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TABLE OF CONTENT
SECTION 1. Bipolar Junction Transistor.............................................................................................................................. 3
1.1. Device Operation: An Introduction ................................................................................................................................... 3
1.2. BJT Amplifier .................................................................................................................................................................... 4
1.2.1. Common-Emitter (CE) Amplifier................................................................................................................................. 4
1.2.1.1. DC Operating Point ............................................................................................................................................... 13
1.2.1.2. AC Analysis........................................................................................................................................................... 19
1.2.1.3. AC Analysis: small signal circuit parameters........................................................................................................ 25
1.2.1.4. Maximum Output Signal Swing ............................................................................................................................ 30
1.2.2. Common-Emitter (CE) Amplifier with ac-coupled input and output ........................................................................ 33
1.2.2.1. AC Coupling of Input and Output for vin and vout .................................................................................................. 33
1.2.2.2. DC Operating Point ............................................................................................................................................... 37
1.2.2.3. AC analysis (ac coupled vin and vout) ..................................................................................................................... 38
1.2.2.4. AC Analysis: small signal circuit parameters: (ac coupled vin)............................................................................. 40
1.2.2.5. Effect of Base-width modulation or Early effect .................................................................................................. 44
1.2.2.6. AC analysis with Base-width modulation effect ................................................................................................... 46
1.2.2.7. AC Analysis (using transconductance): small signal circuit parameters with base-width modulation ................ 48
1.2.3. Common-Emitter (CE) Amplifier: Various schemes of Base-bias ............................................................................ 52
1.2.3.1. Base-voltage biasing using single base-resistor and independent voltage-source ................................................ 53
1.2.3.2. Base-voltage biasing using voltage-divider bias ................................................................................................... 55
1.2.4. Common-Emitter (CE) Amplifier using Emitter Resistor.......................................................................................... 55
1.2.4.1. DC Operating Point ............................................................................................................................................... 56
1.2.4.2. AC Analysis: small signal circuit parameters with base-width modulation ......................................................... 58
1.2.4.3. AC Analysis : Alternative approach using transconductance, gm ......................................................................... 62
1.2.5. BJT Amplifier having load-resistor and source-resistor in the circuit ....................................................................... 65
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1.2.5.1. DC Operating Point ............................................................................................................................................... 67
1.2.5.2. AC Analysis: small signal circuit parameters with base-width modulation ......................................................... 68
SECTION 2. Metal Oxide Semiconductor Field Effect Transistor ................................................................................... 75
2.1. Device Operation: An Introduction ................................................................................................................................. 75
2.1.1. Device structure: ......................................................................................................................................................... 75
2.1.1.1. Metal Oxide Semiconductor (MOS) Capacitor ............................................................................................... 75
2.1.1.2. Drain / Source Region and Contacts...................................................................................................................... 75
2.1.1.3. Device structure as a whole ................................................................................................................................... 75
2.1.2. Device electrical operation ......................................................................................................................................... 77
2.1.2.1. MOS Transistor in cut-off ..................................................................................................................................... 77
2.1.2.2. MOS Transistor turned-on and in non-saturation.................................................................................................. 78
2.1.2.3. MOS Transistor turned-on and in saturation ......................................................................................................... 81
2.2. MOSFET Amplifier ......................................................................................................................................................... 87
2.2.1. Common-Source (CS) Amplifier................................................................................................................................ 87
2.2.2. DC operating point...................................................................................................................................................... 91
2.2.3. AC analysis ................................................................................................................................................................. 93
2.2.3.1. Circuit transconductance, gm ................................................................................................................................. 96
2.2.3.2. Drain-to-source small-signal resistance, ro or rds ................................................................................................... 99
2.2.3.3. small-signal parameters: voltage gain and input/output impedance ................................................................... 103
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SECTION 1. BIPOLAR JUNCTION TRANSISTOR
1.1. Device Operation: An Introduction
Note: To be inserted.
