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    ASTM E1316-02a Standard Terminology For Nondestructive Examinations PDF

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    Designation: E 1316 - 02a Standard Terminology for Nondestructive Examinations‘ ‘This wanda is sued unde the ned designation E1316; the nim mmeitly following the desieniton indicts the year of pation ee of revo th eb ese pretest eb ee ‘ipencin epson (6) nds an eter change sine the bt ison or eappoval INDEX OF TERMS, Section common NOT Terms ‘oie Emission roctomagnete Tesing ‘Gane: ara X Radiology Leak Testing und Portal Ena Mage Pardo Exe Newton Radiology ze LUvasone Examination Infonet Examen Opt! Holography ‘vel ane Opes! tins ‘Appendix 1. Seope 1.1 This standard defines the terminology used in the standards prepared by the FO7 Commitice on Nondestructive ‘Testing. These nondestructive testing (NDT) methods include: acoustic emission, elecuomaguetic esting, gamma wl X-raliology, leak testing, Tiquid pencirant examination, mag= netic particle examination, neutron radiology and gaging, ultrasonic examination, and other (echnical methods, 1.2 Seotion A defines terms that are common 10 multiple NDT methods, whereas, the subsequent sections define terms, pertaining to specific NDT methods. An alphahetical list of the terms defined in this standard is given in Appendix X1, which also identifies the section in Which each tenn is defined. 1.3 As shown on the chart below, when nondestructive testing produces an indication, the indication is subject to interpretation a false, nontelevant or relevant. If it has heen interpreted as relevant, the necessary subsequent evaluation ‘will result in the devision to aveept or reject the material. With the exception of accept and reject, which retain the meaning found in most dictionaries, all the words used in the chart are defined in Seotion A, ‘Tsing and is Bower responsibly of Subcommitae 1702 on Eta ‘Crest edton approved July 10,2002. Puls pablaed a E1316" 9, Las previous elton E Page 2 2, Referenced Documents 2.1 ASTM Standards: 1.94 Guide for Radiographic Exam E127 Practice for Fabricating and Checking Aluminum Alloy Uluasouie Standard Referenve Blocks! 1215 Practice for Standardizing Tquipment for Tlectro- ‘magnetic Examination of Seamless Aluminum-Alloy tube? E494 Practice for Measuring Ultrasone Velocity in Mate vials? * nmal Book of ASTM Sundar, VO 03.3, Coprmigkt by the AST International Wed Feb 25 1657-00 2000 ly & 1316-020 F $66 Practice for Flectromagnetie (Fddy-Curren)) Sorting of Ferrous Metals? E 664 Practice for Measurement of the Apparent Avenua- tion of Longimidinal Ultrasonic Waves by. Immersion Method™ E750 Practice for Characterizing Acoustic Emission Instru- ‘mentation? E 804 Practice for Calibration of the Ultrasonic Test System by Lxirapotation Herween I'lat Bottom Hale Sizes* E 1033 Practice for Electromagnetic (Eddy-Current) Ex- ‘amination of ‘Type F-Coninuously Welded (CW) Fe ‘magnetic Pipe and Tubing Above the Curie Temperature® "Bicone Sse 190% tama Dao of ASTM Standard Vl 0303 F 1067 Practiee for Acoustic Emission Examination of Fiberglass Reinforced Plastic Resin (FRP) Tanks/Vessels? E 1118 Practice for Acoustic Emission Examination of Re- inforeed Themnoseiting Resin Pipe (RTRP)? E 1213 Test Method for Minimum Resolvable Temperature Dilferenee for Thermal Imaging Systems? 3, Significance and Use 3.1 The terme found in this proposed standard are intended lo be used unifommly and consisieny in all nondestructive testing standards. The purpose of this standard is to promote a clear understanding and interpretation of the NDT standards in which they are used, Section A: Common NDT Terms ‘The terns defined in Section A are the diteet responsibility of Subcommittee £07.92, Editorial Review. 4. Terminology acceptable quality level—the maximum percent defecsive or the maximum number of units defective per hundred units ‘hat, for the purpose of sampling test, ean be considered satisfactory as a process average. amorphous silicon (a-Si) X-ray detector, n—an amorphous silicon (a-Si) X-ray detector consists of a glass substrate with a matix of photodiodes fabricated from amorphous silieon and switehes arranged in rows and columns upon it the photodiodes are activated by light photons emitted from 4 scimitlaror whieh is activated by X mays andl is usually in close contact with the diode matrix. calibration, instrument, n—the comparison of an instrument with, or the adjustment of an instrument to, a known references) often tagcuble w the National Institue of ‘Standards and Technology (NIST). (See also standardiza- ton, instrument.) defect, n one or more flaws whose aggregate size, shape, orientation, location, oF properties do not meet specified acceptance eritera and are rejectable, discontinuity, n—a lack of continuity or cohesion; an inten ‘donal of unintentional interruption in the physical structure for configuration of a material or component evaluation—a review, following