergroundconnectioniswidelyusedfor
oWag
W ner
Wa
Wag
n gro
ound connectionis widely useed fo
fo
for
oeelim
oeliminatingtheeffectsofstraycapacitance
pac
aci
c tance
iimi
m natting the effects of stray
r cap
oin a bri
b dge
br
gee cir
circu t.
circui
oinabridgecircuit.
Page 11 of
Gathered
of Mahatma Gandhi
ELECTRONIC INSTRUMENTATION
EC 010 704
(Syllabus)
References
1.
Measurement Systems:
2.
Electronic Instrumentation:
HSKalsi
3.
4.
M
Measurement & In
stttrumentation Principles:
ri
Measurement
Instrumentation
5.
AlbertDHelfrick
&WilliamDCooper
Albert
D Helfrick &
WilliamDCooper
AlanSMorris
Alan S Morris
D.V.SMurthy
D.V.
S Murthy
EC 010 704
ELECTRONIC
ELE
LECTRONIIC IINSTRUMENTATION
LE
NST
TRUM
R
ENTATION
(Syllabus)
(Syl
ylllabu
l
s)
EC 0010
100 7704
0
04
(Syllabus)
3 hours lecture
lecc uree and
lect
an
n 1 hour
hooour tutorial per week
References
Refer
ence
es
e
References
6.
ELECTRONIC INSTRUMENTATION
INST
ST
TRUM
MEN
ENT
NTATI
A ON
O
11. A Course
Cour
o se in Electrical and Electronic Measurements
our
Measureme
rem nts and Instrumentation:
rem
Instru
rument
ru
m atio
io
on:
Electronic Instrumentation
Insttrumentat
ntation
ntat
iion
o and
an
nd Measurements
Measurements
David A Bell
DavidABell
7.
InstrumentationDevices
and
Instru
st mentatio
a nDevices
ices
e a
nd Systems:
8.
Electronic Measurements
M urem
Meas
rements
men
n and Instrumentation:
9.
Me
Measur
a emen
nts and Instrumentation:
Measurements
J B Gup
Gupt
p a,
JBGupta,
CSRangan,SGSharma&VSVMani,
C
S Rangan,SG Sharma&V S V Mani
M ,
Ma
R
K Rajputtt,
RKRajput,
U A Ba
Baks
B
a hi, A V Baks
ak
aks
kshi,
hi
UABakshi,AVBakshi,
10. A Course in Electrical
Ele
leeectriccal and
a
and Electronic
Ele
Electro
lec nic Measurements
Measureme
r
nts and
an
nd Instrumentation:
In
nstru
str mentation:
A
K Sawhney,
AKSawhney,
Recorder
Re
eco
corder Types
Typ
ypess
yp
ELECTRONIC
ELECTR
CT ONI
NIIC IINSTRUMENTATION
NST
TRUMENT
TATI
A ON
AT
N
EC 010 704
(Syllabus)
(S labus)
(Syl
(S
Module
Mod
ulle
le 4(12 hrs)
EndDevices
End
Devices
DigitalVoltmeterandAmmeter,
Digital
Voltmeter and Ammeter,
RecordingTechniques:
Recording
Techniques:
oGalvanometric.
o
Galvan
nomeetricc.
Co rol Sys
Cont
yystem:
ys
ControlSystem:
oP
Poteentiometric
oPotentiometric
Basic
Principles of Data Acquisition System.
BasicPrinciplesofDataAcquisitionSystem.
oMagnetic.
BasicPrinciplesofSignalAnalyzers:
Page 1 of
Gathered
of Mahatma Gandhi
Recording Techniques
oXT Recorders:
oSingle input parameterVs.Time,
oEvent ismarkedbyposition ofstylus &
oTime bypaper rollingspeed.
oE.g.,Speed,Frequency.
oE.g.,
Speed,
d Frequency.
y
oXY Recorders:
oTwo input parametersCompared,
parameters Compared,
d
o1st Event provides
providesXaxisdata&
X axis data&
X
o2nd Event provides
providesYaxisdata.
Y axis dat
Y
atta.
VICharacteristics,StressStrainCurve.
oE.g., VI
Characteristics, StttressStrain Curve
vee.
