IEC 61850 Testing - Equipment

Requirements and Tools

IEC 61850 Seminar

Dr. Alexander Apostolov

K02 03 20060309

Page: 1

OMICRON

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Intelligent Substation Automation Systems

Comms Gateway

Intelligent Sensor
Control

Status

Advanced
Merging Unit

LAN
Switch

Advanced
Merging Unit

Configuration Tools

Communications
Based Protection IED
Communications
Based Control IED

Intelligent Sensor
Status

Advanced
Merging Unit
Protection
IED

Analysis Tools

Communications
Based Protection IED

Protection
IED

Control

HMI

Communications
Based Control IED
Protection
IED

Communications Based
Monitoring/Recording IED
Communications Based
Monitoring/Recording IED
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Intelligent Substation Automation Systems

IMED

IMED

IMED

IMED

IMED
IMED

Substation
Substation
Substation
Computer
PCMR
Unit
Computer

IMED

IMED

IEC 61850

IMED
IMED

IMED

IMED

IMED

OMICRON

IMED

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Intelligent Substation Automation

Systems
Substation HMI
Substation Protection, Control,
Monitoring & Recording (PCMR)
Bay PCMR

Bay PCMR

Device PCMR Device PCMR Device PCMR Device PCMR

OMICRON

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Substation Communications Architecture

Substation
HMI

Substation
Computer
Router

Ethernet Switch

IED

IED

MU

IOU

Substation Bus

IED

Ethernet Switch

WAN

IED

SCADA Master

Process Bus

IOU

MU
OMICRON

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Quality Process

OMICRON

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Type test
The verification of correct behavior of
the IEDs of the SAS by use of the
system tested software under the
environmental test conditions
corresponding with the technical data.
Marks the final stage of the hardware
development and is the precondition
for the start of the production.
Type test must be carried out with IEDs
that have been manufactured through
the normal production cycle

OMICRON

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System test
System test is used to check the
correct behavior of the IEDs and of the
overall SAS under various application
conditions.
The system test marks the final stage
of the development of IEDs as part of a
SAS product family

OMICRON

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Factory Acceptance Test (FAT)

The factory acceptance test (FAT) is a
customer agreed functional tests of the
specifically manufactured SASinstallation or its parts, using the
parameter set for the planned
application.
This test should be carried out in the
factory of the system integrator by the
use of process simulating test
equipment

OMICRON

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Site Acceptance Test (SAT)

The site acceptance test (SAT) is the
verification of each data and control
point and the correct functionality
inside the SAS and between the SAS
and its operating environment at the
whole installed plant by use of the final
parameter set.
The SAT is a precondition for the SAS
being put into operation

OMICRON

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Test responsibilities
The manufacturer is responsible for the
correct handling of type tests and
system tests of his individual products
and the SAS product family.
Type tests and system tests are
preconditions for starting the regular
delivery.
All IEDs have to pass device specific
routine tests defined by the
manufacturer to ensure quality before
the products are handed over for
delivery.

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Test responsibilities
Customer specific verifications and
approvals may be required according to
the customers philosophy and shall be
negotiated between the system integrator
and the customer.
The system integrator is obliged to prepare
and carry out these special investigations
with individual products and the overall
SAS.
The system integrator is obliged to prove
the fulfillment of the technical
requirements, including performance
criteria.
OMICRON

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Test responsibilities
When introducing an SAS, the system
integrator is responsible for ensuring that
all functions are jointly tested by the
representatives of the system integrator
and the customer
The Factory Acceptance Test (FAT) is
optional
The Site Acceptance Test (SAT) is
mandatory
Both are performed with the specific
configuration and parameter set of the
customer.

OMICRON

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Test responsibilities
The successful finishing of the FAT (if
required) is the precondition for the
equipment delivery and the further site
acceptance test at the customers
premises.
FAT and SAT, as well as their contents,
shall be negotiated between the customer
and the system integrator.
The commissioning of the SAS on site is
normally the responsibility of the system
integrator.
Commissioning is followed by a trial
operation phase.
OMICRON

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Test Equipment
Test equipment: all tools and instruments which
simulate and verify the input/outputs of the operating
environment of the SAS such as switchgear, transformers,
network control centers or connected telecommunication
units on the one side, and the communication channels
between the IEDs of the SAS on the other

The test equipment shall support:

normal process simulation
transient and fault process simulation
communication check and simulation

OMICRON

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Normal Process Test Equipment

Basic Process test equipment must be
able to provide:
all alarms and position indications for the
substation control system
enable the simulation of measured values
(including overrange)
be able to display all commands from the
SAS.