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1.2. BJT Amplifier
1.2.1. Common-Emitter (CE) Amplifier
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Base-current = IB + ib
Collector-current = IC + ic
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iC I S e v BE
VT
I S vBE
i
o B e
VT
I S vBE VT
i
o E e
o
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Figure 1-4. Large-signal behaviour small-signal (fluctuation of v and i) behaviour superimposed on the static (DC
operating point) behaviour
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I S e vBE
I
v BE
I
C v BE B v BE
VT
VT
VT
i B
v BE VT vbe
IB
ib
i B
VT
r = small-signal fwd-bias resistance
IB
VT
o Collector current/voltage:
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iC I S e vBE
I
i
iC
C g m c , transconductance in CE configuration
v BE VT
vbe
VT
v BE I C
v BE
VT
VT
iC I C
iB I B
i E
i E
IC I B
I
I
v BE C v BE B v BE
VT
VT
VT
i E
IC
I
v BE B v BE
VT
VT
I S e vBE
VT
ic iC
ib iB
I
v BE
I
C v BE E v BE
VT
VT
VT
ie ic i b
Summary:
v
VT
r be
IB
ib
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Device-transconductance in CE configuration
IC
i
gm c
VT
vbe
ic i b , ie ic i b
(B)
(C)
small-signal current-voltage
(B)
IC
(C)
VBE (ON)
(E)
(E)
VBE(ON) >= V[cut-in]
In piecewise-linear
model of BE fwd-bias
junction
IE
fwd-bias diffusionresistance of BE
junction
Figure 1-5. small-signal (fluctuation of v and i) behaviour superimposed on the static (DC operating point) behaviour
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1.2.1.1. DC Operating Point
Figure 1-6. DC Analysis of the circuit in Figure 1-2: replace all the time-dependent voltage / current sources with
their respective average value (= 0V and = 0A, by definition of small-signal average values)
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o Note: if VBB < VBE(ON), IB = 0
BE junction is not turned ON
BJT is still in CUT-OFF mode (minority carrier injection into Base region from Emitter 0)
3. DC controlled current at Collector:
o IC = IB
o Note: assuming BJT in forward-active region of operation (which has to be verified from the VCE voltage)
4. DC voltage across the Collector and Emitter set by the DC load-line:
o VCE = VCC - IC RC
o Note: verify if BJT is indeed in forward-active region of operation by checking VCE > VCE,SAT
where VCE,SAT 0.2V
The IB, IC, VCE, VBE values at the DC operating point are also designated as IBQ, ICQ, VCEQ, VBEQ (i.e. the IB, IC, VCE, VBE
values at Quiescent-point or Q-point)
Note:
I S vBE
i
Comparison between VBE(ON) 0.7V (piecewise-linear for BE junction) vs. the large-signal model B e
o Base-current in piecewise-linear (used for hand calculation of bias I-V values), IB1 = (VBB 0.7) / RB
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VT
EC21003 Introduction to Electronics Notes: Working Document - Last updated 29 Oct 2009
S
o Base-current from iB e
vBE
VT
where, IB0 needs to be solved by iteration (since, no closed-form solution of the above transcendental equation is
available)
o Example: IS = 10-15 A, = 100
For IB ~ 1 uA, 10 uA, 100 uA VBE(ON) ~ 0.66 V, 0.72 V, 0.78 V (0.78V will take BJT near saturation)
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Figure 1-8. DC equivalent ckt and small-signal equivalent ckt of B-E fwd-bias junction
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1.2.1.2. AC Analysis
RC
(C)
VCC
(B)
RB
(E)
VBB
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Figure 1-10. Visualizing small-signal operation for the circuit in Figure 1-2: Replace all the static or DC voltage /
current values calculated from DC-analysis with 0V and 0A (i.e. not contributing in voltage / current fluctuation in
small-signal, by definition) and then include all time-dependent small-signal voltage / current sources
small-signal current-voltage in BJT
(B)
(C)
(E)
Figure 1-11. small-signal equivalent circuit using and alternative representation using transconductance gm
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Figure 1-12. small-signal current and voltage around the DC operating point
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Figure 1-13. small-signal analysis at the DC operating point for the circuit in Figure 1-2
Small-signal analysis:
o Objective is to find out i-v relationship at the DC operating point, after forcing the assumption i,v values are small
changes around the DC bias values, so that the small-signal i,v values can be superimposed on DC I-V values (
linearizing the circuit around the DC operating point or DC bias point)
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o Note: What if i, v values are large?
In forward-active region of operation, the small-signal assumption may still be used to predict the first-order /
primary behaviour of current-voltage in the circuit. ( used in designing circuit using hand calculation)
However, there will be higher-order effects affecting the i, v values ( the effects are included in circuit simulation
to predict the accurate current voltage values)
Figure 1-14. small-signal analysis (alternative diagram) at the DC operating point for the circuit in Figure 1-2
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Note:
o AC load-line vs. DC load-line:
They are identical unless, we are bypassing any of the DC-biasing resistor using shunt-capacitor across the resistor
in small-signal operation (at a frequency away from f = 0 Hz).
