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Ming Cheng, Bo Xu, Cheng Chen, Xichuan Yang, Fuguo Zhang, Qin Tan, Yong Hua,
Lars Kloo, and Licheng Sun*
The development of cost-effective, high-efficiency solar cells
that can meet the ever increasing demand of sustainable
energy is one of the great challenges in the 21st century. Over
the past two years, the emerging family of metal-halide-based
perovskites with the general formula (RNH3)MX3 (R = alkyl,
M = Pb, X = I, Br, or Cl) have been demonstrated to constitute
highly promising photovoltaic materials to fulfill this target.
The perovskite materials possess a unique combination of
intrinsic properties, such as the approproate direct band gap
(1.55 eV), high absorption coefficient, excellent carrier mobility,
very low exciton binding energy, long holeelectron diffusion
lengths, simple (often solution-based) fabrication processes all
together generating high power conversion efficiency (PCE)
of solar cells containing such materials.[125] Typical perovskite
solar cell (PSC) devices consist of several layers starting with a
layer of a nanocrystalline metal oxide, such as a mesoporous
TiO2,[1,15,24] an Al2O3 scaffold,[11] or a ZnO thin film,[12] covered
with the photoactive perovskite (RNH3)MX3 layer, a hole-transport material (HTM) layer, and a metal counter electrode. To
date, extraordinary PCEs of over 19% have been reported for
cells based on a lead-containingperovskite as light-absorbing
material and 2,2,7,7-tetrakis(N,N-di-p-methoxyphenyl-amine)9,9-Spirobifluorene (Spiro-OMeTAD) as the HTM.[24] However, the high cost of Spiro-OMeTAD impedes the growth and
advancement of highly efficient and cost-effective PSCs.[2628]
Moreover, Spiro-OMeTAD suffers from low hole mobility and
conductivity in its pristine form; therefore, p-type dopants are
necessary in order to promote high device performance.[1,12,24]
However, some of the p-type dopants used have been observed
to accelerate the cell degradation due to their deliquescent properties.[29] In addition, the p-type doping strategy increases the
overall cost and also requires a strict optimization of the doping
Dr. M. Cheng, B. Xu, Dr. Y. Hua, Prof. L. Kloo,
Prof. L. Sun
Department of Chemistry
KTH Royal Institute of Technology
SE-10044 Stockholm, Sweden
E-mail: lichengs@kth.se
Dr. C. Chen, Prof. X. Yang, F. Zhang, Q. Tan, Prof. L. Sun
State Key Laboratory of Fine Chemicals
Institute of Artificial Photosynthesis
DUT-KTH Joint Education and
Research Centre on Molecular Devices
Dalian University of Technology (DUT)
116024 Dalian, China
DOI: 10.1002/aenm.201401720
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M1
max solutiona)
[nm]
[M1 cm1]
max filmb)
[nm]
E00c)
[eV]
HOMOc)
[eV]
LUMOc)
[eV]
Hole mobility
[cm2 V1 S1]
Conductivity
[S cm1]
429
23 600
557
1.84
5.29
3.45
2.71 104
1.16 103
521
37 100
spectra were recorded in CH2Cl2 solution (2 105 M); b)Films were prepared by spin-coating an o-dichlorobenzene solution (20 mg mL1) of M1 onto glass
slides at a spin speed of 1500 rpm; c)CV measurements were carried out in CH2Cl2 solutions with TBAPF6 (0.1 M) as supporting electrolyte, ferrocene/ferrocenium (Fc/Fc+)
as internal reference, and converted to the vacuum scale according to the formula of EHOMO = (Eox + 4.50) (eV) and ELUMO = (Ered + 4.50) (eV).
a)Absorption
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a)
M1
-4.6
Ag
- 5.1
CH3NH3PbI3
- 4.5
PC70BM
Ag
HTM
Perovskite
PC70BM
ZnO
ITO
Glass
-3.45
-3.91
-3.91 -3
ZnO
b)
ITO
-5.29
-5.43
- 5.87
e)
d)
0.5 eV
-5.29
-4.6
MoOx
Ag
PC70BM
M1
ZnO
-5.29 -5.6
-5.1
PEIE
Ag
ZnO
MoOx
-3.45
-3.91
-4.0
ITO
- 5.1
-4.6
M1
- 4.5
PC70BM
Ag
MoO3
Active Layer
PEIE
ZnO
ITO
Glass
-3.45
- 3.91
ITO
c)
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-5.6
-5.87
- 5.87
With PEIE layer
Figure 3. a) Device structure of the (CH3NH3)PbI3-based solar cells. Inset shows the molecular structure of PC70BM. b) Energy level diagram of the
components of the (CH3NH3)PbI3-based solar cells under flat band conditions. c) Device structure of the inverted BHJ OSCs based on M1 blended
with PC70BM. Inset shows the molecular structures of PC70BM and PEIE. d) Energy level diagram of the components of the inverted device under
flat band conditions. e) Illustration of the vacuum level shift and reduced work function of ZnO and ITO electrode after deposition of the PEIE layer.
