Beruflich Dokumente
Kultur Dokumente
Abstract
We studied martensitic stainless steel AISI 420, modified using glow discharge plasma nitriding. Microhardness measurements,
X-ray diffraction (XRD), Scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and Auger electron
spectroscopy (AES) were used to investigate the surface microhardness, crystal structure, microstructure and chemical bonding in
the modified surfaces. High surface microhardness (;1300 HV) over a case depth of about 60 microns is obtained. Glancing
incidence X-ray diffraction (GIXRD) indicates the presence of a predominantly Fe3 N phase with dispersed CrN within 2 5
microns on the surface. In addition, using Bragg Brentano geometry, we measured the presence of a minor phase of Fe4 N in the
case depth. SEM confirms that the microstructure within 2 5 microns of the surface is different from that of the bulk. XPS
shows nitride phase formation on the surface. AES measured over the cross-section of the case depth shows a direct relation of
the increased surface microhardness to the high nitrogen content. 2002 Elsevier Science B.V. All rights reserved.
Keywords: Nitriding; Vickers hardness test; Auger electron spectroscopy; Photoelectron spectroscopy; Martensitic
1. Introduction
The protection of material surfaces from hostile environments and severe operating conditions is of great
technical interest and economic necessity in the mechanical engineering industry. This is because the surface
subsurface properties of materials determine their performance. The requirements of high hardness, with
improved wear, corrosion and fatigue properties can be
attained by surface modifications using nitriding w1x.
The improvement in properties is due to the diffusion
of nitrogen into the surface andyor formation of nitrides
of the metal elements, constituting the steel. However,
stainless steel in general is considered difficult to nitride
conventionally because of the high temperatureyactivation energy for nitrogen diffusion, and the existence of
a surface oxide film, which hinders diffusion w2x. In
contrast to conventional nitriding, plasma nitriding is
known to be a better choice because the target material
is continuously subjected to a flux of ions and neutrals
present within a glow discharge. The bombardment of
these ions and neutrals in the presence of a chemically
* Corresponding author. Tel.: q91-79-323-5018; fax: q91-79-3235024.
E-mail address: alphonsai@yahoo.com (I. Alphonsa).
0257-8972/02/$ - see front matter 2002 Elsevier Science B.V. All rights reserved.
PII: S 0 2 5 7 - 8 9 7 2 0 1 . 0 1 5 3 6 - 5
264
SEM measurements were carried out on a Leo electron microscope, UK, model no. 440I on cross-sectioned
plasma nitrided AISI 420 samples. The samples were
sectioned using diamond wafering blades. They were
first polished with different grit size emery papers and
finally mirror polished with 0.05 mm Al2O3 powder.
The samples were cleaned in ultrasonic cleaner after
every polishing step. Nital solution (2%) was used as
an etchant to reveal the case microstructure. XPS and
AES measurements were done using the multitechnique
spectrometer model no. 5700 made by Physical Electronics, USA. XPS studies were done using monochromatic Al Ka photons with a resolution of 0.6 eV FWHM
of the Ag3d5y2 peak, which was also used to calibrate
the binding energy scale. AES measurements were done
at a primary energy of 3 keV electrons with a spot size
of ;5 micron diameter. Surface cleaning was achieved
using in-situ argon ion bombardment and was monitored
by measuring the C1s and O1s signals, which were
found to be negligible. The Argon ion bombardment
was carried out with 4 keV ion beam energy at a beam
current of 0.4 mA for a time period of 5 min. The low
energy (4 keV) ion beam used for surface cleaning
ensures that the surface contamination is removed and
no impact induced mixing occurs due to sputtering.
Microhardness experiments were performed on the
cross-sectioned samples with a Vickers indentor using a
load of 100 g and a dwell time of 20 s with the major
axis of the indentor parallel to the free surface. Hardness
measurements were carried out over a distance of 200
microns from the surface in order to define the microhardness depth profile. Plasma nitriding was carried out
on three sets of samples followed by the characterization
measurements for every set confirming the consistency
in the results.
3. Results and discussion
In Fig. 1, we show the glancing incidence XRD
patterns of the untreated AISI 420 compared with the
modified surface taken at 28 incidence angle. While the
pattern for the untreated sample (Fig. 1a) shows the aFe peak, the treated surface shows peaks in addition to
that of a-Fe, which are assigned to hexagonal -Fe3N
(Fig. 1b). The broad and weak peak at 37.78 could be
due to overlap of a minor phase of CrN with -Fe3N,
which we confirm with higher resolution XRD and with
XPS studies. Note also the asymmetry in the a-Fe peak,
which is due to hexagonal -Fe3N. This is clearly seen
when we plot the difference of the two patterns as
shown in Fig. 1c. We find no evidence for any other
phase within the sensitivity of the technique, which
probes -1 micron of the surface in GIXRD. However,
bulk sensitive XRD (Fig. 1d) done on the same sample
in the powder mode, which also affords higher resolu-
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266
Fig. 2. SEM picture of plasma-nitrided AISI 420 showing a case depth of 61 microns. Note the different microstructure in the first 2 3 microns.
the peaks at higher binding energy amounts to a maximum of 34% of the total Cr content present in the
surface. This indicates that less than one third of the
12% Cr present in the surface has transformed into a
nitride. Since Fe3N and CrN is confirmed to exist in the
surface by XRD and XPS, the N 1s of Fe3N and CrN
appear at the same binding energy and hence are
observed as a single peak.
Having looked at the chemical states of Fe and N on
the surface, we next investigated the relative atomic
Fig. 4. N1s core-level X-ray photoemission spectrum of plasma nitrided AISI 420 (thin line) superimposed with a single peak Voigt profile
(thick line) indicating nitride formation.
267
4. Conclusion
In conclusion we have obtained plasma nitrided martensitic SS 420 with predominantly epsilon-Fe3N phase
on the surface. The Fe2p, Cr2p and N1s XPS results
confirm nitride phase formation. The AES depth profiles
indicate a direct relation of the increased surface microhardness in plasma nitrided AISI 420 to the nitride
phase formation in the measured case depth.
Fig. 6. Atomic concentration profiles obtained using Auger electron spectroscopy of a cross-sectioned plasma-nitrided AISI 420 sample.
268
Fig. 7. Microhardness and nitrogen concentration profiles across the cross-section of plasma-nitrided AISI 420 showing the direct relation of high
hardness to the high nitrogen concentration in the case depth. Error bars are within the symbol size.
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