Beruflich Dokumente
Kultur Dokumente
NEURTEK S.A.
Polg.Ind.Azitain, Parcela 3 A
Apdo.399
Emails: comercial@neurtek.es
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
FAX 943 82 01 57
www.neurtek.com
lu
er
a
er
h
M
c
er
C.
nb
on
trie
elg
an
/G
nb
tK
Er
rm
bli
S.
n
us
ati
ym
B
tte
s
e
e
G
l
i
u
y
w
a
z
/
d
t
y
i
i
u
I
o
t
p
A
G
p
n
i
In
P
a
an
ug
rf
ter
Re
/Ta
H/
e-W
IC
/Ja
&
-W
or
all
rp.
rac
erm
ny
sdo
lle
ik A
erm
mb
es
ef
ion
ech
o
r
a
r
a
t
a
G
t
n
G
z
G
e
C
b
/
h
i
a
/
u
i
yH
H
t
H
or
ch
ck
rfa
Be
ics
o/C
erm
eC
ty
nik
sti
mb
y
/G
rsi
ch
sto
y
Ma
orp
pie
ast
fac
-In
Brn
G
l
e
e
o
r
n
r
C
a
es.
G
k
t
v
f
P
an
R
a
P
k
a
u
c
i
K
i
l
d
n
.
f
S
n
n
n
m
n
o
u
m
n
o
nG
o
yo
r
a
a
y
r
s
c
ds
U
a
i
h
l
H
e
C
e
e
y
n
i
e
p
s
c
P
b
r
b
l
a
E
A
e
e
o
&
ol
lan
/G
te
xsit
/G
m
F
b
r
h
o
r
m
n
a
h
n
t
G
M
H
r
e
e
k
G
e
t
k
a
l
e
i
c
M
.K
y
Ge
eu
P
-Lu
ak
Se
niv
mb
eth
eK
lag
ue
a
Co
an
ds
m/
ayr
U
/N
A
raP
ap
An
kG
rtin
H
ali
t
t
n
u
i
B
S
e
m
r
l
y
a
r
r
t
e
l
a
y
n
t
n
t
y
l
U
n
T
e
s
n
A
t
o
M
a
er
an
x/
en
rg/G
y
ech
rsi
Au
uri
we
TP
y
bu
eth
erm
ero
an
gsz
bH
le/
A
ive
tet
A
erm
yT
an
X
t
G
N
n
m
n
i
s
m
y
G
/
m
/
r
u
m
a
r
.
/
d
n
U
e
r
rs
G
e
bH
SA
ard
Inc
bH
yH
y
sch
bg
Ge
lan
er
/G
ive
ma
i
t
U
r
h
r
/
m
s
r
n
i
b
r
/
n
e
l
m
H
o
e
s
e
n
a
r
G
e
i
F
U
s
er
Hu
ica
sin
/G
ch
nG
mb
Eb
rm
eth
erl
y
BB
niv
y
SS
ha
em
Ge
con
tem
A
yB
eG
an
./N
IZM la A
U
T
/
p
i
h
s
s
t
S
r
i
V
i
S
l
an
.
t
a
y
C
m
s
f
e
U
a
m
B
S
r
p
r
W
v
/
a
m
e
c
e
.
s
e
y
i
&
e
r
e
g
o
h
of
re
Ch
/G
an
hn
ezu
Ge
orp
niv
nn
tin
lsc
cts
rop
ty
.
st T
AG
en
ik/
lU
Tec
cC
rin
Ha
sel
Eu
du
h
erm versi
V
Co
F
a
P
i
e
fi
o
c
y
m
/
i
G
c
S
r
.
t
h
e
i
t
d
a
G
/
i
&
i
P
A
r
c
A
o
c
n
s
n
.
n
r
G
n
e
B
r
a
H
C
e
O
ou
ch
bH
Air
cie
lA
U
y
eK
ive
erl
y
y
an
ine
y
Te
m
an
ch
Gm
al S
itz
tah
Un
an
n
an
m
s
t
y
u
nL
S
i
s
i
i
a
a
m
w
r
n
e
m
m
r
n
s
S
a
lg
Y
pp
er
er
V
Dig
ch
Ge
cto
A/
nd
erm
Be
re
./G
erm lands
Kru
du
/G
g/G
rla
te/
r Te
ls/
MP
u
G
n
e
n
t
u
E
a
n
G
/
Co
t
f
o
r
h
c
u
e
c
&
ie
y
rA
et
sti
ule
Fu
ch
mi
the
yss
tut
mi
an
em
bH
./N
aye
he
r In
SA
ors
sch
Th
Se
sti
t
Ne
h
m
V
f
B
C
.
e
z
/
U
r
n
t
.
o
t
C
I
n
/
N
e
y
x
titu
ds
ei
pt
s
G
ika
CH
ol
B.V
er
hu
n
o
s
t
l
/
c
f
n
i
k
r
c
R
O
i
s
a
n
e
r
a
s
S
H
e
I
a
i
n
A
n
n
b
r
W
erl
X
AM
he
sdo
em
erm ectro
A
fer
he
t f
y
Gm
SR
nd
/G
Ho
rm
Ch
l
ho
n
US
u
op
g
a
O
t
e
r
/
E
a
G
l
n
t
.
i
t
n
l
r
t
H
A
au
nc
Ink
ips
ga
ve
hu
ny
tas
tze
y
erm
Ins
dt
ls I
Fr
hil
oti
Ka
+R
rsc
wi
/G
an
otu
ermi
ma
P
y
S
f
o
r
O
P
d
m
h
H
f
e
/
n
m
o
/
e
c
b
n
a
y
o
h
s
to
G
y
un
er
AG
Th
an
ise
rm
un
Au
H/
an
ort
/G
Gm
h
old
E
a
tze
a
P
l
m
c
b
r
r
H
G
r
u
r
m
G
e
a
f
e
.
F
e
m
h
er
ina
zu
ch
ch
mb
rg/
Th
yo
t f
y
/G
/G
ie G
ne
sit
lG
bu
ors
tt
y
an
itu
en
/Ch
e
r
m
a
t
R
l
s
B
m
n
y
V
e
m
s
m
t
s
h
e
a
r
n
t
lix
yU
rsi
niv
Ha
EP/
y
Ch
rm
le E
Ge
en
k-In
lca
ive
Fe
U
an
ck
nc
Ge
H/
A
hu
ule
TEV
uis
n
a
y
/
ity
a
n
c
b
m
h
l
o
y
i
e
N
s
n
r
U
c
L
I
m
a
e
s
-P
.W
rk
a
ers
an
k
ita
ch
x
i
A
h
G
G
K
e
v
r
u
m
r
i
o
/
.
c
a
S
r
m
B
h
e
w
b
n
h
n
V
e
t
h
er
ho
r. O
M
ng
rfa
tei
/G
mt
PD
sU
ea
sru
)/G
D
Tsi
ny
ach
ns
IST
Gr
en
y
pie
G
F
a
e
esa
d
arl
e
t
n
a
/
S
y
.
