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III.A page 1
Outline
Introduction
Basic Mechanism
Overview on Non-Destructive Effects
Overview on Destructive Effects
Conclusion
III.A page 2
Introduction
SEE is electrical noise induced by the natural space
environment (high energy ionising particles)
Ionisation mechanism
III.A page 3
Introduction
Energetic Particles
Causing Single
Event Effects
Galactic cosmic rays
Cosmic solar particles
(heavily influenced by
solar flares)
Trapped protons in
radiation belts
III.A page 4
Outline
Introduction
Basic Mechanism
Overview on Non-Destructive Effects
Overview on Destructive Effects
Conclusion
III.A page 5
III.A page 6
Delayed component :
diffusion
(low field regions)
III.A page 7
Bulk CMOS
Epi CMOS
Bipolar
III.A page 8
III.A page 9
Sensitive Volyme SV
The volume responsible
for charge collection
for a SEE
m3
p+(E)
E, Z
a
c
c
n
Recoil
III.A page 10
sat
LETth
10
20
30
40
50
60
LET (MeV.cm/mg)
III.A page 11
cm2 or m2
pC
MeV-cm2/mg
Critical Charge QC
MeV-cm2/mg
cm2 or m2
Sensitive Volume SV
m3
III.A page 12
Overview on Non-Destructive
Single Event Effects
III.A page 13
III.A page 14
Ion Hit
Bitline
Comp
WL
(After Baumann)
EPFL Space Center 9th June 2009
III.A page 15
III.A page 16
Advanced Memories
Internal test modes
Microprogrammed cell
architecture
Flash Memories
Dominant effect
Crashes internal state
controller and buffers
III.A page 17
III.A page 18
May affect
subsequent
circuits if not
well filtered in
design
III.A page 19
III.A page 20
III.A page 21
n+ p+ R
p
n+
p+
IH
IL
SCR
n+ p+
VH
V DD
n-WELL
Rn
p-SUBSTRATE
Rp
If an energetic particle
produces I>IL, np>1 and
VDD>VH, then latchup will
occur
As technology scales,
soon VDD<VH and latchup
is no longer a problem
pnp
npn
VL
Rn
III.A page 22
III.A page 23
Vin
Vdd
p+
Vss
Vout
n+
p+
n+
p+
P subtrate
III.A page 24
n+
III.A page 25
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III.A page 27
Mechanism:
Localized current in body of device
turns on parasitic bipolar transistor
Creating direct current path between
drain and source
Always destructive
III.A page 28
III.A page 29
high-current conditions
high-current conditions
Conclusion
Heavy ions
direct ionisation
SEE can be
Destructive (SEL, SEB, SEGR, SHE, etc)
Non-Destructive (SEU, SEFI, SET, etc)
III.A page 31
Bibliography
RADECS short course 2003 Sophie
Duzellier, Component characterisation and
Testing; Single Event
NSREC Short Course Notes 2005
A. Holmes-Siedle, L. Adams. Handbook of
Radiation Effects, Oxford University Press
ECSS E-ST-10-12C, Methods for the
calculation of radiation received and its effects,
and a policy for design margins, http://www.ecss.nl/
With Handbook, ECSS-E-HB-10-12A Calculation Of Radiation
And Its Effects And Margin Policy Handbook http://ecsswiki.esa.int
EPFL Space Center 9th June 2009
III.A page 32