Beruflich Dokumente
Kultur Dokumente
Waveguide Filters
Xiao-Ping Chen and Ke Wu
ecause of the inherent structural flexibility in coupling design and topological arrangement, substrate integrated waveguide (SIW) filter topologies enjoy
better out-of-band frequency selectivity and/or in-band phase response with
the allocation of finite transmission zeros (FTZs). In the first article in this
series, basic design rules and fundamental electrical characteristics have been
presented that indicate the superior performances of SIW structures and their filter applications. Advanced design techniques and innovative structure features have recently
been reported in a large number of publications. They include cross couplings realized by
physical and nonphysical paths and SIW filters with dual-mode or multimode techniques.
Miniaturization-enabled techniques including low-temperature cofired ceramic (LTCC)
technology have been developed and applied to the development of SIW filters to reduce
the size for low-gigahertz applications using nontransverse electromagnetic (non-TEM)
modes. Wideband SIW filters, multiband SIW filters, and reconfigurable SIW filters have
also been reported by various research groups. This article reviews these advanced and
innovative SIW filter technologies, and related examples are presented and discussed.
Xiao-Ping Chen and Ke Wu (ke.wu@polymtl.ca) are with the Poly-Grames Research Center, Department
of Electrical Engineering, Ecole Polytechnique (University of Montreal), Center for Radiofrequency
Electronics Research of Quebec, Montreal, Quebec H3T 1J4, Canada.
Digital Object Identifier 10.1109/MMM.2014.2332886
Date of publication: 8 September 2014
September/October 2014
1527-3342/142014IEEE
121
Source
Load
5
4
: Nonresonant Node
(NRN)
: Resonator
(a)
(b)
-10
-20
-30
-40
-50
-60
-70
Simulation S11
Measurement S21
Simulation S21
Measurement S11
30 31 32 33 34 35 36 37 38 39 40
Frequency (GHz)
(c)
3.0
Simulation
2.5
Measurement
2.0
1.5
1.0
0.5
0.0
122
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R4
R3
R1
R2
Positive Coupling
Negative Coupling
(a)
(b)
0
-10
S21 and S11 (dB)
-20
-30
-40
-50
Full-Wave Simulation
Measurement
-60
-70
17
18
19
20
21
22
23
24
Frequency (GHz)
(c)
123
zeros on the left or right side of the passband, respectively, due to the diagonal coupling. All the coupling
between resonators is realized by magnetic postwall
irises that provide positive coupling. For the filter of
two transmission zeros on the left side of the passband,
the TE101 mode is used for the first or third SIW cavity resonator, while the TE102 resonant mode is excited
in the second or fourth SIW cavity for the equivalent
realization of a negative coupling in signal path 13.
All of the resonators in the filter with two transmis-
50-X Conductor-Backed
Coplanar Waveguide
(CBCPW)
Load
Source
Substrate
50-X CBCPW
Metal
(a)
(b)
-1.0
Measured S11
-10
-1.5
-2.0
Simulated S11
-2.5
-3.0
.0
.6
.2
.8
.4
.0
34 34 34 35 35 36
Measured S21
-20
Simulated S21
-30
-40
-50
-60
(continued)
-70
-80
30
32
34
36
38
40
Frequency (GHz)
(c)
Figure 3. The (a) geometric configuration, (b) structural topology, and (c) frequency responses of the first prototyped fourth-order
cross-coupled SIW filter with negative coupling structure and sourceload coupling [13]. (d) The frequency responses of the second
prototyped fourth-order cross-coupled SIW filter with negative coupling structure and sourceload coupling [13].
(continued)
124
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.0
-1
.5
-1
.0
-2
.5
-2
.0
-3 34.0 34.4 34.8 35.2 35.6 36.0
-10
-20
Measured S11
Simulated S11
Measured S21
Simulated S21
-30
-40
-50
-60
-70
-80
30
32
34
36
38
40
Frequency (GHz)
(d)
Figure 3. (continued) The (a) geometric configuration, (b) structural topology, and (c) frequency responses of the first prototyped
fourth-order cross-coupled SIW filter with negative coupling structure and sourceload coupling [13]. (d) The frequency responses
of the second prototyped fourth-order cross-coupled SIW filter with negative coupling structure and sourceload coupling [13].