h
n
y
G
K
u
a
H
o
a
a
rm
tu
P
al
y
td
an
Q
rm
ali
erl
sti
ft (
/It
Ge
um
tH
r
e
en
m
KL
z
a
r
/
y
a
n
t
r
u
v
l
t
I
t
G
s
n
i
g
t
U
h
e
r
hi
Ita
en
H/
sti
Leu
lsc
nt
/G
fer
Sw
/Au
bu
gsz
m
e/C
ric
ria
sin
ho
G/
ble
sel
mb
ne
rei
t
c
a
u
e
g
r
n
A
F
l
i
G
c
m
n
n
u
u
G
e
e
lg
ie
ty
C
Ga
hu
-El
sch
Fra
lbo
Be
Sci
rsi
ard
em
rsc
Bo
tria
/
C/
r&
n
of
uto
Me
ive
ch
o
ick
t
E
e
a
y
A
f
F
r
n
us
n
t
h
p
bH
o
m
te
oc
be
-U
Sc
y
Ja
yo
e
m
IM
e
r
l
s
t
/
o
n
i
t
d
P
G
y
a
s
n
g
i
l
a
l
a
h
R
an
ers
y
wi
V
nd
Ac
ica
rm
zia
in
Ha
an
ud
niv
SA
se
pe
hla
Ge
pa
erm
em
y
m
/
c
U
y
e
S
U
S
r
h
G
s
n
/
n
/
A
.
a
t
/
e
in
C
a
y
cia
SA
eu
en
/G
t IP
ma
hi
Ch
Inc
/
Cib
tal
rm
r
n
g
I
U
a
u
D
e
a
m
e
/
e
t
/
s
n
i
l
.
l
i
y
i
bH
c
re
a
U
n
m
/G
/G
st
ut
A
pA
a
n
V
m
l
a
u
b
I
y
n
S
G
i
y
C
I
o
t
y
T
G
l
y
l
S
lg
it
y
a
si
.K
rm
y
ica
y
log
Be
fer
sit
/It
Co
lich
Ge
an
mp
ers
ver
r
/
d
o
n
o
i
o
/
v
o
e
i
e
a
J
n
O
m
&
h
n
n
v
D
IT
U
M
bH
er
H
m
ila
Un
un
rm
y
ech
V
for
l/G
ius
y
Gm
tru
Ge
mb
iM
Fra
tal
nT
s
e
/
n
n
I
n
m
i
s
g
G
G
s
o
i
e
/
a
e
u
K
F
n
r
d
nic
y
D
de
es
Lu
ic
m
sz
ax
lia
io
o
n
t
lgi
r
r
t
n
i
g
r
t
a
n
o
F
a
e
M
f
k
t
t
s
i
l
a
n
I
l
r
a
er
/G
y
y
du
lec
So
arl
hu
og
ca
ch
tze
an
y
niv
an
bH
Sa
Pro
sti
G
rsc
toe
sia
ins
wi
U
s
m
e
m
r
y
o
m
p
an
y
e
l
S
r
e
r
l
F
e
a
s
/
e
G
e
l
O
e
d
t
s
a
m
m
g
All rights reserved. No part of this work may be reproduced, distributed,
i
C
t
r
G
h
n
a
G
e
y
n
/
e
/
ty
e
ck
e/I
elt
an
rec
/G
tal
rsi
ns
an
gsg
y
en
AG
mu
i
r
b
D
m
t
e
n
l
l
p
m
i
n
i
B
h
e
or otherwise processed in the form of translations, reprints, photocopo
t
v
r
e
a
s
A
i
u
e
c
p
k
y
e
r
h
ud
ell
n/J
Un
ny
up
tria
/G
an
nc
sch
ern
ive
ian
nta
A
o
s
a
r
r
t
n
t
i
n
o
W
m
r
ies, microfilms, or any other method, mechanical or electronic, without
u
s
y
o
t
o
n
r
i
f
K
o
F
M
A
r
rm
u
H
e
ra
U
an
H/
ns
FG
Ch
he
/G
ity
Ge
erb
hlk
po
-G
m
b
c
o
/
s
r
e
D
d
i
G
the prior written permission of the company DataPhysics. These restricr
u
y
s
erm
t
o
i
o
G
a
y
m
i
e
it
ft
.K
A
ut
an
elg
nC
un
W
niv
le P
zG
ha
Co
ers
er
B
o
De
A
l
c
m
u
y
n
i
v
U
M
/
i
tions do not apply to the exceptional cases specified under 53, 54, 55
r
i
s
s
S
.
L
&
n
h
l
e
n
c
.V
U
a
a
ry
lL
ny
ein
bH
hs
ny
c./
an
t/G
ah
eU
Ch
rm
sch
sN
nic
c
m
i
r
t
a
r
n
e
h
m
of the German copyright act UrhG.
ma
r
n
h
I
o
w
e
S
a
e
i
c
c
l
e
e
G
h
G
k
s
erm
ttg
ep
im
gsg
H/
eiz
/Ta
ine
ke
Te
mt
rgi
ste
u
a
G
h
r
n
b
n
p
a
s
t
e
w
/
y
l
c
The use of names, trade names, merchandise descriptions and such in
e
u
D
o
s
e
S
B
h
g
i
S
n
A
r
e
h
w
a
y
Gm
un
strat
P
A
Sc
ma
rsc
ali
nd
sit
yG
tro
ny
e
h
o
r
S
r
y
r
t
o
a
k
c
a
n
t
o
i
this document does not justify the assumption that such names may
e
p
l
n
e
F
U
s
e
r
s
a
V
r
a
G
rs
./
iv
er
e
El
nd
erm cs Co
a
Jap
nc
/Au
rfo
rm
er/
ch
ive
itz
u
rk
I
Un
e
G
y
s
v
e
e
n
r
simply be used by anyone; often we are concerned with legally proe
/
t
w
s
i
c./
o
g
t
o
t
U
m
f
y
u
ik
n
/G
ie
/S
olo
Lu
orw
las
an
y/K
De
lyt
oly
pe
an
og
for
ch
n
t
V
r
P
l
i
P
a
p
i
tected registered trademarks even if they are not marked as such.
r
H
m
i
h
o
s
G
r
n
a
r
f
c
r
y
n
y
F
in
e
os
le L
m
+A
sit
ch
yZ
ive
an
t f
/G
f Te
tD
u
r
m
u
e
rita
f
n
u
g
n
o
r
r
e
h
T
m
t
B
a
a
t
e
n
i
t
t
sc
er
te
sti
niv
en
Fo
al U
nu
nd
en
sch
esd
/G
rea
och
rU
sZ
titu
Text: Nils Langer, Gerhard Maier
an
gil
y
k-In
ic I
ion
Dr
s
h
ren
e
ein
o
r
t
c
aft
A
f
t
f
w
t
n
h
t/G
h
a
f
i
n
h
an
I
m
c
o
c
f
c
a
c
G
a
e
N
e
s
y
a
e
l
o
y
T
s
l
m
F
t
t
l
F
g
t
n
r
P
/
n
o
l
E
i
.
