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1.

Properties
p
of semiconductor materials

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Fundamentals of Semiconductor Fabrication


G.S. May and S.N. Sze
Ch t
Chapters:
1 and
d2
2.4
4

Semiconductor Devices: Physics


y
and Technology
gy
S.M. Sze
Ch t
Chapters:
2
2.1,
1 2
2.2,
2 2
2.4,
4 2
2.5,
5 2
2.6
6 and
d2
2.7
7

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Classification of Materials

Resistivity
Quartz

Wood
Diamond

Insulators

Si

Ge

Semiconductors

Pb

Au

Conductors

1018 1016 1014 1012 1010 108 106 104 102 100 10-2 10-4 10-6 10-8

Resistivityy ((cm))
Key point: the conductivity of semiconductors can be controlled by doping

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Semiconductor materials
II

III IV V VI VII

Semiconductors
Element

Si, Ge

Compo
ound

III-V
Binary:
GaAs, AlAs, InAs
GaP InP
GaP,
InP, AlP
GaN, InN
Ternary:
AlGaAs, InGaAs,
InGaP, InGaN
Quaternary:
GaInNAs
Quinary:
GaInNAsSb

II-VI
Example: Al0.3Ga0.7As = alloy of 30% Al and 70% Ga (mole fraction)
Properties change with alloy composition.

ZnO, CdHgTe,
ZnSe

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Crystalline structure
Amorphous structure

a
Ga

Polycrystalline structure

Diamond Lattice (Si)

Zinc-blende Lattice (GaAs)

Concept of Unit Cell


Single crystal structure

a = lattice constant for cubic case

Lattice is defined by translational symmetry:


L = n1a + n2b + n3c (n1, n2, n3 are integers)
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Crystalline structure
Diamond-like

a/4
a
a/2

Each atom shared by


8 cubes: 8/8 = 1

Each atom shared by


2 cubes: 6/2 = 3

Each atom inside the


unit cell: 4

Number of atoms p
per cm3 = 8 / a3 = 8 / ((5.43 x 10-8)3 = 5 x 1022 at/cm-3
a (Si) = 5.43 Angstrom

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Miller Index Notation


[001]
[111]

[100]

How to identify directions? (basis of unit vectors)


[[h k l]] given
g
direction
<h k l> family of equivalent directions: i.e. [100], [001], .

[010]

[110]

How to identify planes? (vectors perpendicular to planes)


(h k l) given plane
{h k l} family of equivalent planes: i.e. (100), (001),

(1 0 0)

William Hallowes Miller


((1801 - 1839))

Universidad Politcnica de Madrid

How to construct Miller indices? (Cubic case)


Plane intercepts with crystal axes of a unit cell
Intercepts: X = a
Y=
Z=

1/a
1/ xa
1/

Reciprocal

Intercepts: X = a
Y=a
Z=

1
0
0

(100)

In a units

1/a
1/a xa
1/
1/

Reciprocal

(110)

In a units

Intercepts: X = a/2
Y=a
Z=

1
1
0

2/a
1/a xa
1/

Reciprocal

2
1
0

(210)

In a units

Miller indices are always integers and they


are the inverses of the intercepts in real space
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How to construct Miller indices in hexagonal symetry


With three (independent) axis system: a1, a2, a3
Plane C
a3

Plane
a e A =(100)
( 00)
Plane B =(010)
Plane C =(110)

Plane B
a2

a1

Intercepts at : a1

1/a1
1/ xa1
1/

1
0
0

All these planes are equivalent by a 60 rotation


But the [100] direction is not to the (100) plane

a2
a1

Plane A

Byy convention a 4-axis ((4-index)) system


y
is used to
describe the hexagonal structure which removes
these apparent discrepancies.

