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Technology Outlook
1
NI Global Test Technology Outlook
2
Key Trends for Automated Test
• Technology Trends
PCI Express
Multicore
FPGA Reconfigurable I/O
• Methodology Trends
Hybrid Systems
Parallel Test
Multi-standard & MIMO RF
Real-time Test
3
Next Generation PCI Express
7000
6000
Bus Throughput (MB/s)
5000
4000
3000
2000
1000
PCI (32-bit, 33 MHz)
0
1 4 8
Number of Lanes
Test System Bus Comparison
10000
PCI Express/
PXI Express (x4)
Increasing (Improving) Bandwidth
1000
Max Bandwidth (MB/s)
PCI/PXI
Gigabit Ethernet
USB 2.0
100
IEEE 1394a
VME/VXI
Fast Ethernet
10
GPIB (HS 488)
USB 1.1
GPIB (488.1)
1
10000 1000 100 10 1 0.1
Approximate Latency (μs)
5
PCI Express Advantages
• Software compatibility
• High throughput (up to 6 GBytes/s)
• Scalable bandwidth
• Dedicated bandwidth per slot
• Peer-to-peer communication
• Long life (20+ years in mainstream market)
6
Peer to Peer Extends System Bandwidth
1 GigaBytes/s 1 GigaBytes/s 1 GigaBytes/s
Input
Input
Input
Processing
Output
Processing
Processing
Output
Processing
1 GigaBytes/s
1 GigaBytes/s
2
Peripheral Module
3
Peripheral Module
4
Processor Module
H
5
Peripheral Module
H
Peripheral Module
H
7
Processor Module
H
8
Peripheral Module
PXI Chassis with Multiple Processors
Multicore Computing
Faster processors Multicore processors
“To fully exploit the power of processors working in parallel ... new software must deal
with the problem of concurrency.” – Bill Gates
Performance Benchmarks
Fast Fourier Transforms per second (FFTs/s)
0
40,0%
PXI-8106 PXI-8108 PXI-8110
18,6%
20,0%
0,0%
8110 vs 8108 8110 vs 8106 8108 vs 8106
Multicore Programming Techniques
Bus Interface
LabVIEW and
Measurement
FPGA Programmable
Analog or
FPGA
System Digital
Front End
Model
LabVIEW Driver
12
Benefits of FPGAs in Test Systems
• High Reliability – Designs implemented in hardware
• Low Latency – Run algorithms at deterministic rates
down to 5 ns
• Reconfigurable – Create DUT / application-specific
personalities
• High Performance – Computational abilities open new
possibilities for measurement and data processing speed
• True Parallelism – Enables parallel tasks and pipelining,
reducing test times
13
FPGAs for Test Application Areas
• Real-time / co-processing
Processing • Data reduction / in-line processing
• Protocol-aware ATE
Protocols • Interfacing (digital or modulated)
14
Data Reduction and Signal Processing
Filtering Algorithmic pattern generation
Peak-detect Co-processing
FFTs Modulation/demodulation
Custom triggering
Image Sensor
15
Real-Time Spectral Analyzer
16
METHODOLOGY TRENDS
NI Confidential
Hybrid Test Systems
18
Which instrumentation buses to you use most
frequently in your test systems? (select up to 3)
Source: NI Automated Test Customer Advisor Board and Regional Advisory Councils
19
High Performance Hybrid Core
Parallel Test: From Signal to Software
NI LabVIEW
Parallel UUT Test Parallel Data Transfer Parallel Program Execution Parallel Processing
(PXI Express & P2P) (Multithreading) (Multicore & FPGA)
21
Parallel vs. Sequential Testing
Sequential
Parallel
Auto-schedule Parallel
Example: Auto-schedule Parallel Test
WiMAX
Fixed
Stationary ZigBee Bluetooth
Radio
IEEE IEEE IEEE
802.11A/B 802.11G 802.11N
NI WLAN Toolkit
NI LabVIEW
NI PXIe-8106 PXIe-5673 6.6 GHz RF PXIe-5663 6.6 GHz RF
Dual Core Controller Vector Signal Generator Vector Signal Analyzer
Multi-Standard RF Test
GSM Tester
WLAN Tester
Spectrum
Analyzer
Radio Multi-
Tester Protocol
UUT
Power
Meter
RFID Tester
26
MIMO – Multiple Input, Multiple Output
• Common configurations are 2x2 and 4x4
• Used in 802.11n, WiMAX, LTE, and evolving standards
• Use of spatial domain yields higher data throughput
27
Direction Finding
• Three or more receive antennas
• Unique propagation delay to each receiver
• Direction can be calculated through phase difference
Rx0
Rx1
Tx Rx2
28
6 Channel Phase Coherent Record Setup
29
3 Channel Phase Coherent Playback Setup
100 MHz BW Each Channel, Total of 1.5 GB/sec Streamed from Disk
30
Real-Time Testing
• Traditional: Test vectors “talk” or “listen”
They know what they want to say and what they
expect to hear – standard ATE model
• Protocol-Aware: “Real-world communication”
In-cycle responses to the DUT
Intelligence in the hardware
• Means of emulating world around the DUT
HIL and Beyond
Real-Time Simulation
Real-World System
Model-Based Dynamometers
Model-Based
Dynamometer
Control and
Stimulus
PXI-5610
RFID Upconverter DAC DDC Base-
Tag band
PXI-5600 ADC DUC
Downconverter
Key Trends for Automated Test
• Technology Trends
PCI Express
Multicore
FPGA Reconfigurable I/O
• Methodology Trends
Hybrid Systems
Parallel Test
Multi-standard & MIMO RF
Real-time Test