Artwork and layout: Gerhard Maier, Horst Rau
s
u
D
S
r
a
e
l
e
s
p
c
x
e
g
u
r
es
ok
aft
fr
, In
ina
era
D
un
e/G
bo
ive
Ma
erm
c
l
h
t
h
n
M
h
h
s
n
f
c
e
fi
G
aG
e
c
C
i
d
u
s
/
y
t
r
ha
in
lM
G
o./
dt
ny
an
ors
al U
an
en
rls
lsc
erl
ny
me
eC
eF
sta
Printed in Germany, August 2007
Ka
ma
oya
rm
nic
Sci
e
a
h
r
n
h
sel
R
e
h
i
t
y
A
m
e
g
e
c
e
t
c
r
rm
/G
a
ch
y
G
si
gs
US
Ne
/G
Te
e
r
r
e
a
uts
tag
/
/
D
n
f
e
.
Copyright 2007 by DataPhysics Instruments GmbH, Filderstadt
a
e
i
G
e
f
n
p
c
u
M
/
g
a
g
o
iv
a
ty
D
un
ad
rou
dv
AG
t In
jin
rsi
sch
kst
Un
olo
n
r
n
r
e
t
n
g
H
G
s
r
a
o
v
a
/
e
A
a
n
e
n
y
p
x
ni
gi
ies
eF
Qi
do
t f
est
y/C
an
eW
/Ja
ne
olo
log
ao
ap
sit
DataPhysics is a registered trade mark of
al U
itu
sch
aro
ch
rm
rp.
Co
r
n
t
o
t
c
d
s
D
P
G
e
i
o
i
s
e
h
n
u
u
n
in
a
/G
hn
ec
an
nd
ny
pA
ch
s
oC
niv
fB
ing
De
k
p
c
T
g
i
e
a
a
u
g
DataPhysics Instruments GmbH
o
l
a
r
e
U
Q
T
n
J
n
T
l
g
o
u
y
A
on
g
erm schu
al
y
rp/
an
sit
Gil
ech
US
ne
esc
lin
r
tun
g
a
c
G
n
T
r
l
/
y
fi
b
e
Microsoft
and Windows are registered trade marks of
/
A
a
u
h
r
r
a
n
n
a
t
f
S
iv
In
o
M
rh
bH
in
En
Fo
ut
y
ef
ma
erm s/Por
ns
Un
d
a
l
t
m
r
s
ne
i
n
y
t
h
G
n
the
Microsoft
Corporation
u
i
e
d
t
p
G
h
a
/
n
o
s
n
J
la
G
ili
ai
Br
ch
Za
KG
inz
&
ma
sin
G/
Ph
eri
erm
zer
or
hs
at
r
a
e
g
t
t
A
L
n
c
e
e
t
i
G
fr
c
a
r
n
o
o
s
M
s
G
A
m
H/
/G
ess
rte
ns
hu
en
-H
/Sw
G/
tv
US
nik
Bio
mb
plc
rsc
sdi
Sto
ma
Joh
E
TD
c./
en
sA
ch
l
l
e
L
o
G
e
g
nz
g
e
n
n
a
r
F
d
I
t
n
ie
u
H
oli
ke
lin
ny
an
So
o.
on
ro
CH
i
io
y
r
i
s
h
a
r
r
m
k
C
R
a
t
n
g
s
c
i
e
b
s
y
s
a
E
A
M
us
rna
Ch
erm
rat
SEA
an
k&
-Fa
y
For
erm
FH
eg
fr
RE
bo
ne
pp
rm
nte
)/G
erc
an
i
rg
G
t
I
I
a
D
n
t
e
a
/
C
e
L
I
u
M
a
m
a
K
h
G
M
b
t
l
er
erg
OL
iw
ec
(H
y
al
n
H/
sti
ina
Ge
R
an
pa
/Ta
orT
rnb
n/G
Ch
In
bH
mb
tug
he
o
y
a
r
oa
/
A
J
c
t
m
c
o
y
e
SA
G
y
i
i
/
r
m
s
en
e
y
/P
rs
G
ut
an
ex
/U
sit
nt
m
ut
G
n-N
n
e
G
a
r
e
a
l
e
n
u
/
e
v
a
m
l
i
e
M
i
r
r
/
P
t
D
ng
ng
ers
an
erl
slid
niv
Un
Ge
en
erm
zu
ara
rla
ais
tB
htu
dia
lU
Jap
Bio
nz
H/
ua
/G
K
ua
laj
u
/
c
t/
a
n
e
b
i
t
yE
h
I
s
a
H
y
i
r
N
l
h
t
m
a
it
c
t/
g
rm
u
st
fur
SA
h
in
ad
s
c
a
G
e
n
o
i
e
n
n
o
r
u
U
i
r
I
i
fl
h
s
c
e
/
s
N
d
y
r
i
g
em
er
eG
we
Jor
ol
R
Ba
be
ies
niv
al T
lan
un
itn
y
Lpit
m
dd
och
U
ch
rO
ity
Sch
on
log
ch
r
R
i
a
a
u
s
s
e
s
o
i
t
an
g
t
A
r
R
C
r
g
d
d
i
a
n
r
S
e
A
u
o
lg
m
s
n
v
h
i
u
e
F
N
r
e
r
U
i
.
A
b
SA
eij
/B
mu
Ge
Tec
ive
e.V
aly
m/
Un
ia
US
is D
rz
M
e/U
rt /
ma
ort
nt
Un
jet
y
./It
o./
gn
leu
W
v
Ind
a
e
k
a
r
n
D
C
o
A
o
/
a
.
e
g
v
.
r
n
n
o
a
C
i
f
N
tt
ul
I
S.P
no
for
Ltd
rm
Pet
.V.
thw
Ch
A
CO
Stu
sch
lia
In
tria
Ge
vt .
AG
Lig
ty/
a
h
y
ips
AL
/
rt e
s
US
i
l
t
l
t
c
/
i
i
s
e
m
u
.
h
rP
o
r
s
le/
y
k
h
u
e
de
Ch
A b o u tH i sD
ataPhysics
tor y of the company
Ta b l e o f c o n t e n t s
Page
OCA 35
Automatic, video-based contact angle measuring instrument
10
OCA 40 Micro
12
Automatic , video-based contact angle measuring instrument for microstructures
14
16
18
PCA 100M
Video-based portable contact angle measuring instrument
20
PCA 100R
Robot-assisted contact angle measuring instrument for process control
22
Tensiometers
DCAT 11EC / DCAT 11 / DCAT 21
Dynamic contact angle measuring instruments and tensiometers
24
SVT 20N
Spinning drop video tensiometer
26
28
30
Data sheets
Specifications of OCA
Specifications of PCA/ DCAT/ SVT
32
submicroscopic level.
State-of-the-art optics, highprecise mechanical systems,
fast electronic controllers, and
high-resolution video cameras
guarantee to the user of these
DataPhysics instruments the correct view for any analytical task.
After all, our development engineers profit from more than two
decades of practical experience in
these measurement techniques.
We would like to invite you to use
NEURTEK S.A.
Electrical field in
an electro wetting
platform EWP 100
Apdo.399
Emails: comercial@neurtek.es
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
FAX 943 82 01 57
www.neurtek.com
O C A 1 5 E C / O C A 1 5 p l u s
O C A 2 0 / O C A 3 0
Video -based optical contac t angle
measuring instruments
NEURTEK S.A.