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How to construct Miller indices in hexagonal symetry


With four (not independent) axis system: a1, a2, a3, a4
Plane C
a4

Plane
a e A = (1010)
( 0 0)
Plane B = (0110)
Plane C = (1100)

Intercepts at: a1

a3

1/a1
1/ xai
1/a3
1/

1
0
1
0

Now the (1010) direction is to the A plane (a1 - a3 composition)


a3

a1

Plane B

The plane perpendicular to the a4 axis is called the


b
basal
l plane.
l
It
Its Mill
Miller iindices
di
are (0001)

a2
a3
a1

Plane A

a2
Generic Miller indices are written as (h k i l) or (h k i c)
(
), i.e. theyy are not independent
p
Note that i = (h+k),
That is, the sum of the first three equals zero

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WHY such elaborated


elaborated Miller indices?
Using reciprocals avoids the mathematical complication of infinite intercepts
Represent the plane coordinates and distance between planes in reciprocal space,
(TEM where diffraction images are used)
(TEM,
used).
Reciprocal Space: geometrical construction for crystallography and solid state physics
c

Vectors in real space are: L = n1a + n2b + n3c


Reciprocal lattice vectors are g = h a* + k b* + l c* ; (hkl) the Miller indices
b

a
c

a* b c) / a b c
b* (c a) / a (b c)
c* (a b) / a (b c)
c

and
and
and

|a*| = 1 / |a|
|b*| = 1 / |b| (reciprocals)
|c*|| = 1 / |c|
|c

being |a (b c)| = a x (b x c) = volume of unit cell

b
a

with:

Reall iinterplanar
R
t l
spacing
i (dhkl) between
b t
consecutive
ti (hkl) planes
l
iis: dhkl = 1/ g
For succesive planes with (100) Miller indices (orange) real distance between
them is d100 = a, while in reciprocal space is g100 = 1a* = 1/ a
For succesive p
planes with ((200)) Miller indices (g
(green)) d200 = a/2,, while in
reciprocal space is g200 = 2a* =2/a
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Reciprocal Space:
Fourier transform of the spatial wavefunction of the original lattice (or direct lattice)
Transforms real points and distances into diffraction patterns
Gives a better understanding of scattering and any diffraction measurement (XRD
(XRD, TEM)

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Tunneling Microscope vs X-Ray Diffraction

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Purity
E
Expressed
d iin N
Ns ((nines)
i
)
purity of 99.9999 % = 6N
Generally, a minimum of 7N purity it is needed for IC applications

Calculate the purity of a 500 gr Si crystal containing 61014 cm-3 impurities of As


D
Density
it off Si = 2.53
2 53 gr/cm
/ 3, Atomic
At i weight
i ht = 28 gr/mol
/ l

mol
500 gr of Si
28gr

6.0231023 atoms
= 17.86 mol; X
= 1.071025 atoms
mol

cm 3
500 gr of Si
= 197.6 cm3;
2 .53 gr

1.071025 atoms
atoms density =
= 5.411022 atoms/cm3
3
197.6 cm

5.411022 6 1014
P it =
Purity
x 100 = 99.9999988
99 9999988
5.411022

7
7.5N
5N

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Discrete energy
gy levels are conceptually
p
y the same as bands in solids!!
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Pauli exclusion principle

Free electrons

Coupled Systems

Bound electrons

Levels splitting depend on wavefunction interaction


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Consequences of the periodic structure of crystals


For Carbon (Z=6)
Electron Shells (1s2,2s2, 2p2)

Ele
ectron Ene
ergy

For Si (Z=14)
Electron Shells (1s2,2s2, 2p6, 3s2, 3p2)

Bands properties depend on:

Coupling

No interaction

average distance between atoms


nature of those atoms
determine electrical behavior
(metal, insulator, semiconductor)

Interatomic spacing

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Electrical conduction in Semiconductors

What is needed for


electrical conduction?

Carriers free to move under an electric field (accelerate)


Free states to move in from the previous one occupied
For a metal: no problem. Many free carriers (electrons) and a quasi-continuum of free states.
No gap.
For a semiconductor: depends on doping and temperature (breaking bonds, ionization).
Two-carrier (electron and hole) conductivity.
F an iinsulator:
For
l
there
h
would
ld b
be no conductivity,
d i i unless
l
under
d extreme conditions.
di i
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Linear array of atoms (1D)


Use of rectangular shaped potential
Solution
S l ti off Schrdinger
S h di
equation
ti

V
(
r
)

(r ) E (r )
2m

k ( r ) e j k r U n ( k , r )

Real
potential

(Bloch functions)

Un(k,r) are periodic functions in space with


potential periodicity (envelope function)
For a single atom:
Levels 1s, 2s 2p, 3s 3p 3d, etc...

