Beruflich Dokumente
Kultur Dokumente
Abstract
Ultrasonic phased arrays offer great advantages in scanning, sweeping, steering and focusing beams, as well as options for advanced imaging.
Until recently, the imaging options have been limited to S-scans and E-scans, or the standard top, side, end views. However, more recent
work has shown great potential for alternative imaging approaches, e.g. superimposing the ultrasonic image on the component to show defect
location. Also, advanced digital filtering techniques can be used to tighten up images. Some of these techniques are commercial, while others
are still under development. Advanced imaging techniques have significant advantages for trainees, managers etc., but the value for structural
integrity is less obvious.
Introduction
Imaging has always been an important aspect of NDT;
after all, if one cannot image a defect, how can one interpret
the readings? However, it is primarily in the last decade or
two, when personal computers and laptops became dominant,
that imaging has taken great strides. These steps have
occurred in conjunction with technical developments in NDT,
to ultrasonics in general which lends itself to complex
imaging due to its digital data and to phased arrays (PA)
in particular.
Phased arrays [1,2] are well described elsewhere, and
will not be defined in detail here. PA inherently provide a 2D
or 3D image using S-scans and E-scans, and particularly with
encoded scans where all the data is stored for subsequent
imaging. However, it is possible to go well beyond the
standard PA images and reprocess them into complex overlays
and others. This paper describes developments in these
areas.
3D Imaging
Naturally, some people wanted 3D imaging to show the
flaws in the best possible way. Software programs are
available today [3], but their engineering value is
questionable. Figure 4 shows an example, with a 3D image in
the bottom right view.
Almost all analysis approaches, be they called Fracture
Mechanics, Engineering Critical Analysis or Fitness-ForPurpose, use an ASME-style box round the defect for
defining the defect boundaries (see Fig. 5). This suits a top,
277
Fig. 2 : Top, side, end view of weld. Top left: top view or C-scan; top right, end view; bottom left, side view; bottom right,
waveform or A-scan.
Fig. 3 : Multi-view display showing S-scans, C-scans, weld overlays and linked cursors.
278
278
model both the array itself and the component. There are
several approaches: simple and advanced ray tracing, beam
profiling, beam propagation models.
Figure 6 shows a simple ray tracing program results for
a weld [5]. These programs are very useful for developing
Scan Plans for codes, and can save a considerable amount
of time and effort. With these easy-to-use programs, one can
determine coverage, appropriate angles, number of beams
required etc. very quickly and fulfill the code.
More complex ray tracing programs can be used for
advanced components. For example, Fig. 7 shows a PA beam
in a rail head (6) using Imagine3D. This particular program
also provides an A-scan for operator evaluation.
Commercial programs are available as well to model PA
beams. As there is (theoretically) an infinite variety of array
shapes, sizes and frequencies, this can be important to
optimize for some special applications. Figure 8 shows
modeled results comparing unfocused beams in a pipe (left)
with focused beams (right) under various parameters [7]. It
is clear that there is a substantial difference between these
two array designs.
279
2D and 3D Overlays
More advanced overlays can be used to give better
location and overview of defects [1,2]. These can be
produced in both 2D and 3D, though neither approach is
strictly commercial yet. Figure 10 shows a 2D overlay of an
S-scan on a steel weld. The overlaid weld profile shows that
the stress corrosion cracking occurs in and around the root
and HAZ.
3D images and overlays can also be developed, as
shown in Fig. 11 [2].
Again, the value of these displays is not proven yet,
but they are in the process of being commercialized.
Advanced filtering
Fig. 7 : Ray tracing of PA beam in rail head.
Fig 8
280
Fig 9
Michael Moles : Proceedings of the National Seminar & Exhibition on Non-Destructive Evaluation
281
Fig. 12 : Steps in DSP of A-scans. Top, original waveform. Second, Weiner filtering. Third, Autoregressive spectral extrapolation. Bottom,
magnitude of the analytic signal.
References
1.
2.
Conclusions
l
l
l
Acknowledgements
Several images were used from other companies,
specifically Eclipse Scientific, UTEX Scientific, CEA, and
Zetec. In addition, some images from the Olympus NDT
books are courtesy of OPG.
3.
4.
5.
6.
7.
8.
9.