Benchtop SEM

The Most Advanced Benchtop SEM

Ad

vanc

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ion

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Intu

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Utmost ease of operation through a touch

panel system with intuitive GUI

iti

*Optional accessory

o
ve per
ti

capabi

High Vacuum or Low Vacuum mode selectable

Sample imaging at various angles using a tilt
rotation motorized specimen holder*

Eas

ce

ick re
sp

Sample: Compound eye of an ant

onse

Speedy system startup

A single touch to select
High Vacuum or Low Vacuum mode

an

Qu

n
mai ten

Cartridge filament integrating

wehnelt for easy exchange
Auto gun alignment capability

Intuitive operation
Advanced capabilities

Sample: Iron rust

Touch panel
JEOL's renowned image quality can be achieved with the utmost ease. A touch panel
system with intuitive GUI will guide the operator through the imaging process with the level
of ease equal to a smartphone.

Automated functions
Auto controls include alignment, focus, stigmator, contrast/
brightness, and Full Auto. A single touch of Full Auto will initiate
the entire imaging process to present an image instantly.

Manual control
An item touched and selected will turn
green.
Hard, continued pressing of the buttons
for coarse control. Light, intermittent
tapping for fine control.
These control buttons combines the
ease of operation from the touch panel
and the familiar feel of the knobs.

Image search/
display
The Display image button is used to
search a library of images for a specific
image. Checking the Display image
button after selecting a desired image
will present a magnified view of the
image for closer examination.

Minimum
magnification
image
Checking the Low Mag Image will allow
the operator to view an image acquired
at the lowest magnification immediately
after the evacuation sequence was
completed. This is a useful feature when
examining the positioning of the sample.

Preset
magnification
Up to 6 magnifications are presettable.
Programming frequently used
magnifications will increase operating
efficiency. One of the buttons can be
used to preset the current magnification.

Stylish Mechanism

Intuitive operation
Advanced capabilities
HV
S
single touch can switch the mode between High
E IVacuum and Low Vacuum, allowing the
Observe Aoperator
H
to acquire a variety of images.
S EVI
H
High vacuum mode
S EVI
HV
B
EI
Secondary electron image in the High Vacuum mode can bring
HV
out clear images of samples that require high magnification
B
Low
vacuum
mode
image and
samples with
an uneven surface. Comparing SEI
EI
HV
images with BEI images allows for closer examination of the
B
H
surface structure.
EI
V
L
SE
The image mode
may also be switched to backscattered
V
Search
imageI windowH differences.
electron image to examine compositional
S EVI
LV
HV
SEI
LV
Print H V
HV
BEI
SEI
01 H V
HV
S
B
EI
EI
Retrieve imaging conditions
H
HV
S EVI
BEI
HV
LV
B
EI
Dual frame display
H
LV
B EVI
HV
LV
B
EI
Metrology
LV
HV
SEI
LV
HV
EDS
SEI
LV
HV
HV
SEI
SEI
HV
HV
BEI
S
EI
HV
HV
BEI
S
EI
Powerful aid in complicated H
analysis
HV
V
BEI
BEI
L
H
V
Qualitative/Quantitative
B EVI
analysis
LV
H
B EVI
L
L

2 m

Sample: Butterfly scales

Accelerating voltage 15 kV, magnification 30,000

1 m

5 m

Sample: Metal fracture surface

Accelerating voltage 15 kV, magnification 5,000

Sample: Coated paper

Accelerating voltage 5 kV, magnification 3,000

Sample: Yogurt culture

Accelerating voltage 15 kV, magnification 20,000

10 m

LV

Sample: Mouse trachea

Accelerating voltage 15 kV, magnification 10,000

LV
2 m

H
B EVI

LV

H
S EVI

H
S EVI
H
B EVI

LV

H
B EVI

H
B EVI

LV

LV

H
B EVI

LV

H
S EVI
H
B EVI

LSHEVV
I

H
B EVI

10 m

Sample: Aluminum alloy 10 m

Backscattered electron image
Accelerating voltage 10 kV, magnification 3,000

High vacuum mode

Sample: Concrete
Backscattered electron image
Accelerating voltage 15 kV, magnification 200

H
S EVI

Low vacuum mode

The Low Vacuum mode, a standard feature in NeoScope,

is designed to increase the pressure in the specimen
chamber to neutralize the charges on the sample surface,
allowing the operator to observe uncoated non conductive
samples.
The Low Vacuum mode is also effective for samples
containing a small amount of oil or water and gas-emitting
samples that resist coating.