Rectangular
Rectang
lar
potential

For a linear array of atoms: energy bands

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Energy bands
GAP
Indirect
Direct

Degeneracy
Light holes
Heavy holes
p=

Crystals may have different properties depending on the directions


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4
3

GaAs

Conduction
band

Carrier
population

2
Energ
gy (eV)

2
E=0.31

1
Eg

0
-1
-2

Conduction
band

Si

1
Eg

0
-1

Valence
band

[[111]]

[[100]]

-2

Valence
band

[[111]]

[[100]]

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Concept of effective mass


When an electron is moving inside a solid material, the interaction with atoms will affect its
movement and this cannot be described byy a simple
p Newton's law.
The concept of effective mass allows to describe the movement of electrons by Newton's law.
If m* (effective mass) includes all internal effects from the crystal potential,
Then the force exerted on the electron by an external electric field is
Then,
Using the group velocity, Planks relation, and a Bloch function representing the electron:

p=

The effective
Th
ff ti mass is
i proportional
ti
l tto th
the reciprocal
i
l
of the curvature of the energy band profile.
The smaller the curvature, the higher the effective mass.

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A hole is a virtual particle that represents


the movement of many electrons moving in
th opposite
the
it direction
di ti under
d an electric
l t i field
fi ld
The effective mass of holes is in general
higher that that of electrons.
electrons This seems a
natural result of the higher difficulty to move
many electrons sequentially.

Small band curvature


means a heavyy (big)
( g) mass

High band curvature


means a light
li ht ((small)
ll) mass

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The energy band dispersion is taken as a


parabolic function of the wave vector k
(approximation to the Brillouin zone center).
center)

Ec
The group velocity essentially means the
average motion of the components of the wave
packet that represent
p
p
the electron.

A higher or infinite effective mass means that


the crystal field opposes the external field and
slows down the electron movement. Electron
momentum is mostly transferred to the lattice.

m*(k)

m*(k) is only constant near k=0


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Binaries and ternary compounds

Ba
andga
ap ene
ergy (e
eV)

Vegards
g
law

AlN

aInxGa1x As x aInAs (1 x) aGaAs

Bandgap

(almost linear)

Bowing parameter

Eg In x Ga1x As x Eg InAs (1 x ) Eg GaAs b x (1 x )

GaN

AlP

SiC

GaP

AlSb
GaAs

1
0
30
3,0

InN

35
3,5

(non- linear)

AlAs

InP

Si
Ge

55
5,5

Bowing
gp
parameter
stands for non-linear
behavior

GaSb
InAs

60
6,0

Lattice Constant

InSb

65
6,5

()
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Bandgap energy versus T

Varshnis law

T 2
E (T ) Eg
Eg
E (0)
(T )

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Electrron Energy

Interatomic spacing
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We need to determine the carrier distribution with respect to energy


in different bands. How electrons (holes) fill the bands:
Two concepts will be introduced to determine this:
Density
D
it off states
t t
Fermi-Dirac distribution and Fermi-Level
The distribution of these states in the bands is not uniform in energy
Density of states tells us how many states exist at a given energy E
The function f(E) specifies, under equilibrium conditions, the probability that
an available state at an energy E will be occupied by an electron. It is a
probability
p
y distribution function.
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Carrier distribution Functions


Fermi-Dirac (fermions, spin , Pauli)

Bose Einstein (bosons, spin 1, no Pauli)

Maxwell-Boltzman (non interac. molec.)

