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Properties
p
of semiconductor materials
Classification of Materials
Resistivity
Quartz
Wood
Diamond
Insulators
Si
Ge
Semiconductors
Pb
Au
Conductors
1018 1016 1014 1012 1010 108 106 104 102 100 10-2 10-4 10-6 10-8
Resistivityy ((cm))
Key point: the conductivity of semiconductors can be controlled by doping
Semiconductor materials
II
III IV V VI VII
Semiconductors
Element
Si, Ge
Compo
ound
III-V
Binary:
GaAs, AlAs, InAs
GaP InP
GaP,
InP, AlP
GaN, InN
Ternary:
AlGaAs, InGaAs,
InGaP, InGaN
Quaternary:
GaInNAs
Quinary:
GaInNAsSb
II-VI
Example: Al0.3Ga0.7As = alloy of 30% Al and 70% Ga (mole fraction)
Properties change with alloy composition.
ZnO, CdHgTe,
ZnSe
Crystalline structure
Amorphous structure
a
Ga
Polycrystalline structure
Crystalline structure
Diamond-like
a/4
a
a/2
Number of atoms p
per cm3 = 8 / a3 = 8 / ((5.43 x 10-8)3 = 5 x 1022 at/cm-3
a (Si) = 5.43 Angstrom
[100]
[010]
[110]
(1 0 0)
1/a
1/ xa
1/
Reciprocal
Intercepts: X = a
Y=a
Z=
1
0
0
(100)
In a units
1/a
1/a xa
1/
1/
Reciprocal
(110)
In a units
Intercepts: X = a/2
Y=a
Z=
1
1
0
2/a
1/a xa
1/
Reciprocal
2
1
0
(210)
In a units
Plane
a e A =(100)
( 00)
Plane B =(010)
Plane C =(110)
Plane B
a2
a1
Intercepts at : a1
1/a1
1/ xa1
1/
1
0
0
a2
a1
Plane A
Plane
a e A = (1010)
( 0 0)
Plane B = (0110)
Plane C = (1100)
Intercepts at: a1
a3
1/a1
1/ xai
1/a3
1/
1
0
1
0
a1
Plane B
a2
a3
a1
Plane A
a2
Generic Miller indices are written as (h k i l) or (h k i c)
(
), i.e. theyy are not independent
p
Note that i = (h+k),
That is, the sum of the first three equals zero
a
c
a* b c) / a b c
b* (c a) / a (b c)
c* (a b) / a (b c)
c
and
and
and
|a*| = 1 / |a|
|b*| = 1 / |b| (reciprocals)
|c*|| = 1 / |c|
|c
b
a
with:
Reall iinterplanar
R
t l
spacing
i (dhkl) between
b t
consecutive
ti (hkl) planes
l
iis: dhkl = 1/ g
For succesive planes with (100) Miller indices (orange) real distance between
them is d100 = a, while in reciprocal space is g100 = 1a* = 1/ a
For succesive p
planes with ((200)) Miller indices (g
(green)) d200 = a/2,, while in
reciprocal space is g200 = 2a* =2/a
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Reciprocal Space:
Fourier transform of the spatial wavefunction of the original lattice (or direct lattice)
Transforms real points and distances into diffraction patterns
Gives a better understanding of scattering and any diffraction measurement (XRD
(XRD, TEM)
Purity
E
Expressed
d iin N
Ns ((nines)
i
)
purity of 99.9999 % = 6N
Generally, a minimum of 7N purity it is needed for IC applications
mol
500 gr of Si
28gr
6.0231023 atoms
= 17.86 mol; X
= 1.071025 atoms
mol
cm 3
500 gr of Si
= 197.6 cm3;
2 .53 gr
1.071025 atoms
atoms density =
= 5.411022 atoms/cm3
3
197.6 cm
5.411022 6 1014
P it =
Purity
x 100 = 99.9999988
99 9999988
5.411022
7
7.5N
5N
Discrete energy
gy levels are conceptually
p
y the same as bands in solids!!
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Free electrons
Coupled Systems
Bound electrons
Ele
ectron Ene
ergy
For Si (Z=14)
Electron Shells (1s2,2s2, 2p6, 3s2, 3p2)
Coupling
No interaction
Interatomic spacing
V
(
r
)
(r ) E (r )
2m
k ( r ) e j k r U n ( k , r )
Real
potential
(Bloch functions)
Rectangular
Rectang
lar
potential
Energy bands
GAP
Indirect
Direct
Degeneracy
Light holes
Heavy holes
p=
4
3
GaAs
Conduction
band
Carrier
population
2
Energ
gy (eV)
2
E=0.31
1
Eg
0
-1
-2
Conduction
band
Si
1
Eg
0
-1
Valence
band
[[111]]
[[100]]
-2
Valence
band
[[111]]
[[100]]
p=
The effective
Th
ff ti mass is
i proportional
ti
l tto th
the reciprocal
i
l
of the curvature of the energy band profile.