[See more later on using an Emittor-resistor (RE) and bypassing it using an Emitter capacitor (CE) for ac operation ]
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Figure 1-15. ac load-line is different from DC load-line if using shunt bypass cap. across any bias resistor
1.2.1.3. AC Analysis: small signal circuit parameters
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[ib / vbe]
where,
[ part 1 ] : fraction of vin getting applied across BE junction as the small-signal vbe
[ part 1 ] x [ part 2 ]: current injected into Base as the small-signal ib
[ part 1 ] x [ part 2 x [ part 3 ]: corresponding controlled current appearing at the Collector of BJT as the smallsignal ic
[ part 1 ] x [ part 2 x [ part 3 ] x [ part 4]: the voltage drop developed across RC as the small-signal vout, (-1
denoting the reversal of vout phase w.r.t. vin phase)
Av as RC
[ic / ib]
[iout / ic]
where,
[ part 1 ] : fraction of iin getting injected into Base
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[ part 1 ] x [ part 2 ]: corresponding controlled current appearing at the Collector of BJT as the small-signal ic
[ part 1 ] x [ part 2 ] x [ part 3 ]: fraction of ic delivered to the external resistors. (-1 representing the direction of
iout opposite to that of ic)
Small signal input resistance, Rin = vin / iin , having the load-resistor (not the circuit biasing resistors), if any, removed
o From Figure 1-21, the circuit does not include any load-resistor
o Rib = vbe / ib = r
o Rin = vx / ix = RB + Rib = RB + r
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Figure 1-16. small-signal resistance looked from input for Figure 1-2
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Figure 1-17. small-signal resistance looked from output for Figure 1-2
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1.2.1.4. Maximum Output Signal Swing
IC
IC = VCC / RC
(VCEQ, ICQ)
IB = IBQ
VCC
VCE
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VCE,SAT ~ 0.2 V
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Figure 1-19. output signal-swing (Vpeak) with signal distorted and clipped at VCE(sat)
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o Max. o/p signal swing = smaller of ( (VCC - VCE) and (VCE - VCE, SAT) ) [Vpeak]
=> 2 x smaller of ( (VCC - VCE) and (VCE - VCE, SAT) ) [Vp-p]
1.2.2. Common-Emitter (CE) Amplifier with ac-coupled input and output
1.2.2.1. AC Coupling of Input and Output for vin and vout
AC coupling of input:
o In Figure 1-2, the input signal source vin has two floating nodes and it is connected in series
o Alternative connection is to connect vin through an ac coupling capacitor as shown in Figure 1-21
o Often the input is available having single-ended, where one-end is signal and the other end goes to GND reference
of the entire circuit.
o Second, if there is a DC component in the input signal (real-life signal generator), the DC value must be isolated
from the DC-voltage of Base-bias
o Drawback of using ac coupling capacitor:
at near-DC frequency, entire vin is not going to be transferred to the input of the gain-device (BJT) There will
be a lower cutoff frequency > 0 Hz
AC coupling of output:
o In Figure 1-2, the output signal is VC + vout a DC component is (== VC) is embedded with the signal
E.g. if we are using a 12 V power-supply (VCC = 12 V), for maximum possible signal swing, VC 0.5 VCC = 6V
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o In order to isolate the DC component output voltage (also referred to as output common-mode voltage, VOCM) of an
amplifier output from the DC-bias voltage of the subsequent amplifier (or any other circuit), vout is taken through an
ac coupling capacitor as shown in Figure 1-21
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Figure 1-22. BJT Circuit diagram illustrating the need for ac coupling of input and output
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1.2.2.2. DC Operating Point
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o IB = (VBB VBE(ON)) / RB
where, VBE(ON) 0.7V in case of BJT forward-active region of operation, having its BE junction in forward-bias
condition
o Note: if VBB < VBE(ON), IB = 0
BE junction is not turned ON
BJT is still in CUT-OFF mode (minority carrier injection into Base region from Emitter 0)
2. DC controlled current at Collector:
o IC = IB