E EF (eV)

Notice that if E - EF is high


g enough
g ((~3 KT)) all functions are equal
q
This is the case of a non-degenerate semiconductor and then,
F-D may be replaced by M-B, much easier to handle.
F-D
F D function reaches rapidly unity (100%) below the Fermi energy
B-E function diverges at Fermi energy and is not valid below it.
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Fermi Dirac distribution


Fermi-Dirac
distribution. Fermi Level
fe (E)

1
E EF
1 exp

kT

E - EF (eV)
Means the carrier Energy Average (Chemical potential)
50%
%p
probability
y for E = EF at any
y temperature
p
Close to CB when more electrons than holes
Close to the VB when more holes than electrons
At (almost) midgap for intrinsic semiconductors
At 0K is
i a step-like
t lik function
f
ti
At higher temperature the probability for electrons in CB increases
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How many electrons (holes) in a Band?


Probability to occupy a state of a given energy (Fermi distribution)
Electrons

Holes

fe (E)

1
E EF
1 exp

kT

f p (E) 1 fe (E)

1
E E
1 exp F

kT

Density
y of states available
Electrons : g e ( E )

1 2m

2 2 2
*
e

3/ 2

E Ec 1/ 2

3/ 2

1 2mh*
1/ 2
Holes : g p ( E ) 2 2 Ev E
2
Electron (hole) density

g (E)
n( E ) g ( E ) f ( E ) dE
dE
exp ( E EF ) / k BT 1

Integration limits?

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Non degenerate case: Ec EF > ~3 kT


Non-degenerate
f (E )

1
E EF
1 exp

kT

1 2me kT
4 2

Approximated by
M
Maxwell-Boltzman
ll B lt
eq.

E E
f ( E ) exp F

kT

3/ 2

E EF
exp c
kT

3/ 2

EF Ev
EF Ev
exp

NV exp
kT
kT

1 2mh kT
p
4 2

Ec E F
N
exp

C
kT

This defines the effective density of states NC, NV that have a RT value of:

NC
NV

4
1

2 m e kT
2

2 m h kT
2

3/2

19
~
2
.
72

10
cm

3/2

19
~
1
.
16

10
cm

for Si

only close to k=0


where m* is const.

for Si

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Electron and Hole Carrier Densities


Definition of ni

n.p is a constant product for a given T and material

E c E F E F Ev
n p n N c N v exp

kT

Ec Ev
EG
N c N v expp
N c N v expp

kT

kT
ONLY INTRINSIC (E at midgap)
EG
10
3
ni n p N c N v exp
~ 1.0 10 cm for Si
2kT
ALWAYS (no
( specific
ifi EF position)
iti )

2
i

ni is
i called
ll d the
th intrinsic
i t i i carrier
i density,
d it andd depends
d
d on:
Semiconductor (gap energy, Eg)
Semiconductor (effective masses)
Temperature (through both T and Eg)

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Electron and Hole Carrier Densities


The situation we have considered here is referred to as the INTRINSIC case:
* The number of electrons and holes MUST be EQUAL (covalent bond breaking)
* This fact may be exploited to obtain an expression for the FERMI LEVEL position

ni n p N C exp ( Ec EF ) / kT NV exp ( E F Ev ) / kT
NV
2 E F Ec Ev
exp
p

NC
kT

N v Eg 3
mh*
Ec Ev 1
EF
kT ln
kT ln *
2
2
Nc 2 4
me
FERMI LEVEL LIES NEAR MIDWAY BETWEEN
THE CONDUCTION & VALENCE BANDS

Ec= Ev + Eg
Assuming Ev = 0

Position changes with material and temperature


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Electron and Hole Carrier Densities


EXAMPLE
Relative to the middle of the band gap
gap, estimate the position of the Fermi level in intrinsic Si at 300 K and 600 K
K.
The electron and hole effective masses may be taken as 1.1mo and 0.6mo, respectively. Does the Fermi level lie
above or below the middle of the gap at these temperatures?

mh* E g 3
3
0.6 E g
E F (300 K)
kT ln *
0.0259 ln
0.011 eV
2 4
m
2
4
1
.
1
2

e
Eg

mh* E g 3
3
0.6 E
E F (600 K)
0.0518 ln g 0.022 eV
kT ln *
2 4
1.1 2
me 2 4
Eg

NOTE THAT SINCE mh* < me* FOR SILICON, THE FERMI LEVEL WILL ALWAYS LIE
BELOW THE MIDDLE OF THE GAP FOR AN INTRINSIC MATERIAL!
ALSO NOTE HOW INCREASING TEMPERATURE PUSHES THE
FERMI LEVEL FURTHER DOWN BELOW THE MID-GAP

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Band filling

f ( E)

1
E EF
1 exp

kT

Intrinsic
The Fermi level
DOES not move

Intrinsic carrier density will change exponentially with Temperature!


