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Course Overview
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Course Title :
Electronic Devices
Instructor-in-charge : Dr. Navneet Gupta
(email: ngupta@bits-pilani.ac.in)
(Chamber: 2210-H, FD-II)
Instructors :
Contents:
Crystal structure of semiconductor materials.
Basics of semiconductor devices
Conduction mechanism in materials/devices
Different types of devices
Text Book
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Text Book :
B. G. Streetman, and
Sanjay Banerjee, Solid
State Electronic Devices,
6th ed., PHI Learning
Private Limited, New Delhi,
2009.
Reference Books
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Reference Books :
Donald
A. Neaman and D.
Biswas, Semiconductor Physics
and Devices , 4th edition, Tata
Mc Graw Hill.
S.M. Sze, Semiconductor Devices:
Physics & Technology, 2nd ed.,
John Wiley
Evaluation Scheme
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Component
Duration
Mid Term
Test
Assignments
&
class
participation
Quizzes
90 min
Marks
(300)
100
--
40
03-10-2012;
10:00-11:30 pm
--
10 min
40
Tutorial hour
Compre.
Exam.
3 hours
120
Evaluation
type
Closed Book
Open Book
Closed Book
Importance
as per ISA
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1st Generation
Valves
4th Generation
LSI and VLSI
2nd Generation
Semiconductor Devices, Diode and
Transistor
5th Generation
ULSI
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3rd Generation
SSI and MSI
6th Generation
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Course Coverage
Topics:
Crystal structure
Semiconductor Material
p-n junction
Metal-semiconductor junction
Field-Effect Transistors
Bipolar Junction Transistors
Special diodes
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Semiconductor Materials
Electronic Materials: The goal of electronic
materials is to generate and control the flow of an
electrical current.
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Crystal Properties
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Lecture-2
Crystal Lattices
Periodic Structures
(a) Crystalline
(b) Amorphous
(c) Polycrystalline
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Cubic Lattices
Nc N f Ni
n
8
2
1
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Atomic Radius
Half the distance between nearest neighbours in a crystal
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4 3
n r
3
APF
a03
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Notation
(hkl)
{hkl}
[hkl]
<hkl>
Interpretation
crystal plane
equivalent planes
crystal direction
equivalent directions
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Volume Density
mass of the unit cell M
v
nA
v
N AVc
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Planar Density
Effective number of atoms on the crystal plane Ne
p
Area
A
Example: Planar density in SC on (100) plane
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Linear Density
Number of lattice points per unit length (lattice
parameter) in the direction of interest
Ne
L
L
Example: Consider direction [110] in a FCC unit cell
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Lecture-3
Example #1
Calculate the surface density of atoms on (110)
plane in a FCC structure. Take lattice constant
4.5 Ao.
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Diamond Structure
Zinc-blende lattice
Diamond Lattice
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Cell volume:
(.543 nm)3 = 1.6 x 10-22 cm3
(MGS) Si + 2CO,
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Purification
-The MGS silicon is purified to EGS silicon (Electronic Grade Silicon)
The crucible is
A single crystal
heated to just above seed is then
1412oC,
lowered into the
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Seed crystal
Crucible
6. Edge Rounding
1. Crystal Growth
Heater
7. Lapping
2. Single Crystal Ingot
8. Wafer Etching
9. Polishing
4. Flat Grinding
Polishing table
5. Wafer Slicing
Polishing
head
Dopant Incorporation
-Dopant is introduced into the melt but control is non-trivial due to segregation,
-Any impurity will possess a certain chemical potential in silicon,
-This will be different for solid or liquid phases.
Liquid
Cs
CL
Cs
CL
Solid
Kd = CS/CL
-Where Kd is the distribution coefficient, for silicon Kd <1, impurities prefer to
be in liquid phase!
Chapter-3:
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Covalent bonding: Si
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Silicon Atom
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Lecture-4
4N Electrons
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Semiconductor
Insulator
Metal
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Direct semiconductor
Indirect
semiconductor
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Effective Mass
Movement of electrons in lattice is different from that of
an electron in free space.
In lattice besides external forces, internal forces are also
present.
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Lecture-5
Intrinsic Material
A perfect semiconductor crystal with no impurities or lattice
defects is called an intrinsic semiconductor.
EHPs are the only charge carriers in intrinsic material
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Extrinsic Material
Charge carriers: intrinsic carriers + carriers created due
to impurities.
Doping : technique for varying the conductivity of
semiconductors.
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Carrier Concentrations
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Lecture-6
Example 1
Assume that the fermi energy level for a particular
material is 6.25 eV. Calculate the temperature at which
there is 1 % probability that a state 0.3 eV below the
fermi energy level will not contain an electron
Answer = 756 K
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Density of states
Density of states: is the energy distribution of allowed
states in semiconductors.
gc (E)
gv (E)
4 2mn
h3
* 3/ 2
4 2m p
h
E Ec
* 3/ 2
Ev E
no
f ( E ) g ( E )dE
po [1 f ( E )]g v ( E )dE
Ec
po N v e EF Ev / kT
no N c e Ec EF / kT
2mn kT
N c 2
2
3/ 2
2m p *kT
N v 2
2
h
3/ 2
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ni
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Nc Nv e
E g / 2 kT
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Nc Nv e
E g / 2 kT
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Example:2
A Si sample is doped with 1017 As atoms/cm3. What is the
equilibrium hole concentration po at 300K? Where is EF relative
to Ei?
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