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Nanyang ENC
The commercial landscape for wireless applications is changing at an ever increasing rate. Driven by
consumer demands for greater efficiency, higher levels of performance at lower cost and greater freedom of
movement, industry has to demonstrate flexibility as well as good engineering practice. To this end, this
course will try to increase human resource potential by explaining some of the fundamental issues
associated with the design, manufacture and measurement of RF and microwave integrated circuits. The
course is based around the textbook RFIC and MMIC Design and Technology co-edited by the course
leader Dr Stepan Lucyszyn and published by the Institution of Electrical Engineers (IEE), in Nov. 2001.
A major problem within companies is the poor communications between their R&D engineers, circuit
designers, production engineers and metrologists. Each understand their own field of expertise, but may
have limited practical insight at the other levels. For example, the R&D group may propose technologies to
the circuit designer that are not accessible, while a circuit designer may ask a production engineer to meet
overly demanding tolerance specifications. The final integrated circuit may have superior performance but it
may not be in a suitable form to be measured accurately. This course aims to address such conflicts.
WORKSHOP Contents
Day 1
(040705)
Day 2
(050705)
Day 3
(060705)
This workshop begins by introducing the basic building blocks (passive components and active devices)
traditionally employed in advanced RF and microwave integrated circuits. These building blocks are then
incorporated into the practical design of integrated circuits. Modern techniques for manufacturing hybrid
circuits and multi-chip modules are then explained in detail. Finally, techniques for measuring the scattering
parameters of both hybrid and monolithic microwave integrated circuits are explained. Throughout the
course, some of the more fundamental tradeoffs associated with the whole design-manufacturemeasurement process are discussed.