The smaller the curvature, the higher the effective mass.
Ec
The group velocity essentially means the
average motion of the components of the wave
packet that represent
p
p
the electron.
m*(k)
Ba
andga
ap ene
ergy (e
eV)
Vegards
g
law
AlN
Bandgap
(almost linear)
Bowing parameter
GaN
AlP
SiC
GaP
AlSb
GaAs
1
0
30
3,0
InN
35
3,5
(non- linear)
AlAs
InP
Si
Ge
55
5,5
Bowing
gp
parameter
stands for non-linear
behavior
GaSb
InAs
60
6,0
Lattice Constant
InSb
65
6,5
()
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Varshnis law
T 2
E (T ) Eg
Eg
E (0)
(T )
Electrron Energy
Interatomic spacing
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E EF (eV)
1
E EF
1 exp
kT
E - EF (eV)
Means the carrier Energy Average (Chemical potential)
50%
%p
probability
y for E = EF at any
y temperature
p
Close to CB when more electrons than holes
Close to the VB when more holes than electrons
At (almost) midgap for intrinsic semiconductors
At 0K is
i a step-like
t lik function
f
ti
At higher temperature the probability for electrons in CB increases
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Holes
fe (E)
1
E EF
1 exp
kT
f p (E) 1 fe (E)
1
E E
1 exp F
kT
Density
y of states available
Electrons : g e ( E )
1 2m
2 2 2
*
e
3/ 2
E Ec 1/ 2
3/ 2
1 2mh*
1/ 2
Holes : g p ( E ) 2 2 Ev E
2
Electron (hole) density
g (E)
n( E ) g ( E ) f ( E ) dE
dE
exp ( E EF ) / k BT 1
Integration limits?
1
E EF
1 exp
kT
1 2me kT
4 2
Approximated by
M
Maxwell-Boltzman
ll B lt
eq.
E E
f ( E ) exp F
kT
3/ 2
E EF
exp c
kT
3/ 2
EF Ev
EF Ev
exp
NV exp
kT
kT
1 2mh kT
p
4 2
Ec E F
N
exp
C
kT
This defines the effective density of states NC, NV that have a RT value of:
NC
NV
4
1
2 m e kT
2
2 m h kT
2
3/2
19
~
2
.
72
10
cm
3/2
19
~
1
.
16
10
cm
for Si
for Si
E c E F E F Ev
n p n N c N v exp
kT
Ec Ev
EG
N c N v expp
N c N v expp
kT
kT
ONLY INTRINSIC (E at midgap)
EG
10
3
ni n p N c N v exp
~ 1.0 10 cm for Si
2kT
ALWAYS (no
( specific
ifi EF position)
iti )
2
i
ni is
i called
ll d the
th intrinsic
i t i i carrier
i density,
d it andd depends
d
d on:
Semiconductor (gap energy, Eg)
Semiconductor (effective masses)
Temperature (through both T and Eg)
ni n p N C exp ( Ec EF ) / kT NV exp ( E F Ev ) / kT
NV
2 E F Ec Ev
exp
p
NC
kT
N v Eg 3
mh*
Ec Ev 1
EF
kT ln
kT ln *
2
2
Nc 2 4
me
FERMI LEVEL LIES NEAR MIDWAY BETWEEN
THE CONDUCTION & VALENCE BANDS
Ec= Ev + Eg
Assuming Ev = 0
mh* E g 3
3
0.6 E g
E F (300 K)
kT ln *
0.0259 ln
0.011 eV
2 4
m
2
4
1
.
1
2
e
Eg
mh* E g 3
3
0.6 E
E F (600 K)
0.0518 ln g 0.022 eV
kT ln *
2 4
1.1 2
me 2 4
Eg
NOTE THAT SINCE mh* < me* FOR SILICON, THE FERMI LEVEL WILL ALWAYS LIE
BELOW THE MIDDLE OF THE GAP FOR AN INTRINSIC MATERIAL!