interpretation of the indica tions noted, t0 determine whether they meet specified acceptance criteria examination, n—a procedure for determining a property (or properties) or other vomitions or characteristics of a material ‘of component by direct or indirect means. Now 1 Examples incu wlilzation of Xray or illic waves for the purpose of determining (diretly or by caleulauon) flaw content, density, or (fr ulrsond)aoduls,or detection af flaws hy indvction of ‘eddy cutess, observing thermal behavior, AE respons, oF uilization of magnetic particles or Tigo penetrants. false indication, n—aay NDT indication that is interpreted to be ‘caused by a condition other than a discontinuity or imper- ection, flaw, » an imperfection or discontinuity that may be detect Copyright, by the AST ternational Wed Feb 25 16:97-36 2000 able by nondestruetive testing and is not nevessaily sejeet able, aw characterization, n—the process of quantifying the size, shape, orientation, location, growth, or other properties, of & flaw based on NDT response. imperfection, »—a depatue of a quality characteristic fom its intended condition, {ndication—the response or evidence from a nondestructive examination, Dascissos—An indication 18 determined by merpretation to be selevant, on-elevant, o fae Inspection, n—a procedure for viewing or observing visual characterises of material or component in a careful, critical manner. [Noru 2--Examples include performance ofa visuaoptial inspection, bev the rule of nut pte or Liu penelnl exsain tion, or carefully observing 8 surface condition prior to performing an uluasouis or eddy-cuuen! exauinaton, (Fo the sane weet woud as “spoctaele™ or "spectator) interpretation—the determination of whether indications are relevant or nonrelevant interpretation, n—the de‘ennination of whether indications are relevant, nonrelevant, or false Nondesiructive Evaluation soe Nondestructive Testing, Nondestructive Evaminarion—scc Nondestructive Testing. Nondestructive Inspection—see Nondestructive Testing Nondestructive Testing (NDT), n—the development and application of teehnieal methods 10 examine materials or ‘components ie ways dhat do uot impair Future usefulness aux servicezhility im order to detect, locate, measure and eval flaws; 10 assess integrity, properties and composition; and to measure geometrical characteristics, nonrelevant indication, nan NDT indication that is caused bby a condition or type of discontinuity that is not rejectable, False indications are non-relevant relevant indication, n—an NDT indication that is caused by a condition or type of discontinuity dhat requires evaluation, standardization, instrument, » the adjustment of an NDT (ly & 1316-020 instrument using an appropriate reference standard, o obsain or establish a known and reproducible response. (This is usually done prior to an examination, but ean be carried out, ‘anytime there i concer about the examination ar instrae ‘ment response. (See also calibration, instrument.) (est, n—a procedure for determining a property or eharacter- istic of a material or @ component by direct measurement [Nom 3—Faamples inchide mechanical tess to detemine stenath, Tarde ur bur propecty: determination uf lukaye (u lak lel) ot heoking the performance (Function) ofa piece of equipment, Section B: Acoustic mission (#750, # 1067, and 1118) ‘The boldface designations in parentheses indicate the standards from which the terms in that section were derived, ‘The terms defined in Section 8 are the direct responsibility of Sueommittee E0704 on Acoustic Emission Method acoustic emission (AE)—the class of phenomena whereby, transient clastic waves are generated by the rapid release of cocrgy fiom localized sources within a material, or dhe transient waves so. generated. Acoustic emission is the recommended term for general use. Other terms that have been nsed im Al: literature include (1) stress wave emission, Q) microseismie activity, and G) emission or acoustic nission wid oder qualifying modifies acoustic emission channel—ee channel, acoustic emission, acoustic emission count (emission count) (N}—see count, acoustic emission. acoustic emission count rate—see count rate, acoustic emnis- sion (emission rate or count rate) (N). acoustic emission event—see event, acoustle emission. acoustic emission event energy—see energy, acoustic event. acoustic emission sensor—see sensor, acoustic emalsslo ‘acoustic emission signal amplitude—see shyt amplitude, acoustic emission, ‘acinste emission signal (emission signal) —see signal, acous- tie emission. acoustic emission signature (signarure}—see signature, acoustic emission. acoustic emission transducer—see sensor, acoustic emission. acoustic emission waveguide—wee waveguide, woustic exsis- sion. acousto-ultrasonies (4U)—a nondestructive examination ‘method thar uses induced stress waves 10 detect and assess diffuse defect states, damage conditions, and variations of mechanical propenics of w tex structure, The AU method