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Band filling

HOLES

g(E)

Intrinsic semiconductor

f(E)

equal density of electrons and holes

ni no po

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Extrinsic (doped) semiconductors (Si case 3s2, 3p2)

Intrinsic

p-type

Si atoms: 4 covalent bonds

Boron (3 electrons) in Si

n-type
Phosphorous (5 electrons) in Si

me* o 2
Ec Ed 13,6 (eV )
mo s

mo s o
ro 0,53 * (A)
me o
Dopant atoms cannot move. Upon ionization, there is a fixed charge!
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Extrinsic (doped) semiconductors (Si - case)

Donor level
EF

g(E)

E i i semiconductor
Extrinsic
i
d

f(E)

diff
different
t density
d
i off electrons
l
and
dh
holes
l

At a given temperature, how to calculate:


The position of the Fermi level
The density of electrons
The density of holes

ni2 n p

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Extrinsic versus intrinsic semiconductors


Intrinsic
Intrinsic

(ni)

1017

1 x 1016 cm-3

no (cm-33 )

1016

Extrinsic
(Nd)
Eti i
Extrinsic

1015

1 x 1015 cm-3

n0 (cm-1)

Ionization

1014
1013
1012

Intrinsic (ni)

1011
0

10

12

1000/T
((K))-1
1000/T

Fermi level position as a function


of the temperature and doping

Carrier density in doped (extrinsic)


and intrinsic semiconductors as a
function of temperature and doping
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Extrinsic versus intrinsic semiconductors

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General case of a semiconductor with donors (Nd) and acceptors (Na)

n N a p N d

Charge neutrality condition:


Carrier densities:

n N C exp ( Ec E F ) / kT

p NV exp ( E F Ev ) / kT

Ionization Factor:

E EF
Na Na f (Ea ) Na 1 exp a

kT

E Ed
N d N d 1 f ( Ea ) N d 1 expp F
kT

Particular case of a n-type semiconductor (Nd)

n Nd

Charge neutrality condition with Na = 0:

n p Nd

ni2 n p

4n
2
d

N N
n
2

2
i

If att RT

Nd >> ni
p ni2 / Nd
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Impurities doping
Impurities,
III

Donor impurity: 1 more electron than the host atom

IV

VI

For Si : As o P (all group V)


For GaAs : Si, C in Ga sites (amphoterous)
Acceptor impurity: 1 electron less than the host atom
For Si : B (all group III)
For GaAs : Be (group II) in Ga sites
Si, C in As sites (amphoterous)
Selecting a donor (acceptor) depends on:
Atom size
Atom electronegativity
Doping control
Crystal compatibility
Doping technique
Energy
E
l
level
l (shallow,
( h ll
d
deep,
multiple)
li l )
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VII

Impurities doping
Impurities,

Shallow level character compares with kT

EC
EF

n-type
donors

EF

acceptors

EF

intrinsic
p-type

EV
As a consequence of doping
the Fermi level shifts closer
to the band edges

Ionization energies for several dopants


in Si and GaAs

Shallow level

higher ionization rate

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Crystal defects
Point defects (difficult to detect and measure, but quite ACTIVE)

Silicon

Substitutional
(AsSi)

Lattice vacancy
(VSi)

Interstitial
(IAs)

Frenkel Pair

Antisite
((As in Ga site))

GaAs

Antisite
(Ga in As site)

They generate energy levels in the bandgap


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Crystal defects

Extended defects (easier to detect and measure)

Edge

Screw

Dislocations

Stacking faults

Au

They may generate


Th
t energy levels
l
l in
i the
th bandgap.
b d
Degrade mobility and optical properties
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St
Steps
i the
in
th fabrication
f b i ti off a device
d i
1.

