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Microelectronics Reliability
journal homepage: www.elsevier.com/locate/microrel
a r t i c l e
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Article history:
Received 24 February 2014
Received in revised form 12 October 2014
Accepted 13 October 2014
Available online 22 November 2014
Keywords:
Filler dispersion
Light emitting diode
Thermal interface material
Thermal transient measurement
a b s t r a c t
The next generation packaging materials are expected to possess high heat dissipation capability. Understanding the needs for betterment in the eld of thermal management, the present study aims at investigating the package level analysis on a high power LED. In this study, commercially available thermal
paste was heavily lled with ceramic particles of aluminium nitride (AlN) and boron nitride (BN) in order
to enhance the heat dissipation of the device. Different particle sizes of AlN and BN llers were incorporated homogenously into the thermal paste and applied as a thermal interface material (TIM) for an effective system level analysis employing thermal transient measurement. It was found that AlN TIM achieve
less LED junction temperature by a difference of 2.20 C compared to BN lled TIM. Furthermore, among
D50 = 1170 nm, 813 nm and 758 nm, the AlN at D50 = 1170 nm was found to exhibit the lowest junction
temperature of 38.49 C and the lowest total thermal resistance of 11.33 K/W compared to the other two
llers.
2014 Elsevier Ltd. All rights reserved.
1. Introduction
Light emitting diodes (LEDs) are semiconductors, and like all
other solid state technology, they are getting better and cheaper
on a predictable curve. The reasons LEDs have taken on the aura
of inevitability; due to their high efciency, good reliability, long
lifetime, variable colour and low power consumption [1]. The
promising features of LED technology have attracted a great deal
of attention from the lighting industry. It has been stated that overall, the solid state lighting market will enjoy a compound annual
growth rate (CAGR) of 12% by 2017 [2].
Despite the rapid gain, high power LEDs decrease in package
size and also the operating parameters keep on increasing. The
excessive rise in the junction temperature causes thermal runaway
and catastrophic failures which resulting in a major drawback of
the technology [3,4]. The heat generated at the pn junction affects
the efciency of the light generation process and results in a
measurable drop in LEDs brightness. Correspondingly, if the heat
dissipation is ineffective, heat will accumulate inside the dies
and will affect their chips, electrical and optical characteristics as
well as reliability of the device [5].
Corresponding author.
E-mail address: anithambigai@gmail.com (P. Anithambigai).
http://dx.doi.org/10.1016/j.microrel.2014.10.009
0026-2714/ 2014 Elsevier Ltd. All rights reserved.
384
Fig. 1. Schematic diagram of the TIM placement in the thermal set up.
The DUT was pressed against the external heat sink at constant
pressure in order to obtain repeatable results.
3. Results and discussion
3.1. SEM analysis of ller powder
SEM images were captured on the AlN and BN pellets as
described in Section 2. Fig. 2(a) and (b) shows the BN30 and
BN120 respectively. As observed, the BN particles get ner as the
milling time increases and the particles exhibit a hexagonal chain
like structure. Fig. 3(a) and (b) shows the AlN30 and AlN120
respectively. It is seen that the AlN particles are polygonal as
expected, and the particles get smaller as the milling time
increases. Comparing Figs. 2 and 3, it is observed that BN particles
are smaller than AlN employed in this study.
3.2. Thermal transient measurement
Thermal transient measurement enables one to determine the
temperature rise undergone by the DUT driven under specic current. Structure function evaluations on the other hand aids in
determining every region inside an LED package. Each gradient in
a cumulative structure function denotes each layer in a package
which enables one to understand the heat transfer mechanism
inside the DUT.
Fig. 2. SEM micrographs of the BN powder milled at different time, (a) BN30 and (b)
BN120.
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which allow the heat transfer more efcient for a system that
has large interfacial area.
As observed from Fig. 4, the temperature rise graph actually
explains heat path in which the heat travelled in the system. Both
curves moved together until 2.78 s then one curve started to
diverge during the transfer of heat between thermal paste and heat
sink. This suggests that, the internal resistance of the package contributes the largest factor of the temperature rise; followed by the
divergent point as it enters the TIM area and nally into the
ambient.
