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DOI: 10.1002/adma.201401641
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knowledge, this is the first reported PCE above 10% for solar
cells based on Pb/Sn alloy perovskites.
Unlike recently reported high-performance planar heterojunction perovskite solar cells requiring metal oxide layers and/
or vapor deposition,[13,34,35] our method is a simple solution process. Regardless of the improved performance, development of
this system provides a better understanding of the effect of Pb
substitution in organometal perovskites and it may eventually
lead to completely Pb-free systems to achieve the cost-effective
production of high efficiency and environmentally benign
photovoltaics.
Understanding the effect of Sn on perovskite crystallization is critical for controlling film morphology and thus device
performance. Therefore, we have systematically studied the
structure and morphology of organolead perovskites with differing concentrations of Sn. X-ray diffraction patterns of pure
and mixed Pb/Sn perovskites, CH3NH3Pb1aSnaI3xClx, deposited on PEDOTS:PSS/ITO substrates are shown in Figure S1,
where a = 0, 0.15, 0.5, 0.75, and 1. Calculated space groups and
lattice parameters are summarized in Table 1.
Within the full range of composition, all samples can be
indexed according to the perovskite structure. As a increases
from 0 to 1, corresponding to CH3NH3PbI3xClx (MAPbX)
and CH3NH3SnI3xClx (MASnX), a phase transition is clearly
observed. It has been reported that pure MAPbX and MASnX
have tetragonal I4cm and P4mm symmetry respectively at room
temperature.[21] Figure S2 shows an enlarged view of 2225
2. There are two peaks within this range when a 0.5, which
could be indexed to (211) and (202) planes in the tetragonal
I4cm space group, agreeing with the reported MAPbI3 structure
at room temperature.[36] The two peaks gradually disappear and
a single peak rises up corresponding to the (113) plane in the
P4mm space group when a becomes greater than 0.5 due to
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Figure 1. From left to right, SEM image for cross section, device configuration of planar heterojunction solar cell, and the crystalline structure for
MAPb1aSnaX.
Sn at%
Pb at%
Space Group
a ()
b ()
c ()
12.568
I4 cm
8.920
8.920
MAPb0.85Sn0.15X
0.12
0.88
I4 cm/P4mm
8.871
8.871
12.510
MAPb0.5Sn0.5X
0.44
0.56
I4 cm/P4mm
8.838
8.838
12.434
MAPb0.25Sn0.75X
0.75
0.25
P4 mm
6.258
6.258
6.681
P4 mm
6.220
6.220
6.708
MAPb0Sn1X
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Figure 2. (a) and (b) XRD spectra for MAPbX and MAPb0.85Sn0.15X films respectively. (c) SEM images for MAPbX and MAPb0.85Sn0.15X films. (d) EDS
elemental maps of Pb and Sn in MAPb0.85Sn0.15X.
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ions in the precursor solutions immediately begin to selfassemble into the perovskite structure as is evidenced in the
XRD patterns for both MAPb0.85Sn0.15X and MAPbX measured
before annealing (Figure S3). The alteration in transformation kinetics induced by tin inclusion is evident in the massive
increase in the (110) reflection 14.2 2 after being annealed for
30 min in MAPb0.85Sn0.15X relative to MAPbX, which indicates
more rapid transformation. Peaks corresponding to both iodide
and chloride based organometal perovskites (at 2 = 14.2 and
15.9, respectively)[13,38] are evident in MAPb0.85Sn0.15X and
MAPbX at initial stage and after 30 min of annealing while only
the reflection corresponding to the iodide based organometal
perovskite remains after annealing for 120 min.
This indicates that in addition to being exist in the final
iodide based perovskite as substitutional impurities, chloride
ions also alter the transformation pathway during annealing
by introducing the competing chloride based perovskite phase.
This alteration in growth pathway likely influences overall
transformation kinetics in addition to modulating the resulting
morphology as compared to pure lead systems, but as of now
the exact mechanism by which chloride inclusion enhances
ultimate material properties is inadequately understood and an
area of active research in the field.[25,38,39] It is understood from
current literature that chloride ions preferentially occupy axial
positions in the mixed I/Cl lead octahedra within the perovskite
lattice while iodide ions may occupy both equatorial and axial
positions,[13,38] however it is difficult for us to make any conclusion to this end in this work. It seems apparent that tin inclusion suppresses the formation of the chloride based perovskite
lattice by virtue of the decreased peak height at 15.9 2 at
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Figure 3. Top images show the morphologies of MAPb0.85Sn0.15X films for annealing times of 0 min, 30 min, and 120 min. Bottom images show the
morphologies of MAPbX in the same manner. The scale bars indicate 5 m.