o Note: assuming BJT in forward-active region of operation (which has to be verified from the VCE voltage)
3. DC voltage across the Collector and Emitter set by the DC load-line:
o VCE = VCC - IC RC
o Note: verify if BJT is indeed in forward-active region of operation by checking VCE > VCE,SAT
where VCE,SAT 0.2V
4. Max. o/p signal-swing possible without distortion / clipping
o Max. o/p signal swing = smaller of ( (VCC - VCE) and (VCE - VCE, SAT) ) [ Vpeak ]
=> 2 x smaller of ( (VCC - VCE) and (VCE - VCE, SAT) ) [ Vp-p ]
EC21003 Introduction to Electronics Notes: Working Document - Last updated 29 Oct 2009
Figure 1-24. small-signal analysis at the DC operating point for the circuit in Figure 1-21
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6. Corresponding small-signal (ac) controlled current between Collector and Emitter:
o ib
Note: assuming BJT in forward-active region of operation
7. small-signal (ac) collector current from / to the external resistor:
o ic = ib
8. small-signal (ac) voltage developed across the external resistor set by the AC load-line:
o vout = ic RC
EC21003 Introduction to Electronics Notes: Working Document - Last updated 29 Oct 2009
[ib / vin]
where,
[ part 1 ] : current injected into Base as the small-signal ib when vin getting applied across BE junction
[ part 1 ] x [ part 2]: corresponding controlled current appearing at the Collector of BJT as the small-signal ic
[ part 1 ] x [ part 2 ] x [ part 3 ] : the voltage drop developed across RC as the small-signal vout, (-1 denoting the
reversal of vout phase w.r.t. vin phase)
Av as RC
[ic / ib]
[iout / ic]
where,
[ part 1 ] : fraction of iin getting injected into Base
[ part 1 ] x [ part 2 ]: corresponding controlled current appearing at the Collector of BJT as the small-signal ic
[ part 1 ] x [ part 2 ] x [ part 3 ]: fraction of ic delivered to the external resistors. (-1 representing that the
direction of iout is taken opposite to that of ic)
Small signal input resistance, Rin = vin / iin , having the load-resistor (not the circuit biasing resistors), if any, removed
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o From Figure 1-21, the circuit does not include any load-resistor
o Rib = vbe / ib = r
o Rin = RB | | Rib = RB || r
Figure 1-25. small-signal resistance looked from input for Figure 1-21
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Small signal output resistance, Rout = vout / iout , having the vin shorted
o vin = 0 (shorted) ib = 0 ic = 0
o Roc =
o Rout = vx / ix = Roc | | RC = RC
Figure 1-26. small-signal resistance looked from output for Figure 1-21
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1.2.2.5. Effect of Base-width modulation or Early effect
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Figure 1-27. Base-width modulation effect: movement of the bias-point on VCE and the controlled current source
becoming non-ideal with a finite resistance across it
iC I S e v BE
VT
1 VCE
VA
iC I S e v BE
VT
o Finite output impedance of the controlled current-source between Collector and Emitter:
iC I S e v BE
iC I S e v BE
ro
VT
VCE I C
VCE
VA
VA
VCE V A
iC
IC
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VT
1 VCE
VA
EC21003 Introduction to Electronics Notes: Working Document - Last updated 29 Oct 2009
For VA typically > 50 V, < 250 V and Collector current ~ 1 mA, ro ~ 50 100 kOhm (large compared to
external bias resistor RC)
Note: we would like to have ro as large as possible w.r.t. the external resistors connected to the collector
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Figure 1-28. small-signal analysis at the DC operating point for the circuit in Figure 1-21
In short:
[ic / ib]
o Av = [ 1 / r ] . [ . ro / (ro + RC)]
[vout / ic]
[ RC . (-1)]
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o Av = [ro / (ro + RC)] ( RC / r)
For ro >> RC Av ( RC / r )
[ic / ib]
[iout / ic]
Small signal input resistance, Rin = vin / iin , having the load-resistor (not the circuit biasing resistors), if any, removed
o From Figure 1-21, the circuit does not include any load-resistor
o Rib = r
o Rin = RB | | Rib = RB || r
Small signal output resistance, Rout = vout / iout , having the vin shorted
o vin = 0 (shorted) ib = 0 ic = 0
o Roc = ro
o Rout = Roc | | RC = ro | | RC
For ro >> RC Rout RC
1.2.2.7. AC Analysis (using transconductance): small signal circuit parameters with base-width modulation