combines aspects of acoustic emission (AE) signal analysis with ultrasonic materials characterization techniques. adaptive location source location by iterative use of simu- {ted sources in combination with computed location. AK activity, n—the presence of acoustic emission dunng a test, AE amplinude—see AB [AE ris, a—the rectified, ime averaged AE signal, measured ‘na near seal andl reported in voll, AE signal duratlon the time between AE signal start and AE, signal end [AE signal end—the recognized termination of an AE signal, usually defined as the last crossing of the threshold by that signal [AE signal generator—a device which can repeatedly induce a specified transient signal ito an AB instrument. AE signal rise time the time between AE signal start and the Copyright, by the AST International Wed Feb 25 16.9797 2000 pou wnplitude of that AE signal AE signal start—the heginning of an AF signal as recognized by the system processor, usually defined by an amplinude excursion exeveding Uireshold, array, n—a group of two or more AE sensors positioned on a structure for the purposes of detecting and locating sources. ‘The sourees would normally be within the array. ‘arrival time interval (At,)—see Interval, arrival time, attenuation, » the decrease in AE amplitude per unit dis tance, normally expressed in a8 per unit length, average signal level, ”i—the rectified, time averaged AE logarithmic signal, measured on the ALi amplitude logarith- ‘mic scale and reported in dB,,. units (where 0 dB. refers to TAY at the preamplifier input). burst emission—see emission, burst, ‘channel, acoustic emission—an assembly of a sensor, pream- plifier or impedance matching transformer, filters secondary amplifier or other instrumentation as needed, connecting, cables, and detector or processor [Nom 4—A channet for examining sberplass renforeed plastic (FRP) nay ntze moe than one sens with seared electronics, Channels may be processed independently or in predetermined groups similar sensitivity and fequency characteristics. ‘continuous emission—sce emission, continuous. count, acoustic emission (emission count) (N)—the number ‘of times the acoustic eminsion signal exceeds a preset Chresold during ny selected portion of tex. count, event (N,)—the umber obtained by counting each: iscemed acoustic enistion event ance. ‘count rate, acoustic emission (emission rate or count rate) (8)—the time rate at which emission counts occur. count, ring-town—see count, acoustic emission, the preferred ‘erm coupiant—a materia used at the suctureo-sensor iretace to improve the transmission of acoustic energy across the ierfce daring aeanstie emission manitoring cumulative (acoustic emission) amplitude distribution FH — ribution, amplitude, cumulative. cumulative (acoustic emission) threshold crossing distribution FAY) —see distribution, threshold crossing, cumul: AByg—a logarithmic measure of acoustic emission amplitude, referenced to t V. nade (Bap Signal peak am = 20 opiate) oy (fly & 1316-020 1 AY at the sensor ontpnt (before amplification), and Peak voluge of the measured acoustic emission signal Acoustic Emission Reference Seale: 3 2h 3 3g = os dead time—any interval during data acquisition when the ‘instrument of system is unable to accept new data for any reason. (E 750)* digferential (acoustic emission) amplinude distribution F(¥)— see distribution, differential (acoustic emission) ampll- tude (V). differential (acoustic emission) threshold crossing distribution /(V)—see dstributton, differential (acoustle emlsston) ‘threshold crossing. distribution, amplitude, cumulative (acoustic emission) F(¥)—the number of acoustic emission events with signals ‘that execed an arbitrary amplitude as a function of amplitude v. distribution, threshold crossing, cumulative (acoustic emis jon) F, (V)_ the number of times the acoustie emission signal exceeds an arbitrary threshold as a function of the lareshold voltage (V). distribution, differential (acoustic emission) amplitude A(V)—the umber of acoustic emission events with signal amplitudes betweon amplitudes of V and V+ AV 93 a Tunevion of the amplitude 77) is the absolute value af the derivative of the cumulative amplitude distribution F(V). distribution, differential (acoustic emission) threshold crossing f, (¥)—the number of times the acoustic emission signal waveform has a peak between thresholds P'and V+ A. Vas a function of the threshold F f{V) is the absolute value The desenton in parebescsflloing the tems indicate the ASTM of the derivative of dhe cumulative threshold crossing. distribution F, (V) Aistribution, logariti stic emission) amplitude 9(V)—the mmher of acoustic emission events with signal amplitudes between V and aV (where a is a constant ‘multiplicr) asa funetion of the amplitude, This isa variant of the differential amplitude distribution, appropriate for loga- rithmically windowed data dynamic range—ihe difference, in decibels, besween the ‘overload level and the minimum signal