Search image window

H
B EVI

Print

LV

H
B EVI

Retrieve imaging conditions

Dual frame display

H
S EVI

LV

LV

Sample: Filter paper

Accelerating voltage 15 kV, magnification 540

Metrology

H
B EVI

200 m

LV

H
S EVI
H
B EVI

H
S EVI

LV
H
S EVI

H
B EVI

LV

H
S EVI
H
B EVI
50 m

LV

EDS

Sample: Dandelion puff

Accelerating voltage 15 kV, magnification 80

500 m

Powerful aid in complicated analysis

Qualitative/Quantitative
analysis

Sample: Cookie
Accelerating voltage 15 kV, magnification 500

50 m

High vacuum mode

Low vacuum mode

Search and print

Search image window

The Search image window allows the operator to select and print image data. The window also allows the operator to restore the
photographing conditions (accelerating voltage. filament current, probe current, etc.) for any image.

Print

Retrieve imaging conditions

01

Dual frame display

Metrology
High vacuum mode
EDS
Low vacuum mode

High vacuum
High vacuum
mode mode
Search image window
Powerful aid in complicated analysis
Search image window

Low vacuum
Low vacuum
mode mode
Qualitative/Quantitative
Print
analysis

Checking a desired image and pressing the Output images

window
SearchSearch
image image
window
button in the Search image window will display a preview
Retrieve
imaging
conditions
image. If multiple images are selected, the system will
automatically print 3 images per page.

Print Print
Dual frame display

Retrieve
imaging
conditions
Retrieve
imaging
conditions
Metrology
NeoScope can retrieve the imaging conditions of any
image that is saved in memory. The system will retrieve the
data when an image is selected and the Load observation
conditions button is pressed. It is a convenient feature for
routine operation.

Dual
Dual frame
displaydisplay
EDS frame

Metrology
Metrology

EDS EDS
Powerful aid in complicated analysis

Sample: Human hair

Print view

Qualitative/Quantitative
analysis

Print
Retrieve imaging conditions

Compare

Dual frame display

NeoScope can simultaneously display live and retrieved images. In the example below, a low magnification image is presented
on the right while a magnified live image on the left. This allows the operator to compare a current image with another image
retrieved from memory.

Metrology

01

High vacuum mode

EDS
Low vacuum mode
Search image window
Powerful aid in complicated analysis
Print
Qualitative/Quantitative
analysis
Retrieve imaging conditions
Dual frame display
Sample: Star sand

Metrology
Measure
EDS

01

NeoScope incorporates a feature to measure the distance between 2 points. When the Scaler button is selected, the functions
needed for measurement will be assigned to the auto control buttons. The measured results can be saved in image and CSV
data files.

Powerful aid in complicated analysis

No.1
5.79 m

Qualitative/Quantitative
analysis
No.3
6.12 m

No.2
5.47 m

No.4
5.54 m

No.
1
2
3
4

Length
5.79
5.47
6.12
5.54

[unit]
um
um
um
um

Angle[deg]
44
12
89
41

Sample: Metal particles

9

EPrint
DS

Retrieve imaging conditions

01
Elemental
analysis

Dual frame display

EDS

Metrology

Pressing the Analysis button will open the EDS view. EDS
supports qualitative/quantitative analysis, point analysis,
and mapping (elemental distribution).

EDS

Powerful aid in complicated analysis

Sample: Black ore (mineral)

Qualitative/Quantitative
analysis
Two buttons, Image and Spc, initiate analysis.
Pressing the Quantitative button after data acquisition will
display quantitative results.

Image

Element
CK
OK
Al K
Si K
Ca K
Fe K
Total

(ke V)
0.277
0.525
1.486
1.739
3.69
6.398

Mass % Atomic number %

45.65
70.06
1.5
1.73
0.78
0.53
26.03
17. 09
15.38
7.07
10.66
3.52
100
100

Spc

Point analysis
Mapping (elemental distribution)
Pressing the Map button will initiate elemental mapping of the image.
The mapped results will show 2 dimensional distribution of the
constituent elements.