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125
R1
S
(a)
(b)
-20
-30
-40
-50
Simulated S11
Simulated S21
Simulated S11
Simulated S21
-60
-70
-80
S Parameters (dB)
-10
S11 and S21 (dB)
L
R2
Positive Coupling
Negative Coupling
-20
-30
-40
-50
-60
12
-90
15.0 17.5 20.0 22.5 25.0 27.5 30.0 32.5 35.0
Frequency (GHz)
S11 Measured
S21 Measured
S11 Simulated
S21 Simulated
-10
13
14
15
16
17
18
Frequency (GHz)
(c)
(a)
0
-10
Degenerate Mode
Spurious Resonant Mode
-30
(a)
-40
-50
-70
-80
-90
Simulated S11
Simulated S21
Simulated S11
Simulated S21
(b)
WS21S
-20
-60
(b)
126
Frequency
(c)
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Input Port
Metal 1
Substrate 1
Metal 2
Substrate 2
Cavity
Metal 3
Cavity
Substrate 3
Metal 4
Substrate 4
Metal 5
Output Port
S
(a)
1
(b)
0
-5
-10
S21 and S11 (dB)
-15
-20
-25
-30
-35
-40
-45
Measurement
EM Simulation
-50
28.0 28.5 29.0 29.5 30.0 30.5 31.0 31.5 32.0
Frequency (GHz)
(c)
127
WSS(dB)
Two types of techniques are often used to generate dualpassband or multiband responses for multifunctional
system applications. The first method is to use novel
resonant structures with a great degree of design freedom, such as stepped-impedance or dual-behavior resonators, because their two dominant resonances coincide
with the two center frequencies of two designated passbands by adjusting their geometric parameters. The resonators are placed so that appropriate coupling in the
structure can be established. This method is very suitable for the case where the passbands are distant from
each other in frequency.
The other method is to use transmission zeros that
are produced by cross-coupling or bandstop resonators
to split a single passband into dual passbands or multibands based on a single-filter circuit. This method is
128
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(a)
(b)
0
-10
Measured Results
Simulated Results
-10
dB
-20
(a)
-20
-30
-40
-50
-60
-30
-70
-40
-80
Measurement
Simulation
18
19
-50
20
21
22
Frequency (GHz)
23
24
23
24
(c)
-60
0
-70
6
10 12 14 16
Frequency (GHz)
(b)
18
20
-10
-20
-30
-40
-50
Measurement
Simulation
-60
-70
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-80
18
19
20
21
22
Frequency (GHz)
(d)
129
RF In
Layer 1
P'
Through
Vias
(a)
(a)
Layer 1
Layer 2
PIN Diode +
Biasing
P
Top Via
Through Via
Wall Via
Layer 3
Wall Via
P'
RT/Duroid
0.635 mm
RT/Duroid
2.54 mm
(b)
-15
-20
-25
-30
-10
S11 (Simulated)
S21 (Simulated)
S11 (Measured)
S21 (Measured)
-35
-40
-45
50
52
54
56 58 60 62 64
Frequency (GHz)
(c)
66
68
70
-20
-30
-40
S11
S21
-50
1.4
1.6
1.8
2.0
Frequency (GHz)
(c)
2.2
Figure 11. (a) and (b) The geometric configuration and (c)
measured frequency response of a reconfigurable SIW filter [40].
plasma acts as a switchable metallic post that can change
the resonant frequency of an SIW cavity.
In [46], a dielectric post exhibiting dispersion provides
electromagnetic agility and adaptability for the filter by
introducing a vertical material perturbation. Low-loss
dispersion of nanoparticles with variable concentrations
is used as the enabling mechanism for electromagnetic
agility and adaptation. The post diameter determines
the amount of perturbation achieved. However, it is still
a very challenging task to simultaneously tune the resonant frequency of an SIW cavity and coupling between
two SIW cavities for constant absolute bandwidth or
relative bandwidth during the tuning process.
130
(b)
-10
S-Parameters (dB)
RF Out
-5
Layer 3
(GND)
Wall Vias
4
+
+ 3
Layer 2
Top Vias
1
+
2
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Port 1
Port 2
Slot
Metallic Vias
Resonator 4
Middle Metal Layer
Resonator 1
Resonator 2
Resonator 3
Bottom Metal Layer
(a)
1
-
+
2 + 3
(b)
S-Parameters (dB)
-10
-20
Conclusions
-30
-40
-50
Measured
Simulated
-60
-70
13.5
14.0
16.0
16.5
September/October 2014
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