Beruflich Dokumente
Kultur Dokumente
Course Code
Course Title
Course Planner
ECE206
15699::Manjit
Course Category
Lectures
3.0
TextBooks
Sr No
Title
Author
Edition
Year
Publisher Name
T-1
2nd
2005
Mc graw Hill
Author
Edition
Year
Publisher Name
Reference Books
Sr No
Title
R-1
9th
2008
Pearson
R-2
D. A. Neamen
3rd
1997
R-3
Microelectronic Devices
E.S. Yang
4th
1988
Mc graw Hill
R-4
B.G. Streetman
3rd
1995
Prentice Hall
R-5
Microelectronics
4th
1987
McGraw-Hill
R-6
Microelectronic Circuits
1991
Other Reading
Sr No
OR-1
http://forum.jntuworld.com/showthread.php?3988-Electronics-devices-and-Circuits(EDC)-Notes-All-8-Units ,
OR-2
http://freedownloadpdfonlinesoftcopy.blogspot.in/2012/12/electronic-devices-and-circuits-by.html ,
OR-3
http://www.kinindia.com/university/electric-circuits-and-electron-devices-notes-ec2151-eced/ ,
OR-4
http://ebookcut.com/search/ebook/pdf/electronics-circuits-and-electronics-devices-lecture-notes.html ,
OR-5
http://engineeringppt.blogspot.in/2011/08/electronic-devices-and-circuits.html ,
OR-6
http://www.vidyarthiplus.com/vp/attachment.php?aid=7577 ,
OR-7
http://eng.upm.edu.my/~mariam/KKK%203201/notes_kkk3201.html ,
Relevant Websites
Sr No
Salient Features
RW-1
http://www.sli.ece.ufl.edu/eel6383/Chapter11.pdf
RW-2
http://en.wikipedia.org/wiki/Capacitance_voltage_profiling
CV Characterstics
RW-3
http://www.home.agilent.com/upload/cmc_upload/All/59536939.pdf?&cc=IN&lc=eng
CV Characterstics
0.0
3.0
RW-4
http://www.ecse.rpi.edu/~schubert/2006-Course-ECSE-2210-MicroelectronicsTechnology/MT-21-Ch12-2.pdf
Transient response
RW-5
http://solar.njit.edu/~leej/lecture/ph641/Ch04_summary.pdf
FERMI DIRAC
RW-6
http://whites.sdsmt.edu/classes/ee320/notes/320lecture4.pdf
RW-7
http://ee.eng.usm.my/eeacad/arjuna/Electronic%20device%20lecture3.pdf
Application of diodes
RW-8
RW-9
http://www.ece.cmu.edu/~ee321/spring99/LECT/lect22apr9.pdf
RW-10
http://whites.sdsmt.edu/classes/ee320/notes/320lecture18.pdf
Spill Over
Lecture
Number
Week 1
Lecture 1
Modeling Devices(Static
characteristics of ideal two
terminal and three terminal
devices)
T-1:3.4
R-1:1.8
OR-2
OR-4
Lecture 2
Modeling Devices(Static
characteristics of ideal two
terminal and three terminal
devices)
T-1:3.4
R-1:1.8
OR-2
OR-4
Lecture 3
Modeling Devices(Static
characteristics of ideal two
terminal and three terminal
devices)
T-1:3.4
R-1:1.8
OR-2
OR-4
Lecture 4
T-1:3.13
R-2:8.2
Week 2
Chapters/Sections
of Text/reference
books
Learning Outcomes
Pedagogical Tool
Demonstration/ Case
Study / Images /
animation / ppt etc.