Line analysis

Probe tracking

Using mapped results, the operator can:

Create quantitative maps in color
where each color represents the
quantitative value of an element.

Reconstruct maps of additional elements

EDS

by data processing alone after analysis.

Select a specific area on the map and
extract the spectrum

Overlap elemental maps and

identify where the elements of

interest exist in the area of view
or how they are overlapped.

10

EDS

EDS

Powerful aid in complicated

Pointanalysis
analysis
Analytical Assistance is one of the functions to help the operator navigate any data acquisition process, including mapping and
line analysis.
When a type of analysis is selected from the Analytical Assistance view, the system will display a series of process steps needed
for the analysis. The buttons shown in the view will guide the operator through any analytical procedure.

Qualitative/Quantitative
Mapping (elemental distribution)
analysis
An example of mapping sequence
Line

analysis

Probe tracking
EDS
Select MAP.

Select an image.

Select conditions.

Start analysis.

EDS

Select elements.

Point analysis

Verify conditions.

Mapping (elemental distribution)

Point analysis

Line analysis

When multiple analytical

points are selected on
the image, the system will
automatically analyze the
elements on each point,
and display spectral data.
These spectra can be
compared after the
analysis is completed.

When a line is defined on the image,

the system will begin measuring
relative concentration changes in the
elements on the line.
The elements may be edited after the
analysis is completed.

Point analysis
Probe tracking

Mapping (elemental distribution)

Line analysis

Mapping (elemental distribution)

EDS

1-003
1-001

1-002

Probe tracking

30 m

Line analysis

Probe tracking

EDS

Probe tracking is
designed to maintain a
stable analytical point
for prolonged operation.

EDS

EDS

11

01
View at varying angles
Tilting and Rotating Motor Drive Holder
The Tilting and rotating motor drive holder allows the operator to examine samples at different angles.
Observation of a tilted sample results in 3 dimensional information of the sample.

Startup

The tilt rotation motorized specimen holder is optional.

Tilt
T i lt
Selecting
High
Vacuum or
Low Vacuum
mode
Tilt
Tilt

45

45

Filament
Auto gun alignment

10 m

Sample: Substrate; magnification 45

EDS analysis

Sample: Substrate; magnification 45

Design your own operating environment

Coating device

You can select any wallpaper for

your GUI.
Select one that you desire.

JCM-6000 character
Mr.Power Supply

Sample: Spiderwort, uncoated, Low Vac mode

Rokumaru kun

SEM
12

10 m

Easy maintenance
Quick
response
Tilting and Rotating
Motor Drive Holder
Startup

Intuitive
operation
Selecting High Vacuum
or Low Vacuum mode

NeoScope will be ready for operation in 3 minutes after

it is powered on.

Placing a sample and closing the door will automatically

initiate the evacuation sequence.
An SEM image will be displayed when the evacuation is
completed.

Filament
Tilting and Rotating Motor Drive Holder

Advanced capabilities
Auto gun alignment
Startup

Tilting and Rotating Motor Drive Holde

Selecting High Vacuum or Low Vacuum

mode
Startup
Tilting and Rotating Motor Drive Holder
EDS analysis
A single touch on the panel can switch
Filament
the mode between High Vacuum and
Startup

Selecting High Vacuum or Low Vac

Low Vacuum.

Auto gundevice
alignment
Filament
Coating
Selecting
High Vacuum or Low Vacuum mode

Filament

Auto gun alignment

EDS analysis
Auto
gun alignment

Coating device

EDS analysis

EDS analysis

Coating device

NeoScope incorporates a JEOL proprietary dry SD detector. The detector is always ready for analysis during SEM
imaging.

Coating device

New Laboratory

13

Tilting and Rotating Motor Drive Holder

Peripherals
Startup

Easy
maintenance
Tilting andHigh
Rotating
MotororDrive
Selecting
Vacuum
LowHolder
Vacuum mode
Tilting
Startupand Rotating Motor Drive Holder
Filament

Quick response

Changing filaments is simple and easy.

Unlike the conventional filament assembly that requires cleaning of the
wehnelt, the electron gun in NeoScope uses a pre-centered cartridge
filament that integrates a wehnelt. Since the cartridge is replaced as a unit,
cleaning of the wehnelt or centering of the filament is not needed. The
exchange process is quick and insures correct positioning of the filament.