Polg.Ind.Azitain, Parcela 3 A
Apdo.399
Emails: comercial@neurtek.es
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
FAX 943 82 01 57
www.neurtek.com
O C AA u3t o5m a t i c c o n t a c t a n g l e m e a s u r i n g
and contour analysis instrument
OCA 35/6 on tilting base unit TBU 90E 35 with electronic turn table with vacuum fixation
ETT/VAC and electronic multiple dosing system E-MD/6
10
NEURTEK S.A.
Polg.Ind.Azitain, Parcela 3 A
Emails: comercial@neurtek.es
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
FAX 943 82 01 57
www.neurtek.com
11
O C AF u l4l y 0a u t M
icro
omatic contac t angle and contour
Software controlled
picoliter dosing system
OCA 40 Micro with high-speed camera system UpHSC 2000, top view video system TV-VS
and electronic picoliter dosing system
12
NEURTEK S.A.
Polg.Ind.Azitain, Parcela 3 A
SCA 21 surface free energy and work of adhesion analysis of printer ink
Apdo.399
Emails: comercial@neurtek.es
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
FAX 943 82 01 57
www.neurtek.com
13
14
NEURTEK S.A.
Polg.Ind.Azitain, Parcela 3 A
Apdo.399
Emails: comercial@neurtek.es
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
FAX 943 82 01 57
www.neurtek.com
15
Te m p e r a t u r e a n d
e n v iTor goe nne rm
ental control
ate and control athmosphere
according to your needs
Needle heating device NHD 400 in combination with heating chamber TEC 400
Liquid temperature
control unit TFC 100
16
The TEC 400 and TEC 700 are temperature control chambers with
twin electric resistance heater for
the software controlled temperature setting up to 400 C respectively 700 C, also under protective atmosphere (inert gas inlet).
Polg.Ind.Azitain, Parcela 3 A
Molten glass
drop on a solid
substrate
NEURTEK S.A.
Apdo.399
Emails: comercial@neurtek.es
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
FAX 943 82 01 57
www.neurtek.com
17
18
angular or arbitrary),
constant volume mode with
axis-symmetric drop shape oscillations,
relaxational mode following the
instant increase/decrease of the
drop volume.
pressure measuring mode with
automatic drop volume tracking
and an increased accuracy and
resolution of the dilatational
modulus,
analysis of the real and imaginary part of the interfacial dilatational modulus based on the
oscillating or relaxing contour of
pendant drops.
analysis of the relaxational
modulus.
Oscillating drops
For the measurement of surface
elasticities and for relaxational
studies at phase boundaries,
DataPhysics has developed the
oscillating drop generator ODG 20
and the innovative oscillating
drop generator ODG 20P with a
high resolution pressure sensor.
This extension to the optical contact angle measuring and drop
contour analysis systems of the
OCA series based on a piezoelectric transducer excites oscillating
drops with a wide range of frequencies and amplitudes. Periodic
variations in the drop volume, or
alternatively in the drop shape
with constant volume, can be performed. The excitation frequency
ranges up to 50 Hz, depending on
the density and viscosity of the
fluid. The amplitude of the axissymmetric oscillations varies from
Polg.Ind.Azitain, Parcela 3 A
Apdo.399
Emails: comercial@neurtek.es
NEURTEK S.A.
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
FAX 943 82 01 57
www.neurtek.com
19
PCA 100M
20
NEURTEK S.A.
Polg.Ind.Azitain, Parcela 3 A
Emails: comercial@neurtek.es
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
FAX 943 82 01 57
www.neurtek.com
21
PCA 100R
Ro b o t- as sis t e d c o n t a c t an g l e m e asur in g
instrument for process control
22
components:
RCC-Z (z-axis system),
RCC-XY (x/y-axis system) with
fully or semi-automatic measuring modes,
MT FPD easy-travel, manual
sample tables for positioning the
measuring head manually and
with a one-button controller for
initiating automatic procedures
of contact angle measurements.
NEURTEK S.A.
PCA 100R/2 with RCC-XY 1600 and RCC-Z 230 for 60 TFT LCD substrates
Polg.Ind.Azitain, Parcela 3 A
Apdo.399
Emails: comercial@neurtek.es
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
FAX 943 82 01 57
www.neurtek.com
23
Te n s i o m e t e r s
Selection of measuring bodies and accessories for the DCAT 11EC, DCAT 11, and DCAT 21
24
NEURTEK S.A.
Polg.Ind.Azitain, Parcela 3 A
Fl e x i b i l i t y i s o n e o f
Da t a Phy si c s p r i o r i t y
o b j e c ti ve s f o r
t e n si o m e t e r s
Apdo.399
Emails: comercial@neurtek.es
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
FAX 943 82 01 57
www.neurtek.com
25
D C AT
1 1 E C / D C AT 1 1 / D C AT 2 1
Dynamic contac t angle measuring
devices and tensiometers
SCAT 32 measuring
the contact angle
SCAT 31
measurement of the static, timeand temperature-dependent
surface and interfacial tensions
according to the Du-Noy ring
method, the Wilhelmy plate and
the wire hoop method,
lamella breakpoint test to determine the surface elasticity,
automatic ring corrections according to Zuidema & Waters, Mason
&Huh and Harkins & Jordan,
gas-, liquids- and solids data base.
SCAT 32
force-based measurement of the
dynamic contact angle of prismatic and cylindrical solids (e.g.
plates, films, rods and single fibers)
as well as the wetted length accor
ding to the Wilhelmy method,
adsorption measurement on
powders and fiber bundles with
the determination of the average contact angle according to
the modified and the extended
Washburn method,
analysis of the surface free
energy of solids as well as their
26
SCAT 33
fully automatic determination
of the critical micelle formation
concentration (CMC) of surfactants in forward, reversed and
extended mode,
calculation of the minimum
surface tension in case of synergistic effects of surfactant
mixtures,
calculation of the head space
required by molecules on the
surface,
calculation of the free adsorption energy after Gibbs,
calculation of the surface excess,
automatic control of the dosing
devices LDU x/x for additive and
subtractive dosing .
SCAT 34
determination of the density of
liquids.
SCAT 35
determination of the sedimentaLDU 2/2 liquid dosing unit
tion rate,
measuring of the yield forces on
soft gels, pastes etc.,
measuring of the penetration
resistance and penetration rate.
NEURTEK S.A.
Polg.Ind.Azitain, Parcela 3 A
Apdo.399
Emails: comercial@neurtek.es
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
FAX 943 82 01 57
www.neurtek.com
27
SVT 20N
28
NEURTEK S.A.
Polg.Ind.Azitain, Parcela 3 A
Fast exchange
capillary FEC
SVTS 21 Oscillation
calculation of surface and interfacial tensions based on spinning drop contours, predefined
speed increments and sinusoidal
Emails: comercial@neurtek.es
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
www.neurtek.com
29
30
Workshop
I n t h e ar e a s o f s e r v i c e
an d su p p o r t we go
b eyo n d t h e l i mi t s
Hotline and services
If you need fast help with issues
concerning the configuration
of instrumentation, software,
or computers, please turn to
the service departments of our
representatives or directly to the
DataPhysics service department
service@dataphysics.de
or to the hotline
+49 (0)711 770556-55.
Our specialists will be pleased to
assist you with any questions you
have.
