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Research Statement
Deep sub-micron CMOS technologies enable highly integrated circuit systems for consumers and
communications. These systems contain embedded high performance analog/mixed-signal (AMS)
circuit blocks and sensitive radio frequency (RF) frontends. Furthermore, the sophisticated CMOS
devices and emerging materials used in VLSI introduce new and unknown reliability issues in
VLSI circuit design, such as spatial stochastic unreliability effects, temporal deterministic
unreliability effects and dynamic unreliability effects. In the past, to cope with the reliability
issues, circuit designers pay attention to only verifying reliability issues in the technology level
and designing circuits conservatively. However, these measures expose more and more
limitations. Therefore, design for reliability will become one of the essential elements for the
future nanometer CMOS circuit design.
My research is about developing reliable AMS circuit in nanometer CMOS technologies. The
goal of my research is as follows:
To improve the quality of AMS IC design (e.g. robustness, yield and circuit lifetime)
To shorten the time to market and avoid expensive re-design process
Currently, I am working on the following topics:
Modeling and simulation techniques to verify circuit reliability efficiently
Design techniques to assure the reliability of circuits
Current Research
To effectively handle large scale and sophisticated simulations, reduced (macro)models are used
for simulations. My doctoral dissertation focused on the development of linear macrmodeling and
signal integrity verification in the perspective of digital signal processing. Currently, I am
extending my research on non-linear macromodeling, simulation and self-healing circuit design.
A. Non-Linear Marcomodeling and Simulation Techniques for AMS Circuits
New needs are raised to sophisticatedly simulate non-linear characteristics in nanometer CMOS
RF components and AMS components in a device/circuit level for a reliable design. However,
related studies are just begun in the VLSI design community. My collaborator, Dr. Ngai Wong,
and I are developing a ten times speed up non-linear modelling and simulation methodologies
for computation-intensive simulation processes, in order to practically verify the performance of
AMS circuits within a reasonable period of time. The modelling process mainly relies on the
generalized non-linear system identification, which can model circuit systems with massive ports
and arbitrary input/output responses. Meanwhile, the simulation process will be leveraged by the
extremely efficient GPU computation platform, such that large-scale simulations become practical.
We want to develop: i) automatically configured non-linear system identification process using
bilinear models and stochastic models, ii) highly parallelized time-domain transient computation
methodologies using multi-dimensional numerical inverse Laplace Transform, and iii) a
software/hardware architecture for CPU-GPU co-simulation. We are applying a research grant
and support from HKU, and will seek for other funding opportunities (e.g. NVIDA) in the future.
B. Self-Healing AMS Circuit Design
I am carrying studies about building reliable AMS circuits with stochastic reliability problems in
nanoscale CMOS technology, that cannot be designed using conservative design approaches. The
objective of this study is to improve the production yield and circuit lifetime of AMS circuits.
Recently, Dr. Abhilash Goyal (Graduate from Georgia Tech.) and I have started to design lowcomplexity self-healing (self-calibrating) AMS circuits. In particular, we are applying oscillation
principle to develop a self-healing phase locked loop (PLL) topology that can compensate
degradation, ageing and variation in a real-time manner without an external test signal source. We
will generalize this topology to other AMS circuit components in the future. Furthermore, we