It is observed from Fig. 4 that junction temperature for BN is
higher than AlN. The junction temperature for AlN samples is
39.26 C while for BN is 41.43 C which is about 10.97% higher than
AlN. This difference in the temperature is as expected due to the
intrinsic thermal conductivity of the ller materials. AlN has a
thermal conductivity of 140180 W/m K meanwhile BNs thermal
conductivity is approximately 33.5 W/m K.
Fig. 5 shows the differential structure function of BN and AlN
lled TIM. Each peak denotes each layer inside the MX6 XLamp
LED. The point of divergence is clearly shown in Fig. 5 where the
junction to board thermal resistance is approximately 9.21 K/W.
The transients diverge signicantly as they enter the TIM area,
allowing one to determine the exact value of the thermal resistance contributed by the LED package. Referring to Fig. 5, the junction to board thermal resistance of the LED tested with BN and AlN
TIM is 13.13 K/W and 11.21 K/W respectively. Again as expected,
the thermal which is resistance of AlN TIM is lowering compared
to BN TIM due to the intrinsic thermal conductivity of the ller
materials.
In addition, the heat transfer through AlN TIM is more effective
due to the viscosity of the TIM compounded. In present work, as
mentioned above, the mixing ratio was xed at 1:4, 1 part ller
and 4 parts thermal paste. Due to the nature of BN powder which
has a very low density of 2.10 g/cm3, the process ability was tough
as it requires more BN powder compared to AlN with a higher density of 3.26 g cm3. Thus, with less ller powder required, the viscosity of AlN compounded TIM was maintained within process
ability and the ow characteristics of the TIM was more spreadable
compared to BN compounded TIM which was too viscous. Thus,
besides the intrinsic thermal conductivity factor, the process ability of TIM compound is equally important to ensure a good heat
transfer mechanism.
Since, AlN showed better performance with lower junction temperature and thermal resistance, so the subsequent experiments
were carried out using AlN ller. Characteristics of AlN lled TIM
was further studied in order to observe the inuence of particle size
in enhancing the system level thermal analysis of LED packages.
Fig. 3. SEM micrographs of the AlN powder milled at different time, (a) AlN30 and
(b) AlN120.
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Fig. 8. Cumulative structure function of different particle sizes of AlN lled TIM.
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Rthreal
TJ TA
P el POpt
where Pel is the electrical power and Popt is the optical power. Considering optical power in the thermal resistance calculation according to Eq. (1) yields the real thermal resistance values.
Fig. 10 shows the cumulative structure function of AlN30, with
and without optical correction. It was found from Fig. 10 that a combined measurement of thermal and optical gave a signicant difference in the transients where the curves shift to the right. Thermal
resistance increases approximately 5.61 K/W with optical correction. The presence of optical power reduces the heat power and
eventually increases the total thermal resistance of the device under
test where thermal resistance can be obtained. Thus, next experiment was carried out as a combined measurement of thermal and
radiometric to produce more accurate thermal resistance values.
3.2.5. Effect of increasing current
Fig. 11 shows the cumulative structure function of AlN30 TIM
with different current.
The driving current was increased from 150 to 350 mA at an
interval of 100 mA at ambient temperature of 25 C.
As observed from Fig. 11, the transients of all three samples follow the same pattern form junction to ambient denoting that the
TIM has got insignicant inuence on the increasing driving
current.
Fig. 9. Dispersion of AlN particles into the thermal paste (a) AlN30, (b) AlN60 and
(c) AlN120.
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Fig. 10. Cumulative structure function of AlN30, with and without optical
correction.
4. Conclusion
A comparison between AlN and BN as llers into commercially
available thermal paste employed is reported in this paper. The
compounded mixtures were used as thermal interface material
for effective heat dissipation of CREE MX6 LED. Among AlN and
BN llers, AlN TIM achieved less LED junction temperature with
a difference of 2.20 C compared to BN lled TIM. This is obviously
because of their respective thermal conductivity values. From AlN
llers of different particle sizes, it was found that among AlN30,
AlN60 and AlN120 llers, the AlN30 TIM exhibits the lowest
junction temperature of 38.49 C and the lowest total thermal
resistance of 11.33 K/W as compared to the other two llers.
In a nut shell, employing llers incorporated TIM results as one
of the improved methods in thermal management of power LEDs.