We p r ov i d e yo u w i t h
ma x i mu m su p p o r t
p r i o r an d a f t e r s al e s an d
i n s t al l a ti o n
NEURTEK S.A.
Polg.Ind.Azitain, Parcela 3 A
Apdo.399
Emails: comercial@neurtek.es
20600 EIBAR
sat@neurtek.es
SPAIN
902 42 00 82
System service
FAX 943 82 01 57
www.neurtek.com
31
Technical data
OCA 15EC and OCA 15 plus
with L- and LHT-variants
OCA 40 Micro
motorized X-, Y- and Z-axis as well as auto focus and motorized adjustment
of the observation angle,
100 x 100 x 42 mm
220 x 300 x 42 mm 1)
100 x 100 x 42 mm
300 x 300 x 42 mm 1)
Electronic positioning
accuracy:
3.0 kg
100 x 100 x 42 mm
220 x 155 x 42 mm 1)
220 x 155 x 42 mm 2)
Optics:
6-fold zoom lens (0.74.5 magnification) with integrated fine focus ( 6 mm)
Halogen lighting with software controlled continuous adjustable intensity
without hysteresis
Video system:
Measuring
techniques:
Software SCA 20:
Video based measurement of static and dynamic contact angles according to the sessile and captive drop as well as tilting table / base methods, measurement of drop and
lamella contours.
Operation of one ES/2 electronic
syringe unit and of one temperature
control system MTF 1200 or HTFC 1800
195 x x 70 mm
100 x 100 mm
100 x 100 x 50 mm
Electronic positioning
accuracy:
3 kg
Optics:
Automatic 7-fold zoom lens with integrated fine focus ( 4 mm) and
- Mikro lens 20-fold with 7.555 magnification; FoV with 1/2 standard
camera 0.85 x 0.640.116 x 0.087 mm or optional
- Mikro lens 50-fold with 18.75137.5 magnification; FoV with 1/2 standard
camera 0.34 x 0.2560.046 x 0.035 mm
Video system:
Optics:
Video system:
Analog 2/3 CCIR CCD camera with PCI frame grabber with 50 images per
second, field of view 1.75 x 1.411.7 x 9 mm
image distortion < 0.05 %
Optional: High speed camera system with up to 1024 x 1024 pixel UpOCAH (up
to 1000 images/second), UpHSC 1000 (up to 1600 images/second) or UpHSC
2000 (up to 2200 images/second)
Measuring
techniques:
Measuring techniques:
Calculation of surface free energies on solids and their contributions with error limits based
on measured contact angles, evaluation according to Fowkes (geometric mean), Wu (harmonic
mean), extended Fowkes (including H bonds), Zisman (critical surface tension), Owens-Wendt
(dispersive and polar), van Oss and Good (acid-base theory), Schultz I + II (two-liquid method),
Neumanns Equation of State (EOS), calculation of dispersive and polar contributions of liquids
based on measured surface and interfacial tensions as well as contact angles with error limits,
calculation of wetting envelopes, work of adhesion, and other diagrams
Calculation of surface and interfacial tensions based on pendant drop contours and
rising bubbles
Calculation of surface and interfacial tensions based on pendant drop contours and rising bubbles
Calculation of surface and interfacial tensions of liquids based on liquid lamellae on test
spheres and rods
Calculation of surface and interfacial tensions based on pendant drop contours and rising bubbles
Software SCA 23
Temperature measurement:
Static and dynamic contact angle on fibers for the automatic, software controlled measurement and analysis of the static contact angle according to the
generalized Length-Height-method for the Drop-on-Fiber setup
Dimensions
(L x W x H):
Weight:
20 kg
22 kg 1)
20 kg
26 kg 1)
Power supply:
Temperature measurement:
Dimensions (L x W x H):
Temperature measurement:
Dimensions
(L x W x H):
Weight:
16 kg
18 kg 1)
19 kg 2)
18 kg
20 kg 1)
21 kg 2)
Power supply:
32
1) L-variant
2) LHT-variant
33
1) L-variant
Weight:
30 kg
Power supply:
34
Te c h n i c a l d a t a O C A
Te c h n i c a l d a t a
PCA 100M
Dimensions of PCA-MS
sample table
on
100
and
request
receivers,
x 100 mm;
e.gspecial
for printing
sample
rollers,
tables
SVT 20N
0180
resolution: 0.0v1
110-62103 mN/m
Speed range:
0.502.50 g/cm3
Resolution: 0.002 g/cm3
Weighing range:
Tilting range :
Optics:
Optics:
Video system:
Analog 1/2 CCIR CCD camera with PCI frame grabber with 50 images per second, field
of view 6.4 x 4.8 mm or
USB 1/2 CCIR-CCD camera with 52 images per second, field of view 6,4 x 4,8 mm
Image distortion < 0.05 %
Video system:
Programmable travel
for sample table:
Travel resolution:
Measuring techniques:
Capillary diameters:
Balance lock:
Integrated
Integrated
Measurement of the static, time- and temperature-dependent surface and interfacial tensions of and/or between liquids using the Du-Noy ring method (to DIN 53915 and ASTM971), the Wilhelmy plate and the wire hoop method, tension and pressure on the interface
Lamella breakpoint test
Automatic ring corrections according to Zuidema & Waters, Mason &Huh and Harkins &
Jordan
Temperature range:
Temperature measurement :
Dimensions (L x W x H):
Weight:
25 kg
Power supply:
Measuring techniques:
Video based measurement of static and dynamic contact angles according to the sessile
and captive drop as well as tilting table / base methods, measurement of drop and lamella
contours.
Operation of up to four electronic syringe units with automatic refill function, automatic
measuring procedures, User level management system
Software SRC:
Available variants:
Calculation of surface free energies on solids and their contributions with error limits
based on measured contact angles, evaluation according to Fowkes (geometric mean), Wu
(harmonic mean), extended Fowkes (including H bonds), Zisman (critical surface tension),
Owens-Wendt (dispersive and polar), van Oss and Good (acid-base theory), Schultz I + II
(two-liquid method), Neumanns Equation of State (EOS), calculation of dispersive and
polar contributions of liquids based on measured surface and interfacial tensions as well
as contact angles with error limits, calculation of wetting envelopes, work of adhesion,
and other diagrams
PCA 100M/2: portable handheld instru- PCA 100R/2: for use with robot systems with
multiple dosing system for two test liquids
ment with multiple dosing system for
PCA 100R/4: for use with robot systems with
two test liquids
multiple dosing system for four test liquids
PCA 100M/4: portable handheld
.