of 15.2 mA cm2, a Voc of 795 mV, and a fill factor (FF) of 59.1%,
resulting in a PCE of 7.14%. The average PCE of ten identical
devices without HTM is (6.73 0.42)% (Table S3, Supporting
Information). The introduction of dopant-free Spiro-OMeTAD,
doped Spiro-OMeTAD or M1 as HTM substantially increased
the best PCEs to 8.9%, 12.4%, and 13.2%, respectively, under
standard global AM 1.5G illumination. There are two main
reasons for this improvement. One is the HTM layer could
play as an electron blocking layer in the solar cell devices, thus
the charge extraction in these devices are more efficient. Also,
HTM might prevent Ag electrode to directly contact the perovskite layer and penetrate into the layer, resulting in reducing
charge recombination sites in these devices. This result indicates that an efficient HTM indeed is a crucial component in
(CH3NH3)PbI3-based perovskite solar cells. However, the efficiency of device based on dopant-free spiro-OMeTAD is still
very low, just about 8.91%, which is mainly due to its low FF
value. The low FF of PSCs based on dopant-free spiro-OMeTAD
can partly be ascribed to the low conductivity of spiro-OMeTAD
in their pristine form.
The statistical data based on ten identical devices containing
M1 or doped Spiro-OMeTAD as the HTM are collected in
Tables S1 and S2, Supporting Information, giving average PCEs
of (12.6 0.5)% and (12.1 0.3)%, respectively. Comparable
and even a little higher efficiencies can be obtained when M1 is
used as HTM without any doping. Comparing the devices containing M1 and Siro-OMeTAD, the following observations can
be made. Considering the only slightly lower Jsc, observed for
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For PSCs, the generated charge (electrons or holes) may persist in the perovskite owing to the slow charge collection in the
thick perovskite layer and require significant time for charge
distribution. This would impede a quick response to the rapid
scanning of the applied voltage for the JV measurements.
Therefore, the slow charge collection via the perovskite material itself must be improved to eliminate the large discrepancy
with scan direction. PC70BM is widely used in BHJ solar cells
as acceptor (A) material and can form large interfacial donor/
acceptor (D/A) contacting area with donor (D) material, which
allows the efficient collection and dissociation of a larger
number of excitons. Also, previous research has shown that the
Figure 5. a) JV plots of the hole-only devices based on M1 and Spiro-OMeTAD and b) JV plots of electron-only devices based on M1 and LiTFSIdoped Spiro-OMeTAD.
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Figure 6. a) JV characteristics and b) IPCE spectra of the perovskite-based solar cells with M1 or Spiro-OMeTAD as HTM together with a cell without
HTM.
of the cathode after the PEIE deposition onto the ZnO film surface (4.0 eV for PEIE-coated ZnO vs 4.5 eV for ZnO only).[56]
The IPCE of the best-performing devices processed with and
without the PEIE layer were investigated. As shown in Figure 7,
both the devices showed a very wide response to the solar
spectrum in the region of 350750 nm and the IPCE values
increased in the region 450750 nm when the PEIE layer was
used; correspondingly, a higher Jsc was obtained. The integrated
current densities calculated from the IPCE spectra are 11.3 and
12.3 mA cm2, respectively, all matching the measured Jscs considering the experimental error.
Going back to the PSC devices, Electrochemical Impedance
Spectroscopy (EIS) was performed under one sun illumination
to the devices containing M1 or Spiro-OMeTAD as HTMs in
order to gain insight into the charge/hole transport in these
devices. The results were fitted by following the equivalentcircuit model reported in previous literature and shown in
Figure 8.[61,62] The main arc located at lower frequencies is identified with the recombination loss process and the arc at higher
frequencies of the impedance spectrum is typically attributed
to the hole transport of and hole extraction from the HTM.
From the results we can note that the devices containing M1
present slightly higher recombination resistances than those of
Spiro-OMeTAD-based devices. Additionally, the HOMO energy
level of M1 is 0.07 eV lower than that of Spiro-OMeTAD. Both
these factors the higher Voc observed for the devices containing
M1. At the same time, the devices containing M1 display lower
HTM resistance than those of Spiro-OMeTAD based ones, but
Table 2. Photovoltaic parameters of (CH3NH3)PbI3-based solar cells with and without HTM.
HTM
Voc
[mV]
Jsc
[mA cm2]
FF
[%]
PCE
[%]
Integrated Jsc
[mA cm2]
M1a)
1016
19.1
67.8
13.2
18.2
M1b)
1030
18.8
68.0
13.1
18.2
a)
970
18.3
50.2
8.9
Spiro-OMeTADb)
981
19.4
65.2
12.4
18.4
No HTM
795
15.2
59.1
7.14
13.9
Spiro-OMeTAD
a)Without
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Figure 7. a) JV characteristics and b) IPCE spectra of BHJ OSCs employing M1 as donor material.