Planned
discussion
Week 2
Week 3
Week 4
Week 5
Week 6
Lecture 5
T-1:3.13
R-2:8.2
Lecture 6
Introduction to Semiconductor
Equations and Carrier Statistics
(Poisson's and continuity
equations)
T-1:3.1 2.10
R-2:6.2.1
Lecture 7
Introduction to Semiconductor
Equations and Carrier Statistics
(Poisson's and continuity
equations)
Lecture 8
Lecture 9
OR-1
OR-3
T-1:3.1 2.10
R-2:6.2.1
OR-1
OR-3
Introduction to Semiconductor
Equations and Carrier Statistics
(Fermi-Dirac statistics and
Boltzmann approximation to the
Fermi-Dirac statistics)
T-1:19.2
R-2:3.5.2-3.5.3 3.3
RW-5
Introduction to Semiconductor
Equations and Carrier Statistics
(Fermi-Dirac statistics and
Boltzmann approximation to the
Fermi-Dirac statistics)
T-1:19.2
R-2:3.5.2-3.5.3 3.3
RW-5
Lecture 10
discussion
Quiz,Test 1
Lecture 11
Semiconductor Diode(Barrier
formation in metal-semiconductor
junctions)
T-1:3.1-3.3
R-1:1.1-1.2
R-2:7.1-7.2
Barrier formation in
metalsemiconductor
junctions
discussion
Lecture 12
Semiconductor Diode(Barrier
formation in metal-semiconductor
junctions)
T-1:3.1-3.3
R-1:1.1-1.2
R-2:7.1-7.2
Barrier formation in
metalsemiconductor
junctions
discussion
Lecture 13
R-2:9.3
RW-1
Lecture 14
R-2:9.3
RW-1
Lecture 15
Semiconductor Diode(CV
characteristics and dopant
profiling)
T-1:3.9
R-1:1.11
RW-2
RW-3
CV characteristics and
dopant profiling
Lecture 16
Semiconductor Diode(IV
characteristics)
T-1:3.4-3.5
R-1:1.3
R-2:8.1
IV characteristics of
Semiconductor Diodes
Week 6
Week 7
Lecture 17
T-1:4.3
R-1:1.9
R-2:8.2
RW-6
Lecture 18
T-1:4.3
R-1:1.9
R-2:8.2
RW-6
Lecture 19
Quiz,Test 2
Lecture 20
Semiconductor Diode(Some
Applications of diodes)
T-1:3.12-3.13
R-1:2.7-2.11
R-2:14.3-14.5 8.6
RW-7
Lecture 21
Semiconductor Diode(Some
Applications of diodes)
T-1:3.12-3.13
R-1:2.7-2.11
R-2:14.3-14.5 8.6
RW-7
MID-TERM
Week 8
Week 9
Lecture 22
T-1:10.1-10.3
R-1:5.1-5.2
R-2:13.1
OR-5
OR-6
OR-7
Basic introduction to
JFET HFET
T-1:10.5
R-2:11.1-11.3
T-1:10.5
R-2:11.1-11.3
animations of the
diagram of JFET
Lecture 23
Lecture 24
Lecture 25
T-1:10.4
R-2:13.4
Lecture 26
T-1:10.4
R-2:13.4
Lecture 27
R-2:11.2
Week 10
Week 11
Week 12
Week 13
Week 14
Lecture 28
R-2:11.2
Lecture 29
T-1:10.5-10.7
R-1:5.7
R-2:11.3-11.4
Lecture 30
T-1:10.5-10.7
R-1:9.10 -9.11
R-2:11.3-11.4
RW-8
Discussion
Lecture 31
T-1:10.5-10.7
R-1:9.10 -9.11
R-2:11.3-11.4
RW-8
Discussion
Lecture 32
Bipolar transistors(IV
characteristics and elers-Moll
model)
T-1:5.1-5.6 5.12
R-1:3.1-3.3
R-2:10.5.1
IV characteristics and
elersMoll model
Lecture 33
Bipolar transistors(IV
characteristics and elers-Moll
model)
T-1:5.1-5.6 5.12
R-1:3.1-3.3
R-2:10.5.1
IV characteristics and
elersMoll model
Lecture 34
Quiz,Test 3
Lecture 35
T-1:8.3-8.5
Lecture 36
T-1:8.3-8.5
Lecture 37
T-1:5.5
RW-4
Lecture 38
T-1:5.5
RW-4
Lecture 39
T-1:5.6-5.10 10.7
R-1:8.5 9.6
R-2:10.1-10.2
RW-9
RW-10
brainstorming
Lecture 40
T-1:5.6-5.10 10.7
R-1:8.5 9.6
R-2:10.1-10.2
RW-9
RW-10
brainstorming
Week 14
Lecture 41
T-1:5.6-5.10 10.7
R-1:9.6 8.5
R-2:10.1-10.2
Discussion
Lecture 42 will be
In Lecture 42 the
reserved for contingency students will be able to
do the revision of all
the course taught after
MTE
Lecture 42
T-1:5.6-5.10 10.7
R-1:9.6 8.5
R-2:10.1-10.2
Discussion
Lecture 42 will be
In Lecture 42 the
reserved for contingency students will be able to
do the revision of all
the course taught after
MTE
SPILL OVER
Week 15
Lecture 43
Spill Over
Lecture 44
Spill Over
Lecture 45
Spill Over
Frequency
Quiz,Test
Out Of
2
Total :-
10
20
10
20
Test 2
Objective
To test the students JFET/HFET, MIS structures and MOSFET operation, JFET
knowledge regarding characteristics and small signal models, MOS capacitor CV and
the course
concept of
accumulation, Depletion and inversion, MOSFET characteristics
and small signal models,IV characteristics and elers-Moll model
Evaluation Mode
Allottment /
submission Week
10 / 11
Quiz,Test 1
Individual
The test is of 30
marks and each
question carries 5
marks or multiple of
5 .The test should
be conceptual and
numerical based
2/4
Quiz,Test 2
To prepare student
for higher
competitive exams
UNIT-3
Individual
5/6