OMICRON

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Normal Process Test Equipment

More complex test equipment must be
able to simulate reactions of the
switchgear in real time.
There is a need to be able to generate
various conditions for the reactions,
such as to simulate an earth fault on
one busbar section during a switching
sequence.
Test equipment should also be capable
of generating a large quantity of data
traffic in a short time or intermittent
data traffic on a regular basis.

OMICRON

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Transient and Fault Test

Equipment
This test equipment should be capable of injecting
programmable transients of voltages and currents
in a three-phase power system. It shall allow the
simulation of many kinds of faults or other
abnormal conditions such as:

Short circuit faults

Power swing
Saturation of current transformers
Others

The test equipment should be capable of producing

simulated faults, thus producing disturbance
records.

OMICRON

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Communications Test
Equipment
This test equipment is used for performing tests at
all communication channels for:
internal links of the SAS
telecommunication

The communication test system should be a

convenient and efficient tool which enables the
performance of the following functions at all
required levels (network control center, substation,
bay and process level):
simulation of a server, simulation of a client, monitoring of
the data traffic;
quality analysis of the data traffic (for example, the quality
of electrical signals, time breaks, etc.).

OMICRON

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Basic Test Requirements

The manufacturer should provide a test concept that
covers all activities beginning with prototype
functional tests in the development state to the final
type and system tests.
The scope and object of tests, the test procedures
and the passing criteria must be specified.
All tests shall be documented in such a way that the
results are reproducible.
All tests should be performed by an internal part of
the manufacturers organization that is qualified for
performing the tests and has the organizational
independence to state whether a product has passed
the tests or not.

OMICRON

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System Test Requirements

The system test is the proof of correct functionality
and the performance of each IED under different
application conditions (different configuration and
parameters) and in co-operation with other IEDs of
the overall SAS product family including all tools.

OMICRON

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Type Test Requirements

The fitness for use of a newly designed
product shall be proven by a type test.
The type test shall be performed using
samples from the manufacturing process.
The type test is the verification of the
product against the technical data which
are specified, such as:
mechanical withstandability
electromagnetic compatibility
climatic influences
functional correctness and completeness

OMICRON

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Routine Test Requirements

The routine test consists of special
hardware and functionality tests
The routine tests should be carried out for
each product before leaving the
manufacturer.
Routine tests include:
Function tests
Insulation test
Burn-in test

OMICRON

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Conformance Test
The conformance tests are performed on
the communication channels of IEDs.
They include the verification of the
communication procedure in accordance
with the standard or its parts.
Conformance Testing is defined in IEC
61850 -10.

OMICRON

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Required documentation
Model Implementation Conformance
Statement (MICS): details the standard data
object model elements supported by the
system or device
The Protocol Implementation Conformance
Statement (PICS) is a summary of the
capabilities of the system to be tested.
Protocol Implementation eXtra Information for
Testing (PIXIT) contains system specific
information regarding the capabilities of the
system to be tested and which are outside the
scope of the 61850 standard. The PIXIT shall
not be subject to standardisation.

OMICRON

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Conformance Test Process

OMICRON

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Conventional Multifunctional
IED Performance
Process

Analog
Sensor

Sensor
Module

Function
Module

Outputs
Module

Process
Control

Process
Status
Sensor

Input
Module

Multifunctional
IED

Process
Event Start

tSM

Event End

tFM

tOM

tPC

tEVT

OMICRON

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IEC 61850 Based Hybrid

Function Performance
Process
Merging Unit
Analog
Sensor

Status
Sensor

Protection IED

Sensor
Module

Interface
Module

Input
Module

Interface
Module

Interface
Module

LAN
Switch

Function
Module

Outputs
Module

Process
Control

Input/Output Unit

Process

Process

Event Start

tSM

Event End

tIM1

tLAN

tIM2

tPM

tOM

tPC

tEVT

OMICRON

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IEC 61850 Based Hybrid Function Performance