Table 3. Device performance parameters for BHJ OSCs based on M1:PC70BM (1:1.2).
Thickness of ZnO film
[nm]
Voc
[mV]
Jsc
[mA cm2]
FF
[%]
PCE
[%]
460 6.5
5.74 0.11
33.1 0.3
0.87 0.02
3.72 0.04
10
878 6.3
9.46 0.04
44.8 0.3
10
805 4.28
10.9 0.09
52.5 0.4
4.60 0.19
25
850 5.1
11.4 0.3
59.8 2.0
5.97 0.22
30
855 3.8
11.9 0.3
61.5 2.1
6.25 0.22
30
10
897 6.6
12.5 0.4
61.6 1.4
6.91 0.13
50
835 3.2
11.1 0.3
56.2 1.9
5.21 0.18
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Figure 8. a) Recombination resistance and b) transport resistance of HTMs in the PSC devices containing M1 or Spiro-OMeTAD as HTMs under one
sun illumination obtained from a fitted electrochemical model to EIS data.
Experimental Section
PSC Fabrication: The devices were fabricated based on an optimized
structure of ITO/ZnO/PC70BM/CH3NH3PbI3/HTM/Ag using a
solution-based process. The ITO-coated glass substrates were cleaned
by ultrasonic treatment in detergent, deionized water, acetone, and
isopropyl alcohol under ultrasonication for 15 min each, followed
by a plasma treatment for 15 min. After treatment, a thin layer of
ZnO was spin-coated onto the ITO surface at 3000 rpm for 30 s. This
procedure repeated three times in order to obtain a continuous and
smooth film with a thickness of about 25 nm. PC70BM was dissolved in
o-dichlorobenzene at a concentration of 15 mg mL1. The solution was
spin cast on the ZnO film at a speed of 1500 rpm for 1 min and then
annealed at 120 C for 10 min in ambient air. The thickness of the PC70BM
is about 10 nm. A PbI2 solution (dissolved in N,N-dimethylformamide at
a concentration of 460 mg mL1) was then spin coated on top of the
PC70BM layer at 3000 rpm for 15 s. After drying several minutes in air,
the substrate was dipped into a solution of (CH3NH3)I in 2-propanol
(10 mg mL1) for 1 h, then dried under a flow of dry N2. The thickness
of the perovskite capping layer is about 350 nm. Subsequently, the HTM
layer (about 40 nm) was produced by spin-coating the M1 (dissolved in
o-dichlorobenzene at a concentration of 30 mg mL1) solution on top
of the perovskite layer with a spin speed of 2000 rpm. For the SpiroOMeTAD-based devices, the Spiro-OMeTAD solution (80 mg SpiroOMeTAD, 30 L TBP and 20 L Li-TFSI solution (520 mg Li-TFSI in 1 mL
acetonitrile), all dissolved in 1 mL chlorobenzene) was deposited by spin
coating at 4000 rpm for 30 s. Finally, a layer of 200 nm Ag was deposited
sequentially under high vacuum (<4 104 Pa) by thermal evaporation
through a shadow mask to form an active area of 16 mm2.
BHJ Solar Sell Fabrication: The devices were fabricated with an
optimized inverted structure of ITO/ZnO/PEIE/M1:PC70BM/MoO3/Ag
using a solution-based process. The ITO-coated glass substrates were
cleaned by ultrasonic treatment in detergent, deionized water, acetone,
and isopropyl alcohol under ultrasonication for 15 min each, followed by
a plasma treatment for 15 min. After treatment, a thin layer of ZnO was
spin-coated onto the ITO surface at 3000 rpm for 30 s. The procedure
can be repeated a different number of times in order to generate a
continuous and smooth film with different thicknesses (this ZnO
coating procedure was skipped for ITO-only and PEIE-only devices).
PEIE (Mw = 70 000 g/mol) was dissolved in H2O at a concentration of
3540 wt%. It was further diluted using 2-methoxyethanol to a weight
concentration of 0.4%. The solution was spin cast onto the ZnO film
(for combined ZnO and PEIE devices) or onto the ITO (for PEIE-only
devices) at a speed of 5000 rpm for 1 min. The approximate thickness
of the film obtained was 10 nm. Spin-coated PEIE films were annealed
at 120 C for 10 min in ambient air (this PEIE coating procedure
was skipped for ZnO-only devices). The active layers (120 nm)
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Supporting Information
Supporting Information is available from the Wiley Online Library or
from the author.
Acknowledgements
This work was financially supported by the Swedish Energy Agency, the
Knut and Alice Wallenberg Foundation, the National Natural Science
Foundation of China (21120102036, 91233201), and the National Basic
Research Program of China (973 program, 2014CB239402).
Received: September 27, 2014
Revised: November 8, 2014
Published online: January 7, 2015
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