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Figure 1-29. Alternative small-signal analysis (using transconductance, gm) for the circuit in Figure 1-21
[ic / vbe]
. gm [ ro / (ro + RC)]
. [vout / ic]
[ RC . (-1)]
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o Av = gm [ro / (ro + RC)] ( RC ), where gm = IC / VT
Notice that gm = IB / VT = / r It leads to the previous Av expression using
For ro >> RC Av gm RC
[ic / vbe]
[iout / ic]
Small signal input resistance, Rin = vin / iin , having the load-resistor (not the circuit biasing resistors), if any, removed
o From Figure 1-21, the circuit does not include any load-resistor
o Rib = r
o Rin = RB | | Rib = RB || r
Small signal output resistance, Rout = vout / iout , having the vin shorted
o vin = 0 (shorted) ib = 0 ic = 0
o Roc = ro
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o Rout = Roc | | RC = ro | | RC
Note: for ro >> RC, Rout RC
Figure 1-30. small-signal resistance looked from input for Figure 1-21
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Small signal output resistance, Rout = vout / iout , having the vin shorted
o vin = 0 (shorted) i1 = 0 i2 = 0
o Roc = r0
o Rout = Roc | | RC = r0 | | RC
Figure 1-31. small-signal resistance looked from output for Figure 1-21
1.2.3. Common-Emitter (CE) Amplifier: Various schemes of Base-bias
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1.2.3.1. Base-voltage biasing using single base-resistor and independent voltage-source
Figure 1-32. BJT CE amplifier: Base-biasing using fixed-bias and single base-resistor
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Figure 1-33. BJT CE amplifier: Base-biasing using fixed-bias and single base-resistor Special case VBB VCC (No
independent voltage-source required for VBB)
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1.2.3.2. Base-voltage biasing using voltage-divider bias
Figure 1-34. BJT CE amplifier: Base-biasing using voltage-divider network and supply-voltage
1.2.4. Common-Emitter (CE) Amplifier using Emitter Resistor
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1. DC input current at Base:
o IB = (VBB VBE(ON)) / (RB + (1 + ) RE)
where, VBE(ON) 0.7V in case of BJT forward-active region of operation, having its BE junction in forward-bias
condition
o Note: if VBB < VBE(ON), IB = 0
BE junction is not turned ON
BJT is still in CUT-OFF mode (minority carrier injection into Base region from Emitter 0)
2. DC controlled current at Collector:
o IC = IB
o Note: assuming BJT in forward-active region of operation (which has to be verified from the VCE voltage)
3. DC voltage across the Collector and Emitter set by the DC load-line:
o VCE = VCC - IC RC
o Note: verify if BJT is indeed in forward-active region of operation by checking VCE > VCE,SAT
where VCE,SAT 0.2V
4. Max. o/p signal-swing possible without distortion / clipping
o Max. o/p signal swing = smaller of { (VCC (VCE + V(RE)) ) and (VCE - VCE, SAT + V(RE)) } [ Vpeak ]
=> 2 x smaller of{ (VCC (VCE + V(RE)) ) and (VCE - VCE, SAT + V(RE)) } [ Vp-p ]
For RE << RC, it is the RC which decides the AC o/p signal head-room (max Vpeak before clipping / distortion)
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1.2.4.2. AC Analysis: small signal circuit parameters with base-width modulation
Figure 1-36. small-signal resistance looked from input for Figure 1-35
[ic / ib]
[vout / ic]
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o Av = [ 1 / (r + (+ 1) RE) ] . [ . ro / (ro + RC + RE)]
[ RC . (-1)]
Note: in the expression [ro / (ro + RC + RE)], we are taking the ib flow through RE is << ic flow through RE
o Av = [ ro / (ro + RC + RE) ] ( RC / (r + (+ 1) RE))
For ro >> RC, RE Av ( RC / (r + (+ 1) RE))
[ic / ib] .
[iout / ic]
Small signal input resistance, Rin = vin / iin , having the load-resistor (not the circuit biasing resistors), if any, removed
o From Figure 1-21, the circuit does not include any load-resistor
o Rib r(+ 1) RE, taking ic ib
Otherwise Rib rRE + RE . ro / (ro + RC + RE)]
o Rin = RB | | Rib
Small signal output resistance, Rout after having the vin shorted
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Figure 1-37. small-signal resistance looked from output for Figure 1-35
vin = 0 (shorted)