instrument with multiple dosing system RCC-Z 230: z-axis robot with max. 230 mm
for four test liquids
travel
. RCC-XY 400, 800, 1200, 1600: x/y-axis robot
with max. 1600 mm travel
. MT FPD 400, 600: manual x-y sample tables
with max. 600 mm travel
other variants on request
Dimensions
(L x W x H):
Weight:
Power supply:
35
Force-based measurement of the dynamic contact angle of prismatic and cylindrical solids
as well as on single coated plates and the wetted length according to the Wilhelmy method
Adsorption measurement on powders and fiber bundles with the determination of the
average contact angle according to the modified and the extended Washburn method
Calculation of the surface free energy of solids and their components from measured
contact angles, evaluation according to the methods of Fowkes, Wu, Extended Fowkes,
Zismann, Owens-Wendt, van Oss & Good, Neumanns Equation of State
Calculation of Work of Adhesion
Fully automatic determination of the critical micelle formation concentration of surfactants (CMC) in forward, reversed, and extended mode
Interfacial CMC
Calculation of the minimum surface tension in case of synergistic effects of surfactant
mixtures
Calculation of the head space required by molecules on the surface
Calculation of the free adsorption energy after Gibbs
Calculation of the surface excess
Automatic ring corrections according to Zuidema & Waters, Mason & Huh and Harkins &
Jordan
Control of the dosing devices LDU x/x for additive and subtractive dosing
Determination of the density of liquids with the optional available density determination
set DIS 11
Temperature measurement:
Dimensions (L x W x H):
Weight:
Power supply:
36
37
Te c h n i c a l d a t a P C A / D C AT/ S V T
t
u
er
G
d
itt
y
an
za
/B
y
us
oly
pu
itte
aiw
/G
Ind
an
eri
-W
ICI
an
ica
Jap
ug
rf A
t
Re
rP
l
H
W
e
/
./T
l
&
c
m
o
A
o
m
b
l
h
r
p
n
y
f
e
a
r
t
d
s
a
r
l
k
c
r
e
o
n
s
l
i
e
a
m
e
e
i
e
o
r
a
r
H
a
C
/G
in
/G
Ha
rat
tut
sC
Ch
eie
/Cz
ik G
ity
fab
bH
erm
ach
sti
ity
ock
tic
B
ce
rpo
hn
ier
t
G
s
s
ers
m
n
rno
a
y
/
r
c
s
I
y
M
o
p
v
a
f
B
i
G
l
e
e
o
C
t
P
an
R
an
Pa
ur
ck
iv
KG
ik
lar
d
n
of
.
f
S
Un
n
n
n
m
n
o
u
m
n
o
o
y
r
a
a
y
r
s
c
U
a
i
h
l
H
en
C
e
it
e
y
an
Ep
As
eb
eroli
&
ole
/G
tec
x-P
sit
/G
mb
ers
F
b
h
o
r
m
n
a
h
n
v
t
G
M
H
r
e
k
G
e
t
i
k
a
l
e
i
c
M
y
Ge
eu
P
-Lu
ak
Se
o. K
niv
mb
Un
eK
lag
ue
a
N
an
ds
m/
ayr
U
A
raP
ap
+C
An
kG
rtin
H
ali
t
t
n
u
i
B
S
m
r
l
y
a
r
r
te/
e
l
a
y
n
t
n
H
t
y
l
U
n
T
A
/
b
n
a
it
en
us
er
ch
Ge
an
M
rio
x
e
s
P
/
y
m
e
r
A
h
z
m
o
u
w
T
y
t
m
/
t
r
r
n
e
s
T
G
A
r
A
e
a
bH
an
Xe
tle
ty
Ge
Ne
ng
mb
niv
s
y
Ge
rt
rsi
Gm
c./
H/
erm
hu
A
cas
Ha
U
an
nd
H/
erm
ge
e
c
b
r
n
S
G
a
I
b
v
y
y
s
b
w
G
l
e
/
i
m
i
t
U
r
/
s
r
er
an
re
Gm
Ne
ub
Fo
rsi
bH
Un
Gm
in/
Ge
cal
rlin
Eb
eth
ive
ns
Sch
y
BB
ms
an
erm
mi
el H
Gm
Be
M/
N
o
n
n
e
A
S
h
e
a
G
Z
/
c
t
A
y
e
a
.
I
U
T
/
p
i
h
s
s
t
S
r
i
V
i
S
l
.
t
a
ch
y
a
C
m
s
i
f
e
l
U
a
m
r
W
v
e
e
./
y
&
er
M
eB
gS
ha
esp
nic
Ge
of
zu
no
Ch
an
Ge
orp
niv
tin
cts
rop
ch
llsc
G/
t Tr
ty
ne
an
C
m
n
i
U
u
e
u
s
e
i
ea
r
A
e
ik/
s
l
T
c
r
H
s
E
d
h
d
e
r
V
F
a
P
i
e
fi
o
c
y
m
e
/
n
i
G
c
S
r
.
t
h
e
i
v
t
d
/
A
c
-G
Co
ni
era
rsi
en
ir P
an
hn
Ho
C.A
Oc
B
AG
ou
fer
bH
U
eK
ive
A
erl
Sci
y
y
hl
Tec
an
ny
ho
z
h
n
ine
l
y
n
n
a
t
m
a
c
L
Gm
n
a
i
t
U
a
n
a
m
s
t
y
u
n
u
S
i
s
i
i
a
a
m
w
r
n
e
a
m
m
r
n
Y
s
S
r
a
lg
V
Fr
pp
er
Dig
ch
Ge
cto
A/
nd
erm
Be
Ge
y
re
erm lands
Kru
du
/G
g/G
rla
te/
r Te
ls/
MP
o./
u
an
G
n
e
n
t
u
E
a
n
G
/
C
t
f
o
r
h
c
m
u
e
u
c
t
r
&
y
rA
sti
ule
F
mi
the
yss
tut
mi
sch
Ne
Ge
an
e
bH
aye
he
r In
SA
sch
Th
Se
sti
Ne
m
V./
for
B
C
.
e
z
/
U
m
r
n
t
.
o
t
Ch
I
n
/
N
e
a
s
t
G
y
x
d
ei
p
s
G
ik
CH
olB.V
er
hu
n
o
t
l
/
c
f
n
i
k
r
c
R
hr
O
i
s
a
e
r
a
s
S
H
e
a
i
e
n
A
n
n
b
r
B
W
erl
X
AM
he
sdo
em
erm ectro
A
fer
he
t f
y
Gm
SR
nd
eth
/G
Ho
rm
Ch
l
ho
n
US
u
op
g
a
O
t
e
r
/
E
a
G
l
n
t
N
.
i
t
n
l
r
/
t
c
s
H
u
A
.
s
nk
ga
hu
ny
tze
b.v
y
erm
Ins
dt
ilip
Fra
t
s In
ata
RI
rsc
wi
/G
an
otu
ermi
ma
Ph
y
S
f
o
cal
r
O+
P
dK
mo
h
H
i
f
/
n
m
o
/
e
c
n
o
r
b
n
a
y
G
o
h
s
t
m
G
y
u
e
e
t
n
/
A
d
n
e
u
m
r
a
u
H
an
/G
ol
Eis
tzerm
A
Ch
Po
ch
rG
e
bH
/G
erm y Fra
mb
hu
of
ha
he
fr
erm
na
h. G
c
g
i
G
c
G
c
m
r
T
y
s
t
G
/
s
t
ezu
h
t
/
u
e
r
d
G
t
u
i
n
n
i
n
C
t
s
l
b
o
y
a
n
i
e
/
e
r
m
t
l
ss
em
an
ity
nR
am
tha
Bra
ix B
P/V
Ins
erm Unive
yU
y
Ch
le E
lca
ers
VE
Fel
eH
/G
erm
sen
ckk
v
sit
u
l
A
i
E
i
an
r
c
n
G
H
h
u
T
u
n
e
a
b
la
o
y
in
e/
N
sc
ny
rm
U
iv
ch
L
I
P
W
a
n
k
m
a
e
h
s
n
.