Process
Merging Unit
Analog
Sensor

Sensor
Module

Interface
Module

LAN
Switch

GOOSE
Interface
Module

SAV
Interface
Module

Protection IED

Function
Modules

Outputs
Module

Process
Control

Process
OMICRON

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IEC 61850 Based Function Performance

Process
Merging Unit

Protection IED

Analog
Sensor

Sensor
Module

Interface
Module

Status
Sensor

Input
Module

Interface
Module

Process

Outputs
Module

Interface
Module

LAN
Switch

Function
Module

Control Interface
Unit

Process
Control
Event Start

tSM

Event End

tIM1

tLAN1

tIM2

tFM

tIM3

tLAN2

tIM4

tOM

tPC

tEVT

OMICRON

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Functionality

Protection
Control
Monitoring
Recording
Analysis
Metering
Remote interface

OMICRON

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Conventional Functional Test

Setup

Multifunctional
IED
V

52a Trip

Test
Device

Laptop
Computer

OMICRON

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Test setup
Ethernet
Switch

Laptop
Computer

GOOSE
or GSSE
GOOSE
or GSSE

Ethernet
IEC 61850
Based IED
V

Ethernet

Trip

IEC 61850
Based Test
Device

OMICRON

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Test setup
Laptop
Computer
Ethernet
Switch
Ethernet

GOOSE
or GSSE

IEC 61850
Based MU
V

Ethernet

GOOSE
or GSSE

IEC 61850
Based IED
Trip

IEC 61850 Based

Test Device

OMICRON

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NET-1 Option for the CMC 256

OMICRON

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NET-1 Option for the CMC 256

OMICRON

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Protection Testing
Conventional Hard-Wired
Protection
Sampled Values
Relay

Test Set

Hard-wired
Analog
Signals

Hard-wired
binary outputs to binary inputs

GSE

OMICRON

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The Vision: Fully Networked

Protection Testing
GOOSE, GSSE
Protection
Relay

Test Set

SV (Sampled Values)

OMICRON

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The GOOSE Module

OMICRON

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GOOSE Module Functions

Configuration of the CMC 256 + NET-1
Subscriptions
Simulations (Publishing GOOSE)

Editing GOOSE Data

GOOSE Parameters
Datasets

Mapping
To / from binary Inputs / Outputs

Importing GOOSE Data from SCL

OMICRON

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OMICRON's Layering
Test Modules

Binary Inputs

Binary Outputs

Mappings
GOOSE
Subscriptions

GOOSE
Simulations

Network

OMICRON

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Getting the GOOSE Data

Import SCL File
File | Import Configuration
SCL File (*.icd, *.cid, *.scd)

All GOOSE Data are imported

Both for Subscription and Simulation
Delete what is not needed / wanted
New Import adds Data again

Eventually Edit GOOSE Data

OMICRON

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GOOSE Parameters
Identification
(GOOSE
Header)
Dataset
(Payload)

OMICRON

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Mapping is Simple

OMICRON

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Virtual Wiring
GOOSE Configuration is
another Type of HCC
Binary I/Os of Test Set are assigned
Fully Automatic
Totally virtual
No changing of Wires
No User Interaction

OMICRON

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Multiple GOOSE Mappings

Map only Data
needed for a Specific Test
Re-Assign Binary I/Os of the Test
Set as needed
Fully automatic

Use Standard Assignments

Bin In 1 = Trip
Bin In 2 = Start
Minimal Setup Work
Re-use of Existing Test Plans

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Test setup

OMICRON

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Test results

OMICRON

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The IEC 61850 Functional System Test

ICD
File

ICD
File

IEC 61850
Standard System
Configuration Tool

SCD
File

Network
System
Simulator

Scheme
Testing Tool

IEC 61850
Standard Test
Configuration
Tool

Other Test
Modules
IED
IED
IED
Simulator
Simulator
Simulator
MU
MU
Simulator
MU
Simulator
Simulator

Test Device

OMICRON

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The IEC 61850 Functional System Test

IEC 61850
Standard System
Configuration Tool

Network
System
Simulator

IEC 61850
Standard Test
Configuration
Tool

SCD
File

IEC 61850
Standard IED
Configuration
Tool

Scheme
Testing Tool

Other Test
Modules
IED
IED
IED
Simulator
Simulator
Simulator
MU
MU
Simulator
MU
Simulator
Simulator

CID
CID
File
CID
File
File
Test Device
Test Device
Test Device

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