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To compute Roc (small-signal impedance, when looked into collector or BJT), apply a small-signal voltage, vx
and estimate the corresponding small-signal current, ix
Current flow through r, i1 (say) = ix . [ RE / (RE + r) ] . (-1)
where, the factor (-1) for the direction of the current i1 is opposite to ix
(4) Voltage drop across Emitter resistor
= ix . ( RE || r )
Voltage drop across Collector - Emitter
= ( ix - i 1 ) r o
= ix r o - i1 r o
= ix ro + ix . [ RE / (RE + r) ] ro
Or, if using transconductance (gm) notation, Voltage drop across Collector - Emitter
= ix ro - gm [ix . (RE || r)] . ro
(5) ROC = vx / ix = RE || r + ro + ( . [ RE / (RE + r) ] ) ro
Or, if using transconductance (gm) notation,
ROC = vx / ix = RE || r + ro + [ gm . (RE || r )] ro
Note: ROC is
= the regular series resistance (= (RE || r ) + ro ) in the Collector-to-GND path
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+ another additional resistance term ( which is [ . RE / (RE + r) ] ro = [ gm . (RE || r )] ro ), because the current
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Figure 1-38. small-signal resistance looked from input for Figure 1-35
[ic / vbe]
. [vout / ic]
EC21003 Introduction to Electronics Notes: Working Document - Last updated 29 Oct 2009
Notice that gm = IB / VT = / r It leads to the previous Av expression using
for ro >> RC, Av [ r / (r + ( + 1) RE) ] . gm RC
[ic / vbe]
[iout / ic]
Small signal input resistance, Rin = vin / iin , having the load-resistor (not the circuit biasing resistors), if any, removed
o From Figure 1-21, the circuit does not include any load-resistor
o Rib r + ( + 1) RE, taking ic ib
Otherwise Rib rRE + RE . ro / (ro + RC + RE)]
o Rin = RB | | Rib
Small signal output resistance, Rout = vout / iout , having the vin shorted
o vin = 0 (shorted) ib = 0 ic = 0
o Roc = RE || r + ro + [ gm . (RE || r )] ro
Note: ROC is
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= the regular series resistance (= (RE || r ) + ro ) in the Collector-to-GND path
+ another additional resistance term ( = [ gm . (RE || r )] ro ), because the current [ gm . (RE || r )] opposes the flow
of current sourced by vx
o Rout = Roc | | RC
Note: ROC > ro
So, for ro >> RC, Rout RC
1.2.5. BJT Amplifier having load-resistor and source-resistor in the circuit
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VCC
RC
R1
vout
CC
RL
RS
CB
vin
R2
RE
Figure 1-39. BJT CE amplifier using non-zero source resistor and finite load resistor
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Figure 1-40. BJT CE amplifier using non-zero source resistor and finite load resistor (Figure 1-39)
1.2.5.1. DC Operating Point
1. DC input current at Base:
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o IB = (VBB VBE(ON)) / (RB + (1 + ) RE)
where, VBE(ON) 0.7V in case of BJT forward-active region of operation, having its BE junction in forward-bias
condition
o Note: if VBB < VBE(ON), IB = 0
BE junction is not turned ON
BJT is still in CUT-OFF mode (minority carrier injection into Base region from Emitter 0)
2. DC controlled current at Collector:
o IC = IB
o Note: assuming BJT in forward-active region of operation (which has to be verified from the VCE voltage)
3. DC voltage across the Collector and Emitter set by the DC load-line:
o VCE = VCC - IC RC
o Note: verify if BJT is indeed in forward-active region of operation by checking VCE > VCE,SAT
where VCE,SAT 0.2V
4. Max. o/p signal-swing possible without distortion / clipping
o Max. o/p signal swing = smaller of { (VCC (VCE + V(RE)) ) and (VCE - VCE, SAT + V(RE)) } [ Vpeak ]
=> 2 x smaller of{ (VCC (VCE + V(RE)) ) and (VCE - VCE, SAT + V(RE)) } [ Vp-p ]
1.2.5.2. AC Analysis: small signal circuit parameters with base-width modulation
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Figure 1-41. small-signal resistance looked from input for Figure 1-39
[ic / ib]
[vout / ic]
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o Av = [ (RB || Rib) / (RS + RB || Rib ) ] (1 / Rib ) . [ . ro / (ro + RC || RL + RE)] . [ RC || RL . (-1)]
where Rib = (r + (+ 1) RE)
Note: in the expression [ro / (ro + RC || RL + RE)], we are taking the ib flow through RE is << ic flow through RE
o Av = [ (RB || Rib) / (RS + RB || Rib ) ] [ ro / (ro + RC || RL + RE) ] (RC || RL / Rib)
For ro >> RC, RE Av [ (RB || Rib) / (RS + RB || Rib ) ] (RC || RL / Rib)
[ic / ib] .