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acid.[40] We surmise that an analogous loss mechanism is relevant for excess chloride in both MAPbX and MAPb1aSnaX
and we present this in Scheme S1. Thus, we conclude the trend
of morphological changes should not be relevant to the loss
of chloride since it is a common phenomenon observed in all
systems.
To appreciate the implications of these compositional trends,
it is necessary to understand the physical mechanism behind
SEM EDS, which is shown in Figure S5. The generated characteristic X-ray emission enables elemental analysis. The pearshaped character of the detection volume in EDS means that
this technique acquires more signals from a samples bulk
than its surface. Note that the electron accelerating voltage in
our EDS measurement is 15 keV, which means a penetration
depth of few micrometers, much greater than the thickness
of our perovskite films (350450 nm). Therefore, it is reasonable to propose that the elemental ratios reported above and in
Table 1 are most representative of the composition at the base
of the growing perovskite film, an event that is preferentially
initiated at the substrate/perovskite interface. Summarizing the
above data with this in mind, we observe an abnormally high
concentration of Sn and Cl at the substrate interface in the as
cast specimens which we thought it is due to initiation of the
nucleation process, suggesting a Sn-Cl bond generation event
before other bonds formation. This explains why the bulk of
the sample in Figure 3a has a much higher concentration of
Sn2+ and Cl than the theoretical value.
All the above demonstrates the unique influence of Sn2+ on
nucleation and growth behavior of these hybrid perovskites.
Figure 4. (a) UV-vis absorption spectra, (b) EQE results and (c) JV curves for MAPbX and MAPb0.85Sn0.15X measured under simulated AM1.5 illumination and in the dark, (d) The relationship between 1/Rs and light intensity for MAPbX and MAPb0.85Sn0.15X devices.
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Voc (V)
FF
Jsc (mA/cm2)
PCE (%)
0.91 0.02
0.52 0.025
13.3 1.0
15% Sn perovskite*
0.76 0.01
0.66 0.008
19.1 0.2
50% Sn perovskite
0.24 0.03
0.53 0.010
0.7 0.1
0.11 0.02
75% Sn perovskite
0.06 0.02
0.25 0.035
3.5 0.8
0.06 0.03
100% Sn perovskite
0.03 0.02
0.25 0.016
5.3 2.0
0.04 0.01
Pure Pb perovskite
*The
which is one of the broadest EQE ranges achieved in highperformance hybrid perovsktie solar cell.[11,23,3033] Peak EQE
exceeds 80% near 450 nm, and across the entire range tested
(330 nm to 900 nm) the MAPb0.85Sn0.15X device shows marked
enhancement compared to the MAPbX device.
Figure 4c shows current density-voltage (JV) curves measured under simulated AM1.5 illumination (100 mW/cm2) and
in the dark, respectively. Both perovskites show good diode
behavior with relatively low leakage current in the dark JV
curves. The MAPb0.85Sn0.15X perovskite solar cell exhibits a
short-circuit current dentsity (Jsc) of 19.5 mA/cm2, an opencircuit voltage (Voc) of 0.77 V, and a fill factor (FF) of 0.67,
yielding an overall power conversion efficiency (PCE) of 10.1%.
Relevant results for the MAPbX perovskite solar cell are Jsc =
14.5 mA/cm2, Voc = 0.92 V, and FF = 0.55. The MAPb0.85Sn0.15X
device shows a remarkably improved Jsc, which agrees well with
its broadened absorption and superior EQE. In addition to the
substantial increase in Jsc, Sn substitution enables a significant
FF improvement from 0.55 to 0.67. As both devices are fabricated with the same architecture, electrode and base contact
resistances are consistent. Thus, the increase in FF points to a
decrease in internal and interfacial resistances of the perovskite
absorber in MAPb0.85Sn0.15X due to the greatly improved perovskite film quality and coverage as compared to the pure lead
based control.
As evidenced in the results from XRD and SEM, the
MAPb0.85Sn0.15X film possesses much enhanced crystallinity
and surface coverage compared to those from the pure Pb
sample, suggesting a more ordered arrangement of atoms and
less defects. Shown in Figure 4d is the plot 1/Rs vs. light intensity, where the series resistance (Rs) is estimated from the slope
of the JV curve near Voc. As can be seen, MAPb0.85Sn0.15X has
a steeper slope than MAPbX, suggesting that carrier transport
is significantly improved via partially replacement of Pb2+ with
Sn2+. It can be speculated that the improved film coverage and
homogeneity enable more effective exciton dissociation and
facilitate the charge transport across the interfacial layers to
the electrodes while the poor film formation and coverage will
induce severe charge recombination. When a 0.5, Voc dramatically decreases. Takahashi et al. has attributed this to Sn2+
oxidation and the associated p-type doping.[22] Moreover, poor
fill factors with a 0.5 can be easily explained by consistently
inferior film quality as is evident in Figure S4.