Startup
Selecting
High Vacuum or Low Vacuum mode
Auto
gun alignment
Selecting
Filament High Vacuum or Low Vacuum mode

Intuitive operation
Filament
Autoanalysis
gun alignment
EDS

Advanced
Auto
gun alignment capabilities

Any new filament that is installed requires alignment to insure good image quality.
This alignment process is fully automated in NeoScope.

Filament-wehnelt integral grid

Coating device

EDS analysis

EDS analysis
Peripherals
Coating device

Coating device

Easy maintenance

Coating allows non conductive samples to be observed in the SEI mode under high vacuum. Comparing the SEI image with the
low vacuum BEI image allows for closer examination of the fine surface structure.

Quick response

Coating

Intuitive operation
20 m

14

Sample: Resin fracture surface , Uncoated

Low Vacuum mode, backscattered electron image
Accelerating voltage: 15 kV; magnification: 1,500

20 m
Sample: Resin fracture surface, gold coated
High Vacuum mode, secondary electron image
Accelerating voltage: 15 kV; magnification: 1,500

Advanced capabilities

Specifications
Magnification

Optional accessories
Tilt rotation motorized holder

Secondary electron image: 10 to 60,000

Tilt: -15 to +45; rotation: 360

Backscattered electron image: 10 to 30,000

EDS

(when image size is 128 mm 96 mm)

Imaging mode

Secondary electron image, backscattered electron image

Accelerating voltage

Secondary electron image; 5 kV, 10 kV, 15 kV (3 stages)

Backscattered electron image; 10 kV, 15 kV (2 stages)

Electron gun

Installation requirements
Power supply

Small gun with cartridge filament

Voltage: Single phase AC 100 V

integratinng wehnelt

(120 V, 220 V, 240 V)

Auto bias

50/60 Hz, 700 VA (AC 100 V),

(linked to accelerating voltage and filament current)

840 VA (AC 120 V),

Condenser lens

Two stage electromagnetic zoom condenser lens

880 VA (AC 220 V),

Objective lens

Electromagnetic lens

960 VA (AC 240 V),

Auto magnification

Magnification corrected with reference to sample

Fluctuation 10% or less, with grounding

correction

height (7 mm, WD56 to 53 mm, WD10)

Bias current

Installation Room

Preset magnification 6 levels, user programmable

Room temperature

15 to 30C

Specimen stage

Humidity

60% or less

Operation table

Sturdy table with a loading capacity of

Manual control for X and Y: X: 35 mm, Y: 35 mm

Maximum sample size 70 mm diameter 50 mm height

100 kg or more

Specimen exchange Draw-out mechanism

Weight

Main console: approximately 50 kg

Image memory

One, 1,280 960 16 bits

Pixels

640 480, 1,280 960

RP: approximately 9 kg

Image processing

Pixel accumulation

Power supply box: approximately 10 kg

Base unit
dimensions

Image accumulation (recursible)

Automated functions Filament, alignment, focus,

(Width)
(Depth) (Height)
325 mm 490 mm 430 mm

stigmator, exposure
Metrology

Distance between 2 points, angles

File format

BMP, TIFF, JPEG

Computer

PC (desktop PC), OS Windows 7

Monitor

23 inch wide LCD monitor (touch panel)

Evacuation system

Fully automatic, TMP: 1, RP: 1

Specications subject to change without notice.

The ofcial name of Windows7 is Microsoft(R), Windows(R), Operating System.
Windows is a registered trademark of Microsoft Corp. in the U.S.
Other trademarks referenced in this catalog and marked with* are the
property of our allied companies.

System composition
JCM-6000 base unit

PC & LCD

Rotary
Pump

Power supply box

3P

Index of samples
Compound eye of an ant
Iron rust
Yogurt culture
Metal fracture surface
Butterfly scales
Coated paper
Mouse trachea
Aluminum alloy
Concrete
Filter paper (LV)
Dandelion puff (LV)
Cookie (LV)
Human hair
Star sand
Metal particles
Black ore (mineral)
Substrate
Spiderwort (LV)
Resin fracture surface (LV, HV)

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