[iout / ic]
Small signal input resistance, Rin = vin / iin , having the load-resistor (not the circuit biasing resistors), if any, removed
o From Figure 1-21, the circuit does not include any load-resistor
o Rib r(+ 1) RE, taking ic ib
o Rin = RS + RB | | Rib = RS + RB || (r(+ 1) RE)
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Figure 1-42. small-signal resistance looked from output into Collector for Figure 1-39
Small signal output resistance, Rout after having the vin shorted
vin = 0 (shorted)
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To compute Roc (small-signal impedance, when looked into collector or BJT), apply a small-signal voltage, vx
and estimate the corresponding small-signal current, ix
Current flow through r, i1 (say) = ix . [ RE / (RE + (r + RS || RB) ) ] . (-1)
where, the factor (-1) for the direction of the current i1 is opposite to ix
(4) Voltage drop across Emitter resistor
= ix . ( RE || (r + RS || RB))
Voltage drop across Collector - Emitter
= ( ix - i 1 ) r o
= ix r o - i1 r o
= ix ro + ix . [ RE / (RE + (r + RS || RB)) ] ro
Or, if using transconductance (gm) notation, Voltage drop across Collector - Emitter
= ix ro + gm [ix . (RE || (r + RS || RB))] . ro
(5) ROC = vx / ix = RE || (r + RS || RB) + ro + ( . [ RE / (RE + (r + RS || RB)) ] ) ro
Or, if using transconductance (gm) notation,
ROC = vx / ix = RE || (r + RS || RB) + ro + [ gm . (RE || (r + RS || RB))] ro
Note: ROC is
= the regular series resistance (= (RE || (r + RS || RB)) + ro ) in the Collector-to-GND path
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+ another additional resistance term ( which is [ . RE / (RE + (r + RS || RB)) ] ro = [ gm . (RE || (r + RS || RB) )]
ro ), because the current i1 or [ gm . (RE || (r + RS || RB))] opposes the flow of current sourced by vx
o Finally, output impedance Rout = ROC || RC || RL
Note: ROC > ro
So, for ro >> RC, Rout RC || RL
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SECTION 2. METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR
2.1. Device Operation: An Introduction
2.1.1. Device structure:
2.1.1.1. Metal Oxide Semiconductor (MOS) Capacitor
// Remark: need to insert:
// MOS cap gate-induced charge accumulation
// Enhancement vs. depletion
2.1.1.2. Drain / Source Region and Contacts
// Remark: need to insert:
// Gate/Source contact
2.1.1.3. Device structure as a whole
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Figure 2-1. A cross-section of a MOSFET Device: (1) Poly-Si Gate, (2) Gate-oxide / Thin-oxide (thin-ox) underneath
of which a conducting channel is formed, (3) and (4) Heavily doped Drain and Source regions, (5) Lightly doped
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Bulk/Substrate, (6) Thick-oxide / Field-oxide (FOX) for isolation from any other adjacent MOS devices.
Metal contacts for Drain and Source are not shown
2.1.2. Device electrical operation
2.1.2.1. MOS Transistor in cut-off
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o VDS > 0 Creation of an electric field across the mobile-charge (inversion) layer
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Figure 2-3. NMOSFET is turned ON or conducting channel formed (VGS > VTn): Now if VDS = 0 V ID = 0
Figure 2-4. NMOSFET is turned ON or conducting channel formed (VGS > VTn): Now if VDS > 0 V ID > 0
Square-law model:
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o Channel acting like a nonlinear resistor
o ID = (n COX) (W/L) [(VGS VTn) VDS/2]) VDS
o Process transconductance, kn = n COX [in A/V2]
given for a device fabrication technology
o Device aspect-ratio = W/L
Geometry of the device may be changed while designing the circuit (Design-parameter)
o Device-transconductance = kn (W/L) [in A/V2]
Device-transconductance is usually denoted by n or Kn for NMOS device
2.1.2.3. MOS Transistor turned-on and in saturation
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Figure 2-5. NMOSFET is turned ON or conducting channel formed (VGS > VTn): VDS = VGS - VTn Onset of the
saturation through pinching off at the Drain-end of the channel
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Figure 2-6. NMOSFET ID vs. VDS behaviour (VGS > VTn) ignoring the channel length modulation
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Figure 2-7. NMOSFET ID vs. VDS behaviour (VGS > VTn) ignoring the channel length modulation for various VGS
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Figure 2-8. NMOSFET is turned ON or conducting channel formed (VGS > VTn):
Effect of channel length modulation when VDS > VGS - VTn
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Figure 2-9. NMOSFET ID vs. VDS behaviour (VGS > VTn) considering the channel length modulation for various VGS
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Device Electrical Operation Summary:
VA = Early voltage (analogy from BJT Early voltage) because of channel-length modulation effect
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Figure 2-10. NMOS biased using a gate voltage (for amplifier operation) and resistor loading at Drain
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Figure 2-11. NMOS common-source amplifier with small-signal vin at the gate