Strip
St
triip Ch
Chart
hartt Re
R
Recorder
c rder
co
(Galvanometer Type) ; XT
X Recorder
Recor
orrder
deer
Writing
W
Wr
iting Te
T
Techniques
echniiqu
ques
u
oPen &
&Ink
Ink Stylus
St lus
Sty
oMultiplepenscanbeused
oMultiple pens can bee use
u d
oImpact
printing
o
Imp
pact pr
rrinti
ting
ti
ng
oPressuresensitivepaper
o
P ssure sensit
Pr
Pre
nsit
s tive
ive
v pa
pa
aperr
Writing
oThermall Wri
riitin
ting
g
oThermalpaper&heatedstylus
oThermal
l pap
p err & hea
pa
h ted stttylus
uss
u
oElectric
Writing
o
Eleectr
E
El
c ic Wri
W
ting
oElectrostaticpaper
oEle
Electr
Ele
lectr
ctrost
ostati
ost
t c paper
ti
Writing
oOptical Wri
Wr
r tin
ng
oPhotosensitivepaper
oPhoto
sensitive paper
Strip
Stri
rip
ri
p Chart Recorder
Reco
co
ord
r er
Galvanometer
(Optical Galvano
ome
m terr Ty
Ty ; XT
Type)
X Recorderr
Page 2 of
Strip
Stri
St
ri Chart
ri
rip
Ch
har
ar Record
art
Recorder
rder
rd
err
(Potentiometric
(Poten
(P
enti
en
ttiiom
ometric Type
Typ - Basic Circuit)
Circcui
u t) ; XT
XT Recorder
Recoord
r er
Gathered
of Mahatma Gandhi
XY
Y Recorder
Rec
R
ecorderr
ec
(Basic
(Bas
asic Setup)
as
Setupp)
S
Digital
Digi
Di
ita
t l Data R
Rec
Recording
ecor
ec
o ding
g
Tape)
(Magnetic Tape
p)
pe
oDigitalmagnetictapesareused
oDigita
ta
al magnetic tapes are used
d
o twotypes,
two
w types,
wo
oincrementaland
oinc
i remental and
osynchronous.
osyn
s chr
ch onous.
s
oIncremental
oIn
ncrement
n
me al :
oIncrement
oInccrem
r entt foreachdigitalcharactertoberecorded.
f eac
fo
for
a h digital character to be record
ac
ded.
oInput
oInp
put datamaybeatarelativelyslow
data may be at a relatively slow
da
dat
oEachcharacterisequallyandpreciselyspaced
oEach cha
charac
rac
racter
acter
te is equall
all y and
nd precisely spaced
Digital
Digi
Di
g tal Data Recording
Rec
R
ecor
ec
o ding
(Magnetic
(Mag
gneeti
t c Tape)
Tape
p)
Digital
Digi
Di
g tal Data
Da
ata Recor
Recording
ordi
or
d ng
(NRZ
(NRZ Method)
(N
Methood)
otape
o
t e ismagneticallysaturatedatalltimesineitherthe
tap
is magnet
gnet
etica
ically saturated at all tim
ic
im in either
imes
her
er the
oSynchronousdigitalrecorder,
oSynchronous
digital recorder,
o+ve or
orve dir
direction.
ect
cttion
ion..
otapemovesataconstantspeed
otape moves at a constant spe
s ed
tenthousand
oupto ten
thousand characters
haractersper
eer
r second.
econd.
ofdata
isrecorded
oBlock of
data is
recorded
oSeparatedfromeachotherbytherecordgap.
oSeparated
from each other by the record gap.
ostarts andstops thetape
oforeachblockofdatatoberecorded.
Page 3 of
Gathered
of Mahatma Gandhi
ohaszeropowerinthespectrumatzerofrequency,
obipolarformatprovidesthreestatesignal(+V,0, V)
Programmable
P
Pr
ograammable Logic
Logicc Controller
L
C
Programmable
Prog
Pr
o rammable Logic
i C
ic
Contr
Controller
trol
tr
olle
ol
l r
le
oProgrammablelogiccontroller
oProgra
mma
able
b logic
ic con
c trollerr (
(PLC)
PLC
C) is
isa
a
oprocessor
s oriient
en ed
e digital dev
vic
ice
c which contains
oprocessororienteddigitaldevicewhichcontains
othatmuchintelligence
torun
adiscretelogicsystem
o
tha
at muc
u h int
uc
intelligence to
in
run
na
discrete logic sys
ysstem
tem
m
operforminglogicaloperations.
o
perrfor
formin
mi g logical operation
ns.
s
oThediscretelogicsystemreferstoaindustrialapplication
oThe
discreete log
logic
ic sys
s tem refers to a industtria
rial
ial app
a licatiion
n
owhereoperationsoccurinsequence
forinputs
owhere
e operations occur in sequence for
r inp
i uts
uts
owhicharemainlyswitchingdevicesand
o
whiich are mainly switching dev
ev
vic
iice
c s and
ooutputsarerelaysandcoils.
oout
o puts are relays and
nd coi
cco
oiils.
Programmable
Programm
mmable Logic
mm
Log
L
o icc Controller
Control
olle
ol
lle
ler
e
Basic
B
Ba
asicc Wave
W ve Analyser
Wa
Ana
nalyse
a se
s r
Frequency
Selective
Resonator
Page 4 of
Gathered
Selectsthe
Average
Value
Indicates
theOutput
Value
of Mahatma Gandhi
oMeasuresfrequencyinMHzRange.
oIFstageisIncluded.
