Beruflich Dokumente
Kultur Dokumente
140
120
100
Other
Bridging test
At-Speed tests
Stuck-at tests
80
60
40
20
0
180 nm 150 nm 130 nm 90 nm
65 nm
Technology Node
Reference www.elecdesign.com
4
Tester memory
Free space
Stimulus Data
Response Data
Stimulus Data
100011010111010001
001011010111011111101110110
110011010111010001101110001
DeCompressor
100011010111010001010101011
100110101110101010
001011010111011111
001010010011010111
110011010111010001
101110010111011101
1011100101110111011110001110
Compressor
Response Data
Tester memory
Scan Vectors
Input Side:
Fan-out only or
Chip
XOR Spreader
Space Expander
(Spreader Network)
Output Side:
Space compactor
Masking
Masking
Space Compactor
(XOR Trees)
Compressed Output Stream
6
Masking
Optional X-state
masking
De-compressor:
Insert a simple scan fan-out (broadcast) or combinatorial linear
(XOR) spreader to decompress the test stimulus from a small
number of scan in pins to a large number internal scan
channels.
Compactor:
Insert a combinatorial linear (XOR) space compactor on the
internal scan channel outputs allowing the test responses to be
compressed down to a fewer number of scan out pins.
Optionally can insert masking logic to block Xs from entering
the compressor using a wide1 style masking.
X- Masking
Un-modeled ATPG logic: RAMs, mixed signal logic, black boxes etc.
Non-scan flops that get corrupted during scan operation
Flops on paths slower than tester launch-capture cycle
Unintended consequences of last minute design changes
10X reduction
Original design
Input Stim Data = 2 Gbits
10K patterns X 10 scan in pins X 20K bits scan depth X 1 bit
11
Original Design: 6Gb of test data and 20 sec. ATE time for scan test
10 X compression: 90% reduction (600 Mb, 2 sec)
20 X compression: 95% reduction (300 Mb,1 sec)
50 X compression: 98% reduction (120 Mb, 0.4 sec)
100X compression: 99% reduction (60 Mb, 0.2 sec)
Real Benefits start diminishing somewhere between 50-100X while
P&R and ATPG complexity kick in.
Non-Scan vectors (MBIST, Functional, I/O, etc.) dominate test time
and memory at higher compression
Flow
12
Flow
13
define_dft shift_enable
define_dft test_clock
set_attr dft_dont_scan
set_attr dft_controllable
define_dft test_mode
etc
define_dft xxx_segment
fix_dft_violations
connect_scan_chains
14
define_dft scan_chain
check_dft_rules
compress_scan_chains
write_et library -compression
Full-scan
Pin Assign
File
Compression
Pin Assign
Files
15
Compression Results
(smaller is better)
1800
1600
1400
1200
Full-scan
1000
XOR Spreader
800
Compression
broadcast
600
400
200
0
1x
5x
10x
20x
40x
Compression ratio
16
60x
80x
Compression Results
(smaller is better)
400
350
300
Full-scan
250
XOR Spreader
200
Compression
broadcast
150
100
50
0
1x
5x
10x
20x
40x
Compression ratio
17
60x
80x
Compression ratio
100
80
Target
With Masking
60
Without Masking
40
20
0
1
18
Compression ratio
60
50
40
with masking
30
without masking
20
10
0
1
4
Experiment
19
Conclusion
DFT Compression
Can be very effective in reducing Test Cost
Test Application Time
Test Data Volume
20
Co-Authors acknowledgement
21
Vivek Chickermane
Brian Foutz
Pradeep Nagaraj
Vinayak Kadam
compress_scan_chains command:
rc> compress_scan_chains -ratio <integer>
[-chains <actual_scan_chain>+]
[-decompressor < broadcast | xor >]
[-master_control <test_signal>]
[-auto_create |
[-comp_enable <test_signal>]
[-spread_enable <test_signal>]]
[-mask
[-auto_create |
[-mask_load <test_signal>]
[-mask_enable <test_signal>]
[-mask_clock <port|pin>]
[-mask_sdi <port|pin>]
[-mask_sdo <port|pin> -shared_output]]
[-preview] [-inside <instance>] [<design>]
23
Reference www.elecdesign.com
24
write_et command
25
Compression ratio
25
20
15
Target
with masking
10
without masking
5
0
1
2
Experiment
26
70
Compression ratio
60
50
Target
40
With Masking
30
Without Masking
20
10
0
1
3
Experiment
28
Compression Results
70
Compression ratio
60
50
40
with masking
30
without masking
20
10
0
1
4
Experiment
29
30
Un-modeled ATPG logic: RAMs, mixed signal logic, black boxes etc.
Non-scan flops that get corrupted during scan operation
Flops on paths slower than tester launch-capture cycle
Unintended consequences of last minute design changes
X- Masking
31
32