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2.2.2. DC operating point
Figure 2-13. DC Analysis of the circuit in Figure 2-11: replace all the time-dependent voltage / current sources with
their respective average value (= 0V and = 0A, by definition of small-signal average values)
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o Note: if VGS < VT
No conducting channel is formed in NMOSFET ID = 0 and NMOSFET is still in CUT-OFF
2. DC controlled current at Drain:
o Either ID (n COX) (W/L) / 2 (VGS VTn)2
(if in saturation), ignoring channel length modulation for finding the DC bias current
o Or ID = (n COX) (W/L) / 2 [2(VGS VTn) VDS]) VDS
(if in non-saturation)
o Note: whether the NMOS is in saturation region of operation or non-saturation region, it has to be verified from the
VDS voltage
3. DC voltage across the Drain and Source set by the DC load-line:
o VDS = VDD ID RD
o Note: verify if the NMOS is in saturation or non-saturation region of operation by checking VDS > VDS,SAT or VDS <
VDS,SAT , where VDS,SAT = VGS - VTn
The ID, VDS values at the DC operating point are also designated as IDQ, VDSQ (i.e. the ID, VDS values at Quiescent-point
or Q-point)
2.2.3. AC analysis
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Figure 2-15. Visualizing small-signal operation for the circuit in Figure 2-11: Replace all the static or DC voltage /
current values calculated from DC-analysis with 0V and 0A (i.e. not contributing in voltage / current fluctuation in
small-signal, by definition) and then include all time-dependent small-signal voltage / current sources
Figure 2-16. small-signal current and voltage around the DC operating point
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2.2.3.1. Circuit transconductance, gm
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= sqrt(2 Kn ID) expressed in terms of drain bias-current
where n or Kn = n COX (W/L)
Figure 2-17. Circuit-transconductance gm for a given VGS biasing over a range of VDS biasing
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Figure 2-18. Circuit-transconductance gm for two VGS values over a range of VDS biasing
2.2.3.2. Drain-to-source small-signal resistance, ro or rds
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Figure 2-19. drain-source resistance for small VDS values (almost constant slope in ID vs. VDS curve)
o when VDS >= VDS,SAT :
ID (n COX) (W/L) / 2 (VGS VTn)2 ignoring channel length modulation
ID = 0, for a given VGS
EC21003 Introduction to Electronics Notes: Working Document - Last updated 29 Oct 2009
ro (or rds) =
However, ro will be limited by the channel length modulation
o when VDS >= VDS,SAT :
ID = (n COX) (W/L) / 2 (VGS VTn)2 (1 + VDS / VA) Taking channel-length modulation into account
ID = (n COX) (W/L) (VGS VTn)2 VDS / VA, for a given VGS
ID (ID / VA) VDS
o VDS / ID for a given VGS = ro = VA / ID = 1 / ( ID), where = 1 / VA
EC21003 Introduction to Electronics Notes: Working Document - Last updated 29 Oct 2009
rds or ro
[ohm]
VA / ID1
VA / ID2
[ Kn (VGS VT) ] -1
VDS [V]
VTn
VDS,SAT1
VGS1
EC21003 Introduction to Electronics Notes: Working Document - Last updated 29 Oct 2009
Figure 2-20. drain-source resistance for two different VGS values over a range of VDS biasing
2.2.3.3. small-signal parameters: voltage gain and input/output impedance
(4)
(3)
(G)
(D)
(2)
(1)
RD
= VA / ID
RG
(S)
Figure 2-21. small-signal analysis at the DC operating point for the circuit in Figure 2-11
EC21003 Introduction to Electronics Notes: Working Document - Last updated 29 Oct 2009
1. input small-signal (ac) vgs
o vgs = vin
Note: if there was a non-zero source-resistor, vgs = vin . RS / ( RS + RG)
From DC biasing stand-point, RG does not matter, for maximizing the transfer of ac-coupled signal to the MOS
device Gate input, RG should be > 0 and large compared to RS
2. Corresponding small-signal (ac) controlled current between Drain and Source:
o gmvgs
3. small-signal (ac) drain current from / to the external resistor:
o id = gmvgs . [ ro / (ro + RD) ]
4. small-signal (ac) voltage developed across the external resistor set by the AC load-line:
o vout = id RD
[id / vgs]
. [vout / id]
o Av = gm [ro / (ro + RD)] ( RD ), where gm = sqrt(2 (n COX) (W/L) ID) = sqrt(2 Kn ID)
For ro >> RD Av gm RD
EC21003 Introduction to Electronics Notes: Working Document - Last updated 29 Oct 2009
o Small signal input resistance, Rin = vin / iin
Since ig = 0, Rig =
o Rin = RG | | Rig = RG
Figure 2-22. small-signal resistance looked from input for Figure 2-11
Small signal output resistance, Rout = vout / iout , having the vin shorted
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o vin = 0 (shorted) vgs = 0 id = 0
o Rod = ro
o Rout = Rod | | RD = ro | | RD
Note: for ro >> RD, Rout RD
Figure 2-23. small-signal resistance looked from output for Figure 2-11
EC21003 Introduction to Electronics Notes: Working Document - Last updated 29 Oct 2009
// Remark: need to insert:
// Source-degeneration resistor effect
// Voltage and current biasing using active-device
// active-device load
// Output-to input feedback-resistor biasing
// Source-coupled pair or diff-amp