Select a high purity, high quality wafer (substrate)

2
2.

E it
Epitaxy
(
(growth
th off a thin
thi layer,
l
a few
f
microns
i
thi k)
thick)

3
3.

Different processes depending on the device

4.

All the p
processing
g is carried out on the epitaxial
p
layer
y
(planar technology)

5
5.

The final
Th
fi l quality
lit off the
th device
d i depends
d
d on the
th quality
lit
and control of all processes involved
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Steps in the fabrication of a device


Materials used
Semiconductors: Si, Ga(Al)As,In(Ga)P, InGaAs, Ga(Al)N, InGaN
Oxides: SiO2, Si3N4

Insulators,, passivation
p

Metals: Au, AuGe (2%), AuZn (2%), Al, Cu,

Ohmic contacts
Schottky barriers

Polycrystalline Si (Polysilicon)

MOS gates,
Integrated resistances

Organic materials: polyamide

Passivation

Others: dopants, gasses for dry etching, chemicals,


photoresists for standard and nano lithography
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Epitaxy

Heteroepitaxy:

The epitaxial layer and substrate are the same material (GaAs on
GaAs Si on Si) or different but with same in-plane
GaAs,
in plane lattice constant
The epitaxial layer and substrate are different materials (GaN on
sapphire InGaAs on InP) with the same or different lattice constant
sapphire,
constant.

<

dislocations
Crritical layer
thickness

Homoepitaxy:

In plane compression
Out plane tension

Lattice mismatch
is defined as
Lattice matched
Same lattice constants
AlAs on GaAs
InGaAs 53% on InP

Pseudomorphic
Different lattice constant
Lattice is strained
InGaAs on GaAs

m(%)

a epi a subs
a subs

100

Metamorphic
Different lattice constant
Strain is relieved by
relaxation forming dislocations

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Fabrication of a device
Planar technology (All the processes are carried out on the surface)
Example: p
p-n
n junction

1. Epitaxy of Si:n

2. Oxidation

5. Development

8. Doping

3. Resist deposition
9. Metallization
6. Etching of the oxide

4. Resist exposure to UV light

7. Resist removal

Final p-n junction

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Wafers

Single crystal Si ingot grown by


a Czochralsky process
Slicing and grinding

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Problems
1.

We want to dope
p GaAs with donor impurities
p
by
y adding
g Si in the crucible during
g the g
growth p
process.
We know that the weight of the liquid GaAs in the crucible is 350 gr. Calculate the weight of Si that it is
necessary to add, in order to obtain a donor concentration of 61017 cm-3.

2.

If the lattice constant of an InP substrate is 5.868 , calculate the mole fraction of In which allows
growing
i IInGaAs
G A lattice
l tti matched
t h d to
t this
thi substrate.
b t t

3.

We grow an InGaAs layer with 30% In on GaAs. Calculate the lattice mismatch.

4
4.

Estimate the bandgap energy at 300K of the In0.2Ga0.8P,


P if we know that the bowing parameter for this
material is 1.21 eV.

5.

Calculate the bandgap energy of the InP at 200K.

6.

The bandgap energy of the Si is 1.12 eV at room temperature.


a) Calculate the probability of finding electrons at the edge of the conduction band if it is absolutely
intrinsic.
b) As a consequence of n-type doping, the Fermi level shifts 0.53 eV from the value of intrinsic Si.
C l l t now th
Calculate
the same probability.
b bilit

Parameters and data:


Density of GaAs : GaAs=5.32
=5 32 gr/cm3 Atomic weights: Si=28 gr/mol,
gr/mol Ga=70 gr/mol,
gr/mol As=75 gr/mol
Lattice constants: InAs=6.058 , GaAs=5.65
Bandgap at 300K: InP=1.35 eV, GaP=2.26 eV
-4
InP: Eg0=1.4206 eV, =4.90610 eV/K, = 327 K, Boltzmann constant = 1.3810-23 J/K, q=1.610-19 C

Universidad Politcnica de Madrid

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