level (usually fixed by one or more of the noise levels, low-level distortion, interference, or resolution level) in a system or sensor. effective velocity, n—velocity calculated on the basis of arrival ‘umes and propagation distances determined by artificial AL ‘generation; used for computed location, emission, burst—a qualitauve deseripuon of the diserere signal related to an individual emission event occurring within the material [Nort $tise of the term burst emission is recommended only for eserbing the qualitative appearance of emission signals. Tig. 1 shows an coselloscope trace of burst emission signals ona background of continuous emission, continuous—a qualitative description of the sas tained signal level produced by rapidly oceurring acoustic conission From structural sourees, leaks, or both. Nore 6— Use of the frm continuous emission 1s recommended only for desribing the qualitative appearance of emission signal Fig 2 and ig, $ show ossiloscape faces of conlinions emission signals a wo ferent sweep ries ‘energy, acoustle emission event: released by an emission event. energy, acoustic emission signal—the energy contained in a detected acoustic emission burst signal, with units usually reported in joules and values whieh can be expressed i logarithmic form (4B, decibels) evaluation threshold a threshold value used for analysis of the examination data. Date may he recorded with a system examination threshold lower than the evaluation threshold. For analysis purposes, dependence of measured data on the system examination threshold must be taken into consider the ‘otal elasie energy FIG. 1 Burst Emission on a Continuous Emission Background. (Sweep Rate—5 msicm) Copyrigkt, by the AST ternational Wed Feb 25 16:97-40 2000 4 (fly & 1316-028 event, acoustic emissi ion event) —a local material change giving rise 10 acoustic emission ‘event count (Ne}—see count, event. ‘event count rate (Ne)—see rate, event count, ‘examination area that portion ofa structure being monitored. ‘with acoustic emission. examination region—that portion of the test article evaluated using acoustic ensission techuvlogy. Felicity effect—the presence of acouistic emission, detectable ‘at a fixed predetermined sensitivity level at stress levels, below those previously applied. (E 1067) Felicity effect the presence of detectable acoustic emission at 4 fixed predetermined sensitivity level at stress levels below those previously applied Felicity ratlo—the ratio of the stress at which the Felicity effect occurs w the previously applied maximum. stress (E1067, E 1118) Copymigkt, by the AST International Wed Feb 25 16.9743 2000 FIG. 2 Continuous Emission. (Sweep Rato—5 mslem.) Now 7 ‘The fixe sensitivity level wil selly be the sme as as used forthe previous loading owt. (E118) instrumentation dead time —voe dend time, instrumentation, first hit location—a zone location method defined by which channel among a group of channels first detects the signal. Aoating threshold—any threshold with amplitude established by a time average measure of the input signal. (E 750) bitte detection and meeswement of wn AE sigual ow a channel Interval, arrival time (At,)—the time interval between the de(ceted arrivals of an aebustie emission wave atthe ith amd Lith sensors of a sensor array. Kaiser effeet—the absence of detectable acoustic emission at fixed sensitivity level, until previously applied stress levels, are exceeded. location aceuracy, n—a value detennined by comparison of the actual position of an AE source (or simulated AE source) ly & 1316-020 (o the computed lovation, location, eluster, na location technique based upon a speei- fied amount of AB activity located within a specified length or area, for example: 5 events within 12 lmear inches or 12 square inches, ocation, computed, n—a source location method based on algorithmic analysis of the difference in arrival times among. sensors, [Noms Sever appmaches to computed location are used including linear location, planar location, thee dimensional location, and adaptive locaton, (@) linear location, n—one dimensional soure location requiring 189 oF snore channels (8) planar location, n—tvo dumensional source loestion requrng tree ‘or more channels, (6) 3D location, »— thee dimensional source location requiring ive oF tore channels, i) sleptive lacation, n source Iosaion by eave wae of 3 sources in combination with computed loeetion, location, continuous AE signal, n—a method of location based ‘on continuous AF signals, as opposed to hit or difference in arrival time location methods uted ‘Nom 9—This typeof location is commonly used in leak Focation due to the presen uf continous eto, Some coi types of enti ‘ous signal Fecation methods inclde signal etieustion and comelation analysis methods, (@) signal arenuation-based source Toeation, n—e source location rnsthod tha lies on the attenuation versus distance phewomenon of AE signal. By monitoring the AF signal magnitudes of th eoninoous signa at Varios