(VacuumTubeVoltMeter)
(VacuumTube
Volt Meter)
R Heterodyne
RF
Het
eterodynee Wave
et
W vee Analyser
Wa
A
Spectrum A
Analyser
na
naly
aly
yser
Spectrum
Spectr
Sp
um
m Analyser
Ana
A
aly
l ser
CRO
CR
O Vs.
Vs. Spectrum
Sp
Spectr
Sp
um
m Analyser
Ana
naly
lyser
y
Page 5 of
Gathered
of Mahatma Gandhi
RF Spectrum Analyser
BD of DSA
Harmonic
H
Ha
rm
mon
o ic Distortion
Disto
tortion
to
n Analyser
A alyser
An
Harmonic
H
Ha
rmonic Distortion
Distortio
iio
on Anal
Analyser
alys
al
ysser
e
Harmonic
Harm
on
nic Distortion
Disto
ort
rtion
n Analyser
Analysser
e
Harmonic
H
Ha
rm
rmon
m icc Distortion
Dis
D
i tortio
on An
Anal
Analyser
a yser
Page 6 of
Gathered
of Mahatma Gandhi
Data
D
Da
ta A
Acquisiti
Acquisition
tiion
on S
System
ysstte
em (DAS)
Data
D
Da
t Acquisition S
ta
System
yste
ys
t m (DAS)
(DAS
(D
AS))
AS
oAtypicaldataacquisition
oA
typ
y ical data acquisition
yp
oAsystem
oA
sysstem usedfor
used
d for
oindividualsensors
oind
i ividual sensors
ind
9data processsing,
9dataprocessing,
osignalconditioning
o
signal
l conditioning
ng
ng
9dataconversion,
9data conversion
n,
odataconversion
odata con
on
onver
nver
versio
si n
sio
9data transm
mission
n and
a nd
9datatransmission
odatahandling
odat
d a handling
omultiplexing
o
mulltip
ti lexing
odataprocessing
odata pro
r cesssin
sing
oassociatedtransmission
oass
ssoci
ss
oci
ciiate
ated transm
miss
i ion
n
ostorage
9datastorage.
9d
data stora
age.
odisplay
Data Acq
Acquisition
cquisition
cq
on S
System
ysstem (D
(DAS)
DAS
AS)
S)
Elements
Elem
El
em
ments
tss o
off Analog
Analogue
o ue
eD
DAS
((i)Transducers
(i)
Transd
sd
sduce
duce
uc rs
uc
(ii)Signalconditioners
(ii)
Signal condit
ition
it
i ers
e
(iii)Calibratingequipment
(iii)
(ii
i Calibrating
g equipm
ment
(iv)Integratingequipment
(iv)
) Int
I egrating equipment
(v)Visualdevices
(v)
Vis
issual
al dev
device
i s
(vi)Graphicrecordinginstruments
(vi)
Graphic recording instruments
(vii)Magnetictapeinstrumentation
(viii)Analoguecomputers
(ix)HighspeedcamerasandTVequipment.
Page 7 of
Gathered
of Mahatma Gandhi
Objectives of DAS
(i)Transducer.
(ii)Signalconditioner.
(iii)Scannerormultiplexer.
((iv)Signalconverter.
) g
(v)
Analoguetodigital converter (ADC).
(v)Analoguetodigitalconverter(ADC).
(vi) Auxiliary equipment and system prog
grammerr.
(vi)Auxiliaryequipmentandsystemprogrammer.
(vii)
Digital recorder.
(vii)Digitalrecorder.
(viii)
Digital printer.
(viii)Digitalprinter.
Configurations
C
Co
nfigurat
attio
ons off DA
D
DAS
S
(General)
(G
Configurations o
off DAS
S
(SC, MC & NR Considerations)
Consiide
deration
e
ns))
SingleSi
iinggle-
DAS
DA
(Using PlugPlug-in
Boards)
g in Board
rds))
Analogue
An
nal
a ogue
u DAS
Page 8 of
Gathered
DAS
(Single Channel)
of Mahatma Gandhi
DAS
(Multi Channel/Analogue MUXed/Single ADC)
DAS
D
DA
S
(Simultaneous
Sampled
S/m
(Simul
ultane
ul
neou
ne
o s Sa
ou
S
mpled S/
/m Multiplier)
DAS
S
Digital
MUX)
(Multi-channel/ using Di
Digi
g tal MU
M
X)
Usedin
Used
in
oWindtunnel
oWindtun
t nel
ell measurements
m surements
me
mea
oSeismographicexperimentation.
oSei
S sm
mogra
m
aph
phic
ic experimentation
on.
on
n.
Data Acq
Acquisition
cquisition
cq
on S
System
ysstem (D
(DAS)
DAS
AS)
S)
Page 9 of
Gathered