t
r
a
a
k
i
c
x
i
A
G
K
e
r
u
U
r
ch
eG
ni
ho
VS
O.
erm
in/
gh
tB
Ma
ab
erm
ffw
ho
mt
PD
ruh
sU
Dr.
y
/G
ste
sin
T/G
ch
erf
rea
s
a
)
n
i
sto
l
T
S
n
a
n
s
r
I
G
e
y
p
u
G
F
a
e
e
d
/
Ka
ue
an
Ba
HS
oh
an
rm
tut
Pa
aly
ia
yG
td.
an
Q
erl
sti
ft (
/It
Ge
um
tH
sit
ral
erm
en
KL
z
a
r
/
y
r
a
n
t
rm
u
v
l
t
I
t
G
s
n
e
i
g
t
U
h
e
i
a
u
/
i
r
n
r
v
c
u
t
t
t
i
e
w
h
G
I
e
e
u
s
H
s
L
l
n
f
S
b
b
le
Un
ic /
e/A
gsz
m
e/C
ria
sin
ho
G/
sel
rei
Gm
ctr
mb
nc
un
ng
urn
un
Ge
e
giu
eA
Cla
yF
a
e
l
h
l
i
h
o
a
i
u
t
i
c
r
E
e
c
d
G
c
m
s
ia
F
os
elb
/B
&
sch
fS
ers
tokar
he
For
str
EC
an
yo
Au
fM
For
rt B
niv
nc
ter
hic
p
bH
o
e
c
M
e
c
Au
o
U
I
m
a
t
/
o
b
S
y
J
y
e
.
o
n
it
de
Pr
Gm
y
al
s/
ngs
it
R
s
l
a
i
l
a
V
n
r
h
b.H
d
a
c
a
.
a
e
y
a
c
A
dw
m
erm
ezi
lan
ain
an
rm
H
mi
niv
SA
Lu
/G
ese
Sp
rm
he
Ge
sch
U
ny
/U
ny
/Sp
n
A
rt.
a
t
/
e
i
C
a
y
P
a
a
e
c
A
b
I
i
u
n
i
h
G
S
e
/
t
lb
h
C
In
Ci
tal
rm
rm
nc
ge
I
U
a
u
D
e
a
m
e
/
e
t
/
s
n
i
A
l
.
l
i
y
i
e
G
A
t
A
a
U
b
/G
ar
mb
lut
an
um
Inc
ns
Sp
rg/
y
ty
yV
T
lgi
. KG
rm
r -I
gy
hG
al C
So
p
ty
rsi
tal
sit
e
e
o
i
I
c
c
e
rbu
o
r
e
i
i
y
l
B
f
s
/
C
l
G
m
a
e
v
/
o
i
er
H
ed
an
J
no
&
no
H/
Do
rm
niv
nh
ITO
Un
niv
ila
sM
bH
ech
Ge
U
um
mb
erm
au
ly
V
or
T
/
M
r
u
r
-U
f
l
i
a
y
G
t
G
m
i
F
s
t
n
e
/
l
I
n
i
s
r
s
ig
an
FG
sen
ium
xG
d
cro
ia/
on
yK
Ka
de
Lu
sze
ro
na
Fre
elg
erm
Mi
ft D
kti
tal
sit
io
lan
an
ng
o
I
l
l
r
B
r
a
u
G
S
r
u
/
g
e
ect
e
/
y
a
h
y
d
l
a
v
h
o
z
o
c
c
n
i
o
n
H
e
i
t
a
c
c
s
a
r
i
t
a
G
n
a
d
rs
in
w
sS
rP
ysi
mb
pto
-U
les
rm
Re
rm
ly
de
Fo
me
g/S
ise
Ce
ala
Ge
hts
nG
aO
Ge
e
Ita
y
y
k
n
/
erm
t
/
c
t
/
e
l
c
g
l
M
i
n
u
e
s
e
e
a
r
/G
ta
rs
an
gs
en
AG
m
G/
in
r
b
D
m
e
n
l
l
p
m
i
n
B
h
e
o
t
v
H
r
e
a
A
i
d
u
c
y
O
y
pp
e
ch
Ge
rne
tak
ch
ell
Au
n/J
Un
tria
an
ian
an
n
niv
on
Wu
rn/
us
y
or
tio
ors
nte
rm
ist
m
f
K
oW
U
o
F
M
a
A
n
r
r
u
H
e
r
x
/
b
k
a
s
e
h
y
e
G
l
r
G
t
h
/G
bH
/G
C
rpo
Gla
eh
DF
de
ion
rsi
um
yerm
tsc
Co
Pa
. KG
ny
AG
lgi
nit
sit
Gm
ive
Wo
aft
/G
o
a
r
r
eu
e
e
n
u
n
l
z
h
C
e
e
H
B
o
D
l
c
u
y
n
M
b
rm
SA
niv
Li
.V./
an
al U
rys
ins
l Li
sch
/U
H&
he
Ge
ny
c
U
e
.
h
N
n
h
Gm
i
/
c
m
b
h
a
c
a
t
a
e
C
r
s
s
n
c
m
r
t
an
e
h
ri
n
In
ler
Gm
erm
aiw
eS
rm
ech
/G
tho
isc
pe
sge
tga
ize
ek
T
m
e
T
e
n
t
G
e
t
g
i
g
H
e
/
i
k
m
/
r
s
u
a
G
h
r
n
b
t
e
hw
g/
ion
Sc
ny
Alp
ISE
res
D
esa
hu
we
B
yS
Gm
lia
un
strat
P
A
Sc
ma
rsc
nd
sit
yG
tro
ny
e
h
o
r
S
y
r
t
o
ng
a
k
c
a
n
tra
o
i
e
p
i
l
n
e
F
U
s
e
r
s
s
t
r
a
V
l
v
/
r
a
G
r
m
.