pont along the objet, the sures can e determined based on the highest magnitode or by inkerpoltion oF extopolation of slip readings. (©) correlation based sour location, » a souce Wcation metho hat compares the changing AE signal levels (asually waveform bese ampli- tde analysis) at too oF more points surounding the source and deter rine te time displacement of these signals. The time displacement data can be used with conventional hit based location techniques arrive a a Suton forthe soure ite location, source, n—any of several methods of evaluating AE. data to determine the position on the structure from which the AE originated. Several anproaches to source location are used, including zone location, computed location, and con {inuous location. location, zone, n—any of several techniques for determining the general region of an acoustic emission source (lor ‘example, total AE counts, energy, hits, and so forth, [Noms 10—Severst approaches fo zone feation are used, including independent channel zone location, fet hit zone locstion, and arial “sxqvence zone Jocntion (a) independent chanel zone location, n—8 zope location technique hat eampses the prose anna of eivily fom ech channel () srsenir sone focaton, ne zone locaton teenque tat compares only tivity fiom the channel first detecting the AF event. (©) arrival sequence zone location, na zone loation technique that compares the onder of arrival among sensors. logarithmic (acoustic emission) amplitude distribution g(V) see distribution, logurithmic (acoustic emission) ampli- tude, overload recovery thme—an interval of nonlinear operation of aan instrument caused by a signal with amplitude in excess of the instrument's linear operating range. Copyrigkt, by the AST ternational Wed Feb 25 1697-44 2000 performance check AE ssstem—see verification, AE. system. pressure, design pressure used in design to determine the reguired minimum thickness and minimum mechanical properties Processing eapaetty—ihe mimber oF hits that enn he processed at the processing specd before the system must inteerupt data collection elear bulfers or otherwise prepare for aecepuing additional daa processing speed —the sustained rate (hits), asa funetton of the parameter set and number of active channels, at which ‘AB. signals ean be continuously processed by a system ‘without interaptign for data transport rate, event count (Ne)—the time rte ofthe event count rearm delay ime—see time, rearan delay. ring-down count see count, acoustic emission, the pre- ferred term, sensor; uevustic emission detection deve, generally pi- ezoelecti, that transforms the particle motion produced hy an elastic wave into an electrical signal signal, acoustic emission (emission signal)—an eleesical signal obtained by detection of one or more acoustic signal amplitude, acoustic emission—the peak voltage ofthe largest excursion attained by the signal waveform from an emission event. signal overload level that level above which operation ‘ceases to be satisfactory as a result of signal distortion, overheating, ar damage signal overload point—the maximum input signal amplitude ‘al which the ratio of ouput to input is observed 10 remain within a preseribed linear operating range. signature, acoustic emission (signature)—a characteristic set ‘of reproducible attributes of acoustic emission signals asso- ciated witha specific test article as observed witha particular instrumentation system under specified test conditions. stimulation the application of a stimulus such as force, Pressure, heat, etc, 0 2 test article to cause activation of acoustic emission sources. system examination threshold—the electronic insrament threshold (see evaluation threshold) which data will be deieetod, ‘ransducers, acoustic emission—see sensor, acoustic emis- sion. ication, AE system (performance check, AE system)— the process of esting an AE system to assure conformance 4 specified level of perfomance or measurement accuracy. (this is usually cared out prior to, daring andor after an AB examination with the AB system connected to the cxamination objet, using a simulated or artificial avoustic emission source.) voltage threshold —a voltage evel on an electtonie compara- tor such that signals with amplitudes larger than this level will be recognized. The volinge threshold may he user adjustable, lixed, or automatic Hating. (E750) ‘waveguide, acoustie emission a device that couples elastic ceneray ffom a structure or other test object to a remotely mounted sensor during AE monitoring. An example of an acoustic emission waveguide would be a solid wie of rod (ly & 1316-020 Ut is coupled at one end (© 2 monitored structure, and to a Section C; Electromagnoti sensor atthe other end ‘Testing (F215, F243, F.$66, F. 1033) ‘The terms defined in Section C are the direct responsibility of Subcommittee 1107.07 on Tlectromagneric: Methods absolute coil—a coil (or cols) that responds) 0 the total

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