ALSO NOTE HOW INCREASING TEMPERATURE PUSHES THE
FERMI LEVEL FURTHER DOWN BELOW THE MID-GAP
Band filling
f ( E)
1
E EF
1 exp
kT
Intrinsic
The Fermi level
DOES not move
Band filling
HOLES
g(E)
Intrinsic semiconductor
f(E)
ni no po
Intrinsic
p-type
Boron (3 electrons) in Si
n-type
Phosphorous (5 electrons) in Si
me* o 2
Ec Ed 13,6 (eV )
mo s
mo s o
ro 0,53 * (A)
me o
Dopant atoms cannot move. Upon ionization, there is a fixed charge!
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Donor level
EF
g(E)
E i i semiconductor
Extrinsic
i
d
f(E)
diff
different
t density
d
i off electrons
l
and
dh
holes
l
ni2 n p
(ni)
1017
1 x 1016 cm-3
no (cm-33 )
1016
Extrinsic
(Nd)
Eti i
Extrinsic
1015
1 x 1015 cm-3
n0 (cm-1)
Ionization
1014
1013
1012
Intrinsic (ni)
1011
0
10
12
1000/T
((K))-1
1000/T
n N a p N d
n N C exp ( Ec E F ) / kT
p NV exp ( E F Ev ) / kT
Ionization Factor:
E EF
Na Na f (Ea ) Na 1 exp a
kT
E Ed
N d N d 1 f ( Ea ) N d 1 expp F
kT
n Nd
n p Nd
ni2 n p
4n
2
d
N N
n
2
2
i
If att RT
Nd >> ni
p ni2 / Nd
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Impurities doping
Impurities,
III
IV
VI
VII
Impurities doping
Impurities,
EC
EF
n-type
donors
EF
acceptors
EF
intrinsic
p-type
EV
As a consequence of doping
the Fermi level shifts closer
to the band edges
Shallow level
Crystal defects
Point defects (difficult to detect and measure, but quite ACTIVE)
Silicon
Substitutional
(AsSi)
Lattice vacancy
(VSi)
Interstitial
(IAs)
Frenkel Pair
Antisite
((As in Ga site))
GaAs
Antisite
(Ga in As site)
Crystal defects
Edge
Screw
Dislocations
Stacking faults
Au
St
Steps
i the
in
th fabrication
f b i ti off a device
d i
1.
2
2.
E it
Epitaxy
(
(growth
th off a thin
thi layer,
l
a few
f
microns
i
thi k)
thick)
3
3.
4.
All the p
processing
g is carried out on the epitaxial
p
layer
y
(planar technology)
5
5.
The final
Th
fi l quality
lit off the
th device
d i depends
d
d on the
th quality
lit
and control of all processes involved
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Insulators,, passivation
p
Ohmic contacts
Schottky barriers
Polycrystalline Si (Polysilicon)
MOS gates,
Integrated resistances
Passivation
Epitaxy
Heteroepitaxy:
The epitaxial layer and substrate are the same material (GaAs on
GaAs Si on Si) or different but with same in-plane
GaAs,
in plane lattice constant
The epitaxial layer and substrate are different materials (GaN on
sapphire InGaAs on InP) with the same or different lattice constant
sapphire,
constant.
<
dislocations
Crritical layer
thickness
Homoepitaxy:
In plane compression
Out plane tension
Lattice mismatch
is defined as
Lattice matched
Same lattice constants
AlAs on GaAs
InGaAs 53% on InP
Pseudomorphic
Different lattice constant
Lattice is strained
InGaAs on GaAs
m(%)
a epi a subs
a subs
100
Metamorphic
Different lattice constant
Strain is relieved by
relaxation forming dislocations
Fabrication of a device
Planar technology (All the processes are carried out on the surface)
Example: p
p-n
n junction
1. Epitaxy of Si:n
2. Oxidation
5. Development
8. Doping
3. Resist deposition
9. Metallization
6. Etching of the oxide
7. Resist removal
Wafers
Problems
1.
We want to dope
p GaAs with donor impurities
p
by
y adding
g Si in the crucible during
g the g
growth p
process.
We know that the weight of the liquid GaAs in the crucible is 350 gr. Calculate the weight of Si that it is
necessary to add, in order to obtain a donor concentration of 61017 cm-3.
2.
If the lattice constant of an InP substrate is 5.868 , calculate the mole fraction of In which allows
growing
i IInGaAs
G A lattice
l tti matched
t h d to
t this
thi substrate.
b t t
3.
We grow an InGaAs layer with 30% In on GaAs. Calculate the lattice mismatch.
4
4.
5.
6.