In conclusion, we have demonstrated the success of partial Sn substitution in organolead perovskites to simultaneously reduce Pb content and increase performance through
broadened absorption and improved solution-cast film
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Table 2. Performance of the studied solar cells under AM 1.5G Illumination (100 mW/cm2).
Experimental Section
Materials and Sample Preparation: Methylammonium iodide (MAI)
was synthesized by reacting 24 mL, 0.20 mole methylamine (33 wt% in
absolute ethanol, Aldrich), 10 mL, 0.04 mole hydroiodic acid (57 wt%
in water with 1.5% hypophosphorous acid, Alfa Aesar), and 100 mL
ethanol in a 250 mL round bottom flask under nitrogen protection at
0 C for 2 h with magnetic stirring. After reaction, the white precipitate
of MAI was recovered by rotary evaporating solvents at 40 C then
dissolved in ethanol and sedimentated in diethyl ether by stirring the
solution for 30 min. This step was repeated three times then the MAI
powder was collected and dried at 50 C in a vacuum oven for 24 h.
To prepare perovskite precursor solution, MAI and lead chloride (PbCl2,
98%, Aldrich) powder were mixed in anhydrous dimethylforamide
(DMF, Aldrich) with a molar ratio of 3:1. For the Sn-based perovskite
precursor solution, MAI, PbCl2, and Tin Chloride (SnCl2, 98%, Aldrich)
powder were mixed with desired molar ratio. The solutions (40 wt%)
were stirred overnight at 80 C and filtered through 0.45 m PVDF filters
before device fabrication.
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Fabrication of the Thin Film Perovsktie Devices: The thin film perovskite
devices were fabricated with the configuration: indium tin oxide (ITO)/
poly(3,4-ethylenedioxythiophene):poly(p-styrene sulfonate) (PEDOT:PSS,
CLEVIOSTM P VP Al 4083)/CH3NH3Pb1aSnaI3xClx/[6, 6]-phenyl-C61
-butyric acid methyl ester (PCBM, American Dye Source Inc.)/fullerene
surfactant (C60-bis)/Ag. ITO glass substrates (15 ohm/sq) were cleaned
sequentially by sonication in detergent and deionized water, acetone,
and isopropanol for 10 min. After drying under N2 stream, substrates
were further cleaned by exposing to plasma for 10 s. A PEDOT:PSS
(Baytron P VP Al 4083 filtered through a 0.45 m Nylon filter) holetransporting layer with a thickness of 45 nm was spin-coated onto ITO
substrates at 5k rpm for 30 s and annealed at 150 C for 10 min in air.
The substrates were then transferred into a N2-filled glove box, spincoated with prepared precursor solution at 6k rpm for 45 s, and annealed
at 90 C for 2 h. The thickness of the studied perovskite thin films is
around 350450 nm, determined by surface profiler (Dektak 3030).
The electron-transporting layer (PCBM, 15 mg/mL in chloroform) and
C60-bis surfactant (2 mg/mL in isopropyl alcohol) was then sequentially
deposited by spin coating at 1 k rpm for 60 s and 3k rpm for 60 s,
respectively. Silver electrodes with a thickness of 150 nm were deposited
under high vacuum (<2 106 Torr) through a shadow mask, defining
a device area of 3.14 mm2, by thermal evaporation. All JV curves in
this study were recorded using a Keithley 2400 source meter unit. The
device photocurrent was measured under AM1.5 illumination condition
at an intensity of 100 mW/cm2. The illumination intensity of the light
source was accurately calibrated with a standard Si photodiode detector
equipped with a KG-5 filter, which can be traced back to the standard cell
of the National Renewable Energy Laboratory (NREL). The EQE spectra
performed here were obtained from an IPCE setup consisting of a Xenon
lamp (Oriel, 450 W) as the light source, a monochromator, a chopper
with a frequency of 100 Hz, a lock-in amplifier (SR830, Stanford Research
Corp), and a Si-based diode (J1157111-Si detector) for calibration.
Supporting Information
Supporting Information is available from the Wiley Online Library or
from the authors.
Acknowledgements
The authors thank the support from the Air Force of Scientific Research
(FA95500910426), the Office of Naval Research (N00014111
0300), the Asian Office of Aerospace R&D (FA23861114072), the
Boeing Foundation, and the National Science Foundation Graduate
Research Fellowship Program under Grant No. DGE-1256082. Part of
this work was conducted at the University of Washington NanoTech User
Facility, a member of the NSF National Nanotechnology Infrastructure
Network (NNIN).
Received: April 11, 2014
Revised: May 30, 2014
Published online: August 14, 2014
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