i
o
e
e
u
h
p
/
E
r
o
e
C
h
e
itz
Inc
Un
Lig
y/A
ver
erf
erm
./Ja
niv
rea
cs
erk
/G
tsc
fty
no
/G
ies
sti
Ko
/Sw
Inc
log
ym
rw
rU
tik
eu
n
e
l
/
n
g
a
h
o
y
Lu
o
o
c
l
a
y
D
l
o
p
a
o
f
c
n
t
V
e
r
P
l
i
P
a
p
i
r
H
m
T
i
h
o
s
G
r
n
a
r
n
f
y
e
er
f
Inc
ity
hn
os
DF
le L
Tec
m
tai
+A
yZ
an
niv
n/G
of
rm
ers
hu
Tec
tut
Bri
sit
aft
tru
e
i
v
rm
c
ng
o
U
ia
r
t
e
i
t
t
h
n
s
F
d
e
l
t
u
e
n
s
n
c
a
s
iv
es
Ind
Ze
ch
U
tu
/G
In
na
re
ile
nn
n
r
i
n
t
o
r
s
c
i
t
o
e
a
g
f
k
i
G
i
D
s
h
r
e
Un
e
o
r
/
t
c
a
A
f
an
In
m
ch
fft
ch
aiw
Gf
an
Na
ect
y
ast
yo
sch
./T
sge
-Pl
uts
DF
Sto
Fa
rne
an
erm
elf
l El
ell
sit
po
c
x
e
g
r
t
u
r
s
B
a
k
a
G
n
f
a
m
n
r
e
I
D
o
/
e
a
,
of
er
lb
hin
ne
Mo
hu
he
s
M
niv
ft f
ch
fic
aG
t/G
./C
y
Ge
Me
nd
rsc
ha
lU
ny
sru
ins
nti
l
o
d
l
n
a
c
em
o
a
a
l
e
e
r
a
s
a
C
a
F
i
y
c
r
h
l
a
y
i
c
c
m
st
an
he
sel
Ro
erm
hn
ine
the
yK
eS
erm gsge
De
S
rm
/G
arm
tsc
ch
y
Ge
sit
Ne
ag
/G
Tec
e
r
r
e
a
u
t
/
D
n
f
e
./U
a
e
i
G
e
f
n
p
c
u
y
v
A
M
/
g
a
g
o
i
a
t
D
u
n
S
h
i
t
n
d
o
I
G
v
n
n
o
c
P
d
ji
na
rks
ers
tol
nt
Hu
Gr
sA
U
an
ELI
ors
A
ing
on
niv
st/
ny
We
gie
/Ca
ies
exa
eF
Q
d
Jap
ny
t f
e
y
a
o
U
g
e
/
n
h
l
o
t
a
.
o
p
l
i
o
lo
a
a
a
itu
sc
ar
ch
rm
rp
Co
rs
n
t
o
t
c
d
s
rm
D
P
e
i
o
i
s
e
h
n
u
u
e
n
n
v
C
G
d
n
n
y
B
G
ni
ing
De
pa
ch
Tec
to
ik/
ech
an
un
gsi
of
lap
rga
/Ja
A
on
hn
gT
Te
rm
ty
un
cu
ill U
lQ
ng
mo
no
S
i
p
c
e
s
n
e
a
h
y
r
a
o
s
u
i
G
e
U
n
e
l
r
c
t
a
c
T
n
l
/
/G
an
rs
ab
A
tug
fr
Sh
ive
Infi
r
Aji
on
a
M
rha
bH
En
Fo
y
erm s/Por
ns
Un
d
ain
le f
tut
m
s
ny
ne
i
n
y
t
h
G
n
u
i
erm
d
a
t
p
G
h
a
/
n
o
i
i
r
a
s
h
l
n
J
a
l
G
a
z
i
a
B
m
G
c
r
n
/
i
m
Z
r
h
s
r
K
t
&
ain
gsi
ter
tze
r
AG
Lor
P
ch
Ge
erm Grea
te
Ge
on
ec
wi
ss
un
ns
s
/G
ik f
Ho
ma
kM
H/
SA
S
/
e
i
ns
v
h
e
n
o
/
G
b
i
c
t
U
i
o
art
c
i
n
h
l
l
t
/
A
d
s
D
n
.
B
o
h
m
k
p
r
s
S
m
J
E
i
T
c
e
s
c
l
l
l
e
g
re
y
HL
Fo
Po
. In
na
ie G
ing
ote
un
H
ken
od
an
an
So
Co
RC
tio
ny
gro
ssl
ch
ikr
em
ri
iw
bri
say
a
A
s
a
E
m
t
a
s
a
h
&
r
r
M
E
n
n
A
a
T
F
u
r
o
m
C
e
H
r
S
a
r
k
/
r
y
F
.
e
g
F
c
E
o
e
G
p
e
R
er
an
rg
tf
Int
I)/
De
Inc
tin
erm
ap
/G
Lab
IC
an
be
M
K
ch
/G
a
ela
erm
titu
HM
erg
OL
iw
e
n
(
y
al
n
H
s
en
i
G
T
a
G
b
R
a
g
n
r
b
n
d
/
T
h
I
H
e
a
p
/
o
u
rn
SA
otu
y
ern
Gm
y/C
ity
A
ico
/Ja
rm
mb
sch
t
Fre
N
P
t
n
s
U
t
x
t
i
e
y
/
r
G
u
/
a
e
s
n
m
u
Ge
n
o
e
a
e
r
e
/G
en
Pla
tru
rsl
n
rlin
niv
ive
ma
inh
erm
D
a/M
ng
ng
slid
e
n
a
e
r
r
u
n
U
s
a
G
u
o
e
e
p
a
B
M
i
z
l
a
i
/
t
i
z
j
r
a
a
H
ua
/G
of
ua
B
al U
nd
en
ich
tut
yE
s/J
ala
yK
urt
mb
ch
t/I
SA
gH
rm
uth
sti
hN
inr
sit
ad
sit
cal
a
r
G
e
n
o
i
e
U
n
o
r
u
i
r
I
inf
e
fl
h
/
s
c
e
s
N
d
y
r
i
r
e
v
m
G
s
r
g
v
T
i
l
a
e
n
i
o
R
e
e
e
l
e
n
w
J
i
o
B
b
a
n
Un
ch
Un
hla
ch
y
hu
Lty
pit
dd
log
rO
on
eit
um
an
gro
tsc
A
rsi
RR
Ca
rsc
g-S
no
de
ida
ati
r
S
-M
e
A
u
o
lgi
s
h
n
v
i
u
e
n
F
N
rm
e
r
U
i
c
j
.
A
A
u
i
b
/
e
h
e
B
D
e
n
V
S
S
.
z
e
v
/
T
G
i
m
U
Ha
/U
r
te
rtm
dia
./U
nis
M
rt /
jet
/It
ma
eu
Un
y
Do
Co
og
ave
.A.
eW
ga
nk
ven
./In
rol
na
las
or
an
l
I
r
C
t
P
i
t
f
o
.
d
w
N
t
p
u
o
.
t
h
e
S
m
n
f
L
.V
ro
er
gth
sP
Stu
sch
lia
SA
LCO
In
y/C
tria
vt .
AG
Eu
rt e
/
ch
Li
Ita
A
us
ilip
ity
sit
e/G
m
./U
hl
rP
o
r
s
y
k
h
A
u
ah
e
a
p
e
r
A
e
i
h
/
c
l
f
ble
n
P
r
t
t
S
La
ive
niv
en
bH
elg
Co
pS
mb
/U
am
um
ach
ma
ly
Yo u r s al e s p ar t n e r :
NEURTEK S.A.
Polg.Ind.Azitain, Parcela 3 A
Apdo.399
20600 EIBAR
902 42 00 82
Emails: comercial@neurtek.es
SPAIN
FAX 943 82 01 57
sat@neurtek.es
www.neurtek.com
Technical information in this document is subject to change without prior notice. Errors and omissions excepted.
Copyright by DataPhysics Instruments GmbH, Filderstadt .
is a registered trademark of DataPhysics Instruments GmbH PI/PROG-0708-3.3/E-5.0
Photos by Thomas Mller, Norbert Heil, Bavaria, Tony Stone, DataPhysics archives. Text, artwork and layout: Gerhard Maier, DataPhysics
V i si t o u r we b si t e a t w w w. d a t ap hy si c s . d e